JPH0789142B2 - Inspection equipment - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION Object of the Invention (Industrial field of application) The present invention uses, for example, an electronic circuit board assembled by mounting various electronic components on a circuit board as an object to be measured. The present invention relates to an inspection device for functionally examining a body.

(Prior Art) In this type of inspection device, between the circuit board and the tester,
By arranging a member called a test fixture and connecting the pattern surface of the circuit board and the output terminal of the tester, the functional inspection of the circuit board is executed.

Here, as shown in FIG. 4, the conventional test fixture is configured by fixing two bases 1, 2 called probe base 1 and interface base 2 to a support base 3 so as to face each other. To be done.

The probe base 1 is arranged to face the pattern of the circuit board, and one end 5a is in contact with the pattern surface and the other end is
The probe pins 5 to which the wire rods 4 are connected are arranged and supported on the 5b side. The interface base 2 connects the wire rods 4 to one end 6a facing the probe pins 5 and the other end 6b of the tester. The interface pins 6 that come into contact with the output terminals are arrayed and supported.

(Problems to be Solved by the Invention) In the inspection device having the above-described configuration, it is necessary to wire the wire 4 to the pin terminals 5b and 6a arranged on the surfaces of the probe base 1 and the interface base 2 that face each other. However, in a state where the two bases 1 and 2 are fixed to the support base 3, it is impossible to perform the wiring manually.

Therefore, conventionally, as shown in FIG. 5, only the probe base 1 is fixed to the support base 3 and the pin terminals 6a of the interface base 2 are wired to both pin terminals 5b and 6a in a state in which the pin terminals 6a face outward. I had no choice but to do it.

Therefore, the length of the wire 4 needs to be sufficiently long so that the interface base 2 can be set in the state shown in FIG.

By the way, when the length of the wire 4 is increased as described above, noise is detected as a signal when noise is superimposed on the inspection signal transmitted by the wire 4, particularly when the inspection signal is a high frequency signal. Therefore, there is a problem that an accurate function test cannot be executed.

Therefore, an object of the present invention is to solve the above-mentioned conventional problems, and to significantly reduce the length of the wire rod for connecting the probe pin and the interface pin as compared with the conventional one, thereby superimposing it on the inspection signal. An object of the present invention is to provide an inspection device capable of reducing noise and performing an accurate function inspection.

[Structure of the Invention] (Means for Solving the Problems) The present invention is directed to an object to be measured having a large number of measuring ends in a plane, and the objects to be measured are arranged corresponding to the respective measuring ends. In contact with the measurement end, the other end side in the inspection device having a probe base array-supporting probe pins connected to the tester, and an interface base for relay connection between the probe base and the tester, the interface base is at least The interface pins are supported by a plurality of division bases divided in each row in the horizontal or vertical direction.

(Operation) In the present invention, the interface base is configured as a plurality of divided bases which are divided into each row of the interface pins in the vertical or horizontal direction. When manufacturing this test fixture, the probe base is first fixed to the support base.

Then, the split base is attached to the support base in order from the end, and every time this attachment is performed, the interface pin supported by the split base and the probe pin supported by the probe base are set based on the wiring information of the inspection device. It will be connected by a wire rod.

In this case, the interface base is divided, so even if you turn the divided base over and connect the wires in the direction that is easier to work, compared to when using the conventional interface base consisting of a single base. If
It is possible to reduce the length of the wire rod to about 1/4.

If the split base is configured to be rotatable with respect to the support base, the above work can be performed more easily and the workability can be improved.

(Example) Hereinafter, one example in which the present invention is applied to a circuit board inspection apparatus will be specifically described with reference to the drawings.

First, an outline of the entire apparatus of the embodiment will be described with reference to FIG.

The apparatus of this embodiment is roughly classified into a circuit board 10 on which an electronic component, which is an object to be inspected, is mounted, a tester 20 for performing a functional test of the circuit board 10, and the circuit board 10 fixedly mounted. Also, the pattern surface of the circuit board 10 and the tester
It consists of a test fixture 30 that connects to 20 output terminals.

The tester 20 includes a lifter 21 that supports the test fixture 30 so that the test fixture 30 can move up and down, and the test fixture 30.
Locating pin 22, which is an example of a guide member for positioning and guiding a support base 60 described later, and the support base 60.
A vacuum port 23 for vacuum suction of the test fixture, and a spring-loaded contact probe 24, which is an output terminal of the tester 20, on the surface facing the test fixture 30.

