JPH0745019Y2 - 液晶回路基板検査用プローブ - Google Patents
液晶回路基板検査用プローブInfo
- Publication number
- JPH0745019Y2 JPH0745019Y2 JP1990013090U JP1309090U JPH0745019Y2 JP H0745019 Y2 JPH0745019 Y2 JP H0745019Y2 JP 1990013090 U JP1990013090 U JP 1990013090U JP 1309090 U JP1309090 U JP 1309090U JP H0745019 Y2 JPH0745019 Y2 JP H0745019Y2
- Authority
- JP
- Japan
- Prior art keywords
- lever
- liquid crystal
- circuit board
- contact needle
- crystal circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000004973 liquid crystal related substance Substances 0.000 title claims description 27
- 238000007689 inspection Methods 0.000 title claims description 17
- 239000000523 sample Substances 0.000 title claims description 12
- 239000004020 conductor Substances 0.000 claims description 4
- 239000010409 thin film Substances 0.000 claims description 3
- 230000006835 compression Effects 0.000 description 2
- 238000007906 compression Methods 0.000 description 2
- 239000000696 magnetic material Substances 0.000 description 2
- 230000002950 deficient Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1990013090U JPH0745019Y2 (ja) | 1990-02-15 | 1990-02-15 | 液晶回路基板検査用プローブ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1990013090U JPH0745019Y2 (ja) | 1990-02-15 | 1990-02-15 | 液晶回路基板検査用プローブ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03106459U JPH03106459U (enrdf_load_stackoverflow) | 1991-11-01 |
| JPH0745019Y2 true JPH0745019Y2 (ja) | 1995-10-11 |
Family
ID=31504096
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1990013090U Expired - Lifetime JPH0745019Y2 (ja) | 1990-02-15 | 1990-02-15 | 液晶回路基板検査用プローブ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0745019Y2 (enrdf_load_stackoverflow) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006258774A (ja) * | 2005-03-18 | 2006-09-28 | Fujitsu Ltd | 4探針プローブヘッドおよび半導体特性の評価方法 |
-
1990
- 1990-02-15 JP JP1990013090U patent/JPH0745019Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH03106459U (enrdf_load_stackoverflow) | 1991-11-01 |
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