JPH01162176A - Testing device - Google Patents

Abstract

PURPOSE:To reduce the length of a wire rod and lower noises overlapping with a testing signal, by constituting an interface base of a plurality of bases divided every lateral or longitudinal row. CONSTITUTION:An interface base 50 is constituted of a plurality of bases 52 which are divided every row of interface pins 51 in a lateral or longitudinal direction. In manufacturing a test fixture 30, first of all, a probe base is fixed to a supporting base 60. Then, the divided bases are sequentially mounted from a first one on the supporting base 60. Every time the divided base is mounted on the supporting base, the interface pin 51 supported by the divided base 52 is connected to a probe pin 41 supported by the probe base 40 by a wire rod based on wiring informations of a testing device. In this case, since the base 50 is divided into many bases 52, it is possible to shorten the length of the wire rod to be approximately 1/4 of that in the case where an interface base constituted by one single base is used.

Description

[Detailed Description of the Invention] [Object of the Invention] (Industrial Field of Application) The present invention uses, for example, an electronic circuit board assembled by mounting various electronic components on a circuit board as an object to be measured. The present invention relates to a testing device for functionally testing the body.

(Prior art) In this type of testing equipment, there is a gap between the circuit board and the tester.
A functional test of the circuit board is performed by arranging a member called a test fixture and connecting the pattern surface of the circuit board to the output terminal of the tester.

Here, as shown in FIG. 4, the conventional test fixture has a probe base 1. It is constructed by fixing two bases 1 and 2, called interface bases 2, to a support base 3 so as to face each other.

The probe base 1 is arranged to support an array of probe pins 5, which are disposed facing the pattern of the circuit board, one end 5a is in contact with the pattern surface, and the other end 5b is connected to the wire rod 4. The interface base 2 has the wire rod 4 at one end 6a facing the probe bin 5.
The interface pins 6 are arrayed and supported, and the other end 6b is brought into contact with the output terminal of the tester.

(Problems to be Solved by the Invention) In the inspection apparatus configured as described above, the pin terminals 5b are arranged on opposing surfaces of the probe base 1 and the interface base 2, respectively.

It is necessary to wire the wire 4 to the base 6a, and the two bases 1.
2 is fixed to the support base 3, it is impossible to carry out the wiring manually.

Therefore, conventionally, as shown in FIG. 5, only the probe base 1 is fixed to the support base 3, and wires are wired to both the pin terminals 5b and 6a with the pin terminal 6a of the interface base 2 facing outward. I had no choice but to.

Therefore, the length of the wire 4 had to be sufficiently long so that the interface base 2 could be set in the state shown in FIG.

By the way, if the length of the wire 4 is increased in this way, if noise is superimposed on the test signal transmitted by the wire 4, especially if this test signal is a high frequency signal, the noise will not be detected as a signal. Therefore, there was a problem that an accurate functional test could not be performed.

Therefore, it is an object of the present invention to solve the above-mentioned conventional problems, and to make it possible to significantly shorten the length of the wire for connecting probe bins and interface pins compared to the conventional method, thereby reducing superimposition on inspection signals. An object of the present invention is to provide an inspection device that can reduce noise and perform accurate functional inspection.

[Structure of the Invention] (Means for Solving the Problems) The present invention provides an object to be measured in which a large number of measuring ends are present in a plane, and one end of the object is arranged corresponding to each measuring end of the object to be measured. In an inspection device, the inspection device has a probe base that supports an array of probe bins that are in contact with a measurement end and are connected to a tester at the other end, and an interface base that connects the probe base and the tester via relay, the interface base comprising: The interface pins are supported by a plurality of divided bases divided into at least one row in the horizontal or vertical direction.

(Function) In the present invention, the interface base is configured as a plurality of divided bases divided into each row of interface pins in the vertical or horizontal direction. When manufacturing this test fixture, first, the probe base is fixed to the support base.

Then, the divided bases are attached to the support base in order from the end, and each time the divided bases are attached, the interface pins supported by the divided bases and the probe bins supported by the probe base are connected based on the wiring information of the inspection device. It will be connected by wire.

In this case, since the interface base is divided, even if you turn the divided base over and face it in the direction that is easier to work with when connecting the wires, it will be easier to connect the wire than when using the conventional interface base consisting of a single base. Ba,
It becomes possible to shorten the length of the wire to approximately one-fourth.

Incidentally, if the divided base is configured to be rotatable with respect to the support base, the above-mentioned work can be performed more easily, and work efficiency can also be improved.

(Example) Hereinafter, an example in which the present invention is applied to a circuit board inspection device will be specifically described with reference to the drawings.

First, the overall outline of the embodiment apparatus will be explained with reference to FIG. 3.

