CN221506993U

CN221506993U - Sheet probe

Info

Publication number: CN221506993U
Application number: CN202322910214.XU
Authority: CN
Inventors: 陈恭科; 廖兴周; 刘志强
Original assignee: Huatong Precision Circuit Board Huizhou Co ltd
Current assignee: Huatong Precision Circuit Board Huizhou Co ltd
Priority date: 2023-10-27
Filing date: 2023-10-27
Publication date: 2024-08-09
Anticipated expiration: 2033-10-27

Abstract

The application relates to the technical field of PCB probes, and provides a sheet probe which comprises a needle head, a positioning sheet, an elastic sheet and a needle tail. According to the application, the probe is arranged into a sheet shape, the excessive current can be realized, the short circuit can not occur when the small PICH connector is docked, the current reaches 20A when the battery protection board is tested, the burnout can not occur, meanwhile, the design size of the structure of the test jig is reduced, the positioning sheet is arranged on the test jig, the positioning accuracy of the probe is ensured, the needle tail is conducted with the switching circuit board or other leads of the test jig, after the needle head contacts with a product to be electrically tested, the needle head exerts an acting force on the product to be electrically tested, the product to be electrically tested exerts a reaction force on the needle head, the elastic sheet is slightly deformed under the action of the elastic sheet resilience, the needle head contacts with the product to be tested more tightly, and the test effect is improved.

Description

Sheet probe

Technical Field

The application relates to the technical field of PCB probes, in particular to a sheet probe.

Background

The probe is a tool for electrical testing of a PCB circuit board, is used for testing a jig or other testing equipment, is usually plated with gold on the surface, one end of the probe is abutted against and electrically connected with a test point of the PCB circuit board, such as a copper leakage position, and the other end of the probe is electrically connected with the testing jig or testing instrument, so that the test point is electrically connected with the testing jig or testing instrument, and the electrical testing of the PCB circuit board is realized.

When the prior art carries out electrical test to the PCB circuit board, the spring needle and the organ probe are adopted to butt the connector, the spring needle is of a cylindrical structure, the diameter is larger, when the connector is in butt joint with a small PICH, short circuit is easy, high current cannot be conducted, the organ probe is mostly imported, the price is high, the length is longer, the required space is large, the structure of the circuit board test fixture is larger, the practical use is not facilitated, and therefore, the sheet probe is provided.

Disclosure of Invention

The embodiment of the application aims to provide a sheet probe which solves the problems that a short circuit is easy and a large current cannot be conducted when a small PICH connector is butted by the probe in the prior art by changing the structure of the probe.

The embodiment of the application provides a sheet probe, which adopts the following technical scheme:

The sheet probe comprises a needle head, a locating piece, an elastic piece and a needle tail, wherein one end of the locating piece is connected with the needle head, the other end of the locating piece is connected with the elastic piece, and the elastic piece is connected with the needle tail.

Preferably, the positioning sheet is provided with a positioning groove.

Preferably, the elastic sheet comprises a plurality of bending sections and a plurality of straight line sections, and the bending sections and the straight line sections are sequentially distributed at intervals.

Preferably, the bending section is provided with a through groove.

Preferably, the needle head structure is any one of U-shaped, tooth-shaped, conical or trapezoidal.

Preferably, the needle tail is provided with a clamping groove.

Preferably, the needle, the locating piece, the elastic piece and the needle tail are integrally arranged.

The application has the beneficial effects that:

Compared with the prior art, the application sets the probe into a sheet shape, can realize the stable passing of large current, can not be short-circuited when the small PICH connector is in butt joint, can not burn out when the battery protection board is tested, can not reach 20A of current, and can reduce the design size of the test fixture structure and the occupied space of the fixture structure;

When the test fixture is used, the positioning sheet is arranged on the test fixture to position the probe, the probe is ensured to be positioned accurately, the needle tail is communicated with the switching circuit board or other leads of the test fixture, after the needle head is contacted with a product to be tested electrically, the needle head applies an acting force to the product to be tested electrically, the product to be tested electrically applies a reaction force to the needle head, so that the elastic sheet is slightly deformed under the action of the elastic sheet resilience force, then the needle head is contacted with the product to be tested more tightly, the test effect is improved, and after the test is finished, the elastic sheet rebounds, so that the probe returns to an initial state.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the embodiments will be briefly described below, it being understood that the following drawings only illustrate some embodiments of the present application and therefore should not be considered as limiting the scope, and other related drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.

FIG. 1 is a schematic diagram of the overall structure of some embodiments of the present utility model;

fig. 2 is a top view of some embodiments of the utility models.

The reference numerals are respectively:

1. A needle; 2. a positioning sheet; 3. an elastic sheet; 4. a needle tail; 5. a positioning groove; 6. bending sections; 7. a straight line segment; 8. a through groove; 9. a clamping groove.

Detailed Description

For the purpose of making the objects, technical solutions and advantages of the embodiments of the present application more apparent, the technical solutions of the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application, and it is apparent that the described embodiments are some embodiments of the present application, but not all embodiments of the present application. The components of the embodiments of the present application generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.

