CN114755516A - Two-port microstrip device testing arrangement - Google Patents
Two-port microstrip device testing arrangement Download PDFInfo
- Publication number
- CN114755516A CN114755516A CN202210341545.3A CN202210341545A CN114755516A CN 114755516 A CN114755516 A CN 114755516A CN 202210341545 A CN202210341545 A CN 202210341545A CN 114755516 A CN114755516 A CN 114755516A
- Authority
- CN
- China
- Prior art keywords
- platform
- stage
- axis displacement
- bearing plate
- carrier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention discloses a two-port microstrip device testing device which comprises an X-axis displacement platform, a radio-frequency connector carrying platform A, a radio-frequency connector carrying platform B, Z, a A, Z-axis displacement platform B, an X-axis displacement platform, a bearing plate carrying platform A, a bearing plate carrying platform B, a bearing plate, a ball spring screw and a to-be-tested piece carrying platform; the radio frequency connector carrier A and the radio frequency connector carrier B can move along the X direction on the X-axis displacement platform; the ball spring screw is arranged in the cavities of the bearing plate bearing platform A and the bearing plate bearing platform B and is positioned below the bearing plate; and the carrier of the piece to be tested is positioned on the bearing plate between the radio frequency connector carrier A and the radio frequency connector carrier B. By the invention, the device test can be completed quickly and efficiently, and the connection of the microstrip lines is completed by using a crimping method without welding and nondestructive test; the microstrip line is suitable for various microstrip line devices, and can be used in different lengths, different widths and different medium thicknesses.
Description
Technical Field
The invention relates to the technical field of radio frequency device testing, in particular to a two-port microstrip device testing device.
Background
Two-port microstrip device is an important component of radio frequency device, and is widely applied to various communication related fields including: base stations, backhaul links, satellite communications, military, radar, aerospace, and the like. In the production of the microstrip device, the electrical property of the device needs to be accurately tested, a common vector network analyzer only has a coaxial calibration piece, if the microstrip device needs to be tested, microstrip coaxial conversion needs to be added, a large test error can be introduced by the microstrip coaxial conversion, and the traditional microstrip device test needs welding, so that the device is damaged, and the later sale cannot be carried out, and the corresponding cost is increased. According to the testing requirements of the microstrip device, a microstrip device testing device with high frequency, rapidness, accuracy and no damage is urgently needed, but no such device exists in the market at present.
Disclosure of Invention
The invention provides a two-port microstrip device testing device, which aims to solve the technical problems that: the technical problem that a microstrip device is easy to damage in the existing test process is solved.
In view of the above problems of the prior art, according to one aspect of the present disclosure, the following technical solutions are adopted in the present invention:
a two-port microstrip device testing apparatus, comprising:
An X-axis displacement stage;
a radio frequency connector stage A and a radio frequency connector stage B, which are arranged on the X-axis displacement platform, and the radio frequency connector stage A and the radio frequency connector stage B can move along the X direction on the X-axis displacement platform;
the X-axis displacement platform is arranged on the X-axis displacement platform, the Z-axis displacement platform A and the radio-frequency connector platform A can move together along the X-axis direction, and the Z-axis displacement platform B and the radio-frequency connector platform B can move together along the X-axis direction;
the supporting plate carrying platform A is connected with the Z-axis displacement platform A and can move along the Z-axis direction, the supporting plate carrying platform B is connected with the Z-axis displacement platform B and can move along the Z-axis direction, and cavities for accommodating the supporting plate are arranged on the supporting plate carrying platform A and the supporting plate carrying platform B;
the bearing plate penetrates through the cavities of the bearing plate carrying platform A and the bearing plate carrying platform B;
the ball spring screws are arranged in the cavities of the bearing plate carrying platform A and the bearing plate carrying platform B respectively and are positioned below the bearing plate;
and the carrier of the to-be-tested piece is used for placing the to-be-tested piece and is positioned on the bearing plate between the radio frequency connector carrier A and the radio frequency connector carrier B.
In order to better realize the invention, the further technical scheme is as follows:
further, the carrier of the object to be measured is a carrier of the object to be measured with a thickness of 0.5 mm, a carrier of the object to be measured with a thickness of 1 mm, a carrier of the object to be measured with a thickness of 2 mm, a carrier of the object to be measured with a thickness of 4 mm or a carrier of the object to be measured with a thickness of 8 mm.
Furthermore, a locking screw A used for locking the bearing plate carrier A in the Z-axis direction is arranged on the Z-axis displacement platform A.
Further, the locking screw A is positioned on the side surface of the Z-axis displacement platform A.
Furthermore, a locking screw B for locking the bearing plate carrying platform B in the Z-axis direction is arranged on the Z-axis displacement platform B.
