JPH08316003A - Square type chip resistor and its manufacture - Google Patents

Square type chip resistor and its manufacture

Info

Publication number
JPH08316003A
JPH08316003A JP7114249A JP11424995A JPH08316003A JP H08316003 A JPH08316003 A JP H08316003A JP 7114249 A JP7114249 A JP 7114249A JP 11424995 A JP11424995 A JP 11424995A JP H08316003 A JPH08316003 A JP H08316003A
Authority
JP
Japan
Prior art keywords
film
substrate
chip resistor
plating
resistance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7114249A
Other languages
Japanese (ja)
Inventor
Toshiaki Shimada
聡明 嶋田
Hiroyuki Yamada
博之 山田
Seiji Tsuda
清二 津田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP7114249A priority Critical patent/JPH08316003A/en
Publication of JPH08316003A publication Critical patent/JPH08316003A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To provide a highly accurate square type chip resistor of low resistance and small TCR and a method for the manufacture with stability at low price. CONSTITUTION: A resistance film 13 is formed on a substrate 11 with a base layer 12 in between. A protective film 14 is formed in such a manner that it covers the resistance film 13 with both its ends left. End-face electrodes 15 are formed in such a manner that they enclose both the ends of the substrate 11 and that they connect the substrate with the portion of the resistance film 13 not covered with the protective film 14. This obtains a square type chip resistor of low resistance and small TCR.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、一般的に電子回路等に
使用され、特に抵抗値の低い領域で抵抗温度係数の小さ
い高精度な角形チップ抵抗器およびその製造方法に関す
るものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a highly accurate rectangular chip resistor which is generally used in an electronic circuit or the like and has a small temperature coefficient of resistance in a low resistance region and a manufacturing method thereof.

【0002】[0002]

【従来の技術】近年、各種電子機器の小型化にともな
い、各種電子部品の実装面積を縮小するため、表面実装
部品への要求が高まっている。その中で角形チップ抵抗
器に対しても、従来からの半固定ボリュームの代替とし
て、高精度なものへの要求が高くなってきている。
2. Description of the Related Art In recent years, with the miniaturization of various electronic devices, the demand for surface-mounted components has been increasing in order to reduce the mounting area of various electronic components. Among them, there is an increasing demand for high precision as a substitute for the conventional semi-fixed volume for the rectangular chip resistor.

【0003】以下に従来の角形チップ抵抗器について、
図面を参照しながら説明する。図4は従来の角形チップ
抵抗器の断面図である。図において、1は96%アルミ
ナを含有する基板で、この基板1の上面および下面の側
部にはそれぞれ上面電極2および下面電極3を有してい
る。4は基板1上の各側部に設けられた上面電極2に電
気的に接続するように設けた抵抗体である。5は上面電
極2の一部および抵抗体4を覆うように設けられた保護
膜である。6は上面電極2と下面電極3とを電気的に接
続するように基板1の側端面に設けられた端面電極であ
る。7は端面電極6を覆うように設けられたNiからな
るNiめっき膜である。8はNiめっき膜を設けられた
はんだめっき膜である。
The conventional rectangular chip resistors will be described below.
This will be described with reference to the drawings. FIG. 4 is a sectional view of a conventional rectangular chip resistor. In the figure, reference numeral 1 is a substrate containing 96% alumina, and an upper surface electrode 2 and a lower surface electrode 3 are provided on the upper and lower sides of the substrate 1, respectively. Reference numeral 4 is a resistor provided so as to be electrically connected to the upper surface electrode 2 provided on each side of the substrate 1. A protective film 5 is provided so as to cover a part of the upper surface electrode 2 and the resistor 4. Reference numeral 6 denotes an end surface electrode provided on the side end surface of the substrate 1 so as to electrically connect the upper surface electrode 2 and the lower surface electrode 3. Reference numeral 7 denotes a Ni plating film made of Ni provided so as to cover the end surface electrode 6. Reference numeral 8 is a solder plating film provided with a Ni plating film.

