CN112505362A - Universal clamp suitable for testing electrical performance of micro-strip line interface microwave device - Google Patents
Universal clamp suitable for testing electrical performance of micro-strip line interface microwave device Download PDFInfo
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- CN112505362A CN112505362A CN202011181245.0A CN202011181245A CN112505362A CN 112505362 A CN112505362 A CN 112505362A CN 202011181245 A CN202011181245 A CN 202011181245A CN 112505362 A CN112505362 A CN 112505362A
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- 238000012360 testing method Methods 0.000 title claims abstract description 76
- 230000005540 biological transmission Effects 0.000 claims abstract description 47
- 238000006243 chemical reaction Methods 0.000 claims abstract description 29
- 239000004020 conductor Substances 0.000 claims abstract description 3
- 238000012812 general test Methods 0.000 claims description 4
- 239000000919 ceramic Substances 0.000 claims description 2
- 238000002955 isolation Methods 0.000 claims description 2
- 239000000758 substrate Substances 0.000 claims description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims 1
- 229910052802 copper Inorganic materials 0.000 claims 1
- 239000010949 copper Substances 0.000 claims 1
- 238000000034 method Methods 0.000 description 12
- 238000006073 displacement reaction Methods 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 230000001276 controlling effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000011056 performance test Methods 0.000 description 2
- 230000001105 regulatory effect Effects 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention relates to a universal fixture suitable for testing the electrical performance of a micro-strip line interface microwave device, which comprises a bottom plate, a bracket, a test supporting block, a vertical moving sliding table and N interface conversion tools, wherein N is equal to the number of micro-strip line interfaces of the microwave device; each interface conversion tool comprises a horizontal moving sliding table, a microstrip transmission line, a coaxial connector and a workbench surface, wherein the horizontal moving sliding table is used for controlling the workbench surface on the horizontal moving sliding table to slide along a straight line on the horizontal plane, the central axis of the microstrip transmission line is parallel to the moving direction of the workbench surface, and the central conductor of the radio frequency coaxial connector is connected with the microstrip transmission line. When the tested microwave device is tested, the vertical moving sliding table and the horizontal moving sliding table of each interface conversion tool are adjusted simultaneously, so that the microstrip line interface of the tested microwave device is in surface contact with and attached to the microstrip transmission line of the interface conversion tool, and the microstrip transmission line of the interface conversion tool and the radio frequency coaxial connector are converted into a coaxial interface mode.
Description
Technical Field
The invention relates to a universal test fixture suitable for electrical performance of a microstrip line interface microwave device, and belongs to the technical field of analysis and measurement control.
Background
The invention discloses a general microwave device testing platform with a line input/output interface, and belongs to the field of microwave device measurement. The microwave device is widely applied to microwave integrated circuits of various civil and military equipment such as radars, communication, electronic countermeasure, aerospace and the like, is an indispensable component in the microwave integrated circuits, and has wide application range and large using amount.
The input and output of the microwave device are all in a microstrip line form, and due to the particularity of ports of the microwave device, the performance parameters of the microwave device cannot be directly tested by a vector network analyzer, and the ports of the microstrip line cannot be converted into coaxial input ports through a testing tool, so that a testing cable connected to the vector network analyzer is connected to perform electrical performance testing. Most of microwave devices for spacecrafts belong to customized devices, are multiple in model specifications and diversified in appearance structure and size, and special test tools are often required to be designed for the devices of each model specification in the traditional test, even a corresponding test tool is required for testing each device to measure. The performance index of the microwave device for the spacecraft is high, particularly for the microwave device with small insertion loss, reliable and good grounding needs to be kept in the device testing process, otherwise, larger testing errors are introduced.
Here, a conventional test tray test technique is described in a schematic manner, as shown in fig. 1(a) and 1 (b).
As can be seen in fig. 1(a), the test requires one test pallet, three or more mating test electrical connectors; the connectors were assembled on the test tray using the fastening screws as shown in fig. 1(b), and then connected to a vector network analyzer to test the electrical properties. The disadvantages are as follows: the special test support block needs to be customized, the pertinence is strong, the cost is high, the repeated utilization rate is low, and the strip line plating layer is easy to scratch.
