CN213068912U - Amplifier testing device - Google Patents
Amplifier testing device Download PDFInfo
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- CN213068912U CN213068912U CN202021270072.5U CN202021270072U CN213068912U CN 213068912 U CN213068912 U CN 213068912U CN 202021270072 U CN202021270072 U CN 202021270072U CN 213068912 U CN213068912 U CN 213068912U
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Abstract
The utility model provides an amplifier testing device, which comprises a base, a testing circuit board and a crimping mechanism, wherein the testing circuit board and the crimping mechanism are connected with the base; the test circuit board is provided with a chip connecting interface for connecting the cross-shaped port amplifier, the test circuit board is fixedly connected with an input adapter and an output adapter, the input end of the chip connecting interface is electrically connected with the input adapter, the output end of the chip connecting interface is electrically connected with the output adapter, one pair of opposite ports of the cross-shaped port amplifier are respectively a signal input end and a signal output end, and the other pair of opposite ports of the cross-shaped port amplifier are grounded ends; the crimping mechanism corresponds to the chip connecting interface in position, and when the crimping mechanism is pressed down, the cross-shaped port amplifier is installed at the chip connecting interface, and the signal input end and the signal output end of the cross-shaped port amplifier are respectively and electrically connected with the input end and the output end of the chip connecting interface. The utility model discloses a testing arrangement can test cross port amplifier.
Description
Technical Field
The utility model relates to a device test technical field especially relates to an amplifier testing arrangement.
Background
Amplifiers are commonly used electronic devices that require testing of various performance parameters prior to shipment. At present, a vector network analyzer can be used for testing performance parameters of an amplifier, input and output ports of the vector network analyzer are all radio frequency coaxial cables, a coaxial interface class amplifier can be measured, and a patch type amplifier (such as an NBB-310 type amplifier with a cross-shaped port) cannot be directly measured.
SUMMERY OF THE UTILITY MODEL
In view of this, the present invention provides an amplifier testing apparatus, which can test an amplifier with a cross-shaped port.
Based on the above-mentioned purpose, the utility model provides an amplifier testing arrangement, include: the test circuit board and the crimping mechanism are connected with the base;
the test circuit board is provided with a chip connecting interface for connecting a cross-shaped port amplifier, an input adapter and an output adapter are fixedly connected to the test circuit board, the input end of the chip connecting interface is electrically connected with the input adapter, the output end of the chip connecting interface is electrically connected with the output adapter, one pair of opposite ports of the cross-shaped port amplifier are respectively a signal input end and a signal output end, and the other pair of opposite ports of the cross-shaped port amplifier are grounded ends;
the crimping mechanism corresponds to the chip connecting interface in position, and when the crimping mechanism is pressed down, the signal input end and the signal output end of the cross-shaped port amplifier are respectively and electrically connected with the input end and the output end of the chip connecting interface.
Optionally, a chip positioning plate is fixedly connected to a position of the test circuit board corresponding to the chip connection interface, a containing groove for containing the cross-shaped port amplifier is formed in the chip positioning plate, and a one-way conductive film is arranged in the containing groove.
Optionally, the input end of the chip connection interface is electrically connected to the input adapter through a first microstrip line, and the output end of the chip connection interface is electrically connected to the output adapter through a second microstrip line.
Optionally, the cross-port amplifier is an NBB-310 type amplifier.
Optionally, the input adapter is connected with a signal output end of the vector network analyzer through a dc blocking device, and the output adapter is connected with a signal input end of the vector network analyzer through a T-shaped bias circuit and the dc blocking device.
Optionally, the crimping mechanism includes a vertical plate and a crimping assembly, one end of the vertical plate is connected with the base, the crimping assembly is connected with the vertical plate in a sliding manner, the crimping assembly includes a crimping head, the crimping head corresponds to the chip connection interface, and when the crimping assembly slides to the crimping position along the vertical plate, the crimping head abuts against the cross-shaped port amplifier at the chip connection interface.
Optionally, the test circuit board and the crimping mechanism are detachably connected with the base.
Optionally, the surface of the test circuit board and the inner wall of the via hole are plated with gold.