【0004】以上のように設けられた角形チップ抵抗器
について、以下にその製造方法について説明する。
The manufacturing method of the rectangular chip resistor provided as described above will be described below.

【0005】まず、チップ状の96%アルミナを含有す
る基板1の上面の側部に厚膜銀系による一対の上面電極
2を形成すると共に、基板1の裏面に上面電極2と対応
させて厚膜銀系の裏面電極3を形成する。
First, a pair of upper surface electrodes 2 made of thick-film silver are formed on the side surface of the upper surface of the substrate 1 containing chip-shaped 96% alumina, and a thickness corresponding to the upper surface electrode 2 is formed on the back surface of the substrate 1. The silver-based back electrode 3 is formed.

【0006】次に、基板1の側部の上面電極2と電気的
に接続されるように基板1上に酸化ルテニウム系の厚膜
グレーズによる抵抗体4を形成する。
Next, a resistor 4 made of a ruthenium oxide-based thick film glaze is formed on the substrate 1 so as to be electrically connected to the upper surface electrode 2 on the side of the substrate 1.

【0007】次に、抵抗体4の抵抗値を所定の抵抗値に
揃えるためにレーザートリミングによる抵抗値修正を行
う。
Next, in order to make the resistance value of the resistor 4 equal to a predetermined resistance value, the resistance value is corrected by laser trimming.

【0008】次に、レーザートリミング修正済みの抵抗
体4を完全に覆うホウケイ酸鉛系のガラスによる保護膜
5を形成する。この際、レーザートリミングを除いた部
位に、スクリーン印刷によりパターン形成をした後、8
50℃あるいは600℃の高温にて焼成して形成する。
Next, a protective film 5 made of lead borosilicate glass is formed to completely cover the resistor 4 after laser trimming correction. At this time, after forming a pattern by screen printing on the part excluding the laser trimming, 8
It is formed by baking at a high temperature of 50 ° C. or 600 ° C.

【0009】次に、アルミナ基板1の側端面に上面電極
2と裏面電極3とを接続する厚膜銀系の端面電極6を形
成する。この際、端面電極6についても一般的に600
℃付近の高温にて焼成して形成する。
Next, a thick film silver-based end face electrode 6 for connecting the upper face electrode 2 and the back face electrode 3 is formed on the side end face of the alumina substrate 1. At this time, the end face electrode 6 is generally 600
It is formed by firing at a high temperature around ℃.

【0010】最後に、はんだ付け時の信頼性確保のた
め、端面電極6を覆うように電気めっきによりNiめっ
き膜7を形成し、その後、Niめっき膜7を覆うように
はんだめっき膜8を形成して、角形チップ抵抗器を製造
していた。
Finally, in order to ensure reliability during soldering, a Ni plating film 7 is formed by electroplating so as to cover the end surface electrodes 6, and then a solder plating film 8 is formed so as to cover the Ni plating film 7. And manufactured a rectangular chip resistor.

【0011】[0011]

【発明が解決しようとする課題】しかしながら上記従来
の構成および製造方法では、1Ω以下の低い抵抗値を有
する抵抗体4は、酸化ルテニウムを主成分とする厚膜グ
レーズ材料では、比抵抗の限界により形成することがで
きないため、AgあるいはPd等の金属粉末を添加した
抵抗体材料が使用され、酸化ルテニウム系のみからなる
抵抗体材料では、抵抗温度特性(以下TCRと略す)を
コントロール可能なTCR調整剤(おもに金属酸化物)
を添加することにより、±50ppm/℃程度を達成す
ることは可能であるが、1Ω以下の抵抗値領域では、抵
抗体材料組成におけるAgあるいはPdの含有率が高い
ために、TCR調整剤によるTCRのコントロールが不
可能となり、TCR値は金属粉末(AgあるいはPd)
自身がもつ+600〜1000ppm/℃となることは
避けられず、低い抵抗値を形成することはできても、T
CRの小さい高精度な角形チップ抵抗器を製造すること
ができないという課題を有していた。
However, in the above-described conventional structure and manufacturing method, the resistor 4 having a low resistance value of 1Ω or less is limited by the limit of the specific resistance in the thick film glaze material containing ruthenium oxide as a main component. Since it cannot be formed, a resistor material to which a metal powder such as Ag or Pd is added is used. With a resistor material composed only of ruthenium oxide, the resistance temperature characteristic (hereinafter abbreviated as TCR) can be controlled by TCR adjustment. Agent (mainly metal oxide)
It is possible to achieve about ± 50 ppm / ° C. by adding Al, but in the resistance value region of 1Ω or less, the content of Ag or Pd in the resistor material composition is high. Control becomes impossible, and the TCR value is metal powder (Ag or Pd)
It is inevitable that the temperature will be +600 to 1000 ppm / ° C, which is a property of itself, and a low resistance value can be formed, but T
There is a problem that it is not possible to manufacture a highly accurate rectangular chip resistor having a small CR.

