CN219657688U

CN219657688U - Electrical property test fixture

Info

Publication number: CN219657688U
Application number: CN202320171210.1U
Authority: CN
Inventors: 殷敏; 周丹; 沈健; 徐亚龙
Original assignee: Suzhou Huaqinyuan Microelectronics Technology Co ltd
Current assignee: Suzhou Huaqinyuan Microelectronics Technology Co ltd
Priority date: 2023-02-09
Filing date: 2023-02-09
Publication date: 2023-09-08
Anticipated expiration: 2033-02-09

Abstract

The utility model discloses an electrical property test fixture, which comprises a mounting plate, at least two groups of test components, at least two groups of moving modules and a device base, wherein the moving modules and the device base are fixedly connected with the mounting plate, the moving modules are symmetrically arranged along the device base, the test components are connected with the moving modules, the positions and angles of the test components are adjusted through the moving modules so as to adapt to devices with more sizes, the test components comprise a probe fixing head and a guide plate, and the probe fixing head is arranged at one end of the guide plate and is used for testing the devices placed on the device base; the device of various models and size all can be placed on the device base, and the position of the test assembly is adjusted through each mobile module, so that the test probe is finally contacted with the port of the device, the electrical property test of the device is realized, and the cable of the device is fixed by the cable fixing clamping seat after being arranged by the guide plate, so that the bending possibility of the cable can be reduced, and the accuracy of the electrical property of the device in the test process is effectively improved.

Description

Electrical property test fixture

Technical Field

The utility model relates to the technical field of electronic device detection, in particular to an electrical property test fixture.

Background

The mobile communication is composed of a mobile station, a base station and a mobile exchange office, the communication mode between the mobile user and the fixed point user or between the mobile users is realized by taking microwaves as transmission means, and the circulator/isolator occupies important positions in the modern microwave communication and has the effect that other components cannot be replaced.

In the prior art, in order to obtain the electrical performance parameters of the devices as soon as possible when the circulator and the isolator are actually designed, the jigs of the adaptive test performance are usually designed at the same time, but because the size and the shape of the circulator are quite different, if each device corresponds to the design test jigs, the design is very troublesome and the cost is consumed, and the device is disclosed as follows: in the patent document of CN212965039U, by adopting the test pressing block to press the pressing part of the PIN needle, the device can achieve good contact in the test, so as to improve the stability of the test and the accuracy of the test result, but the technology cannot solve the problem that the test fixture does not have universality, and the test fixture still needs to be designed according to the correspondence of each device.

Disclosure of Invention

The utility model provides an electrical property test fixture for solving the defects in the prior art.

In order to achieve the above purpose, the present utility model adopts the following technical scheme: the device comprises a mounting plate, at least two groups of test assemblies, at least two groups of moving modules and a device base, wherein the moving modules and the device base are fixedly connected with the mounting plate;

the mobile module is symmetrically arranged along the device base, the test assembly is connected with the mobile module, and the position and the angle are adjusted through the mobile module so as to adapt to devices with more sizes;

the test assembly comprises a probe fixing head and a guide plate, wherein the probe fixing head is arranged at one end of the guide plate and is used for testing devices placed on the device base.

As a further description of the above technical solution: the moving module is movably connected with the guide plate, and the probe fixing heads of the plurality of groups of testing assemblies are arranged close to the device base.

As a further description of the above technical solution: the other end of the guide plate is also provided with a cable fixing clamping seat which is far away from the device base.

As a further description of the above technical solution: the cable fixing clamp seat comprises a V-shaped groove, and the groove is used for fixing a cable of a device.

As a further description of the above technical solution: the probe fixing head is used for setting a test probe, and the test probe is contacted with a port of the device to finish electrical performance test.

As a further description of the above technical solution: the movable module comprises a plurality of movable plates, a plurality of micrometer and a plurality of adjusting blocks, wherein the movable plates are controlled by the micrometer respectively so as to realize the adjustment of XYZ axis directions respectively.

As a further description of the above technical solution: the adjusting block is used for adjusting tightness of the micrometer so as to realize movement and fixation of the micrometer.

As a further description of the above technical solution: the outer surface of the micrometer is provided with scale marks, and the corresponding distance of the moving plate can be known through the scale marks.