Disclosure of Invention
The technical problem solved by the invention is as follows: the universal test fixture for the electrical performance of the microwave device suitable for the microstrip line interface is capable of being adjusted freely in the X, Y, Z direction according to the size and the port position of the microwave device, and meets the universal test requirements for the electrical performance of microwave devices with different appearance structure sizes.
The technical scheme of the invention is as follows: a universal fixture suitable for testing the electrical performance of a micro-strip line interface microwave device comprises a bottom plate, a bracket, a test supporting block, a vertical moving sliding table and N interface conversion tools, wherein N is equal to the number of micro-strip line interfaces of the microwave device;
the support is fixedly arranged on the bottom plate, a hollow platform is constructed above the bottom plate in parallel, a universal test platform body is constructed together, a coordinate system of the universal test platform body takes an axis perpendicular to the bottom plate as a Z axis, and the upper surface of the hollow platform parallel to the bottom plate is an XOY plane;
the vertical moving sliding table is positioned in the middle of the bottom plate, and the upper surface of the vertical moving sliding table can slide along the Z-axis direction of the coordinate system of the universal test platform;
each interface conversion tool comprises a horizontal moving sliding table, a microstrip transmission line, a coaxial connector and a workbench surface, wherein the horizontal moving sliding table is positioned on the upper surface of the hollow platform and used for controlling the workbench surface on the horizontal moving sliding table to slide along a straight line on the horizontal plane;
the relative position relation of the N interface conversion tools is consistent with the relative position relation of the microstrip line interface of the tested microwave device, and the central axis of the microstrip transmission line of the interface conversion tools is aligned with the central axis of the microstrip line interface of the tested microwave device, namely: the central axis of the microstrip transmission line of the horizontal moving sliding table is parallel to the central axis of the microstrip line interface of the microwave device to be measured, and the plane formed by the central axis and the central axis is vertical to the XOY plane; the horizontal direction distance between the microstrip transmission lines of the interface conversion tools can be adjusted by adjusting the horizontal direction moving sliding table;
the test support block is fixedly arranged on the vertical moving sliding table and used for supporting the bottom of the tested microwave device during testing, and the distance from the microstrip line of the tested microwave device to the bottom surface of the interface can be met by adjusting the vertical moving sliding table;
when the tested microwave device is tested, the vertical moving sliding table and the horizontal moving sliding table of each interface conversion tool are adjusted simultaneously, so that the microstrip line interface of the tested microwave device is in surface contact with and attached to the microstrip transmission line of the interface conversion tool, and the microstrip transmission line of the interface conversion tool and the radio frequency coaxial connector are converted into a coaxial interface mode to be connected into an electrical property testing instrument for testing.
The electrical properties include standing wave ratio, forward loss, reverse isolation, phase consistency, and group delay.
The microstrip transmission line is made of a copper-clad plate or a ceramic substrate.
The working frequency band of the microstrip transmission line comprises the working frequency band during the period to be tested.
The microstrip transmission line is replaceable.
Compared with the prior art, the invention has the beneficial effects that:
(1) the invention realizes the nondestructive test of the strip-line coating by the method that the microstrip transmission line of the clamp is tightly attached to the input end and the output end of the microstrip line of the tested microwave device, and reduces the process of damaging the strip-line coating caused by the loading and unloading process compared with the traditional method for testing the support block tool.
(2) The invention realizes the tight connection of the end face of the clamp and the tested device after moving in place by a method of accurate alignment of the displacement platform, thereby ensuring good microwave grounding of the clamp.
(3) The invention ensures the accuracy of testing the electrical performance parameters of the wire-contained circulator with different frequency bands by the method of replacing the microstrip transmission line matched with the different frequency bands.
(4) The invention adopts the X, Y, Z three-direction displacement sliding platform, can be adjusted freely in the X, Y, Z direction according to the size of the microwave device to be tested and the position of the port, so as to meet the test of the microwave devices with different sizes and positions of the port by the same test platform, and solve the problem of coverage of the dimension of the appearance structure of the customized strip line-like microwave device.
(5) Compared with the traditional method for testing the support block tool, the method provided by the invention has the advantages that the process of assembling and disassembling the fastening screw of the customized tool is reduced, and the testing efficiency is greatly improved.