【0012】[0012]

【課題を解決するための手段】上記課題を解決するため
に本発明は、上面に下地層を介して抵抗膜を有してなる
基板と、この基板の上面の抵抗膜の上に設けてなる保護
膜と、前記基板の両側端面に前記抵抗膜と電気的に接続
してなる端面電極と、この端面電極を覆うように設けて
なるめっき膜の構成を有するものである。
In order to solve the above-mentioned problems, the present invention comprises a substrate having a resistive film on the upper surface with an underlying layer interposed between the substrate and the resistive film on the upper surface of the substrate. The protective film, the end face electrodes electrically connected to the resistance film on both end faces of the substrate, and the plating film provided so as to cover the end face electrodes are provided.

【0013】また、基板の上面に活性化処理をして下地
層を形成し、この下地層の上面にCuおよびNiを交互
に積層し加熱して合金化して抵抗膜を形成し、この抵抗
膜上に保護膜を形成し、前記基板の両側端面に樹脂を含
有してなるAgまたはCuなるペーストを印刷・硬化し
て端面電極を形成し、この端面電極を覆うようにめっき
膜を形成してなる角形チップ抵抗器の製造方法からなる
ものである。
Further, an activation treatment is performed on the upper surface of the substrate to form an underlayer, and Cu and Ni are alternately laminated on the upper surface of the underlayer and heated to alloy to form a resistance film. A protective film is formed on the substrate, and a paste containing Ag or Cu containing a resin is printed and cured on both end surfaces of the substrate to form an end surface electrode, and a plating film is formed to cover the end surface electrode. And a method for manufacturing a rectangular chip resistor.

【0014】[0014]

【作用】上記構成により、抵抗膜にCu−Ni合金を用
いて形成しているので、Cu−Niの比率を変えること
によりTCRをコントロールすることができる。このた
め1Ω以下の低い抵抗値でありながら、Cu:Ni比率
を65〜55:35〜45に調整することにより、TC
Rが±100ppm/℃以内を達成しうる角形チップ抵
抗器を実現することができる。
With the above structure, since the resistance film is formed by using the Cu-Ni alloy, the TCR can be controlled by changing the ratio of Cu-Ni. Therefore, even if the resistance value is 1Ω or less, the TC: Ni ratio is adjusted to 65-55: 35-45 to obtain TC.
It is possible to realize a rectangular chip resistor capable of achieving R within ± 100 ppm / ° C.

【0015】また、Ag系またはCu系の電導率の優れ
た導電性樹脂材料により端面電極層を形成するため、端
面電極材料による抵抗値変化がほとんどなく、かつ高温
焼成しなくてよい。したがって、高温による特性の劣化
を防ぐことができるとともに、抵抗値ドリフトやTCR
を抑えることができる。
Further, since the end face electrode layer is formed of the Ag-based or Cu-based conductive resin material having an excellent electric conductivity, there is almost no change in the resistance value due to the end face electrode material and it is not necessary to perform high temperature firing. Therefore, deterioration of characteristics due to high temperature can be prevented, and resistance drift and TCR can be prevented.
Can be suppressed.