From the above, the amplifier testing device provided by the utility model comprises a base, a testing circuit board and a crimping mechanism, wherein the testing circuit board and the crimping mechanism are connected with the base; the test circuit board is provided with a chip connecting interface for connecting the cross-shaped port amplifier, the test circuit board is fixedly connected with an input adapter and an output adapter, the input end of the chip connecting interface is electrically connected with the input adapter, the output end of the chip connecting interface is electrically connected with the output adapter, one pair of opposite ports of the cross-shaped port amplifier are respectively a signal input end and a signal output end, and the other pair of opposite ports of the cross-shaped port amplifier are grounded ends; the crimping mechanism corresponds to the chip connecting interface in position, and when the crimping mechanism is pressed down, the cross-shaped port amplifier is installed at the chip connecting interface, and the signal input end and the signal output end of the cross-shaped port amplifier are respectively and electrically connected with the input end and the output end of the chip connecting interface. The utility model discloses a testing arrangement can test cross port amplifier.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a schematic structural diagram of an apparatus according to an embodiment of the present invention;
fig. 2 is a schematic diagram of the connection between the device of the embodiment of the present invention and a vector network analyzer;
fig. 3 is a schematic diagram of a pin structure of a cross-shaped port amplifier according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in detail with reference to the accompanying drawings.
It should be noted that unless otherwise defined, technical or scientific terms used in the embodiments of the present invention should have the ordinary meaning as understood by those having ordinary skill in the art to which the present disclosure belongs. The use of "first," "second," and similar terms in this disclosure is not intended to indicate any order, quantity, or importance, but rather is used to distinguish one element from another. The word "comprising" or "comprises", and the like, means that the element or item listed before the word covers the element or item listed after the word and its equivalents, but does not exclude other elements or items. The terms "connected" or "coupled" and the like are not restricted to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "upper", "lower", "left", "right", and the like are used merely to indicate relative positional relationships, and when the absolute position of the object being described is changed, the relative positional relationships may also be changed accordingly.
As shown in fig. 1, the present invention provides an amplifier testing apparatus, which includes a base 10, a testing circuit board 20 and a crimping mechanism 30, wherein the testing circuit board 20 and the crimping mechanism 30 are connected to the base 10; a chip connection interface for connecting a cross-shaped port amplifier is arranged on the test circuit board 20, an input adapter 21 and an output adapter 22 are fixedly connected on the test circuit board 20, the input end of the chip connection interface is electrically connected with the input adapter 21, the output end of the chip connection interface is electrically connected with the output adapter 22, one pair of opposite ports of the cross-shaped port amplifier are respectively a signal input end and a signal output end, and the other pair of opposite ports are grounded ends;
the crimping mechanism 30 corresponds to the chip connection interface, and when the crimping mechanism 30 is pressed down, the signal input end and the signal output end of the cross-shaped port amplifier installed at the chip connection interface are electrically connected with the input end and the output end of the chip connection interface respectively. When the cross-shaped port amplifier is tested, the cross-shaped port amplifier is installed in the chip connecting interface, downward pressure is applied to the cross-shaped port amplifier by using the crimping mechanism 30, so that the cross-shaped port amplifier is connected with a corresponding port of the chip connecting interface, the input adapter 21 and the output adapter 22 are respectively connected into the vector network analyzer, and the cross-shaped port amplifier can be subjected to parameter measurement by using the vector network analyzer.
In some embodiments, the position of the test circuit board 20 corresponding to the chip connection interface is fixedly connected to the chip positioning plate 23, the chip positioning plate 23 is provided with a receiving groove 231, a one-way conductive film is disposed in the receiving groove 231, during testing, the cross-shaped port amplifier is placed in the receiving groove 231, and then a pressing mechanism 30 is used to apply a downward vertical pressure to the cross-shaped port amplifier, so that the cross-shaped port amplifier is electrically connected to the chip connection interface, stable signal transmission and accurate testing can be ensured, and it is ensured that a device pin is not damaged during testing.