Drawings
FIG. 1(a) is a schematic view of the loading and unloading of a conventional pallet and test connector in accordance with the practice of the present invention;
FIG. 1(b) is a test view of a conventional pallet embodying the present invention;
FIG. 2 is a schematic diagram of a universal fixture suitable for electrical performance testing of isolators according to the present invention;
FIG. 3 is a schematic structural diagram of a universal fixture suitable for testing electrical performance of a circulator in accordance with the present invention.
Detailed Description
The invention is further illustrated by the following examples.
The structural components, the static positions and the connection relations among the components of the present invention are described and explained in detail with reference to the attached drawings, wherein:
as shown in fig. 2, the invention relates to a general fixture suitable for testing the electrical performance of a microstrip line interface microwave device, which comprises a bottom plate 7, a bracket 8, a test support block 5, a vertical moving sliding table 6 and N interface conversion tools, wherein N is equal to the number of microstrip line interfaces of the microwave device; the support 8 is fixedly arranged on the bottom plate 7, a hollow platform is constructed above the bottom plate 7 in parallel, a general test platform body is constructed together, a coordinate system of the general test platform body takes an axis perpendicular to the bottom plate 7 as a Z axis, and the upper surface of the hollow platform parallel to the bottom plate is an XOY plane; the vertical moving sliding table 6 is positioned in the middle of the bottom plate 7, and the upper surface of the vertical moving sliding table 6 can slide along the Z-axis direction of the coordinate system of the universal test platform.
Every interface conversion frock includes level to removing slip table 4, microstrip transmission line 1, coaxial connector 2, table surface 3, the level is located the cavity platform upper surface to removing slip table 4, a table surface 3 for controlling it on can slide along the straight line at the horizontal plane, microstrip transmission line 1 welds at table surface 3 through the mode of tin soldering, the central axis of microstrip transmission line 1 is parallel with the direction that table surface removed, radio frequency coaxial connector 2 is through mode fixed connection to table surface 3 of screw fastening, radio frequency coaxial connector 2's central conductor links to each other with microstrip transmission line 1 through the welded mode, realize that microstrip line changes coaxial output mode.
The relative position relation of the N interface conversion tools is consistent with the relative position relation of the microstrip line interface aligned to the tested microwave device, and the central axis of the microstrip transmission line 1 of the interface conversion tools is aligned to the central axis of the microstrip line interface of the tested microwave device, namely: the central axis of the microstrip transmission line 1 of the horizontal moving sliding table 4 is parallel to the central axis of the microstrip line interface of the microwave device to be measured, and the plane formed by the central axis and the microstrip transmission line is vertical to the XOY plane; the horizontal direction space between the microstrip transmission lines of the interface conversion tools can be adjusted by adjusting the horizontal direction moving sliding table 4.
The test support block 5 is fixedly arranged on the vertical moving sliding table 6 and used for supporting the bottom of the tested microwave device during testing, and the distance from the microstrip line of the tested microwave device to the bottom surface of the interface can be met by adjusting the vertical moving sliding table 6.
When the tested microwave device is tested, the vertical moving sliding table 6 and the horizontal moving sliding table 4 of each interface conversion tool are adjusted simultaneously, so that the microstrip line interface of the tested microwave device is in surface contact with and attached to the microstrip transmission line 1 of the interface conversion tool, and the microstrip transmission line 1 of the interface conversion tool and the radio frequency coaxial connector 2 are converted into a coaxial interface mode to be connected into an electrical property testing instrument for testing.
The horizontal moving sliding table 4 mainly comprises a working table surface, a crossed roller guide rail, a base, an adjusting screw button (differential head) and a locking screw. Connection relation: the cross roller guide rail and the adjusting screw are matched with each other and fixedly installed between the base and the working table, the smooth displacement of the working table is determined in a cross roller rolling transmission mode by rotating the adjusting differential head clockwise and anticlockwise, and the locking screw penetrates through the outer wall body between the working table and the base and is fixed at the limited position of the cross roller to reach the LOCK state.
In summary, the general fixture suitable for testing the electrical performance of the microstrip line interface microwave device is composed of a plurality of movable arms and a liftable sliding platform, and the testing of the microstrip line interface microwave device is realized through the adjustment of the transmission mechanism.