【0016】[0016]

【実施例】以下、本発明の一実施例における角形チップ
抵抗器について、図面を参照しながら説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS A rectangular chip resistor according to an embodiment of the present invention will be described below with reference to the drawings.

【0017】図1は、本発明の一実施例における角形チ
ップ抵抗器の断面図である。図1において、11は基板
で、好ましくは96%アルミナを含有するものである。
12は基板11の上面に設けられた下地層である。13
は下地層12の上面に設けられた抵抗膜で、好ましくは
Cu−Ni合金からなるものである。14は抵抗膜13
の上面に設けられた保護膜である。15は基板11の両
側端面に設けられ抵抗膜13と電気的に接続された端面
電極で、好ましくは樹脂を含有してなるものである。1
6は端面電極15を覆うように設けられた第1のめっき
膜であり、好ましくはNiを含有してなるものである。
17は第1のめっき膜16を覆いかつ、保護膜14と接
するように設けられた第2のめっき膜である。
FIG. 1 is a sectional view of a rectangular chip resistor according to an embodiment of the present invention. In FIG. 1, reference numeral 11 denotes a substrate, which preferably contains 96% alumina.
A base layer 12 is provided on the upper surface of the substrate 11. Thirteen
Is a resistance film provided on the upper surface of the underlayer 12, and is preferably made of a Cu—Ni alloy. 14 is a resistance film 13
Is a protective film provided on the upper surface of the. Reference numeral 15 denotes an end face electrode provided on both end faces of the substrate 11 and electrically connected to the resistance film 13, which preferably contains a resin. 1
Reference numeral 6 is a first plating film provided so as to cover the end face electrode 15, and preferably contains Ni.
Reference numeral 17 is a second plating film which is provided so as to cover the first plating film 16 and contact the protective film 14.

【0018】以上のように構成された角形チップ抵抗器
について、以下にその製造方法について、図面を参照し
ながら説明する。
The method of manufacturing the rectangular chip resistor having the above structure will be described below with reference to the drawings.

【0019】図2は、本発明の一実施例における角形チ
ップ抵抗器の製造方法を示す工程図である。
FIG. 2 is a process chart showing a method of manufacturing a rectangular chip resistor according to an embodiment of the present invention.

【0020】まず、96%アルミナを含有してなる基板
11を受け入れこの基板11の上面に、後工程のCu−
Ni合金抵抗膜13と基板11の表面を粗化し、アンカ
ー効果により密着性を向上させるため、フッ酸系水溶液
によるエッチング処理を行い、Cu−Ni合金抵抗膜下
地層12を形成するために、無電解Niめっきを行う。
この際、無電解Niめっきの前処理においては、センシ
タイジング、アクチベーティングを交互に複数回行う、
活性化処理を施している。
First, a substrate 11 containing 96% alumina is received, and Cu--
In order to roughen the surfaces of the Ni alloy resistance film 13 and the substrate 11 and improve the adhesion by the anchor effect, an etching treatment with a hydrofluoric acid-based aqueous solution is performed to form the Cu—Ni alloy resistance film underlayer 12. Electrolytic Ni plating is performed.
At this time, in the pretreatment of the electroless Ni plating, sensitizing and activating are alternately performed a plurality of times.
Activated.

