JPH0745019Y2 - Liquid crystal circuit board inspection probe - Google Patents
Liquid crystal circuit board inspection probeInfo
- Publication number
- JPH0745019Y2 JPH0745019Y2 JP1309090U JP1309090U JPH0745019Y2 JP H0745019 Y2 JPH0745019 Y2 JP H0745019Y2 JP 1309090 U JP1309090 U JP 1309090U JP 1309090 U JP1309090 U JP 1309090U JP H0745019 Y2 JPH0745019 Y2 JP H0745019Y2
- Authority
- JP
- Japan
- Prior art keywords
- lever
- liquid crystal
- circuit board
- contact needle
- crystal circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Measuring Leads Or Probes (AREA)
Description
【考案の詳細な説明】 （産業上の利用分野） この考案に係る液晶回路基板検査用プローブは、各種表
示装置や小型テレビ画面に使用される液晶への通電用の
回路基板の導通検査を行なう場合に利用する。DETAILED DESCRIPTION OF THE INVENTION (Industrial field of use) The liquid crystal circuit board inspection probe according to the present invention conducts a continuity test of a circuit board for energizing liquid crystal used in various display devices and small television screens. Use in case.
（従来の技術） 各種表示装置や小型テレビ画面に使用される液晶は、多
数の液晶への通電を適当に断接する事で、表示変更等を
行なうが、この様な表示等の変更が確実に行なわれる為
には、上記多数の液晶に通電する為の回路基板が正しく
導通している（断線していない）事と、隣接しているパ
ターン同士が短絡していない事とが必要である。(Prior Art) Liquid crystals used in various display devices and small TV screens are changed by appropriately connecting and disconnecting power to a large number of liquid crystals. In order to be carried out, it is necessary that the circuit boards for energizing the large number of liquid crystals are properly conducted (not broken) and that adjacent patterns are not short-circuited.
この為従来から、組み上がった液晶回路基板を検査装置
に送り込んで検査する事により、不良品（断線している
ものや短絡しているもの）を見付け出す様にしていた。Therefore, conventionally, a defective product (broken or short-circuited) is found by sending the assembled liquid crystal circuit board to an inspection device and inspecting it.
検査装置による検査は、１対の接触針を液晶回路基板の
端子と液晶とに接触させ、両接触針の間に電圧を加える
事で行ない、導通検査を行なう場合には、両接触針の間
に規定以上の電流が流れた場合には合格（断線や接触不
良がない）とし、反対に規定以上の電流が流れない場合
には不合格（断線或は接触不良がある）とする。又、短
絡検査を行なう場合には、上記両プローブ同士の間に電
流が流れない場合には合格とし、電流が流れた場合には
不合格とする。The inspection by the inspection device is performed by bringing a pair of contact needles into contact with the terminals of the liquid crystal circuit board and the liquid crystal, and applying a voltage between both contact needles. If the current exceeds the specified value, then it is regarded as acceptable (no disconnection or contact failure), and if the current does not exceed the specified value, then it is rejected (disconnection or contact failure). Further, in the case of performing a short-circuit inspection, the test is passed when no current flows between the two probes, and is rejected when a current flows.
この様な検査装置に於いては、上記１対の接触針を、端
子或は液晶の表面に、弾性的に押圧する必要があるが、
この為従来から、第２図に示す様な機構により、各接触
針を弾性的に支持していた。In such an inspection device, it is necessary to elastically press the pair of contact needles against the terminals or the surface of the liquid crystal.
Therefore, conventionally, each contact needle has been elastically supported by a mechanism as shown in FIG.
即ち、先端部に接触針１を支持した針ホルダ２は、互い
に平行に設けられた、上下１対の板ばね３、３により支
持部４に支持し、各板ばね３、３の弾性変形に基づき、
上下方向に変位自在としている。固定部分に形成された
螺子孔５に螺合した調整螺子６の下端部と、上記針ホル
ダ２の上面との間には圧縮ばね７を設け、上記調整螺子
６の調整により、針ホルダ２に支持された接触針１を下
方に押圧する力を調節自在としている。That is, the needle holder 2 that supports the contact needle 1 at its tip is supported by the support portion 4 by a pair of upper and lower leaf springs 3 and 3 which are provided in parallel to each other, so that the leaf springs 3 and 3 are elastically deformed. Based on
It is vertically displaceable. A compression spring 7 is provided between the lower end of the adjusting screw 6 screwed into the screw hole 5 formed in the fixed portion and the upper surface of the needle holder 2, and the needle holder 2 is adjusted by adjusting the adjusting screw 6. The force for pressing the supported contact needle 1 downward is adjustable.
（考案が解決しようとする課題） ところが、上述の様に構成される、従来の液晶回路基板
検査用プローブに於いては、必ずしも十分な性能を得ら
れなかった。(Problems to be Solved by the Invention) However, the conventional probe for inspecting a liquid crystal circuit board, which is configured as described above, cannot always obtain sufficient performance.