Example 1
Taking a circulator with three-terminal strip line input and output ports as an example:
the universal test fixture for the multi-port wired circulator consists of a micro-strip transmission line, a radio frequency coaxial connector, a working table surface, a vertical moving sliding table, 3 horizontal moving sliding tables 4, a bottom plate and a support. The simple summary is a test platform consisting of three movable (X, Y, Z) arms and a liftable (Z) sliding platform, and the test of the wire-carrying circulator is realized through the adjustment of a transmission mechanism.
Firstly, a tested device is placed on a test support block 5, and a vertical moving sliding table 6 is regulated to move along a Z axis, so that the end port of the tested device with a wire is adjusted to be approximately high on a horizontal working table surface 3. And continuously and sequentially adjusting the three horizontal moving sliding tables 4 to move along the X axis and the Y axis so that the microstrip transmission line 1 is tightly attached to the strip line input and output ends of the tested device. The coaxial connector 2 is connected with a test cable of the vector network analyzer, so far, the electrical performance test requirement is met, and the result is shown in fig. 3.
Example 2
Take an isolator with wired input and output ports at two ends as an example: the universal test fixture for the multi-port wired circulator consists of a micro-strip transmission line, a radio frequency coaxial connector, a working table surface, a vertical moving sliding table, 2 horizontal moving sliding tables 4, a bottom plate and a support. The simple structure is a test platform consisting of two movable arms and a sliding platform capable of lifting (Z), and the test of the wire-carrying circulator is realized through the adjustment of a transmission mechanism.
Firstly, a tested device is placed on a test support block 5, and a vertical moving sliding table 6 is regulated to move along a Z axis, so that the end port of the tested device with a wire is adjusted to be approximately high on a horizontal working table surface 3. And continuously and sequentially adjusting the two horizontal moving sliding tables 4 to move along the X axis, so that the microstrip transmission line 1 is tightly attached to the strip line input and output ends of the tested device. The coaxial connector 2 is connected with a test cable of the vector network analyzer, so that the electrical performance test requirement is met. The results are shown in FIG. 2.
Although the present invention has been described with reference to the preferred embodiments, it is not intended to limit the present invention, and those skilled in the art can make variations and modifications of the present invention without departing from the spirit and scope of the present invention by using the methods and technical contents disclosed above.
Claims (5)
1. A universal fixture suitable for testing the electrical performance of a micro-strip line interface microwave device is characterized by comprising a bottom plate (7), a support (8), a test supporting block (5), a vertical moving sliding table (6) and N interface conversion tools, wherein N is equal to the number of micro-strip line interfaces of the microwave device;
the support (8) is fixedly arranged on the bottom plate (7), a hollow platform is constructed above the bottom plate (7) in parallel, a general test platform body is constructed together, a coordinate system of the general test platform body takes an axis perpendicular to the bottom plate (7) as a Z axis, and the upper surface of the hollow platform parallel to the bottom plate is an XOY plane;
the vertical moving sliding table (6) is positioned in the middle of the bottom plate (7), and the upper surface of the vertical moving sliding table (6) can slide along the Z-axis direction of the coordinate system of the universal test platform;
each interface conversion tool comprises a horizontal moving sliding table (4), a microstrip transmission line (1), coaxial connectors (2) and a workbench surface (3), wherein the horizontal moving sliding table (4) is positioned on the upper surface of the hollow platform and used for controlling the workbench surface (3) on the horizontal moving sliding table to slide along a straight line on the horizontal plane, the microstrip transmission line (1) is welded on the workbench surface (3), the central axis of the microstrip transmission line (1) is parallel to the moving direction of the workbench surface, the radio frequency coaxial connector (2) is fixedly connected to the workbench surface (3), and a central conductor of the radio frequency coaxial connector (2) is connected with the microstrip transmission line (1) so as to realize the coaxial output mode of the microstrip line;
the relative position relation of the N interface conversion tools is consistent with the relative position relation of the microstrip line interface aligned to the tested microwave device, and the central axis of the microstrip transmission line (1) of the interface conversion tools is aligned to the central axis of the microstrip line interface of the tested microwave device, namely: the central axis of the microstrip transmission line (1) of the horizontal moving sliding table (4) is parallel to the central axis of the microstrip line interface of the microwave device to be measured, and the plane formed by the central axis and the microstrip transmission line is vertical to the XOY plane; the distance between the interface conversion tool microstrip transmission lines in the horizontal direction can be adjusted by adjusting the horizontal direction moving sliding table (4);
the test support block (5) is fixedly arranged on the vertical moving sliding table (6) and used for supporting the bottom of the tested microwave device during testing, and the distance from the microstrip line of the tested microwave device to the bottom surface of the interface can be met by adjusting the vertical moving sliding table (6);
when the tested microwave device is tested, the vertical moving sliding table (6) and the horizontal moving sliding table (4) of each interface conversion tool are adjusted simultaneously, so that the microstrip line interface of the tested microwave device is in surface contact with and attached to the microstrip transmission line (1) of the interface conversion tool, and the microstrip transmission line (1) of the interface conversion tool and the radio frequency coaxial connector (2) are converted into a coaxial interface mode to be connected into an electrical performance testing instrument for testing.