【0021】次に、Cu−Ni合金抵抗膜下地層12上
に電解めっきにより、CuめっきおよびNiめっきを交
互に複数回繰り返してCu−Niの多層めっき層を形成
する。この際Niめっきは必ずCuめっきの後に行い、
また最外層は必ずNiめっきとなるよう製造する。Cu
めっき膜およびNiめっき膜の膜厚は、後工程での高温
処理された合金抵抗膜のCuとNiの比率が65〜5
5:35〜45になるようにめっき条件(めっき時間、
めっき電流、めっき回数等)を設定した。これは、図3
のCu−Ni合金の比率と性質の関係図に示すように、
CuとNiの比率が65〜55:35〜45の範囲から
外れると、TCRを±100ppm/℃以内に制御する
ことができなくなってしまうためである。
Next, Cu plating and Ni plating are alternately repeated a plurality of times on the Cu-Ni alloy resistance film underlayer 12 by electrolytic plating to form a Cu-Ni multilayer plating layer. At this time, Ni plating must be performed after Cu plating,
Also, the outermost layer is always manufactured by Ni plating. Cu
As for the film thickness of the plated film and the Ni plated film, the ratio of Cu and Ni of the alloy resistance film subjected to the high temperature treatment in the subsequent step is 65 to 5
5: 35-45 plating conditions (plating time,
The plating current, the number of times of plating, etc.) were set. This is shown in Figure 3.
As shown in the relationship diagram between the ratio of Cu-Ni alloy and properties of
This is because if the ratio of Cu and Ni deviates from the range of 65 to 55:35 to 45, the TCR cannot be controlled within ± 100 ppm / ° C.

【0022】次に、多層めっき層を高温処理により、C
u−Niの層状めっき膜を合金化させCu−Ni合金抵
抗膜13を形成する。この際、高温処理は、800℃に
設定した熱処理炉に2時間放置するとともに、抵抗膜の
酸化を防止するためにグリーンガス(水素10%入り窒
素ガス)を供給する。
Next, the multi-layer plating layer is subjected to a high temperature treatment to obtain C
The Cu-Ni alloy resistance film 13 is formed by alloying the u-Ni layered plating film. At this time, in the high temperature treatment, the material is left in a heat treatment furnace set at 800 ° C. for 2 hours and green gas (nitrogen gas containing 10% hydrogen) is supplied to prevent oxidation of the resistance film.

【0023】次に、Cu−Ni合金抵抗膜13を目的の
抵抗値が得られるようレーザートリミングにより抵抗値
修正を行う。この工程により、所望の抵抗値ならびにT
CRをもつCu−Ni合金抵抗膜13が形成され、これ
以降の工程では抵抗特性に影響を与える高温工程がない
ことが不可欠である。すなわち、以下の工程は、低温プ
ロセス工法である。
Next, the resistance value of the Cu-Ni alloy resistance film 13 is corrected by laser trimming so as to obtain a target resistance value. Through this process, the desired resistance value and T
It is indispensable that the Cu-Ni alloy resistance film 13 having CR is formed, and that there is no high temperature step that affects the resistance characteristics in the subsequent steps. That is, the following steps are low-temperature process construction methods.

【0024】次に、抵抗値修正済みCu−Ni合金抵抗
膜13の一部を除いて露出されることがないように、耐
湿および耐熱特性に優れたエポキシ系樹脂ペーストをス
クリーン印刷し、200℃雰囲気のBOX乾燥機で30
分間乾燥硬化して保護膜14を形成する。
Next, an epoxy resin paste having excellent resistance to moisture and heat is screen-printed so as not to be exposed except for a part of the resistance-modified Cu-Ni alloy resistance film 13, and the temperature is set to 200 ° C. 30 in a BOX dryer in the atmosphere
The film is dried and cured for a minute to form the protective film 14.

【0025】次に、基板11の両側端部を略コ字状に囲
み、かつCu−Ni合金抵抗膜13の露出された部分と
接続する樹脂の端面電極15を形成するため、導電性の
樹脂Agペーストをローラー塗布機により塗布し、20
0℃雰囲気のBOX乾燥機で30分間乾燥硬化する。こ
の端面電極15は、Cu系などの電導率の優れた樹脂材
料であれば、他の樹脂材料でもよく、カーボン等も使用
することができる。
Next, a conductive resin is used to form the resin end face electrodes 15 that surround both end portions of the substrate 11 in a substantially U shape and are connected to the exposed portions of the Cu-Ni alloy resistance film 13. Apply Ag paste with roller applicator,
Dry and cure for 30 minutes in a BOX dryer at 0 ° C. The end surface electrode 15 may be made of another resin material such as Cu or the like as long as it is a resin material having an excellent electric conductivity, and carbon or the like can be used.

