JPH082604Y2 - 特性ｘ線検出装置 - Google Patents

特性ｘ線検出装置

Info

Publication number
JPH082604Y2
JPH082604Y2 JP1989091014U JP9101489U JPH082604Y2 JP H082604 Y2 JPH082604 Y2 JP H082604Y2 JP 1989091014 U JP1989091014 U JP 1989091014U JP 9101489 U JP9101489 U JP 9101489U JP H082604 Y2 JPH082604 Y2 JP H082604Y2
Authority
JP
Japan
Prior art keywords
characteristic
window
ray
rays
substance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1989091014U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0330856U (US08087162-20120103-C00010.png
Inventor
財政 岩本
Original Assignee
理学電機工業株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 理学電機工業株式会社 filed Critical 理学電機工業株式会社
Priority to JP1989091014U priority Critical patent/JPH082604Y2/ja
Priority to GB9016868A priority patent/GB2235763B/en
Priority to US07/562,325 priority patent/US5103470A/en
Publication of JPH0330856U publication Critical patent/JPH0330856U/ja
Application granted granted Critical
Publication of JPH082604Y2 publication Critical patent/JPH082604Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP1989091014U 1989-08-03 1989-08-03 特性ｘ線検出装置 Expired - Lifetime JPH082604Y2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP1989091014U JPH082604Y2 (ja) 1989-08-03 1989-08-03 特性ｘ線検出装置
GB9016868A GB2235763B (en) 1989-08-03 1990-08-01 Characteristic x-ray detecting device
US07/562,325 US5103470A (en) 1989-08-03 1990-08-03 Characteristic x-ray detecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1989091014U JPH082604Y2 (ja) 1989-08-03 1989-08-03 特性ｘ線検出装置

Publications (2)

Publication Number Publication Date
JPH0330856U JPH0330856U (US08087162-20120103-C00010.png) 1991-03-26
JPH082604Y2 true JPH082604Y2 (ja) 1996-01-29

Family

ID=14014694

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989091014U Expired - Lifetime JPH082604Y2 (ja) 1989-08-03 1989-08-03 特性ｘ線検出装置

Country Status (3)

Country Link
US (1) US5103470A (US08087162-20120103-C00010.png)
JP (1) JPH082604Y2 (US08087162-20120103-C00010.png)
GB (1) GB2235763B (US08087162-20120103-C00010.png)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6100533A (en) * 1997-03-26 2000-08-08 Eg&G Instruments, Inc. Three-axis asymmetric radiation detector system
JP3853522B2 (ja) * 1998-08-07 2006-12-06 三菱原子燃料株式会社 蛍光ｘ線検査装置
US6345086B1 (en) * 1999-09-14 2002-02-05 Veeco Instruments Inc. X-ray fluorescence system and method
JP3724424B2 (ja) * 2002-01-16 2005-12-07 株式会社島津製作所 蛍光ｘ線分析装置
US10575391B2 (en) * 2015-12-01 2020-02-25 Koninklijke Philips N.V. Determining a status of an X-ray tube of an X-ray system

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1389417A (fr) * 1963-04-01 1965-02-19 Commissariat Energie Atomique Procédé de dosage et dispositifs en faisant application
DE2727989C3 (de) * 1977-06-22 1980-05-08 Kernforschungszentrum Karlsruhe Gmbh, 7500 Karlsruhe Einrichtung zur Bestimmung von Uran und/oder Thorium in Erzproben
JPS5470880A (en) * 1977-11-16 1979-06-07 Hitachi Ltd Proportion counter for neutron moisture meter
US4560877A (en) * 1982-12-29 1985-12-24 General Electric Company Solid state detector module

Also Published As

Publication number Publication date
GB2235763B (en) 1993-05-12
US5103470A (en) 1992-04-07
GB9016868D0 (en) 1990-09-12
JPH0330856U (US08087162-20120103-C00010.png) 1991-03-26
GB2235763A (en) 1991-03-13

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