CN217587418U - Two-port microstrip device testing device - Google Patents
Two-port microstrip device testing device Download PDFInfo
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- CN217587418U CN217587418U CN202220758464.9U CN202220758464U CN217587418U CN 217587418 U CN217587418 U CN 217587418U CN 202220758464 U CN202220758464 U CN 202220758464U CN 217587418 U CN217587418 U CN 217587418U
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Abstract
The utility model discloses a two-port microstrip device testing device, which comprises an X-axis displacement platform, a radio frequency connector platform A, a radio frequency connector platform B, a Z-axis displacement platform A and a Z-axis displacement platform B, wherein the X-axis displacement platform, the bearing plate platform A, the bearing plate platform B, a bearing plate, a ball spring screw and a platform of a piece to be tested; the radio frequency connector stage A and the radio frequency connector stage B can move along the X direction on the X-axis displacement platform; the ball spring screw is arranged in the cavities of the bearing plate bearing platform A and the bearing plate bearing platform B and is positioned below the bearing plate; and the carrier of the piece to be tested is positioned on the bearing plate between the radio frequency connector carrier A and the radio frequency connector carrier B. By the utility model, the device test can be completed quickly and efficiently, and the connection of the microstrip line can be completed by a compression joint method without welding and nondestructive test; the microstrip line structure is suitable for various microstrip line devices, and can be used in different lengths, different widths and different medium thicknesses.
Description
Technical Field
The utility model relates to a radio frequency device tests technical field, concretely relates to two port microstrip device testing arrangement.
Background
Two-port microstrip device is an important component of radio frequency device, and is widely applied to various communication related fields, including: base station, backhaul link, satellite communications, military, radar, aerospace, and the like. In the production of the microstrip device, the electrical property of the device needs to be accurately tested, a common vector network analyzer only has a coaxial calibration piece, if the microstrip device needs to be tested, microstrip coaxial conversion needs to be added, the microstrip coaxial conversion can introduce a large test error, and the traditional microstrip device test needs welding, so that the device is damaged and the corresponding cost cannot be increased in later-stage sale. According to the testing requirements of the microstrip device, a microstrip device testing device which is high in frequency, rapid, accurate and nondestructive is urgently needed, but the device does not exist in the current market.
SUMMERY OF THE UTILITY MODEL
The utility model provides a two port microstrip device testing arrangement, one of the technical problem who aims at the solution is: the prior art has the technical problem that the device is easy to damage when the microstrip device is tested.
In view of the above problems in the prior art, according to the present invention, the present invention adopts the following technical solutions:
a two-port microstrip device testing apparatus, comprising:
an X-axis displacement stage;
the radio frequency connector carrying platform A and the radio frequency connector carrying platform B are arranged on the X-axis displacement platform and can move along the X direction on the X-axis displacement platform;
the X-axis displacement platform is arranged on the X-axis displacement platform, the Z-axis displacement platform A and the radio-frequency connector platform A can move together along the X-axis direction, and the Z-axis displacement platform B and the radio-frequency connector platform B can move together along the X-axis direction;
the supporting plate carrying platform A is connected with the Z-axis displacement platform A and can move along the Z-axis direction, the supporting plate carrying platform B is connected with the Z-axis displacement platform B and can move along the Z-axis direction, and cavities for accommodating the supporting plate are arranged on the supporting plate carrying platform A and the supporting plate carrying platform B;
the bearing plate penetrates through the cavities of the bearing plate carrying platform A and the bearing plate carrying platform B;
the ball spring screws are arranged in the cavities of the bearing plate carrying platform A and the bearing plate carrying platform B respectively and are positioned below the bearing plate;
and the carrier of the to-be-tested piece is used for placing the to-be-tested piece and is positioned on the bearing plate between the radio frequency connector carrier A and the radio frequency connector carrier B.
In order to better realize the utility model discloses, further technical scheme is:
further, the microscope carrier that awaits measuring is a microscope carrier that awaits measuring of 0.5 millimeter thickness, a microscope carrier that awaits measuring of 1 millimeter thickness, a microscope carrier that awaits measuring of 2 millimeters thickness, a microscope carrier that awaits measuring of 4 millimeters thickness or a microscope carrier that awaits measuring of 8 millimeters thickness.
Furthermore, a locking screw A used for locking the bearing plate carrier A in the Z-axis direction is arranged on the Z-axis displacement platform A.