【0026】最後に、露出した端面電極15のはんだ付
け時の信頼性を確保するため、電解めっきにより、Ni
めっき膜16およびはんだめっき膜17を形成して、本
発明による角形チップ抵抗器を得るものである。
Finally, in order to secure the reliability of the exposed end surface electrode 15 at the time of soldering, Ni plating is performed by electrolytic plating.
The plating film 16 and the solder plating film 17 are formed to obtain the rectangular chip resistor according to the present invention.

【0027】以上のように製造された角形チップ抵抗器
は、抵抗値が約20mΩから200mΩの抵抗値を有し
ながら、TCRが約+30ppm/℃を有する高精度な
製品であることが確認できた。
It was confirmed that the rectangular chip resistor manufactured as described above is a highly accurate product having a resistance value of about 20 mΩ to 200 mΩ and a TCR of about +30 ppm / ° C. .

【0028】なお、この本実施例の角形チップ抵抗器で
は、個片状のチップ抵抗器で製造工程を説明したが、一
般的には量産性を向上させるため、複数のチップを同時
に生産すべく縦横方向に複数の分割用スリットを形成し
たシート状のアルミナ基板を使用する。したがって、端
面電極を形成する前工程として端面部を露出させるため
の一次分割工程、および端面電極形成後に個片状チップ
抵抗器とするための二次分割工程が付加される。
In the rectangular chip resistor of this embodiment, the manufacturing process has been described with the individual chip resistors, but in general, in order to improve mass productivity, a plurality of chips should be manufactured simultaneously. A sheet-shaped alumina substrate in which a plurality of dividing slits are formed in the vertical and horizontal directions is used. Therefore, as a pre-process of forming the end-face electrodes, a primary dividing process for exposing the end-face portion and a secondary dividing process for forming individual chip resistors after forming the end-face electrodes are added.

【0029】なお、Cu−Niのめっき膜は電解めっき
により形成したが、無電解めっきでも同様にめっき膜は
形成できる。ただし、めっき膜の成長が遅いため、生産
性を考えた場合、電解めっきの方が有利である。また、
本実施例のCu−Niのめっき膜はCuめっきおよびN
iめっきを交互に複数回繰り返した多層めっき層により
形成したが、電解Cu−Ni合金めっきにより一層で形
成することもできる。
Although the Cu-Ni plating film was formed by electrolytic plating, the plating film can be formed by electroless plating as well. However, since the plating film grows slowly, electrolytic plating is more advantageous in terms of productivity. Also,
The Cu-Ni plating film of the present embodiment is Cu plating and N
Although the i-plating is formed by a multilayer plating layer which is alternately repeated a plurality of times, it may be formed by a single layer by electrolytic Cu-Ni alloy plating.

【0030】[0030]

【発明の効果】以上の説明から明らかなように、本発明
による製造方法によれば、Cu−Niの合金により抵抗
膜を形成することにより、1Ω以下の低い抵抗値で、か
つTCRが±50〜100ppm/℃を有する角形チッ
プ抵抗器を提供することができるものである。
As is apparent from the above description, according to the manufacturing method of the present invention, the resistance film is formed of the alloy of Cu-Ni, so that the resistance value is 1Ω or less and the TCR is ± 50. It is possible to provide a rectangular chip resistor having ˜100 ppm / ° C.

【0031】また、従来の厚膜チップ抵抗器の生産設備
であるスクリーン印刷機、端面塗布機および焼成炉、め
っき設備等を使用することにより、量産性に富みかつ安
価に製品を製造することができるものである。
Further, by using a conventional thick film chip resistor production facility such as a screen printer, an end face coater, a baking furnace, and a plating facility, it is possible to manufacture a product with high mass productivity at low cost. It is possible.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例における角形チップ抵抗器の
断面図
FIG. 1 is a cross-sectional view of a rectangular chip resistor according to an embodiment of the present invention.

