JPH082604Y2 - 特性ｘ線検出装置 - Google Patents
特性ｘ線検出装置Info
- Publication number
- JPH082604Y2 JPH082604Y2 JP1989091014U JP9101489U JPH082604Y2 JP H082604 Y2 JPH082604 Y2 JP H082604Y2 JP 1989091014 U JP1989091014 U JP 1989091014U JP 9101489 U JP9101489 U JP 9101489U JP H082604 Y2 JPH082604 Y2 JP H082604Y2
- Authority
- JP
- Japan
- Prior art keywords
- characteristic
- window
- ray
- rays
- substance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000126 substance Substances 0.000 claims description 13
- 239000011247 coating layer Substances 0.000 claims description 3
- 238000001514 detection method Methods 0.000 claims description 2
- 230000005855 radiation Effects 0.000 claims description 2
- 239000000463 material Substances 0.000 claims 1
- 229910052790 beryllium Inorganic materials 0.000 description 3
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 239000010410 layer Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1989091014U JPH082604Y2 (ja) | 1989-08-03 | 1989-08-03 | 特性ｘ線検出装置 |
| GB9016868A GB2235763B (en) | 1989-08-03 | 1990-08-01 | Characteristic x-ray detecting device |
| US07/562,325 US5103470A (en) | 1989-08-03 | 1990-08-03 | Characteristic x-ray detecting device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1989091014U JPH082604Y2 (ja) | 1989-08-03 | 1989-08-03 | 特性ｘ線検出装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0330856U JPH0330856U (en, 2012) | 1991-03-26 |
| JPH082604Y2 true JPH082604Y2 (ja) | 1996-01-29 |
Family
ID=14014694
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1989091014U Expired - Lifetime JPH082604Y2 (ja) | 1989-08-03 | 1989-08-03 | 特性ｘ線検出装置 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US5103470A (en, 2012) |
| JP (1) | JPH082604Y2 (en, 2012) |
| GB (1) | GB2235763B (en, 2012) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6100533A (en) * | 1997-03-26 | 2000-08-08 | Eg&G Instruments, Inc. | Three-axis asymmetric radiation detector system |
| JP3853522B2 (ja) * | 1998-08-07 | 2006-12-06 | 三菱原子燃料株式会社 | 蛍光ｘ線検査装置 |
| US6345086B1 (en) * | 1999-09-14 | 2002-02-05 | Veeco Instruments Inc. | X-ray fluorescence system and method |
| JP3724424B2 (ja) * | 2002-01-16 | 2005-12-07 | 株式会社島津製作所 | 蛍光ｘ線分析装置 |
| EP3384737B1 (en) * | 2015-12-01 | 2019-09-18 | Koninklijke Philips N.V. | Determining a status of an x-ray tube of an x-ray system |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR1389417A (fr) * | 1963-04-01 | 1965-02-19 | Commissariat Energie Atomique | Procédé de dosage et dispositifs en faisant application |
| DE2727989C3 (de) * | 1977-06-22 | 1980-05-08 | Kernforschungszentrum Karlsruhe Gmbh, 7500 Karlsruhe | Einrichtung zur Bestimmung von Uran und/oder Thorium in Erzproben |
| JPS5470880A (en) * | 1977-11-16 | 1979-06-07 | Hitachi Ltd | Proportion counter for neutron moisture meter |
| US4560877A (en) * | 1982-12-29 | 1985-12-24 | General Electric Company | Solid state detector module |
-
1989
- 1989-08-03 JP JP1989091014U patent/JPH082604Y2/ja not_active Expired - Lifetime
-
1990
- 1990-08-01 GB GB9016868A patent/GB2235763B/en not_active Expired - Fee Related
- 1990-08-03 US US07/562,325 patent/US5103470A/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US5103470A (en) | 1992-04-07 |
| GB2235763A (en) | 1991-03-13 |
| GB2235763B (en) | 1993-05-12 |
| JPH0330856U (en, 2012) | 1991-03-26 |
| GB9016868D0 (en) | 1990-09-12 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5181234A (en) | X-ray backscatter detection system | |
| AU6441600A (en) | X-ray fluorescence sensor for measurement of metal sheet thickness | |
| HK1207468A1 (en) | Apparatus for protecting a radiation window | |
| JPH082604Y2 (ja) | 特性ｘ線検出装置 | |
| US5266802A (en) | Electron microscope | |
| KR100797680B1 (ko) | 미량시료분석장치 | |
| CA2083064C (en) | X-ray backscatter detection system | |
| ES469059A1 (es) | Un tubo de rayos x perfeccionado | |
| JP2507934Y2 (ja) | 蛍光ｘ線分析装置 | |
| JP2890127B2 (ja) | 蛍光ｘ線分析用試料ホルダ | |
| JPH0519839Y2 (en, 2012) | ||
| JPH08313642A (ja) | Ｘ線検出装置 | |
| CN107402196B (zh) | X射线荧光分析仪器及用于其的样品容器 | |
| CN216082559U (zh) | 手持式x射线荧光光谱仪防辐射支架装置 | |
| JP2591287Y2 (ja) | 蛍光ｘ線分析用の試料ホルダ | |
| JPS6029897B2 (ja) | 螢光ｘ線分析機のｘ線遮蔽装置 | |
| JP3946643B2 (ja) | 光粒子装置のｘ線分析方法 | |
| JPH01141344A (ja) | 蛍光ｘ線分析装置 | |
| JP3234716B2 (ja) | Ｘ線分析に用いる面積測定方法 | |
| JP2000162161A (ja) | 蛍光ｘ線分析装置 | |
| JPS63153458A (ja) | 蛍光ｘ線分析用試料ホルダ− | |
| KR820001379Y1 (ko) | 미량시료용기 | |
| JPH0738843Y2 (ja) | エネルギー分散型蛍光ｘ線分析装置 | |
| SU563057A1 (ru) | Устройство дл определени элементарного составаВЕщЕСТВА | |
| JPS57149942A (en) | Inspecting device for liquid leakage of battery |