JPH08195553A - Repairing device of soldering part by visual inspection - Google Patents

Repairing device of soldering part by visual inspection

Info

Publication number
JPH08195553A
JPH08195553A JP461295A JP461295A JPH08195553A JP H08195553 A JPH08195553 A JP H08195553A JP 461295 A JP461295 A JP 461295A JP 461295 A JP461295 A JP 461295A JP H08195553 A JPH08195553 A JP H08195553A
Authority
JP
Japan
Prior art keywords
corrected
circuit board
printed circuit
visual inspection
defective portion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP461295A
Other languages
Japanese (ja)
Inventor
Akira Ito
昭 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Denshi KK
Original Assignee
Hitachi Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Denshi KK filed Critical Hitachi Denshi KK
Priority to JP461295A priority Critical patent/JPH08195553A/en
Publication of JPH08195553A publication Critical patent/JPH08195553A/en
Pending legal-status Critical Current

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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

PURPOSE: To obtain an enlarged image of a faulty part on a printed circuit board to be corrected by arranging a test glass for enlarging and displaying a faulty part on the printed circuit board to be corrected at the side part of a stereomicroscope with a rotary mirror in scope system and on an XY drive stage mechanism. CONSTITUTION: The fault data of a printed circuit board 11 to be corrected obtained from an appearance inspection device 10 are stored in a personal computer 6. The printed circuit board to be corrected is called by a CPU of the personal computer 6 and pulses are transmitted to the X/Y-axis drive motor of an XY drive stage 4 according to the fault position data of the printed circuit board 11 to be corrected for positioning the faulty part of the printed circuit board to be corrected at the center of the stereomicroscope 1. An image is projected onto the display part of a solid-scope-type stereomicroscope 1. The faulty part of the printed circuit board 11 to be corrected is successively and automatically shifted and the image positioned at the center point is enlarged by a zoom-type optical system lens 2 to obtain the enlarged image of the faulty part.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、はんだ付け部の目視検
査とその修復装置に関するもので、特に、高密度化によ
って困難となってきている目視検査と、修正作業の効率
化を図ることを目的とするもので、プリント基板に実装
された部品のはんだ付状態や、取付け状態を、拡大され
た画像の目視により検査し、良否の判定結果により、そ
の場で修正作業が行えるようにしたものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a visual inspection of a soldered portion and a repairing apparatus therefor, and in particular, it is aimed to improve the efficiency of visual inspection which is becoming difficult due to high density and the repair work. The purpose is to inspect the soldering condition and mounting condition of the components mounted on the printed circuit board by visually observing the enlarged image, and the correction work can be performed on the spot based on the judgment result of good or bad. Is.

【0002】[0002]

【従来の技術】従来の技術として、外観検査装置等によ
る不良個所へのマーキング方式と、外観検査装置で摘出
した不良個所の位置データを利用した、レーザによる不
良個所指示装置などがある。
2. Description of the Related Art As a conventional technique, there are a marking system for marking a defective portion by a visual inspection device and a device for indicating a defective portion by a laser utilizing position data of the defective portion extracted by the visual inspection device.

【0003】以下一例として、レーザによる不良個所指
示装置について説明する。
As an example, a defect point indicating device using a laser will be described below.

【0004】図5に示すようにはんだ付け外観検査装置
10から得られた被修正プリント基板11の不良部位X
−Y座標データを不良部位指示装置のパソコン6に、フ
ロッピーディスク(以下F/D)又は不良データ転送ラ
インを介して取り込みメモリする。
As shown in FIG. 5, a defective portion X of the to-be-corrected printed circuit board 11 obtained from the soldering appearance inspection apparatus 10
-Y coordinate data is fetched into the personal computer 6 of the defective portion indicating device via a floppy disk (hereinafter referred to as F / D) or a defective data transfer line and stored in memory.

【0005】一方、不良部位指示装置に設けたプリント
板固定台13には、前記被修正プリント基板11を固定
しておき、すでに前記パソコン6にメモリしている不良
位置データを同じくパソコン6のCPU部に読み出し不
良部位指示装置の上部に設けたレーザー照射部14を前
記パソコン6と制御部16でコントロールしてレーザー
15を順次偏向させながら被修正プリント基板11の不
良部位を指示する。
On the other hand, the above-mentioned printed board 11 to be corrected is fixed to the printed board fixing base 13 provided in the defective portion indicating device, and the defective position data already stored in the personal computer 6 is stored in the CPU of the personal computer 6. The laser irradiating unit 14 provided above the reading defective portion pointing device is controlled by the personal computer 6 and the control unit 16 to sequentially deflect the laser 15 to indicate the defective portion on the printed circuit board 11 to be corrected.