Further, the locking screw A is positioned on the side surface of the Z-axis displacement platform A.
Furthermore, a locking screw B for locking the bearing plate carrying platform B in the Z-axis direction is arranged on the Z-axis displacement platform B.
Further, the locking screw B is positioned on the side surface of the Z-axis displacement platform B.
Further, a radio frequency connector a is arranged on the radio frequency connector carrier a.
Further, a radio frequency connector B is arranged on the radio frequency connector carrier B.
Compared with the prior art, one of the beneficial effects of the utility model is that:
the utility model discloses a two-port microstrip device testing arrangement, 1) can accomplish the device test fast high-efficiently, and use the method of crimping to accomplish the connection of microstrip line, do not need the welding, nondestructive test; 2) The microstrip line structure is suitable for various microstrip line devices, and can be used in different lengths, different widths and different medium thicknesses.
Drawings
For a clearer explanation of the embodiments or technical solutions in the prior art of the present application, the drawings used in the description of the embodiments or prior art will be briefly described below, it is obvious that the drawings in the following description are only references to some embodiments in the present application, and other drawings can be obtained by those skilled in the art without creative efforts.
Fig. 1 is a schematic diagram of an overall structure of a two-port microstrip device testing apparatus according to an embodiment of the present invention.
Fig. 2 is a schematic structural view of a ball spring screw according to an embodiment of the present invention.
Fig. 3 is a schematic diagram of a structure of a bearing plate carrier a assembly according to an embodiment of the present invention.
Fig. 4 is a schematic structural diagram of a bearing plate and carrier assembly B according to an embodiment of the present invention.
Fig. 5 is a schematic top view of a two-port microstrip device testing apparatus according to an embodiment of the present invention.
Wherein, the reference numbers correspond to the names of the figures:
the device comprises a 1-X-axis displacement platform, a 2-radio frequency connector platform A, a 3-radio frequency connector platform B, a 4-ball spring screw, a 5-supporting plate platform A, a 6-Z-axis displacement platform A, a 7-locking screw A, an 8-supporting plate platform B, a 9-Z-axis displacement platform B, a 10-locking screw B, a 11-radio frequency connector A, a 12-radio frequency connector B, a 13-supporting plate, a 14-0.5 mm thickness workpiece platform, a 15-1 mm thickness workpiece platform, a 16-2 mm thickness workpiece platform, a 17-4 mm thickness workpiece platform, a 18-8 mm thickness workpiece platform and a 19-workpiece.
Detailed Description
The present invention will be described in further detail with reference to examples, but the present invention is not limited thereto.
Referring to fig. 1 to 5, a two-port microstrip device testing apparatus includes:
an X-axis displacement stage 1;
and the radio frequency connector carrying table A2 and the radio frequency connector carrying table B3 are arranged on the X-axis displacement platform 1, and the radio frequency connector carrying table A2 and the radio frequency connector carrying table B3 can move on the X-axis displacement platform 1 along the X direction.
The radio frequency connector carrier A2 can be installed on one side of the X-axis displacement platform 1 through screws, and the radio frequency connector carrier B3 is installed on the other side of the X-axis displacement platform 1 through screws. The structure mainly meets the requirement that the radio frequency connector carrying platform A2 and the radio frequency connector carrying platform B3 move in the X-axis direction, and the moving connection mode can be a screw rod, a sliding rail and the like.
The X-axis displacement platform comprises a Z-axis displacement platform A6 and a Z-axis displacement platform B9, the Z-axis displacement platform A6 and the Z-axis displacement platform B9 are arranged on the X-axis displacement platform 1, the Z-axis displacement platform A6 and the radio-frequency connector carrying platform A2 can move together along the X-axis direction, and the Z-axis displacement platform B9 and the radio-frequency connector carrying platform B3 can move together along the X-axis direction. The radio frequency connector carrying platform A2 is provided with a radio frequency connector A11. The radio frequency connector carrier B3 is provided with a radio frequency connector B12.
Preferably, the Z-axis displacement platform A6 is mounted on the lower portion of the radio frequency connector stage A2 by screws, the Z-axis displacement platform B9 is mounted on the lower portion of the radio frequency connector stage B3 by screws, the radio frequency connector a11 is mounted on the upper portion of the radio frequency connector stage A2, and the radio frequency connector B12 is mounted on the upper portion of the radio frequency connector stage B3.
