JPH076544Y2 - 差信号測定器 - Google Patents
差信号測定器Info
- Publication number
- JPH076544Y2 JPH076544Y2 JP2414988U JP2414988U JPH076544Y2 JP H076544 Y2 JPH076544 Y2 JP H076544Y2 JP 2414988 U JP2414988 U JP 2414988U JP 2414988 U JP2414988 U JP 2414988U JP H076544 Y2 JPH076544 Y2 JP H076544Y2
- Authority
- JP
- Japan
- Prior art keywords
- difference
- signal
- data
- signal lines
- scanner
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2414988U JPH076544Y2 (ja) | 1988-02-25 | 1988-02-25 | 差信号測定器 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2414988U JPH076544Y2 (ja) | 1988-02-25 | 1988-02-25 | 差信号測定器 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01128183U JPH01128183U (enrdf_load_stackoverflow) | 1989-09-01 |
| JPH076544Y2 true JPH076544Y2 (ja) | 1995-02-15 |
Family
ID=31243748
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2414988U Expired - Lifetime JPH076544Y2 (ja) | 1988-02-25 | 1988-02-25 | 差信号測定器 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH076544Y2 (enrdf_load_stackoverflow) |
-
1988
- 1988-02-25 JP JP2414988U patent/JPH076544Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01128183U (enrdf_load_stackoverflow) | 1989-09-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6262589B1 (en) | TFT array inspection method and device | |
| JP2004191373A (ja) | 電子バッテリテスタ | |
| JPH04155267A (ja) | 入力信号の最大値最小値検出装置 | |
| CN111220901B (zh) | 运放测试系统和方法 | |
| JPS61292067A (ja) | 電力量測定方法 | |
| US5448173A (en) | Triple-probe plasma measuring apparatus for correcting space potential errors | |
| US6981192B2 (en) | Deskewed differential detector employing analog-to-digital converter | |
| JPH0645941A (ja) | 検査装置 | |
| JPH076544Y2 (ja) | 差信号測定器 | |
| JPH10197613A (ja) | 内部抵抗測定方法 | |
| JP4040908B2 (ja) | インピーダンス測定装置 | |
| US20030220758A1 (en) | Method for testing an AD-converter | |
| JPH05288783A (ja) | インピーダンス測定方法およびインピーダンス測定装置 | |
| JPH07183346A (ja) | 半導体テスト装置 | |
| JP3374087B2 (ja) | 半導体集積回路の試験方法 | |
| SU1132255A1 (ru) | Устройство дл измерени относительной погрешности делителей напр жени | |
| JP2517456Y2 (ja) | アナログicテスタの校正用治具 | |
| JPH0691464B2 (ja) | A/d変換器の試験装置 | |
| JP2003207550A (ja) | 半導体集積回路の試験方法及び装置 | |
| JP3469369B2 (ja) | 電気計測器 | |
| SU1051459A1 (ru) | Устройство дл измерени электрической емкости | |
| JPH0466878A (ja) | 静電容量、抵抗及びインダクタンスの測定装置並びに測定方法 | |
| JP2983109B2 (ja) | 抵抗検査装置 | |
| JPS61149869A (ja) | 波形解析システム | |
| JP2002098738A (ja) | Icテスタ |