【0006】レーザー15で指示した不良部位は微細、
狭ピッチとなっており、肉眼での修正は困難なため、順
次前記不良部位ごとに、白色インク等を使用して、マー
キングしておき、全不良部位を確認及びマーキングした
後、図示しない拡大鏡又は顕微鏡を設置した作業場所に
被修正プリント基板11を移動して、不良部位の修正作
業を行う。
The defective portion designated by the laser 15 is minute,
Since the pitch is narrow and it is difficult to correct it with the naked eye, the defective areas are sequentially marked using white ink etc., and after checking and marking all the defective areas, a magnifying glass not shown Alternatively, the printed circuit board 11 to be corrected is moved to the work place where the microscope is installed, and the defective portion is corrected.

【0007】[0007]

【発明が解決しようとする課題】一般的に微小部品や、
実装の高密度化により、プリント基板検査における通常
の目視検査では、良否の判定ができない場合が多くなっ
ている。はんだ付検査装置による不良摘出も、虚報(実
際には正常であるのに不良と判断されたもの)が多くあ
る。これらのチェック方法として、ビデオ画像で拡大し
て目視で検査する方法もあるが、平面画像であること、
解像度に限界があることなどから、ICリードの浮きな
どの、はんだ付不良を見逃したり良否を判定するのが困
難となっている。そのほか、顕微鏡による目視検査で
は、眼の疲労、作業効率低下などをまねいている。この
ための改善として、修正作業を行う時に不良と判定した
個所にマーキングが施されていることや、その場で修正
作業が行えること等、現場サイドでのニーズが高まって
いる。前述の従来技術による、はんだ修正方法は、被修
正プリント板上の微細、狭ピッチの不良部位を順次レー
ザーで指し示すのみの機能となっているため、前述のよ
うに全不良部位を順次マーキングした後、拡大鏡などを
設置した作業場所に移動して修正する必要がある。又、
レーザーを不良部位に偏向させる方式のため、レーザー
指示の位置精度が悪くなることなどから、不良部位を指
示し不必要なマーキングを行うなど多くの欠点がある。
Generally, a small component or
Due to high packaging density, it is often impossible to judge pass / fail by a normal visual inspection in a printed circuit board inspection. There are many false alarms (those that were judged to be defective even though they were actually normal) even when defects were picked up by the soldering inspection device. As a check method for these, there is also a method of visually inspecting by enlarging with a video image, but it is a flat image,
Since there is a limit to the resolution, it is difficult to overlook soldering defects such as floating of IC leads and to judge pass / fail. In addition, visual inspection with a microscope causes eye fatigue and reduced work efficiency. As an improvement for this, there is an increasing need on the site side, such as marking on a portion that is determined to be defective when performing repair work, and performing repair work on the spot. Since the solder repair method according to the above-described conventional technique has a function of only indicating the fine and narrow-pitch defective portions on the printed board to be repaired sequentially with the laser, after sequentially marking all the defective portions as described above. , It is necessary to move to a work place where a magnifying glass is installed and correct it. or,
Since the method of deflecting the laser to the defective portion deteriorates the positional accuracy of the laser indication, there are many drawbacks such as indicating the defective portion and performing unnecessary marking.

【0008】[0008]

【課題を解決するための手段】本発明は、上記第一の目
的を達成するため、前記X−Yステージ上に前記被修正
プリント板を搭載して、前記はんだ付検査機で得た不良
位置データを用い、パソコンと制御部とによって前記被
修正プリント板上の不良部位が修正作業者(以下作業
者)の正面に位置するようX−Yステージをコントロー
ルすると同時に、第1のステージにおいて前記対象物を
側面から見ることができる拡大鏡を使用し、不良部位を
確認すると共に、第2のステージにおいて拡大しながら
修正の作業を行なえるようにしたものである。
In order to achieve the first object, the present invention mounts the printed board to be modified on the XY stage and obtains a defective position obtained by the soldering inspection machine. Using the data, the personal computer and the control unit control the XY stage so that the defective portion on the printed board to be repaired is located in front of the repair worker (hereinafter, worker), and at the same time, the target is displayed on the first stage. The magnifying glass that allows the object to be seen from the side is used to confirm the defective portion and to perform the correction work while magnifying the object in the second stage.