In some embodiments, the input terminal of the chip connection interface is electrically connected to the input adapter 21 through the first microstrip line 24, and the output terminal of the chip connection interface is electrically connected to the output adapter 22 through the second microstrip line 25. When the vector network analyzer is used for testing the cross-shaped port amplifier, the signal output end and the signal input end of the vector network analyzer are respectively connected with the input adapter 21 and the output adapter 22 through coaxial cables, so that parameter testing of the cross-shaped port amplifier can be realized through conversion of the connecting ports.
In some embodiments, the amplifier testing apparatus of the present invention is used to test an NBB-310 type amplifier, as shown in fig. 3, the NBB-310 type amplifier is a cross-shaped port amplifier, the pin 1 and the pin 3 are located on two opposite sides of the chip, the pin 1 is a signal input terminal, the pin 3 is a signal output terminal, the pin 2 and the pin 4 are located on two opposite sides of the chip, and the pins 2 and 4 are grounding terminals; when the press-fit mechanism 30 is pressed down, the signal input terminal of the NBB-310 type amplifier is connected with the input terminal of the chip connection interface, and the signal output terminal of the NBB-310 type amplifier is connected with the output terminal of the chip connection interface.
As shown in fig. 2, when testing the NBB-310 amplifier by using the vector network analyzer, the input adapter 21 is connected to the signal output terminal of the vector network analyzer through the dc isolator, the output adapter 22 is connected to the signal input terminal of the vector network analyzer through the T-type bias circuit and the dc isolator, and the T-type bias circuit is used to apply an excitation source to the NBB-310 amplifier, so that the NBB-310 amplifier testing device has a simple structure and is reliable in testing, and the accurate testing of the amplifier can be realized.
IN some embodiments, as shown IN FIGS. 2 and 3, an NBB-310 amplifier is tested, with a signal input (RF-IN) of the NBB-310 amplifier connected to an input of the chip attach interface and a signal output (RF-OUT) of the NBB-310 amplifier connected to an output of the chip attach interface. The signal output end of the vector network analyzer is connected with the signal input end of the NBB-310 type amplifier through the DC isolator, the input adapter 21, the first microstrip line 24 and the input end of the chip connecting interface, the signal output end of the NBB-310 type amplifier is connected with the signal input end of the vector network analyzer through the output end of the chip connecting interface, the second microstrip line 25, the output adapter 22, the T-shaped bias circuit and the DC isolator, and the electrical performance parameter test of the NBB-310 type amplifier by the vector network analyzer can be realized through the connection interface mode conversion of the amplifier testing device.
In some embodiments, the surface of the test circuit board 20 and the inner wall of the via hole are plated with gold to ensure maximum grounding, and can be physically and conveniently connected to the grounding end of the cross-shaped port amplifier, thereby effectively avoiding interference in signal transmission and ensuring stability and accuracy of the test.
In order to keep the vector network analyzer and the cross-shaped port amplifier in impedance matching, 50 Ω impedance matching is set at the connection positions of the first microstrip line 24 and the input adapter 21, and the second microstrip line 25 and the output adapter 22. Alternatively, the base 10 is made of brass, and the surface of the brass is plated with gold.
As shown in fig. 1, in some embodiments, the crimping mechanism 30 includes a vertical plate 31 and a crimping assembly, one end of the vertical plate 31 is connected to the base 10, the crimping assembly is slidably connected to the vertical plate 31, and when the crimping assembly slides along the vertical plate 31 to a crimping position, the crimping assembly abuts against the cross-shaped port amplifier at the chip connection interface. The crimping component comprises a handle 33, a supporting arm 34 and a crimping piece 35, wherein the handle 33 is connected with the upright column 31 through the supporting plate 32, the handle 33 is pivoted with the supporting plate 32, the handle 33 is connected with the crimping piece 35 through the supporting arm 34, one side of the crimping piece 35 is connected with the upright plate 31 in a sliding mode through a sliding rail, the other side of the crimping piece 35 is connected with the supporting arm 34, and a crimping head 351 is arranged at a position, corresponding to the chip connecting interface, on the crimping piece 35; when the handle 33 is rotated downwards, the handle 33 drives the pressing member 35 to slide downwards along the vertical plate 31 through the supporting arm 34, the pressing head 351 abuts against the cross-shaped port amplifier in the chip connection interface, and vertical downward pressure is applied to the cross-shaped port amplifier, so that the cross-shaped port amplifier is electrically connected with the chip connection interface.