Next, the test fixture 30, which is a characteristic configuration of the apparatus of this embodiment, will be described with reference to FIGS. 1 and 2.

The test fixture 30 has a probe base 40 and an interface base 50, and the bases 40, 50 are arranged and fixed in parallel with each other on the support base 60.

First, the mounting structure of the probe base 40 and the interface pin 50 will be described. As shown in FIG. 1, the support base 60 that serves as the base of the test fixture 20.
The interface base 50 is fixed to the. Further, a support column 61 is vertically supported and fixed to the support base 60.

Next, the probe base 40 will be described.

The probe base 40 is a base that supports the probe pin 41 that contacts the pattern surface of the circuit board 1 opposite to the component mounting surface.

As shown in detail in FIG. 1, the probe pin 41 has connection pieces 41a and 41b electrically connected to both ends thereof, and the connection piece 41a on the upper side is an axial direction which is an arrow direction in the figure. It has a spring pin structure so that it is urged toward one end of the.

The probe pin 41 is inserted into an insertion hole 40a formed in the probe base 40 and supported and fixed. Also,
On the upper surface of the probe base 40, each probe pin
A pin guide plate 35 having guide holes 35a corresponding to the arrangement position of 41 is attached and guided by a plate guide 36, and is constantly urged upward by a compression coil spring 37. The probe pin 41 can be accurately brought into contact with the pattern surface of the circuit board 10 by being inserted into the guide hole 35a. Further, guide pins 38 for the circuit board 10 are vertically provided on the pin guide plate 35 so that the board 10 can be accurately positioned on the pin guide plate 35.

Next, the interface base 50 will be described.

The interface base 50 is a base that comes into contact with the spring-loaded contact probe 24 of the tester 20 and has a function as an interface, and the base 50 has various positions facing the spring-loaded contact probe 24 of the tester 20. The interface pin 51 is supported by the. This interface pin 51
Has connection pieces 51a, 51b electrically connected to both ends thereof.

Further, the interface base 50 is formed with a guide hole which is a guided member to be inserted into the locating pin 22 of the tester 20, so that the interface base 50 can be accurately positioned with respect to the tester side.

As will be described later, the interface base 50 is vacuum-sucked to the tester 20 side, and thus has a structure that prevents air from flowing into the tester 20 side.

Next, a characteristic configuration of the interface base 50 will be described.

As shown in FIG. 2, the interface base 50 is composed of, for example, a plurality of division bases 52 divided in the vertical direction for each row of the interface pins 51 arranged at respective positions in a matrix.

Each of the divided bases 52 is constructed so that it can be independently fixed from both sides of the support base 60 by bolts 53. That is, the both edges 60a of the support base 60 are provided with the facing holes 65, while the divided bases
52 has a screw hole 52a at a position facing the hole 65. Then, the bolt 53 is screwed into the screw hole 52a through the hole 65 of the support base 60, whereby the split base 5
2 can be fixed to the support base 60. still,
When the bolt 53 is not completely tightened, the bolt 53 serves as a rotation shaft and is supported by the hole 65 so as to be freely rotatable. As a result, the split base 52 can be rotated.

Also, the probe pin fixed to the probe base 40.
The connecting piece 41a of 41 and the connecting piece 51a of the interface pin 51 supported by the interface base 50 are connected by a wire rod 70.

Next, the operation will be described.

First, the assembly of this inspection apparatus will be described.

This inspection apparatus needs to be individually manufactured according to the types of various boards, and for this reason, it is necessary to wrap the wire 70 on the circuit board 10 and wrap the probe pins 41 and the interface pins 51.

Therefore, for example, the divided bases 52 are temporarily fixed to the support base 60 by bolts 53 in order from the divided base 52 at the left end, for example, in the state shown in FIG.
The other end of the wire 70 having one end connected to is connected to a predetermined interface pin 51 by wrapping.

Here, when performing this wrapping, the bolt 53 is arranged so that the connecting piece 51a to which the wire 70 is connected to the interface pin 51 on the split base 52 is located outside (in a direction not facing the probe pin 41). Is performed by rotating the division base 52 with the rotation axis as the rotation axis. By doing so, it is possible to easily perform the wrapping on the connecting piece 51a facing outward.