即ち、検査時に接触針１が液晶の表面を傷付けない様に
する為には、この接触針１を液晶の表面に押圧する力を
十分に小さくする必要があり、この為には、前記圧縮ば
ね７の弾力を十分に小さくしなければならない。一方、
板ばね３、３や針ホルダ２の質量を小さくする事は、構
上限度があり、これら部材の合計質量は数グラム以上に
なる事が避けられない。That is, in order to prevent the contact needle 1 from damaging the surface of the liquid crystal at the time of inspection, it is necessary to sufficiently reduce the force pressing the contact needle 1 against the surface of the liquid crystal. The elasticity of 7 must be made small enough. on the other hand,
Reducing the mass of the leaf springs 3 and 3 and the needle holder 2 has a structural upper limit, and it is inevitable that the total mass of these members will be several grams or more.
この結果、接触針１支持部分の固有振動数が低くなる事
が避けられず、検査速度を上げる為に、接触針１を水平
移動させる速度を高めた場合、接触針１の先端部が液晶
回路基板上面の凹凸に追従し切れなくなり、正確な検査
作業を行なえなくなってしまう。As a result, the natural frequency of the supporting portion of the contact needle 1 is inevitably lowered, and when the speed of horizontally moving the contact needle 1 is increased in order to increase the inspection speed, the tip portion of the contact needle 1 has a liquid crystal circuit. It will not be able to follow the irregularities on the top surface of the substrate, making it impossible to perform accurate inspection work.
本考案の液晶回路基板検査用プローブは、上述の様な不
都合を解消するものである。The probe for inspecting a liquid crystal circuit board of the present invention solves the above-mentioned inconvenience.
（課題を解決する為の手段） 本考案の液晶回路基板検査用プローブは、第１図に示す
様に構成されている。(Means for Solving the Problems) The liquid crystal circuit board inspection probe of the present invention is constructed as shown in FIG.
８は接触針１を支持する為のレバーで、このレバー８の
中間部をピボット機構により、図示しない支持腕等に、
揺動自在に枢支している。Reference numeral 8 is a lever for supporting the contact needle 1, and an intermediate portion of the lever 8 is attached to a support arm (not shown) or the like by a pivot mechanism.
It is swingably supported.
このレバー８の先端部には、導電材製の接触針１を支持
すると共に、レバー８の表面で、上記ピボット機構部分
と接触針１との間部分に、導電材製の薄膜９をコーティ
ングして、上記接触針１と、ピボット機構部分に設けた
導線（図示省略）とを導通させている。The tip of the lever 8 supports the contact needle 1 made of a conductive material, and the surface of the lever 8 is coated with a thin film 9 made of a conductive material on a portion between the pivot mechanism portion and the contact needle 1. The contact needle 1 and the conducting wire (not shown) provided in the pivot mechanism portion are electrically connected.
又、上記レバー８の基端部には小さな（軽量の）磁性体
10を支持し、この磁性体10の周囲を囲んだ状態で、上記
支持腕等に、ソレノイド11を設けている。Also, a small (lightweight) magnetic material is attached to the base end of the lever 8.
A solenoid 11 is provided on the support arm or the like in a state of supporting the magnetic body 10 and surrounding the magnetic body 10.
このソレノイド11は、導電に基づいて上記磁性体10を上
方に引っ張り、ピボット機構を中心としてレバー８を、
第１図の時計方向に揺動させて、接触針１を下方に移動
させる様に機能する。This solenoid 11 pulls the magnetic body 10 upward based on the conductivity, and moves the lever 8 around the pivot mechanism.
It functions to move the contact needle 1 downward by swinging it clockwise in FIG.
更に、このソレノイド11に印加する電圧を制御する制御
器（図示省略）を設ける事で、上述の様に接触針１を下
方に移動させようとする力の大きさを調節自在としてい
る。Further, by providing a controller (not shown) for controlling the voltage applied to the solenoid 11, the magnitude of the force for moving the contact needle 1 downward can be adjusted as described above.
（作用） 上述の様に構成される、本考案の液晶回路基板検査用プ
ローブの作用は次の通りである。(Operation) The operation of the probe for inspecting a liquid crystal circuit board of the present invention configured as described above is as follows.
検査作業を行なう場合には、ソレノイド11に通電し、レ
バー８の基端部に支持した磁性体10を上方に引き上げ、
このレバー８を第１図で時計方向に揺動させて、レバー
８の先端に支持した接触針１を下方に押し下げ、この接
触針１の先端部を液晶回路基板（図示せず）の上面に接
触させる。When performing the inspection work, the solenoid 11 is energized and the magnetic body 10 supported on the base end of the lever 8 is pulled up,
By swinging the lever 8 clockwise in FIG. 1, the contact needle 1 supported at the tip of the lever 8 is pushed downward, and the tip portion of the contact needle 1 is placed on the upper surface of the liquid crystal circuit board (not shown). Contact.
この際、接触針１を液晶回路基板の上面に押し付ける力
は、制御器によりソレノイド11に印加する電圧を制御す
る事で、調節自在である。At this time, the force for pressing the contact needle 1 against the upper surface of the liquid crystal circuit board can be adjusted by controlling the voltage applied to the solenoid 11 by the controller.