Further, the locking screw B is positioned on the side surface of the Z-axis displacement platform B.
Further, a radio frequency connector a is arranged on the radio frequency connector carrying platform a.
Further, a radio frequency connector B is arranged on the radio frequency connector carrying platform B.
Compared with the prior art, the invention has the following beneficial effects:
the invention relates to a two-port microstrip device testing device, which 1) can quickly and efficiently complete device testing, and completes the connection of microstrip lines by using a crimping method without welding and nondestructive testing; 2) the microstrip line is suitable for various microstrip line devices, and can be used in different lengths, different widths and different medium thicknesses.
Drawings
For a clearer explanation of the embodiments or technical solutions in the prior art of the present application, the drawings used in the description of the embodiments or prior art will be briefly described below, it is obvious that the drawings in the following description are only references to some embodiments in the present application, and other drawings can be obtained by those skilled in the art without creative efforts.
Fig. 1 is a schematic structural diagram of a two-port microstrip device testing apparatus according to an embodiment of the present invention.
Fig. 2 is a schematic view of a ball spring screw according to an embodiment of the present invention.
Fig. 3 is a schematic structural diagram of a combination of a support plate and a carrier a according to an embodiment of the invention.
Fig. 4 is a schematic structural diagram of a combination of a support plate and a carrier B according to an embodiment of the invention.
FIG. 5 is a schematic top view of a two-port microstrip device testing apparatus according to an embodiment of the present invention.
Wherein, the reference numbers correspond to the names of the figures:
the device comprises a 1-X-axis displacement platform, a 2-radio frequency connector platform A, a 3-radio frequency connector platform B, a 4-ball spring screw, a 5-supporting plate platform A, a 6-Z-axis displacement platform A, a 7-locking screw A, an 8-supporting plate platform B, a 9-Z-axis displacement platform B, a 10-locking screw B, a 11-radio frequency connector A, a 12-radio frequency connector B, a 13-supporting plate, a 14-0.5 mm thickness workpiece platform, a 15-1 mm thickness workpiece platform, a 16-2 mm thickness workpiece platform, a 17-4 mm thickness workpiece platform, a 18-8 mm thickness workpiece platform and a 19-workpiece.
Detailed Description
The present invention will be described in further detail with reference to examples, but the embodiments of the present invention are not limited thereto.
Referring to fig. 1 to 5, a two-port microstrip device testing apparatus includes:
an X-axis displacement stage 1;
a radio frequency connector stage A2 and a radio frequency connector stage B3, which are disposed on the X-axis displacement platform 1, and the radio frequency connector stage A2 and the radio frequency connector stage B3 are capable of moving in the X direction on the X-axis displacement platform 1.
Radio frequency connector stage A2 can be mounted on one side of X-axis displacement platform 1 through screws, and radio frequency connector stage B3 is mounted on the other side of X-axis displacement platform 1 through screws. The above structure mainly satisfies the movement of the rf connector stage a2 and the rf connector stage B3 in the X-axis direction, and the moving connection may be realized by a lead screw, a slide rail, or the like.
Z-axis displacement stage a6 and Z-axis displacement stage B9, wherein Z-axis displacement stage a6 and Z-axis displacement stage B9 are disposed on X-axis displacement stage 1, wherein Z-axis displacement stage a6 and rf connector stage a2 are movable together along the X-axis direction, and wherein Z-axis displacement stage B9 and rf connector stage B3 are movable together along the X-axis direction. The radio frequency connector carrier A2 is provided with a radio frequency connector A11. The radio frequency connector carrier B3 is provided with a radio frequency connector B12.
It is further preferable that the Z-axis displacement platform a6 is mounted on the lower portion of the rf connector stage a2 by screws, the Z-axis displacement platform B9 is mounted on the lower portion of the rf connector stage B3 by screws, the rf connector a11 is mounted on the upper portion of the rf connector stage a2, and the rf connector B12 is mounted on the upper portion of the rf connector stage B3.
A support plate stage a5 and a support plate stage B8, wherein the support plate stage a5 is connected to the Z-axis displacement table a6 and is movable in the Z-axis direction, the support plate stage B8 is connected to the Z-axis displacement table B9 and is movable in the Z-axis direction, and cavities for accommodating the support plate 13 are provided on the support plate stage a5 and the support plate stage B8.
A carrier plate 13 which penetrates cavities of the carrier plate stage a5 and the carrier plate stage B8; for example, in the configuration shown in fig. 1, carrier plate 13 passes between carrier plate stage a5 and carrier plate stage B8.
And a plurality of ball spring screws 4 which are respectively arranged in the cavities of the bearing plate carrier platform A5 and the bearing plate carrier platform B8 and are positioned below the bearing plate 13.