The apparatus of this embodiment can be roughly divided into a circuit board 10 on which an electronic component is mounted as an object to be inspected, a tester 20 for performing a functional test of this circuit board 10, and a tester 20 on which the circuit board 10 is placed and fixed. , and a test fixture 0 connecting the pattern surface of the circuit board 10 and the output terminal of the tester 20.

The tester 20 includes a lid 21 that supports the test fixture 30 in a vertically movable manner, a locating pin 22 that is an example of a guide member that positions and guides a support base 60 of the test fixture 30, which will be described later. It has a vacuum port 23 for vacuum suctioning the support base 60, and a contact probe 24 with a spring, which is an output terminal of the tester 20, on the surface facing the test fixture 30.

Next, the test fixture 30, which is a characteristic configuration of the apparatus of this embodiment, will be explained with reference to FIGS. 1 and 2.

The test fixture 30 has a probe base 40 and an interface base 50, each of which has a probe base 40 and an interface base 50.
0.50 are arranged and fixed to the support base 60 at a distance and parallel to each other.

First, probe base 40. interface pin 50
Regarding the installation structure, as shown in FIG. 1, the interface base 50 is fixed to the support base 60, which serves as the base of the test fixture 20. Further, a column 61 is vertically supported and fixed to the support base 60.

Next, the probe base 40 will be explained.

The probe base 40 has a probe pin 41 that contacts the pattern surface of the circuit board 1 on the opposite side from the component mounting surface.
This is the basis for supporting.

As shown in detail in FIG. 1, the probe bin 41 has a connecting piece 41a electrically connected to both ends thereof.

41b, and the upper connection piece 41a has a spring pin structure so as to be biased to protrude toward one end in the axial direction, which is the direction of the arrow in the figure.

The probe bottle 41 is inserted into an insertion hole 40a formed in the probe base 40 and is supported and fixed.

Further, on the upper surface of the probe base 40, a pin guide plate 35 having guide holes 35a corresponding to the array positions of the probe bins 41 is installed and guided by a plate guide 36, and a compression coil spring 3
7, it is always urged upward. The probe bin 41 is configured to be able to accurately contact the pattern surface of the circuit board 10 by being inserted into the guide hole 35a. Furthermore, guide pins 38 for the circuit board 10 are vertically provided on the pin guide plate 35, so that the board 10 can be accurately positioned on the pin guide plate 35.

Next, the interface base 50 will be explained.

This interface base 50 is connected to the tester 20.
in contact with the spring-loaded contact probe 24 of
It is a base that functions as an interface,
Interface pins 51 are supported on this base 50 at respective positions facing the spring-equipped contact probes 24 of the tester 20. This interface pin 51 has connecting pieces 51a and 51b electrically connected to each other at both ends thereof.

Further, a guide hole is formed in the interface base 50, which is a guided member through which the locating pin 22 of the tester 20 is inserted, so that accurate positioning with respect to the tester can be achieved.

Incidentally, as will be described later, this interface base 50 is vacuum-suctioned toward the tester 20.
It has a structure that prevents air from flowing into the 0 side.

Next, the characteristic configuration of the interface base 50 will be explained.

As shown in FIG. 2, this interface base 50 is composed of a plurality of divided bases 52 that are divided, for example, in the vertical direction, for each row of interface pins 51 arranged at respective positions in a matrix.

Each divided base 52 is connected to the support base 60.
It is constructed so that it can be fixed independently with bolts 53 from both sides. That is, opposing holes 65 are provided on both edges 60a of the support base 60, and each divided base 52 has a screw hole 52a at a position opposite to the hole 65. The split base 52 can be fixed to the support base 60 by screwing the bolt 53 into the screw hole 52a through the hole 65 of the support base 60. Note that when the bolt 53 is not completely tightened, the bolt 53 becomes a rotating shaft and is supported in the hole 65 and is rotatable, and as a result, the divided base 52 can rotate. There is.

Further, a connection piece 41a of the probe bin 41 fixed to the probe base 40 and a connection piece 5 of the interface pin 51 supported by the interface base 50 are provided.
1a is connected by a wire 70.

Next, the effect will be explained.

First, the assembly of this inspection device will be explained.

This inspection device needs to be manufactured individually according to the type of each board, and for this purpose, a 7° wire rod is attached to the circuit board 10.
It is necessary to wrap the probe bin 41 and interface pin 51 accordingly.

Therefore, the divided bases 52 are temporarily fixed to the support base 60 one by one, starting from the left-most divided base 52 in FIG. The other end is connected to a predetermined interface pin 51 by wrapping.