【0009】[0009]

【作用】この結果、被修正プリント板上の不良部位は、
作業者の正面に固定され、拡大像を得ることができる。
さらに、不良部位を拡大しながら修正作業やチェック作
業が可能となり被修正プリント板を他の作業場所に移動
する必要がなくなる。
As a result, the defective portion on the printed board to be corrected is
It is fixed on the front of the operator and a magnified image can be obtained.
Further, the correction work and the check work can be performed while enlarging the defective portion, and it becomes unnecessary to move the correction target printed board to another work place.

【0010】[0010]

【実施例】以下本発明の一実施例を図面を用いて説明す
る。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings.

【0011】図1は、実施例の全体構成を示す図で、1
は周知の立体視式の実体顕微鏡で、2はズーム式光学系
レンズで画像を拡大できる。3は回転式ミラーで360
度の回転機構により、側面の像を得ることができ、検査
物が横方向からでないと判定が困難な場合に利用する。
4は対象基板をX方向、Y方向に移動させるXY駆動ス
テージである。5は、XY駆動ステージが移動して修正
を行う作業エリアである。6は、コントロール用パソコ
ンで前工程の外観検査装置10からの位置情報や、XY
駆動ステージ4、品質情報等のデータ処理を行うもので
ある。7は、修正作業時微細部分を監視するのに利用す
るスコープ式実体顕微鏡などの拡大鏡である。8は、こ
れらシステム用架台である。9は、スイッチボックス
で、次のステップへの移動、修正位置への移動を行うも
のである。
FIG. 1 is a diagram showing the overall construction of the embodiment.
Is a known stereoscopic stereoscopic microscope, and 2 is a zoom type optical system lens for magnifying an image. 3 is a rotary mirror 360
The rotation mechanism allows the image of the side surface to be obtained, and is used when it is difficult to make a determination unless the inspection object is in the lateral direction.
An XY drive stage 4 moves the target substrate in the X and Y directions. Reference numeral 5 is a work area in which the XY drive stage moves to make corrections. Reference numeral 6 is a control personal computer, which provides positional information from the visual inspection apparatus 10 in the previous process and XY
The drive stage 4 performs data processing such as quality information. Reference numeral 7 is a magnifying glass such as a scope type stereomicroscope used to monitor a fine portion during a correction operation. Reference numeral 8 is a mount for these systems. A switch box 9 moves to the next step and moves to a correction position.

【0012】図2は図1のシステムの接続系統の概念図
で、図1と同一物には同一符号を付している。
FIG. 2 is a conceptual diagram of a connection system of the system of FIG. 1, and the same components as those in FIG. 1 are designated by the same reference numerals.

【0013】次にこの動作を説明する。まず、実施例装
置のXY駆動ステージ4に被修正プリント板11を手動
又は自動で搬入固定する。外観検査装置10から得られ
た前記被修正プリント板11の不良データをパソコン6
のメモリ部から同じくパソコン6のCPU部に呼び出す
ため、被修正プリント板11の管理番号を、前記パソコ
ン6のキーボード部(図示せず)あるいはバーコードリ
ーダー(図せず)で管理番号を読み取り、入力する。
Next, this operation will be described. First, the to-be-corrected printed board 11 is carried in and fixed to the XY drive stage 4 of the embodiment apparatus manually or automatically. The defect data of the printed board 11 to be corrected obtained from the visual inspection device 10 is stored in the personal computer 6
Similarly, in order to call from the memory section of the personal computer 6 to the CPU section of the personal computer 6, the control number of the printed board 11 to be corrected is read by the keyboard section (not shown) or the bar code reader (not shown) of the personal computer 6, input.

【0014】上記の操作によりパソコン6のCPUに呼
び出された前記被修正プリント板11の不良位置データ
は前記XY駆動ステージ4のX軸駆動モーターとY軸駆
動モーター(いずれも図示せず)にそれぞれ被修正プリ
ント板11の不良個所位置決めのためのパルスを送るた
めのものである。
The defective position data of the to-be-corrected printed board 11 which is called by the CPU of the personal computer 6 by the above-mentioned operation is supplied to the X-axis drive motor and the Y-axis drive motor (not shown) of the XY drive stage 4, respectively. It is for sending a pulse for positioning a defective portion of the modified printed board 11.