In some embodiments, the test circuit board 20 and the press-fit mechanism 30 are detachably connected to the base 10. The base 10 is provided with an installation groove, and the vertical plate 31 of the crimping mechanism 30 is installed in the installation groove and is fixedly connected with the base 10 through a connecting piece. For example, the test circuit board 20 and the crimping mechanism 30 are connected to the base 10 by a connector such as a bolt or a nut, so that the device can be assembled quickly.
Those of ordinary skill in the art will understand that: the discussion of any embodiment above is meant to be exemplary only, and is not intended to intimate that the scope of the disclosure, including the claims, is limited to these examples; within the idea of the invention, also technical features in the above embodiments or in different embodiments can be combined, steps can be implemented in any order, and there are many other variations of the different aspects of the invention as described above, which are not provided in detail for the sake of brevity.
The present embodiments are intended to embrace all such alternatives, modifications and variances which fall within the broad scope of the appended claims. Therefore, any omission, modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included within the protection scope of the present invention.
Claims (8)
1. An amplifier test apparatus, comprising: the test circuit board and the crimping mechanism are connected with the base;
the test circuit board is provided with a chip connecting interface for connecting a cross-shaped port amplifier, an input adapter and an output adapter are fixedly connected to the test circuit board, the input end of the chip connecting interface is electrically connected with the input adapter, the output end of the chip connecting interface is electrically connected with the output adapter, one pair of opposite ports of the cross-shaped port amplifier are respectively a signal input end and a signal output end, and the other pair of opposite ports of the cross-shaped port amplifier are grounded ends;
the crimping mechanism corresponds to the chip connecting interface in position, and when the crimping mechanism is pressed down, the signal input end and the signal output end of the cross-shaped port amplifier are respectively and electrically connected with the input end and the output end of the chip connecting interface.
2. The device of claim 1, wherein a chip positioning plate is fixedly connected to a position of the test circuit board corresponding to the chip connection interface, a containing groove for containing the cross-shaped port amplifier is formed in the chip positioning plate, and a one-way conductive film is arranged in the containing groove.
3. The apparatus of claim 1, wherein an input of the chip connection interface is electrically connected to the input adapter through a first microstrip line, and an output of the chip connection interface is electrically connected to the output adapter through a second microstrip line.
4. The apparatus of claim 1, wherein the cross-port amplifier is a NBB-310 type amplifier.
5. The apparatus of claim 4, wherein the input adapter is connected to a signal output of the vector network analyzer through a dc block, and the output adapter is connected to a signal input of the vector network analyzer through a T-bias circuit and a dc block.
6. The device of claim 1, wherein the crimping mechanism comprises a vertical plate and a crimping assembly, one end of the vertical plate is connected with the base, the crimping assembly is connected with the vertical plate in a sliding manner, the crimping assembly comprises a crimping head, the crimping head corresponds to the chip connection interface in position, and when the crimping assembly slides to a crimping position along the vertical plate, the crimping head abuts against a cross-shaped port amplifier at the chip connection interface.
7. The apparatus of claim 1, wherein the test circuit board, the crimping mechanism and the base are removably connected.
8. The apparatus of claim 1, wherein the surface of the test circuit board and the inner wall of the via hole are plated with gold.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021270072.5U CN213068912U (en) | 2020-07-01 | 2020-07-01 | Amplifier testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021270072.5U CN213068912U (en) | 2020-07-01 | 2020-07-01 | Amplifier testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN213068912U true CN213068912U (en) | 2021-04-27 |
Family
ID=75569633
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202021270072.5U Active CN213068912U (en) | 2020-07-01 | 2020-07-01 | Amplifier testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN213068912U (en) |
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2020
- 2020-07-01 CN CN202021270072.5U patent/CN213068912U/en active Active
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