Then, when the lapping for one of the divided bases 52 is completed, the divided bases 52 are rotated and the lower connection piece 41b of the probe pin 41 and the interface pin 51 are rotated.
The upper connection piece 51a is set to face each other, and then the bolt 53 is fixed by final tightening.

After that, the lapping process for all the split bases 52 can be easily executed by repeating the above-described work in order from the split base 52 on the left side in FIG. 2, for example.

Here, since the wire rod 70 is connected for each of the division bases 52 divided into one row, the interface pins on one large interface base are lapped as shown in FIG. 5 of the related art. Compared with the above, the length of the wire is obviously shorter.

The inspection of the circuit board 10 using the test fixture 30 thus configured will be described.

The support port 60, which is the base of the test fixture 30, is tested by the vacuum port 23 of the tester 20.
The connection piece 51b of the interface pin 51 supported by the interface base 50 is brought into contact with the spring-loaded contact probe 24 of the tester 20 by suction to the 20 side.

After setting in such a state, the circuit board 10 can be energized by the tester 20 to execute a predetermined function test.

Here, the probe pin 41 and the interface pin 51
Since the length of the wire rod 70 for connecting to and is significantly shorter than the conventional one, the noise superimposed when the wire rod 70 is routed is significantly reduced, and even if a high frequency signal is transmitted, Since less noise is generated, it is possible to perform a more accurate function test.

The present invention is not limited to the above embodiment, and various modifications can be made within the scope of the present invention.

For example, in the above-described embodiment, the split base 52 is configured to be rotatable and the connection work of the wire rod 70 is simplified, but the invention is not necessarily limited to this, and the point is that the interface base 50 is provided for each row. If divided, the effect of the present invention that the length of the wire 70 can be shortened can be achieved.

Further, in order to further simplify the work, the split base 52 may be rotatable and a rotation stopper may be provided so that the split base 52 can be stopped at a position where it is easy to work.

Incidentally, referring to the dividing direction for obtaining the dividing base 52, it is preferable that this dividing method corresponds to each group of output terminals of the tester 20, that is, the connection to the interface pin 51 is made by the tester 20. This is because there is a correspondence relationship with the arrangement of the output terminals. Therefore, it is needless to say that the division is not limited to the vertical division as in the above embodiment, but may be the horizontal division.

Further, although the circuit board inspecting apparatus has been described in the above-mentioned embodiments, the same effect can be obtained by applying the circuit board inspecting apparatus to a drive circuit of a matrix liquid crystal display device.

[Effects of the Invention] As described above, according to the present invention, since the interface base is divided into each row, the wire rod for connecting the probe pin on the probe base and the interface pin is made shorter than before. Since it is possible to reduce the noise superimposed on the signal, it is possible to always perform an accurate functional test even when the detection signal is a high frequency signal.

[Brief description of drawings]

1 is a sectional view showing a sectional structure of a test fixture in a circuit board device according to an embodiment of the present invention, FIG. 2 is a plan view of an interface base in the test fixture of FIG. 1, and FIG. 1 is a schematic explanatory view showing the overall configuration of an inspection device using the test fixture of FIG. 1, FIG. 4 is a schematic explanatory diagram of a conventional inspection device, and FIG. 5 is a schematic explanatory diagram showing an assembly work of a conventional test fixture. Is. 10 …… Circuit board, 20 …… Tester, 30 …… Test fixture, 40 …… Probe base, 41 …… Probe pin, 50 …… Interface base, 51 …… Interface pin, 52 …… Split base, 60… … Supporting base, 70… Wire rod.

Claims (4)

[Claims] 1. An object to be measured in which a large number of measuring ends are present in a plane and arranged corresponding to each of the measuring ends of the object to be measured, one end of which contacts the measuring end and the other end of which is connected to a tester. In an inspection device having a probe base that supports arrayed probe pins, and an interface base that relay-connects the probe base and the tester via an interface pin, the interface base is divided at least in each row in a horizontal or vertical direction. An inspection apparatus, wherein the interface pin is supported by a plurality of divided bases. 2. The split base is rotatably supported so that the connection end side with the probe pin can be rotated to the side not facing the probe base. Inspection device. 3. The inspection apparatus according to claim 1, wherein the device under test is a circuit board. 4. The inspection apparatus according to claim 1, wherein the device under test is a liquid crystal drive circuit.