本考案の検査用プローブの場合、ピボット機構を中心と
して揺動する慣性質量が、接触針１とレバー８と磁性体
10とであり、極めて軽量に構成出来る為、接触針１を液
晶回路基板の上面に押し付ける力を小さくする為、ソレ
ノイド11に印加する電圧を小さくした場合でも、上記揺
動する部分の固有振動数を十分に高くする事が可能とな
る。In the case of the inspection probe of the present invention, the inertial mass that swings around the pivot mechanism is the contact needle 1, the lever 8 and the magnetic body.
Since it can be configured to be extremely lightweight, the natural frequency of the oscillating portion is reduced even when the voltage applied to the solenoid 11 is reduced in order to reduce the force for pressing the contact needle 1 against the upper surface of the liquid crystal circuit board. Can be made sufficiently high.
従って、検査速度を上げる為に、接触針１を水平移動さ
せる速度を高めた場合でも、接触針１の先端部を液晶回
路基板上面の凹凸に追従させる事が出来、正確な検査作
業を行なえる様になる。Therefore, even if the speed of horizontally moving the contact needle 1 is increased in order to increase the inspection speed, the tip portion of the contact needle 1 can be made to follow the unevenness of the upper surface of the liquid crystal circuit board, and accurate inspection work can be performed. Like
（考案の効果） 本考案の液晶回路基板検査用プローブは、以上に述べた
通り構成され作用するが、接触針を液晶回路基板の上面
に押し付ける力を小さくし、しかも接触針と共に揺動す
る部分の固有振動数を高く出来る為、傷つき易い液晶表
面を保護しつつ、接触針の移動速度を高めて、検査作業
の能率化を図る事が出来る。(Effects of the Invention) The probe for inspecting a liquid crystal circuit board of the present invention is constructed and operates as described above, but the force for pressing the contact needle against the upper surface of the liquid crystal circuit board is reduced, and the portion that swings together with the contact needle is used. Since the natural frequency of can be increased, the movement speed of the contact needle can be increased and the inspection work can be made more efficient while protecting the surface of the liquid crystal that is easily damaged.
第１図は本考案の、第２図は従来の、それぞれ液晶回路
基板検査用プローブを示す側面図である。 1:接触針、2:針ホルダ、3:板ばね、4:支持部、5:螺子
孔、6:調整螺子、7:圧縮ばね、8:レバー、9:薄膜、10:
磁性体、11:ソレノイド。1 is a side view showing a probe for inspecting a liquid crystal circuit board according to the present invention, and FIG. 2 is a side view showing a conventional probe for inspecting a liquid crystal circuit board. 1: Contact needle, 2: Needle holder, 3: Leaf spring, 4: Support part, 5: Screw hole, 6: Adjustment screw, 7: Compression spring, 8: Lever, 9: Thin film, 10:
Magnetic material, 11: solenoid.
Claims (1)
支されたレバーと、このレバーの先端部に支持された、
導電材製の接触針と、上記レバーの表面で、ピボット機
構部分と接触針との間部分にコーティングされた導電材
製の薄膜と、上記レバーの基端部に支持された磁性体
と、この磁性体の周囲を囲んだ状態で設けられ、通電に
基づいて上記接触針を下方に移動させる方向にレバーを
揺動させるソレノイドと、このソレノイドに印加する電
圧を制御する制御器とから成る、液晶回路基板検査用プ
ローブ。1. A lever having an intermediate portion pivotably supported by a pivot mechanism, and a lever supported by a tip portion of the lever.
A contact needle made of a conductive material, a thin film made of a conductive material coated on the surface of the lever between the pivot mechanism portion and the contact needle on the surface of the lever, and a magnetic body supported at the proximal end portion of the lever, A liquid crystal, which is provided in a state of surrounding the magnetic body and includes a solenoid that swings a lever in a direction to move the contact needle downward based on energization, and a controller that controls a voltage applied to the solenoid. Circuit board inspection probe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1309090U JPH0745019Y2 (en) | 1990-02-15 | 1990-02-15 | Liquid crystal circuit board inspection probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1309090U JPH0745019Y2 (en) | 1990-02-15 | 1990-02-15 | Liquid crystal circuit board inspection probe |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03106459U JPH03106459U (en) | 1991-11-01 |
| JPH0745019Y2 true JPH0745019Y2 (en) | 1995-10-11 |
Family
ID=31504096
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1309090U Expired - Lifetime JPH0745019Y2 (en) | 1990-02-15 | 1990-02-15 | Liquid crystal circuit board inspection probe |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0745019Y2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006258774A (en) * | 2005-03-18 | 2006-09-28 | Fujitsu Ltd | Quadruple probe head and evaluating method for semiconductor characteristic |
| JP4717144B2 (en) * | 2010-01-08 | 2011-07-06 | 日置電機株式会社 | Contact probe fixture |
-
1990
- 1990-02-15 JP JP1309090U patent/JPH0745019Y2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH03106459U (en) | 1991-11-01 |
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