In general, ball spring screws 4 are uniformly mounted on the lower portions of carrier plate stage a5 and carrier plate stage B8, the assembly of carrier plate stage a5 and ball spring screws 4 is mounted on Z-axis displacement platform a6 by screws, and the assembly of carrier plate stage B8 and ball spring screws 4 is mounted on Z-axis displacement platform B9 by screws.
And a locking screw A7 for locking the bearing plate carrier A5 in the Z-axis direction can be arranged on the Z-axis displacement platform A6. The locking screw a7 is located generally to the side of the Z displacement stage a 6.
And a locking screw B10 for locking the bearing plate carrying platform B8 in the Z-axis direction is arranged on the Z-axis displacement platform B9. The locking screw B10 is located on the side of the Z displacement stage B9.
And the carrier for the piece to be tested is used for placing the piece to be tested 19 and is positioned on the bearing plate 13 between the radio frequency connector carrier A2 and the radio frequency connector carrier B3.
The carrier of the piece to be measured is combined according to the length of the piece to be measured 19, the carrier of the piece to be measured is placed on the surface of the bearing plate 13, and the piece to be measured 19 is placed on the corresponding space surface of the carrier of the piece to be measured according to the width of the piece to be measured.
The specific model of the carrier to be measured can be selected according to the to-be-measured piece 19, for example, the carrier to be measured can be the carrier 14 to be measured with a thickness of 0.5 mm, the carrier 15 to be measured with a thickness of 1 mm, the carrier 16 to be measured with a thickness of 2 mm, the carrier 17 to be measured with a thickness of 4 mm, or the carrier 18 to be measured with a thickness of 8 mm, but the invention is not limited thereto.
When the device works, one or more of a carrier 14 with the thickness of 0.5 mm, a carrier 15 with the thickness of 1 mm, a carrier 16 with the thickness of 2 mm, a carrier 17 with the thickness of 4 mm and a carrier 18 with the thickness of 8 mm can be selected to form a carrier with the thickness of the piece to be measured, the carrier with the thickness of 2 mm is placed on the surface of the supporting plate 13, the piece to be measured 19 is placed in a carrier groove with the thickness of the piece to be measured with the corresponding width according to the width of the piece to be measured 19, the screws of the X-axis displacement platform 1, the Z-axis displacement platform A6 and the Z-axis displacement platform B9 are rotated in a matching manner, so that the carrier with the piece to be measured is clamped by the radio frequency connector carrier A2 and the radio frequency connector carrier B3, and the needles of the radio frequency connector A11 and the radio frequency connector B12 are contacted with the upper surface of the piece to be measured 19, so that the ball spring screw 4 has a certain compression amount, and the needles of the radio frequency connector A11 and the radio frequency connector A12 are tightly attached to the surface of the piece to be measured 19, and then connecting the radio frequency connector A11 and the radio frequency connector B12 with an external test instrument to complete the test.
In the present specification, the embodiments are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other.
Reference throughout this specification to "one embodiment," "another embodiment," "an embodiment," or the like means that a particular feature, structure, or characteristic described in connection with the embodiment is included in at least one embodiment described in general terms in this application. The appearances of the same phrase in various places in the specification are not necessarily all referring to the same embodiment. Further, when a particular feature, structure, or characteristic is described in connection with any embodiment, it is submitted that it is within the scope of the invention to effect such feature, structure, or characteristic in connection with other embodiments.
Although the invention has been described herein with reference to a number of illustrative embodiments thereof, it should be understood that numerous other modifications and embodiments can be devised by those skilled in the art that will fall within the spirit and scope of the principles of this disclosure. More specifically, various variations and modifications are possible in the component parts and/or arrangements of the subject combination arrangement within the scope of the disclosure and claims of this application. In addition to variations and modifications in the component parts and/or arrangements, other uses will also be apparent to those skilled in the art.
Claims (8)
1. A two-port microstrip device testing arrangement characterized by comprising:
an X-axis displacement stage (1);
a radio frequency connector stage A (2) and a radio frequency connector stage B (3) which are provided on the X-axis displacement platform (1), and the radio frequency connector stage A (2) and the radio frequency connector stage B (3) are capable of moving in the X-direction on the X-axis displacement platform (1);
the X-axis displacement platform comprises a Z-axis displacement platform A (6) and a Z-axis displacement platform B (9), wherein the Z-axis displacement platform A (6) and the Z-axis displacement platform B (9) are arranged on the X-axis displacement platform (1), the Z-axis displacement platform A (6) and the radio-frequency connector carrying platform A (2) can move together along the X-axis direction, and the Z-axis displacement platform B (9) and the radio-frequency connector carrying platform B (3) can move together along the X-axis direction;
the device comprises a bearing plate carrying platform A (5) and a bearing plate carrying platform B (8), wherein the bearing plate carrying platform A (5) is connected with a Z-axis displacement platform A (6) and can move along the Z-axis direction, the bearing plate carrying platform B (8) is connected with a Z-axis displacement platform B (9) and can move along the Z-axis direction, and cavities for accommodating a bearing plate (13) are arranged on the bearing plate carrying platform A (5) and the bearing plate carrying platform B (8);
a support plate (13) which penetrates through the cavities of the support plate carrier stage A (5) and the support plate carrier stage B (8);
The ball spring screws (4) are arranged in the cavities of the bearing plate carrying platform A (5) and the bearing plate carrying platform B (8) respectively and are positioned below the bearing plate (13);
and the carrier of the to-be-tested piece is used for placing the to-be-tested piece (19) and is positioned on the supporting plate (13) between the radio frequency connector carrier A (2) and the radio frequency connector carrier B (3).