The supporting plate carrying platform A5 and the supporting plate carrying platform B8 are arranged on the supporting plate carrying platform A5, the supporting plate carrying platform A5 is connected with the Z-axis displacement platform A6 and can move along the Z-axis direction, the supporting plate carrying platform B8 is connected with the Z-axis displacement platform B9 and can move along the Z-axis direction, and cavities for accommodating the supporting plate 13 are arranged on the supporting plate carrying platform A5 and the supporting plate carrying platform B8.
A support plate 13 penetrating through the cavities of the support plate stage A5 and the support plate stage B8; for example, in the configuration shown in fig. 1, the support plate 13 passes through the middle of the support plate stage A5 and the support plate stage B8.
And a plurality of ball spring screws 4 which are respectively arranged in the cavities of the bearing plate carrying platform A5 and the bearing plate carrying platform B8 and are positioned below the bearing plate 13.
In general, the ball spring screws 4 are uniformly mounted on the lower portions of the support plate stage A5 and the support plate stage B8, the assembly of the support plate stage A5 and the ball spring screws 4 is mounted on the Z-axis displacement platform A6 by screws, and the assembly of the support plate stage B8 and the ball spring screws 4 is mounted on the Z-axis displacement platform B9 by screws.
And a locking screw A7 used for locking the bearing plate carrying platform A5 in the Z-axis direction can be arranged on the Z-axis displacement platform A6. The locking screw A7 is generally located on the side of the Z-axis displacement stage A6.
And a locking screw B10 used for locking the bearing plate carrying platform B8 in the Z-axis direction is arranged on the Z-axis displacement platform B9. The locking screw B10 is located on the side of the Z-axis displacement platform B9.
And the carrier of the to-be-tested piece is used for placing the to-be-tested piece 19 and is positioned on the supporting plate 13 between the radio frequency connector carrier A2 and the radio frequency connector carrier B3.
The microscope carrier of the piece to be measured is combined according to the length of the piece to be measured 19, the microscope carrier of the piece to be measured is placed on the surface of the supporting plate 13, and the piece to be measured 19 is placed on the corresponding space surface of the microscope carrier of the piece to be measured according to the width of the piece to be measured.
Can select according to 19 to await measuring to the concrete model of a microscope carrier that awaits measuring, for example, the microscope carrier that awaits measuring can be that a microscope carrier 14, 1 millimeter thickness awaits measuring of 0.5 millimeter thickness awaits measuring a microscope carrier 15, 2 millimeter thickness awaits measuring a microscope carrier 16, 4 millimeter thickness awaits measuring a microscope carrier 17 or 8 millimeter thickness microscope carrier 18 that awaits measuring, certainly the utility model discloses but not limited to this.
When the device works, one or more of a carrier 14 with a thickness of 0.5 mm, a carrier 15 with a thickness of 1 mm, a carrier 16 with a thickness of 2 mm, a carrier 17 with a thickness of 4 mm and a carrier 18 with a thickness of 8 mm can be selected according to the length of a workpiece to be tested to form a carrier with a corresponding length, the carrier is placed on the surface of the supporting plate 13, the workpiece 19 is placed in a slot of the carrier with a corresponding width according to the width of the workpiece to be tested, the screws of the X-axis displacement platform 1, the Z-axis displacement platform A6 and the Z-axis displacement platform B9 are rotated in a matched mode, so that the workpiece to be tested is clamped by the radio-frequency connector carrier A2 and the radio-frequency connector B3, the pins of the radio-frequency connector A11 and the radio-frequency connector B12 are in contact with the upper surface of the workpiece to be tested, the ball spring screws 4 have a certain compression amount, the pins of the radio-frequency connector A11 and the radio-frequency connector A12 are tightly attached to the surface of the workpiece to be tested, and then the radio-frequency connector A11 and the radio-frequency connector B12 are connected with an external test instrument to finish a test.
The embodiments are described in a progressive manner in the specification, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other.
Reference throughout this specification to "one embodiment," "another embodiment," "an embodiment," etc., means that a particular feature, structure, or characteristic described in connection with the embodiment is included in at least one embodiment described generally in this application. The appearances of the same phrase in various places in the specification are not necessarily all referring to the same embodiment. Further, when a particular feature, structure, or characteristic is described in connection with any embodiment, it is submitted that it is within the scope of the invention to effect such feature, structure, or characteristic in connection with other embodiments.
