JPH07311160A - Method and device for preforming visual inspection - Google Patents
Method and device for preforming visual inspectionInfo
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- JPH07311160A JPH07311160A JP10522394A JP10522394A JPH07311160A JP H07311160 A JPH07311160 A JP H07311160A JP 10522394 A JP10522394 A JP 10522394A JP 10522394 A JP10522394 A JP 10522394A JP H07311160 A JPH07311160 A JP H07311160A
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- film
- visible light
- image
- ultraviolet
- ultraviolet ray
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- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Image Input (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は透明シート、特に表面保
護フィルムを貼付した偏光フィルムの内部に存在または
混入する気泡や異物を検出することができる外観検査方
法、および該方法に使用する検査装置に関するものであ
る。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a transparent sheet, in particular, a visual inspection method capable of detecting air bubbles or foreign matter existing or mixed in a polarizing film having a surface protective film attached thereto, and an inspection apparatus used for the method. It is about.
【0002】[0002]
【従来の技術】一般的なフィルムの作製方法としては、
キャスティング法や溶融押出法、延伸法、カレンダー
法、切削法、ディスパージョン法などの方法があるが、
作製したフィルム内に気泡や異物が混入すると欠陥製品
となるので、このようなフィルムの欠陥を検出するため
の外観検査工程が必要となる。特に、偏光フィルムのよ
うな光学用途に用いる透明フィルムの場合、上記欠陥は
製品の致命的欠陥となるので、検査工程は極めて重要な
工程である。2. Description of the Related Art As a general method for producing a film,
There are casting method, melt extrusion method, drawing method, calendar method, cutting method, dispersion method, etc.,
If air bubbles or foreign substances are mixed in the produced film, it will result in a defective product. Therefore, an appearance inspection step for detecting such a defect in the film is required. In particular, in the case of a transparent film used for optical applications such as a polarizing film, the above-mentioned defect becomes a fatal defect of the product, so the inspection process is an extremely important process.
【0003】通常、偏光フィルムは偏光作用を生じるフ
ィルム状の偏光子の両面に、補強用のフィルムを貼り合
わせた多層構造であり、液晶表示素子などに広く用いら
れている。また、偏光フィルムの表面には搬送時や取り
扱い時の傷つきなどから保護するために表面保護フィル
ムを貼付しているのが一般的である。Usually, a polarizing film has a multi-layered structure in which a reinforcing film is laminated on both sides of a film-shaped polarizer that produces a polarizing effect, and is widely used in liquid crystal display devices and the like. In addition, a surface protective film is generally attached to the surface of the polarizing film to protect it from scratches during transportation and handling.
【0004】このような偏光フィルムについて前述のよ
うな外観検査を行う場合、表面保護フィルムが積層され
た状態で行わなければならないが、この表面保護フィル
ムは使用時に剥離除去される。従って、外観検査時には
表面保護フィルムの欠陥を検出せずに、偏光フィルムの
欠陥のみを検出する必要があるが、このような検査は極
めて困難なものである。When the above-mentioned appearance inspection is performed on such a polarizing film, it must be carried out in a state where the surface protective film is laminated, but this surface protective film is peeled and removed at the time of use. Therefore, it is necessary to detect only the defect of the polarizing film without detecting the defect of the surface protection film at the time of the appearance inspection, but such inspection is extremely difficult.
【0005】上記実情から、表面保護フィルムが貼付さ
れている偏光フィルムの外観検査は自動化されにくく、
一般には検査員による目視検査が行われている。From the above circumstances, it is difficult to automate the visual inspection of the polarizing film to which the surface protective film is attached,
Generally, visual inspection is performed by an inspector.
【0006】[0006]
【発明が解決しようとする課題】しかしながら、現状の
検査員による目視検査では熟練技術が必要となると共
に、各検査員の間での検査レベルを統一することが困難
である。また、欠陥サイズが小さくなると目視判定しに
くくなるという課題も有する。However, the visual inspection by the current inspectors requires a skilled technique and it is difficult to unify the inspection levels among the inspectors. There is also a problem that it becomes difficult to make a visual determination when the defect size becomes small.
【0007】さらに、可視光線を被検査フィルムの表面
に照射すると、表面保護フィルムと偏光フィルムとの欠
陥が同様の信号強度で検出されるので、可視光線の利用
のみで自動化して偏光フィルムの欠陥だけを検出するこ
とは困難であった。Further, when the surface of the film to be inspected is irradiated with visible light, defects in the surface protective film and the polarizing film are detected with similar signal intensities. Only was difficult to detect.