【0015】このようにして、被修正プリント板11の
不良個所は立体視式の実体顕微鏡1の中心点に位置決め
される。立体スコープ式の実体顕微鏡1の表示部12に
は図4に示すような映像が写し出される。被修正プリン
ト板11の不良個所は、順次自動または、手動により移
動して、中心点に位置決めされた画像は、ズーム式光学
系レンズ2で拡大され、上部から見た(図4a)のもの
と、回転ミラーで見た(図4b)が任意に選択できる。
得えられた画像は、目視により、はんだ付け状態や、実
装状態を確認して品質基準による判定を行い、修正が必
要であれば、スイッチ9により、XY駆動ステージ4を
修正作業エリア5に移動させ、微小個所は、拡大鏡7を
利用して修正作業を行う。
In this way, the defective portion of the modified printed board 11 is positioned at the center point of the stereoscopic stereoscopic microscope 1. An image as shown in FIG. 4 is displayed on the display unit 12 of the stereoscopic stereoscopic microscope 1. The defective portion of the modified printed board 11 is automatically or manually moved sequentially, and the image positioned at the center point is magnified by the zoom optical system lens 2 and viewed from above (FIG. 4a). , Seen with a rotating mirror (Fig. 4b) can be arbitrarily selected.
The obtained image is visually checked for the soldering state and the mounting state and judged according to the quality standard. If correction is necessary, the switch 9 moves the XY drive stage 4 to the correction work area 5. Then, the minute portion is corrected using the magnifying glass 7.

【0016】拡大鏡7の中心点は、常に立体視式の実体
顕微鏡1の中心点と同じになるよう配置し、修正個所の
判断が容易にできるよう配慮してある。
The center point of the magnifying glass 7 is arranged so as to be always the same as the center point of the stereoscopic stereoscopic microscope 1 so that the correction point can be easily determined.

【0017】この時のフローを図3に示す。The flow at this time is shown in FIG.

【0018】なお、外観検査装置10で摘出した不良位
置データをインラインで直結しなくとも、フロッピーデ
ィスクに記録して、本装置パソコン6に受渡し、XY駆
動ステージを制御してもよい。立体視式実体顕微鏡1
は、画面中央に不良個所が来るように配置しておくと、
順次ステップ移動時でも中央に不良個所がきて、判定が
容易となる。また、回転式ミラー3の動作時、中心点が
確保できるので不良個所の監視が容易になる。不良位置
データは、スイッチ9(フットスイッチまたは、切替
器)により、順番に次のステップに移動していく。
The defective position data extracted by the appearance inspection apparatus 10 may be recorded on a floppy disk and delivered to the personal computer 6 of the apparatus to control the XY drive stage without directly connecting the defective position data inline. Stereoscopic stereo microscope 1
If you place it so that the defective part comes in the center of the screen,
Even when the steps are sequentially moved, a defective portion comes to the center, and the judgment becomes easy. Further, since the center point can be secured during the operation of the rotary mirror 3, it becomes easy to monitor the defective portion. The defective position data is sequentially moved to the next step by the switch 9 (foot switch or switch).

【0019】また、その場で修復不可能な不良と判定し
た個所にはインクによるマーキングを施すことも可能で
あり、別工程でも作業が容易にできること。また安全衛
生面では、接眼レンズを使用しないので、疲労感は激減
できる。
In addition, it is possible to mark with ink on the spot which is determined to be a defect that cannot be repaired on the spot, and the work can be easily performed in another step. In terms of safety and hygiene, since no eyepiece is used, fatigue can be reduced drastically.

【0020】前工程の外観検査装置によらない場合は、
ステップ送りプログラム、または手動によりXYステー
ジを操作し、基板の不良個所をチェックする。終了後、
スイッチ9により次のステップに移動する。
When not using the visual inspection apparatus in the previous process,
The XY stage is operated by the step feed program or manually to check the defective portion of the substrate. After the end,
The switch 9 moves to the next step.

【0021】[0021]

【発明の効果】各種基板に対応した検査データの活用
や、拡大立体正立画像により、プリント基板をXYステ
ージ上で目視検査でき、汎用性のある部品実装の良否判
定と、判定結果の修正作業の効率化が可能となる。
[Effects of the Invention] Utilizing inspection data corresponding to various boards, and visual inspection of a printed board on an XY stage by using an enlarged three-dimensional upright image, versatile component mounting / non-defectiveness determination and correction of determination results. The efficiency of can be improved.