Thus, the following detailed description of the embodiments of the application, as presented in the figures, is not intended to limit the scope of the application, as claimed, but is merely representative of selected embodiments of the application. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.

It should be noted that: like reference numerals and letters denote like items in the following figures, and thus once an item is defined in one figure, no further definition or explanation thereof is necessary in the following figures.

In the description of the present application, it should be noted that, directions or positional relationships indicated by terms such as "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., are directions or positional relationships based on those shown in the drawings, or those that are conventionally put in use of the product of the application, are merely for convenience of describing the present application and simplifying the description, and do not indicate or imply that the apparatus or elements referred to must have a specific direction, be configured and operated in a specific direction, and thus should not be construed as limiting the present application. Furthermore, the terms "first," "second," "third," and the like are used merely to distinguish between descriptions and should not be construed as indicating or implying relative importance.

Furthermore, the terms "horizontal," "vertical," "overhang," and the like do not denote a requirement that the component be absolutely horizontal or overhang, but rather may be slightly inclined. As "horizontal" merely means that its direction is more horizontal than "vertical", and does not mean that the structure must be perfectly horizontal, but may be slightly inclined.

In the description of the present application, it should also be noted that, unless explicitly specified and limited otherwise, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present application will be understood in specific cases by those of ordinary skill in the art.

As shown in fig. 1 and fig. 2, the sheet probe according to the embodiment of the application includes a needle 1, a positioning sheet 2, an elastic sheet 3 and a needle tail 4, one end of the positioning sheet 2 is connected with the needle 1, the other end of the positioning sheet 2 is connected with the elastic sheet 3, the elastic sheet 3 is connected with the needle tail 4, when in use, the positioning sheet 2 is mounted on a test fixture to position the probe, the probe is ensured to be positioned accurately, the needle tail 4 is conducted with a transfer circuit board or other wires of the test fixture, after the needle 1 contacts with a product to be tested, the needle 1 applies an acting force to the product to be tested to the electrical property, the product to be tested applies a reaction force to the needle 1, so that the elastic sheet 3 is slightly deformed under the action of the rebound force of the elastic sheet 3, then the needle 1 contacts with the product to be tested more tightly, the test effect is improved, and after the test is finished, the elastic sheet 3 rebounds, so that the probe returns to an initial state.

In this embodiment, the positioning plate 2 is provided with a positioning groove 5, and the positioning plate 2 is mounted on the test fixture through the positioning groove 5.

In this embodiment, the elastic sheet 3 includes a plurality of bending segments 6 and a plurality of straight line segments 7, and bending segments 6 are circular arc, and bending segments 6 and straight line segments 7 interval distribution in proper order can compress the length of probe under the unchangeable condition of probe overall effective length, can be with the structure setting of test fixture littleer, reduces the shared space of test fixture.

In this embodiment, the bending section 6 is provided with the through groove 8, reduces the design weight of the bending section 6, is convenient for it to produce deformation more easily after the atress, improves result of use.

In this embodiment, the structure of the needle 1 is any one of U-shape, tooth-shape, cone-shape or trapezoid, so as to improve the contact effect between the needle 1 and the product to be tested electrically.

In this embodiment, the pin tail 4 is provided with a clamping groove 9, and the pin tail 4 is connected with the test fixture through the clamping groove 9.

In the embodiment, the needle head 1, the locating piece 2, the elastic piece 3 and the needle tail 4 are integrally arranged, so that the processing and the forming are easy.

The working principle of the sheet probe provided by the embodiment of the application is as follows:

When the test fixture is used, the positioning sheet 2 is arranged on the test fixture to position the probe, the probe is ensured to be positioned accurately, the needle tail 4 is communicated with the switching circuit board or other leads of the test fixture, after the needle head 1 contacts with a product to be tested electrically, the needle head 1 applies acting force to the product to be tested electrically, the product to be tested electrically applies reaction force to the needle head 1, so that the elastic sheet 3 is slightly deformed under the action of the resilience force of the elastic sheet 3, the needle head 1 contacts with the product to be tested more tightly, the test effect is improved, and after the test is finished, the elastic sheet 3 rebounds to enable the probe to return to an initial state.

The above is only a preferred embodiment of the present application, and is not intended to limit the present application, but various modifications and variations can be made to the present application by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the protection scope of the present application.

Claims

1. A wafer probe, characterized by: the needle comprises a needle head, a locating piece, an elastic piece and a needle tail, wherein one end of the locating piece is connected with the needle head, the other end of the locating piece is connected with the elastic piece, the elastic piece is connected with the needle tail, the elastic piece comprises a plurality of bending sections and a plurality of straight line sections, and the bending sections and the straight line sections are sequentially distributed at intervals.

2. A wafer probe according to claim 1, wherein: the locating piece is provided with a locating groove.

3. A wafer probe according to claim 1, wherein: the bending section is provided with a through groove.

4. A wafer probe according to claim 1, wherein: the needle head structure is any one of U-shaped, tooth-shaped, conical or trapezoidal.

5. A wafer probe according to claim 1, wherein: the needle tail is provided with a clamping groove.

6. A wafer probe according to claim 1, wherein: the needle head, the locating piece, the elastic piece and the needle tail are integrally arranged.