As a further description of the above technical solution: the micrometer and the adjusting block are connected with the corresponding moving plate.

As a further description of the above technical solution: the movable module further comprises at least two connecting plates, a plurality of movable plates are arranged between the connecting plates, and the connecting plates are respectively connected with the mounting plate and the guide plate.

The utility model has the following beneficial effects:

according to the utility model, the device placed on the device base can be tested through the test assembly arranged on the mobile module, and the test assembly is subjected to adjustment in three directions of the X axis, the Y axis and the Z axis through the mobile module, so that the test probe can be contacted with ports of devices with various specifications, the electrical performance test is completed, the testing of circulators and isolators with various types is completed through one test fixture, the convenience is improved, and meanwhile, the test probe can be better attached to the ports of the devices, thereby improving the test accuracy.

Drawings

FIG. 1 is a schematic perspective view of an electrical performance testing fixture according to the present utility model;

FIG. 2 is a schematic diagram of the mobile module of FIG. 1;

FIG. 3 is a schematic view of the other view of FIG. 2;

fig. 4 is a schematic perspective view of another electrical performance testing fixture according to the present utility model.

Legend description:

1. a mounting plate; 2. a testing component; 3. a mobile module; 4. a device base; 21. a probe fixing head; 22. the device comprises a guide plate, 23, a cable fixing clamping seat, 24, a test probe, 31, a moving plate, 32, a micrometer, 33, an adjusting block, 34 and a connecting plate.

Detailed Description

The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.

Referring to fig. 1-4, one embodiment provided by the present utility model is: the device comprises a mounting plate 1, at least two groups of test assemblies 2, at least two groups of mobile modules 3 and a device base 4, wherein the mobile modules 3 and the device base 4 are fixedly connected with the mounting plate 1, the mobile modules 3 are symmetrically arranged along the device base 4, the test assemblies 2 are connected with the mobile modules 3, the positions and angles of the test assemblies are adjusted through the mobile modules 3 so as to adapt to devices with more sizes, the test assemblies 2 comprise a probe fixing head 21 and a guide plate 22, and the probe fixing head 21 is arranged at one end of the guide plate 22 and is used for testing the devices placed on the device base 4; devices of various types and sizes can be placed on the device base 4, the positions of the test assemblies 2 are adjusted through the moving modules 3, and finally the test probes 24 are in contact with ports of the devices so as to realize electrical performance test of the devices, cables of the devices are fixed through the cable fixing clamping seats 23 after being arranged by the guide plates 22, so that the bending possibility of the cables can be reduced, and the accuracy of the electrical performance of the devices in the test process is effectively improved.

The moving module 3 comprises a plurality of moving plates 31, a plurality of micrometer 32 and a plurality of regulating blocks 33, the moving plates 31 are respectively controlled by the micrometer 32 to respectively realize the adjustment in the XYZ axis direction, the moving module 3 further comprises at least two connecting plates 34, the plurality of moving plates 31 are arranged between the connecting plates 34, the connecting plates 34 are respectively connected with the mounting plate 1 and the guide plate 22, graduation marks are distributed on the outer surfaces of the micrometer 32, the corresponding moving plate 31 moving distance can be known through the graduation marks, the micrometer 32 and the regulating blocks 33 are connected with the corresponding moving plates 31, the regulating blocks 33 are used for regulating the tightness of the micrometer 32 to realize the movement and the fixation of the micrometer 32, and the position of the regulating of the moving plates 31 can be more accurately known in the adjustment process of the moving plates 31 to better enable the test probes 24 to be contacted with ports of devices so as to obtain more accurate electric performance test data (the other visual angle schematic diagram of the moving module 3, and the connecting plate 34 are omitted in the specific connecting mode of the moving module 3 because the micrometer 32 and the moving plate 31 are connected with the guide plate 2 and the guide plate 3 in the same mode, and the specific connecting plate 34 is omitted in the figure 3.