2. The universal fixture for testing the electrical performance of the microstrip line interface microwave device according to claim 1, wherein the electrical performance includes standing wave ratio, forward loss, reverse isolation, phase consistency, and group delay.
3. The microwave device universal test platform with line input and output according to claim 1, characterized in that the microstrip transmission line (1) is made of copper clad laminate or ceramic substrate.
4. The microwave device universal test platform with line input and output according to claim 1, characterized in that the working frequency band of the microstrip transmission line includes the working frequency band during the period under test.
5. The microwave device universal test platform with line input and output according to claim 1, characterized in that the microstrip transmission line is replaceable.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011181245.0A CN112505362A (en) | 2020-10-29 | 2020-10-29 | Universal clamp suitable for testing electrical performance of micro-strip line interface microwave device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011181245.0A CN112505362A (en) | 2020-10-29 | 2020-10-29 | Universal clamp suitable for testing electrical performance of micro-strip line interface microwave device |
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| CN112505362A true CN112505362A (en) | 2021-03-16 |
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| CN202011181245.0A Pending CN112505362A (en) | 2020-10-29 | 2020-10-29 | Universal clamp suitable for testing electrical performance of micro-strip line interface microwave device |
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Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN203134966U (en) * | 2013-01-04 | 2013-08-14 | 咏业科技股份有限公司 | Microstrip antenna |
| CN203519667U (en) * | 2013-10-21 | 2014-04-02 | 中国电子科技集团公司第三十八研究所 | Regulating and testing rack for sheet type microwave device |
| CN206161796U (en) * | 2016-10-31 | 2017-05-10 | 深圳市华扬通信技术有限公司 | Isolator / circulator is tried on clothes from dynamic testing and is put |
| CN107621577A (en) * | 2016-07-14 | 2018-01-23 | 中兴通讯股份有限公司 | A kind of detection device and its detection method of circuit network parameter |
| CN108089035A (en) * | 2018-01-31 | 2018-05-29 | 西南应用磁学研究所 | Strip line isolator Universal test clamping apparatus |
| CN109669118A (en) * | 2019-01-29 | 2019-04-23 | 中国科学院上海微系统与信息技术研究所 | A kind of adjustable microwave circuit test fixture |
-
2020
- 2020-10-29 CN CN202011181245.0A patent/CN112505362A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN203134966U (en) * | 2013-01-04 | 2013-08-14 | 咏业科技股份有限公司 | Microstrip antenna |
| CN203519667U (en) * | 2013-10-21 | 2014-04-02 | 中国电子科技集团公司第三十八研究所 | Regulating and testing rack for sheet type microwave device |
| CN107621577A (en) * | 2016-07-14 | 2018-01-23 | 中兴通讯股份有限公司 | A kind of detection device and its detection method of circuit network parameter |
| CN206161796U (en) * | 2016-10-31 | 2017-05-10 | 深圳市华扬通信技术有限公司 | Isolator / circulator is tried on clothes from dynamic testing and is put |
| CN108089035A (en) * | 2018-01-31 | 2018-05-29 | 西南应用磁学研究所 | Strip line isolator Universal test clamping apparatus |
| CN109669118A (en) * | 2019-01-29 | 2019-04-23 | 中国科学院上海微系统与信息技术研究所 | A kind of adjustable microwave circuit test fixture |
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