Although the invention has been described herein with reference to a number of illustrative embodiments thereof, it should be understood that numerous other modifications and embodiments can be devised by those skilled in the art that will fall within the spirit and scope of the principles of this invention. More specifically, various variations and modifications are possible in the component parts and/or arrangements of the subject combination arrangement within the scope of the disclosure and claims of this application. In addition to variations and modifications in the component parts and/or arrangements, other uses will also be apparent to those skilled in the art.
Claims (8)
1. A two-port microstrip device testing arrangement characterized by comprising:
an X-axis displacement stage (1);
a radio frequency connector stage A (2) and a radio frequency connector stage B (3) which are arranged on the X-axis displacement platform (1), and the radio frequency connector stage A (2) and the radio frequency connector stage B (3) can move along the X direction on the X-axis displacement platform (1);
the X-axis displacement platform comprises a Z-axis displacement platform A (6) and a Z-axis displacement platform B (9), wherein the Z-axis displacement platform A (6) and the Z-axis displacement platform B (9) are arranged on the X-axis displacement platform (1), the Z-axis displacement platform A (6) and the radio-frequency connector carrying platform A (2) can move together along the X-axis direction, and the Z-axis displacement platform B (9) and the radio-frequency connector carrying platform B (3) can move together along the X-axis direction;
the device comprises a bearing plate carrying platform A (5) and a bearing plate carrying platform B (8), wherein the bearing plate carrying platform A (5) is connected with a Z-axis displacement platform A (6) and can move along the Z-axis direction, the bearing plate carrying platform B (8) is connected with a Z-axis displacement platform B (9) and can move along the Z-axis direction, and cavities for accommodating a bearing plate (13) are arranged on the bearing plate carrying platform A (5) and the bearing plate carrying platform B (8);
a support plate (13) which penetrates through the cavities of the support plate carrier stage A (5) and the support plate carrier stage B (8);
the ball spring screws (4) are arranged in the cavities of the bearing plate carrying platform A (5) and the bearing plate carrying platform B (8) respectively and are positioned below the bearing plate (13);
and the carrier of the to-be-tested piece is used for placing the to-be-tested piece (19) and is positioned on the supporting plate (13) between the radio frequency connector carrier A (2) and the radio frequency connector carrier B (3).
2. The two-port microstrip device test device according to claim 1, wherein the carrier to be tested is a carrier (14) to be tested with a thickness of 0.5 mm, a carrier (15) to be tested with a thickness of 1 mm, a carrier (16) to be tested with a thickness of 2 mm, a carrier (17) to be tested with a thickness of 4 mm, or a carrier (18) to be tested with a thickness of 8 mm.
3. The two-port microstrip device testing apparatus according to claim 1, wherein a locking screw a (7) for locking the support plate stage a (5) in the Z-axis direction is provided on the Z-axis displacement platform a (6).
4. The two-port microstrip device testing apparatus of claim 3, wherein said locking screw A (7) is located on the side of said Z-axis displacement platform A (6).
5. The two-port microstrip device testing apparatus according to claim 1, wherein a locking screw B (10) for locking the support plate stage B (8) in the Z-axis direction is provided on the Z-axis displacement platform B (9).
6. The two-port microstrip device testing apparatus of claim 5, wherein said locking screw B (10) is located on the side of said Z-axis displacement platform B (9).
7. The two-port microstrip device testing apparatus according to claim 1, wherein said rf connector stage a (2) is provided with an rf connector a (11).
8. The two-port microstrip device testing apparatus according to claim 1, wherein said rf connector carrier B (3) is provided with an rf connector B (12).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220758464.9U CN217587418U (en) | 2022-03-29 | 2022-03-29 | Two-port microstrip device testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220758464.9U CN217587418U (en) | 2022-03-29 | 2022-03-29 | Two-port microstrip device testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217587418U true CN217587418U (en) | 2022-10-14 |
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ID=83540667
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202220758464.9U Active CN217587418U (en) | 2022-03-29 | 2022-03-29 | Two-port microstrip device testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN217587418U (en) |
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2022
- 2022-03-29 CN CN202220758464.9U patent/CN217587418U/en active Active
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