The other end of the guide plate 22 is also provided with a cable fixing clamping seat 23, the cable fixing clamping seat 23 is far away from the device base 4, the cable fixing clamping seat 23 comprises a V-shaped groove, and the groove is used for fixing a cable of a device, so that the cable can be better kept in a straightening state in the testing process, the influence on an electrical performance testing result caused by bending of the cable is effectively avoided, and the testing result is more accurate; the moving module 3 is movably connected with the guide plate 22, the probe fixing heads 21 of the multiple groups of testing assemblies 2 are arranged close to the device base 4, the probe fixing heads 21 are used for arranging the testing probes 24, and the testing probes 24 are contacted with ports of the devices so as to finish electrical performance testing.

Embodiment two: unlike the above embodiment, which includes three moving modules 3 and three testing components 2, after the moving modules 3 are connected with the testing components 2, they are distributed around the device base 4 to cope with the electrical performance test of devices with more ports, the device base 4 has a hexagonal pillar structure, in other embodiments, more angles can be adjusted between the testing components 2 according to the requirements, and more side-looking components 2 are adopted to adapt to the test of more different devices.

Working principle: firstly, a device to be subjected to electrical performance test is placed at the top end of a device base 4, then the micrometer 32 is used for adjusting the XYZ axis of the moving plate 31, so that the test assembly 2 connected with the moving module 3 moves, finally, the test probe 24 contacts with a port of the device, and cables of the device are fixed by the cable fixing clamping seat 23 after being arranged by the guide plate 22, so that the bending possibility of the cables can be reduced better, and the test accuracy is improved.

Finally, it should be noted that: the foregoing description is only illustrative of the preferred embodiments of the present utility model, and although the present utility model has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications may be made to the embodiments described, or equivalents may be substituted for elements thereof, and any modifications, equivalents, improvements or changes may be made without departing from the spirit and principles of the present utility model.

Claims

1. An electrical property test fixture, characterized in that: the device comprises a mounting plate (1), at least two groups of test assemblies (2), at least two groups of moving modules (3) and a device base (4), wherein the moving modules (3) and the device base (4) are fixedly connected with the mounting plate (1);

the mobile module (3) is symmetrically arranged along the device base (4), the test assembly (2) is connected with the mobile module (3), and the position and the angle are adjusted through the mobile module (3) so as to adapt to devices with more sizes;

the test assembly (2) comprises a probe fixing head (21) and a guide plate (22), wherein the probe fixing head (21) is arranged at one end of the guide plate (22) and is used for testing devices placed on the device base (4).

2. An electrical property test fixture according to claim 1, wherein: the moving module (3) is movably connected with the guide plate (22), and a plurality of groups of probe fixing heads (21) of the testing assembly (2) are arranged close to the device base (4).

3. An electrical property test fixture according to claim 1, wherein: the other end of the guide plate (22) is also provided with a cable fixing clamping seat (23), and the cable fixing clamping seat (23) is far away from the device base (4).

4. An electrical property test fixture according to claim 3, wherein: the cable fixing clamping seat (23) comprises a V-shaped groove, and the groove is used for fixing a cable of a device.

5. An electrical property test fixture according to claim 1, wherein: the probe fixing head (21) is used for arranging a test probe (24), and the test probe (24) is contacted with a port of the device to complete electrical performance test.

6. An electrical property test fixture according to claim 1, wherein: the moving module (3) comprises a plurality of moving plates (31), a plurality of micrometer (32) and a plurality of adjusting blocks (33), and the moving plates (31) are respectively controlled by the micrometer (32) so as to respectively realize the adjustment of the directions of the XYZ axes.

7. An electrical property test fixture according to claim 6, wherein: the adjusting block (33) is used for adjusting the tightness of the micrometer (32) so as to realize the movement and the fixation of the micrometer (32).

8. An electrical property test fixture according to claim 6, wherein: the outer surface of the micrometer (32) is provided with graduation marks, and the corresponding distance of the moving plate (31) can be known through the graduation marks.

9. An electrical property test fixture according to claim 6, wherein: the micrometer (32) and the adjusting block (33) are connected with the corresponding moving plate (31).

10. An electrical property test fixture according to claim 6, wherein: the mobile module (3) further comprises at least two connecting plates (34), a plurality of mobile plates (31) are arranged between the connecting plates (34), and the connecting plates (34) are respectively connected with the mounting plate (1) and the guide plate (22).