【図2】同製造方法を示す工程図FIG. 2 is a process drawing showing the same manufacturing method.

【図3】Cu−Ni合金の比率と性質の関係を示す図FIG. 3 is a diagram showing a relationship between a Cu—Ni alloy ratio and properties.

【図4】従来の角形チップ抵抗器の断面図FIG. 4 is a cross-sectional view of a conventional rectangular chip resistor.

【符号の説明】[Explanation of symbols]

11 基板 12 下地層 13 Cu−Ni合金抵抗膜 14 保護膜 15 端面電極 16 第1のめっき膜 17 第2のめっき膜 11 Substrate 12 Underlayer 13 Cu-Ni alloy resistance film 14 Protective film 15 End face electrode 16 First plating film 17 Second plating film

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 上面に下地層を介して抵抗膜を有してな
る基板と、この基板の上面の抵抗膜の上に設けてなる保
護膜と、前記基板の両側端面に前記抵抗膜と電気的に接
続してなる端面電極と、この端面電極を覆うように設け
てなるめっき膜とからなる角形チップ抵抗器。
1. A substrate having a resistive film on an upper surface thereof with a base layer interposed therebetween, a protective film provided on the resistive film on the upper surface of the substrate, and the resistive film and the electrical conductive film on both side end surfaces of the substrate. Rectangular chip resistor comprising an end face electrode that is electrically connected and a plating film that is provided so as to cover the end face electrode.
【請求項2】 抵抗膜は、Cu−Ni合金でかつその含
有比率が、Cu:Ni=65〜55:35〜45である
請求項1記載の角形チップ抵抗器。
2. The rectangular chip resistor according to claim 1, wherein the resistance film is a Cu—Ni alloy and the content ratio thereof is Cu: Ni = 65 to 55:35 to 45.
【請求項3】 端面電極は、Ag系またはCu系の樹脂
材料を含有してなる請求項1記載の角形チップ抵抗器。
3. The rectangular chip resistor according to claim 1, wherein the end face electrode contains an Ag-based or Cu-based resin material.
【請求項4】 基板の上面に活性化処理をして下地層を
形成し、この下地層の上面にCuおよびNiを交互に積
層し加熱して合金化して抵抗膜を形成し、この抵抗膜上
に保護膜を形成し、前記基板の両側端面に樹脂を含有し
てなるAgまたはCuなるペーストを印刷・硬化して端
面電極を形成し、この端面電極を覆うようにめっき膜を
形成してなる角形チップ抵抗器の製造方法。
4. A resistance film is formed by performing activation treatment on the upper surface of a substrate to form a base layer, and alternately stacking Cu and Ni on the upper surface of the base layer and heating them to alloy them to form a resistance film. A protective film is formed on the substrate, and a paste containing Ag or Cu containing a resin is printed and cured on both end surfaces of the substrate to form an end surface electrode, and a plating film is formed to cover the end surface electrode. Of manufacturing rectangular chip resistor.
JP7114249A 1995-05-12 1995-05-12 Square type chip resistor and its manufacture Pending JPH08316003A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7114249A JPH08316003A (en) 1995-05-12 1995-05-12 Square type chip resistor and its manufacture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7114249A JPH08316003A (en) 1995-05-12 1995-05-12 Square type chip resistor and its manufacture

Publications (1)

Publication Number Publication Date
JPH08316003A true JPH08316003A (en) 1996-11-29

Family

ID=14633043

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7114249A Pending JPH08316003A (en) 1995-05-12 1995-05-12 Square type chip resistor and its manufacture

Country Status (1)

Country Link
JP (1) JPH08316003A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115295262A (en) * 2022-07-14 2022-11-04 捷群电子科技(淮安)有限公司 Anti-vulcanization thick film sheet type fixed resistor and use method thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115295262A (en) * 2022-07-14 2022-11-04 捷群电子科技(淮安)有限公司 Anti-vulcanization thick film sheet type fixed resistor and use method thereof

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