Here, when performing this wrapping, the connection piece 51a to which the wire rod 70 is to be connected to the interface pin 51 on the split base 52 is placed on the outside (the probe bin 41
This is done by rotating the split base 52 using the bolt 53 as a rotation axis so that the split base 52 is oriented so that it is not facing the direction shown in FIG. In this way, it is possible to easily wrap the connecting piece 51a facing outward.

When the wrapping has been completed on - pieces of the divided bases 52, the divided bases 52 are rotated so that the lower connecting piece 41b of the probe bin 41 and the upper connecting piece 51a of the interface pin 51 are set to face each other. Then, the bolt 53 is fully tightened to fix it.

Thereafter, by repeating the above-mentioned operation for the kite starting from, for example, the left divided base 52 in FIG. 2, the wrapping process for all the divided bases 52 can be easily performed.

Here, for each divided base 52 divided into − rows, the wire rod 70
Compared to the conventional one shown in Figure 5, which wraps the interface pins on two large interface bases,
The length of the wire can be clearly shortened.

Inspection of the circuit board 10 using the test fixture 30 constructed in this way will be explained.

The support base 60, which is the base of the test fixture 30, is sucked toward the tester 20 side by the vacuum port 23 of the tester 20, and the connecting piece 51b of the interface pin 51 supported by the interface base 50 is moved to the tester 20. contact probe 24 with a spring.

After setting such a state, the tester 20 can energize the circuit board 10 and perform a predetermined functional test.

Here, since the length of the wire 70 that connects the probe bin 41 and the interface pin 51 is significantly shorter than that of the conventional one, the noise superimposed when the wire 70 is routed is significantly reduced, and even when high-frequency signals Even in the case of transmission, since there is little superimposed noise, it is possible to perform a more accurate functional test.

Note that the present invention is not limited to the above embodiments, and various modifications can be made within the scope of the gist of the present invention.

For example, in the above embodiment, the divided base 52 is configured to be rotatable to simplify the connection work of the wire rod 70, but the invention is not necessarily limited to this. By dividing the wire rod 70, the effect of the present invention that the length of the wire rod 70 can be shortened can be achieved.

Further, in order to further simplify the work, the divided base 52 may be made rotatable and may be provided with a rotation stopper so that the divided base 52 can be stopped at a position where it is easy to work.

Regarding the direction of division to obtain the divided base 52, it is preferable that the division method corresponds to each group of output terminals of the tester 20. In other words, the connection to the interface pin 51 should be made according to the direction of the output terminal of the tester 20. This is because there is a correspondence with the arrangement of the output terminals. Therefore, it goes without saying that the division is not limited to the vertical direction as in the above embodiment, but may also be horizontal.

Further, in the above embodiments, a circuit board inspection device has been described, but similar effects can be obtained even if the present invention is applied to a drive circuit of a matrix liquid crystal display device, etc.

[Effects of the Invention] As explained above, according to the present invention, since the interface base is divided into rows, the wires for connecting the probe pins on the probe base and the interface pins can be made shorter than before. This makes it possible to reduce the noise superimposed on the signal, so that even if the detected signal is a high-frequency signal, it is possible to always carry out an accurate function test.

[Brief explanation of the drawing]

FIG. 1 is a cross-sectional view showing the cross-sectional structure of a test fixture in a circuit board device according to an embodiment of the present invention, FIG. 2 is a plan view of an interface base in the test fixture of FIG. 1, and FIG. 1 is a schematic explanatory diagram showing the overall configuration of an inspection device using the test fixture, FIG. 4 is a schematic explanatory diagram of a conventional inspection device, and FIG. 5 is a schematic explanatory diagram showing the assembly work of a conventional test fixture. It is. DESCRIPTION OF SYMBOLS 10... Circuit board, 20... Tester, 30... Test fixture, 40... Probe base, 41... Probe pin, 50... Interface base, 51... Interface pin, 52 ...Divided base, 60... Support base, 70... Wire rod. Agent Patent attorney Inoue - (1 other person) Figure 2 60G 60 Figure 3 2o Tester 5 Figure

Claims (4)

[Claims] (1) A device to be measured that has a large number of measurement ends in a plane, and a probe that is placed corresponding to each measurement end of the device, one end of which is in contact with the measurement end, and the other end of which is connected to a tester. In an inspection device having a probe base that supports an array of pins, and an interface base that connects the probe base and the tester via interface pins, the interface base is divided into at least one row in the horizontal or vertical direction. An inspection device characterized in that the interface pin is supported by a plurality of divided bases. (2) The inspection device according to claim 1, wherein each divided base is rotatably supported so that the end connected to the probe pin can be rotated to a side that does not face the probe base. . (3) The inspection device according to claim 1 or 2, wherein the object to be measured is a circuit board. (4) The inspection device according to claim 1 or 2, wherein the object to be measured is a liquid crystal drive circuit.