2. The two-port microstrip device testing apparatus according to claim 1, wherein the stage of the device under test is a stage (14) of the device under test having a thickness of 0.5 mm, a stage (15) of the device under test having a thickness of 1 mm, a stage (16) of the device under test having a thickness of 2 mm, a stage (17) of the device under test having a thickness of 4 mm, or a stage (18) of the device under test having a thickness of 8 mm.
3. The two-port microstrip device testing apparatus according to claim 1, wherein a locking screw a (7) for locking the support plate stage a (5) in the Z-axis direction is provided on the Z-axis displacement platform a (6).
4. The two-port microstrip device testing apparatus of claim 3, wherein said locking screw A (7) is located on the side of said Z-axis displacement platform A (6).
5. The two-port microstrip device testing apparatus according to claim 1, wherein a locking screw B (10) for locking the support plate stage B (8) in the Z-axis direction is provided on the Z-axis displacement platform B (9).
6. The two-port microstrip device testing apparatus according to claim 5, wherein said locking screw B (10) is located at the side of said Z-axis displacement platform B (9).
7. The two-port microstrip device testing apparatus according to claim 1, wherein said rf connector stage a (2) is provided with an rf connector a (11).
8. The two-port microstrip device testing apparatus according to claim 1, wherein said rf connector carrier B (3) is provided with an rf connector B (12).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210341545.3A CN114755516A (en) | 2022-03-29 | 2022-03-29 | Two-port microstrip device testing arrangement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210341545.3A CN114755516A (en) | 2022-03-29 | 2022-03-29 | Two-port microstrip device testing arrangement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114755516A true CN114755516A (en) | 2022-07-15 |
Family
ID=82329138
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210341545.3A Pending CN114755516A (en) | 2022-03-29 | 2022-03-29 | Two-port microstrip device testing arrangement |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114755516A (en) |
-
2022
- 2022-03-29 CN CN202210341545.3A patent/CN114755516A/en active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6396296B1 (en) | Method and apparatus for electrical characterization of an integrated circuit package using a vertical probe station | |
| US9000989B2 (en) | Test system with adjustable radio-frequency probe array | |
| US6759853B2 (en) | Automated domain reflectometry testing system | |
| CN103575996B (en) | Antenna detection device | |
| KR20030022736A (en) | Burn-in test socket | |
| CN111707929A (en) | PGA packaging microwave test fixture | |
| KR100428782B1 (en) | Apparatus for measuring tension of pogo pin | |
| CN217587418U (en) | Two-port microstrip device testing device | |
| CN114755516A (en) | Two-port microstrip device testing arrangement | |
| US20060139045A1 (en) | Device and method for testing unpackaged semiconductor die | |
| CN113358936A (en) | Resistance measuring device for conductive adhesive tape in shielding cover | |
| US11899058B2 (en) | Automated test equipment for testing one or more devices-under-test and method for operating an automated test equipment | |
| CN219551396U (en) | Tool for detecting relative position of two parallel surface holes of insulating support type product | |
| CN219657688U (en) | Electrical property test fixture | |
| CN215493724U (en) | Adapter plate for being compatible with various aging machine table tests | |
| CN112757184B (en) | Axial accurate positioning device and method for part test | |
| KR102501995B1 (en) | Automated test equipment for testing one or more DUTs and methods of operating the automated test equipment | |
| CN216350940U (en) | Impedance test probe and impedance test device | |
| CN219798408U (en) | Measuring jig | |
| CN216595320U (en) | Phased array passive antenna automatic testing device | |
| CN218629971U (en) | Crystal frequency testing device and system | |
| KR20210120854A (en) | Pogo block | |
| JPH06180345A (en) | Tray for housing semiconductor device and device and method for testing semiconductor device | |
| CN112505362A (en) | Universal clamp suitable for testing electrical performance of micro-strip line interface microwave device | |
| CN118534159A (en) | Probe card with replaceable probe module and application method thereof |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |