JPS62134263U - - Google Patents

Info

Publication number
JPS62134263U
JPS62134263U JP2249286U JP2249286U JPS62134263U JP S62134263 U JPS62134263 U JP S62134263U JP 2249286 U JP2249286 U JP 2249286U JP 2249286 U JP2249286 U JP 2249286U JP S62134263 U JPS62134263 U JP S62134263U
Authority
JP
Japan
Prior art keywords
light
receiving element
photocurrent
analysis device
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2249286U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0739247Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2249286U priority Critical patent/JPH0739247Y2/ja
Publication of JPS62134263U publication Critical patent/JPS62134263U/ja
Application granted granted Critical
Publication of JPH0739247Y2 publication Critical patent/JPH0739247Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP2249286U 1986-02-18 1986-02-18 受光素子の光電流分布解析装置 Expired - Lifetime JPH0739247Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2249286U JPH0739247Y2 (ja) 1986-02-18 1986-02-18 受光素子の光電流分布解析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2249286U JPH0739247Y2 (ja) 1986-02-18 1986-02-18 受光素子の光電流分布解析装置

Publications (2)

Publication Number Publication Date
JPS62134263U true JPS62134263U (en:Method) 1987-08-24
JPH0739247Y2 JPH0739247Y2 (ja) 1995-09-06

Family

ID=30819928

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2249286U Expired - Lifetime JPH0739247Y2 (ja) 1986-02-18 1986-02-18 受光素子の光電流分布解析装置

Country Status (1)

Country Link
JP (1) JPH0739247Y2 (en:Method)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002181658A (ja) * 2000-12-12 2002-06-26 Sony Corp 受光素子の検査装置および検査方法
JP2002261315A (ja) * 2001-03-05 2002-09-13 Kanegafuchi Chem Ind Co Ltd 薄膜光電変換モジュールの製造方法
JP2004247325A (ja) * 2002-12-19 2004-09-02 National Institute Of Advanced Industrial & Technology 集積型薄膜太陽電池の評価装置および評価方法
JP2007127499A (ja) * 2005-11-02 2007-05-24 Nec Electronics Corp 非破壊検査装置および非破壊検査方法
JP2010073800A (ja) * 2008-09-17 2010-04-02 Lasertec Corp 太陽電池の評価装置、評価方法、及び太陽電池の製造方法
JP2010245431A (ja) * 2009-04-09 2010-10-28 Lasertec Corp 太陽電池の評価装置、評価方法、及び太陽電池の製造方法
JP2010278123A (ja) * 2009-05-27 2010-12-09 Lasertec Corp 太陽電池効率測定装置、太陽電池評価装置
JP2011096845A (ja) * 2009-10-29 2011-05-12 Lasertec Corp 太陽電池評価装置
JP2011155225A (ja) * 2010-01-28 2011-08-11 Dainippon Screen Mfg Co Ltd 太陽電池評価装置および太陽電池評価方法

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002181658A (ja) * 2000-12-12 2002-06-26 Sony Corp 受光素子の検査装置および検査方法
JP2002261315A (ja) * 2001-03-05 2002-09-13 Kanegafuchi Chem Ind Co Ltd 薄膜光電変換モジュールの製造方法
JP2004247325A (ja) * 2002-12-19 2004-09-02 National Institute Of Advanced Industrial & Technology 集積型薄膜太陽電池の評価装置および評価方法
JP2007127499A (ja) * 2005-11-02 2007-05-24 Nec Electronics Corp 非破壊検査装置および非破壊検査方法
JP2010073800A (ja) * 2008-09-17 2010-04-02 Lasertec Corp 太陽電池の評価装置、評価方法、及び太陽電池の製造方法
JP2010245431A (ja) * 2009-04-09 2010-10-28 Lasertec Corp 太陽電池の評価装置、評価方法、及び太陽電池の製造方法
JP2010278123A (ja) * 2009-05-27 2010-12-09 Lasertec Corp 太陽電池効率測定装置、太陽電池評価装置
JP2011096845A (ja) * 2009-10-29 2011-05-12 Lasertec Corp 太陽電池評価装置
JP2011155225A (ja) * 2010-01-28 2011-08-11 Dainippon Screen Mfg Co Ltd 太陽電池評価装置および太陽電池評価方法

Also Published As

Publication number Publication date
JPH0739247Y2 (ja) 1995-09-06

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