【0022】又、前述のように不良部位が常に一定の場
所に精度良く固定できることから、修正、修復作業の補
助ツール類、例えば自動はんだ供給機構、修正補助機構
などを付加設置する場所も固定することが可能となる。
これらのことから、第1に不良部位へのマーキング作業
や被修正プリント板の移動工程が不要となる。
Further, as described above, since the defective portion can be fixed to a fixed place with high accuracy at all times, auxiliary tools for repair and repair work, for example, a place where an automatic solder supply mechanism, a correction assist mechanism, etc. are additionally installed are also fixed. It becomes possible.
For these reasons, firstly, the work of marking the defective portion and the step of moving the repaired printed board are not required.

【0023】第2にはんだ付け外観検査装置の虚報(良
品を不良と判定する)をその場で確認判定することがで
きるため不必要なマーキングや修正、修復作業がなくな
る。
Secondly, since it is possible to confirm and determine a false alarm (determining a non-defective product as defective) of the soldering appearance inspection device on the spot, unnecessary marking, correction and repair work are eliminated.

【0024】以上のように本発明によれば、作業効率向
上と品質の確保はもとより、設備開発費の削減など多く
の効果が得られる。
As described above, according to the present invention, in addition to improving work efficiency and ensuring quality, many effects such as reduction of facility development cost can be obtained.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例の全体構成を示す構成図FIG. 1 is a configuration diagram showing an overall configuration of an embodiment of the present invention.

【図2】図1のシステムの接続系統の概念図2 is a conceptual diagram of a connection system of the system of FIG.

【図3】図2の動作フローチャートFIG. 3 is an operation flowchart of FIG.

【図4】本発明の実施例における顕微鏡拡大映像図FIG. 4 is an enlarged image view of a microscope according to an embodiment of the present invention.

【図5】従来例の全体構成を示す構成図FIG. 5 is a configuration diagram showing an overall configuration of a conventional example.

【符号の説明】[Explanation of symbols]

1 立体視式実体顕微鏡、2 ズームレンズ、3 回転
式ミラー、4 XY駆動ステージ、5 作業エリア、6
パソコン、7 拡大鏡、10 はんだ付け外観検査装
置、11 被修正プリント板、
1 stereoscopic stereoscopic microscope, 2 zoom lenses, 3 rotating mirrors, 4 XY drive stage, 5 working areas, 6
PC, 7 magnifying glass, 10 soldering visual inspection equipment, 11 printed circuit board,

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 はんだ付け部の目視検査修復装置におい
て、前工程の外観検査装置で摘出した被修正プリント基
板の不良個所の位置データにより、位置決め動作を行
い、被修正プリント基板を搭載するXY駆動ステージ機
構と、 該XY駆動ステージ機構上部に配置され、前記被修正プ
リント基板の不良個所を少なくとも横方向、斜め方向か
ら観察し該映像を得るのとができる目視検査、修復用ス
コープ式の回転ミラー付実体顕微鏡と、 該スコープ式の回転ミラー付実体顕微鏡の側部でかつX
Y駆動ステージ機構上部に配置され、前記被修正プリン
ト基板の不良個所を拡大表示する拡大鏡とを有すること
を特徴とするはんだ付け部の目視検査修復装置。
1. An XY drive for carrying out a positioning operation and mounting a to-be-corrected printed circuit board according to position data of a defective portion of the to-be-corrected printed circuit board extracted by a visual inspection device in a previous process in a visual inspection and repair apparatus for a soldering part. A stage mechanism and a scope-type rotary mirror for visual inspection, which is arranged above the XY drive stage mechanism and which can observe the defective portion of the printed circuit board to be corrected from at least the lateral direction and the oblique direction to obtain the image. A stereomicroscope with an X-ray and a side part of the stereomicroscope with a rotating mirror of the scope type and X
A visual inspection and repair device for a soldering part, which is disposed on an upper part of a Y drive stage mechanism and has a magnifying glass which magnifies and displays a defective portion of the printed circuit board to be corrected.
JP461295A 1995-01-17 1995-01-17 Repairing device of soldering part by visual inspection Pending JPH08195553A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP461295A JPH08195553A (en) 1995-01-17 1995-01-17 Repairing device of soldering part by visual inspection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP461295A JPH08195553A (en) 1995-01-17 1995-01-17 Repairing device of soldering part by visual inspection

Publications (1)

Publication Number Publication Date
JPH08195553A true JPH08195553A (en) 1996-07-30

Family

ID=11588884

Family Applications (1)

Application Number Title Priority Date Filing Date
JP461295A Pending JPH08195553A (en) 1995-01-17 1995-01-17 Repairing device of soldering part by visual inspection

Country Status (1)

Country Link
JP (1) JPH08195553A (en)

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