JPH0739247Y2 - 受光素子の光電流分布解析装置 - Google Patents
受光素子の光電流分布解析装置Info
- Publication number
- JPH0739247Y2 JPH0739247Y2 JP2249286U JP2249286U JPH0739247Y2 JP H0739247 Y2 JPH0739247 Y2 JP H0739247Y2 JP 2249286 U JP2249286 U JP 2249286U JP 2249286 U JP2249286 U JP 2249286U JP H0739247 Y2 JPH0739247 Y2 JP H0739247Y2
- Authority
- JP
- Japan
- Prior art keywords
- light
- receiving element
- light receiving
- scanning
- photocurrent
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000004422 calculation algorithm Methods 0.000 claims description 4
- 238000002247 constant time method Methods 0.000 claims description 3
- 238000000034 method Methods 0.000 description 5
- 230000035945 sensitivity Effects 0.000 description 4
- 238000004364 calculation method Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 229910021417 amorphous silicon Inorganic materials 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000000654 additive Substances 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000004141 dimensional analysis Methods 0.000 description 1
- 238000003325 tomography Methods 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Spectrometry And Color Measurement (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2249286U JPH0739247Y2 (ja) | 1986-02-18 | 1986-02-18 | 受光素子の光電流分布解析装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2249286U JPH0739247Y2 (ja) | 1986-02-18 | 1986-02-18 | 受光素子の光電流分布解析装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62134263U JPS62134263U (en:Method) | 1987-08-24 |
| JPH0739247Y2 true JPH0739247Y2 (ja) | 1995-09-06 |
Family
ID=30819928
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2249286U Expired - Lifetime JPH0739247Y2 (ja) | 1986-02-18 | 1986-02-18 | 受光素子の光電流分布解析装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0739247Y2 (en:Method) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4581241B2 (ja) * | 2000-12-12 | 2010-11-17 | ソニー株式会社 | 受光素子の検査装置および検査方法 |
| JP2002261315A (ja) * | 2001-03-05 | 2002-09-13 | Kanegafuchi Chem Ind Co Ltd | 薄膜光電変換モジュールの製造方法 |
| JP4765052B2 (ja) * | 2002-12-19 | 2011-09-07 | 独立行政法人産業技術総合研究所 | 集積型薄膜太陽電池の評価装置および評価方法 |
| JP2007127499A (ja) * | 2005-11-02 | 2007-05-24 | Nec Electronics Corp | 非破壊検査装置および非破壊検査方法 |
| JP2010073800A (ja) * | 2008-09-17 | 2010-04-02 | Lasertec Corp | 太陽電池の評価装置、評価方法、及び太陽電池の製造方法 |
| JP5344595B2 (ja) * | 2009-04-09 | 2013-11-20 | レーザーテック株式会社 | 太陽電池の評価装置、評価方法、及び太陽電池の製造方法 |
| JP2010278123A (ja) * | 2009-05-27 | 2010-12-09 | Lasertec Corp | 太陽電池効率測定装置、太陽電池評価装置 |
| JP5470541B2 (ja) * | 2009-10-29 | 2014-04-16 | レーザーテック株式会社 | 太陽電池評価装置 |
| JP5509414B2 (ja) * | 2010-01-28 | 2014-06-04 | 大日本スクリーン製造株式会社 | 太陽電池評価装置および太陽電池評価方法 |
-
1986
- 1986-02-18 JP JP2249286U patent/JPH0739247Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62134263U (en:Method) | 1987-08-24 |
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