【0008】従って、本発明は偏光フィルムなどの透明
フィルムの外観検査を自動化して行うことができ、しか
も表面保護フィルムにて被覆された構造体であっても、
被検査体である偏光フィルムの欠陥のみを検出すること
ができる外観検査方法を提供することを目的とする。Therefore, according to the present invention, it is possible to automatically perform a visual inspection of a transparent film such as a polarizing film, and even if it is a structure covered with a surface protective film,
An object of the present invention is to provide a visual inspection method capable of detecting only defects in a polarizing film that is an inspection object.
【0009】また、上記外観検査方法に用いる検査装置
を提供することを目的とする。It is another object of the present invention to provide an inspection device used in the above appearance inspection method.
【0010】[0010]
【課題を解決するための手段】そこで、本発明者らは検
査に用いる光線として紫外光線および可視光線を併用
し、反射した紫外光線と透過した可視光線を撮像して、
これを比較判定することによって、上記目的を達成する
ことができる検査方法および検査装置が得られることを
見い出し、本発明を完成するに至った。Therefore, the present inventors have used ultraviolet rays and visible rays in combination as the rays used for inspection, and image the reflected ultraviolet rays and the transmitted visible rays,
It was found that an inspection method and an inspection apparatus that can achieve the above-mentioned object can be obtained by comparing and judging these, and the present invention has been completed.
【0011】即ち、本発明は透明シートの表面に紫外光
線を照射し反射する紫外光線を撮像した画像と、前記透
明シートの表面に可視光線を照射し透過する可視光線を
撮像した画像とを、画像処理により比較解析することを
特徴とする外観検査方法を提供するものである。That is, according to the present invention, an image obtained by irradiating an ultraviolet ray on the surface of a transparent sheet and picked up an ultraviolet ray reflected by the transparent sheet, and an image obtained by picking up a visible ray on the surface of the transparent sheet by irradiating the visible ray and transmitting the visible ray, The present invention provides a visual inspection method characterized by comparative analysis by image processing.
【0012】さらに、本発明は被検査体としての透明シ
ートに紫外光線を照射する紫外光線照射手段と、反射し
た紫外光線を撮像する紫外光線撮像手段と、被検査体と
しての透明シートに可視光線を照射する可視光線照射手
段と、透過した可視光線を撮像する可視光線撮像手段
と、紫外光線撮像手段と可視光線撮像手段によって得ら
れた画像信号を比較判定する画像処理部とを具備してな
る検査装置を提供するものである。Further, according to the present invention, an ultraviolet ray irradiating means for irradiating a transparent sheet as an inspected object with an ultraviolet ray, an ultraviolet ray image pickup means for picking up an image of the reflected ultraviolet ray, and a visible ray for a transparent sheet as an inspected object. And a visible light imaging means for imaging the transmitted visible light, and an image processing part for comparing and judging the image signals obtained by the ultraviolet light imaging means and the visible light imaging means. An inspection device is provided.
【0013】[0013]
【作用】紫外光を吸収する機能を有する偏光フィルムの
ような透明フィルムの表面に表面保護フィルムが貼付さ
れてなる被検査フィルムに、まず可視光線を照射して透
過光を撮影することによって、偏光フィルムの欠陥と表
面保護フィルムの欠陥を含む画像を得る。Function: A film to be inspected having a surface protective film attached to the surface of a transparent film such as a polarizing film having a function of absorbing ultraviolet light is first irradiated with visible light to photograph transmitted light to An image containing defects in the film and defects in the surface protective film is obtained.
【0014】次に、紫外光線を照射してその反射光を撮
影することによって、照射側に貼付している表面保護フ
ィルムのみの欠陥の画像を得る。なお、偏光フィルムの
両面に表面保護フィルムが貼付されている場合には、紫
外光線の照射を他面側からも同様に行い、その反射光も
撮影する。Next, an ultraviolet ray is irradiated and the reflected light is photographed to obtain an image of a defect only on the surface protective film attached to the irradiation side. When surface protective films are attached to both surfaces of the polarizing film, irradiation of ultraviolet rays is similarly performed from the other surface side, and the reflected light is also photographed.
【0015】最後に、可視光線透過光から得られた偏光
フィルムと表面保護フィルムの両方の欠陥を含む画像
と、紫外光線反射光から得られた表面保護フィルムのみ
の欠陥を含む画像とを比較判定することによって、偏光
フィルムの欠陥のみを検出することができるのである。Finally, a comparison judgment is made between an image containing defects of both the polarizing film and the surface protective film obtained from visible light transmitted, and an image containing defects of only the surface protective film obtained from ultraviolet ray reflected light. By doing so, it is possible to detect only defects in the polarizing film.
【0016】[0016]
【実施例】以下、本発明の実施例を図面を用いて具体的
に説明するが、本発明はこれらに限定されるものではな
く、本発明の技術思想を逸脱しない範囲で種々の応用、
変形が可能である。Embodiments of the present invention will be specifically described below with reference to the drawings. However, the present invention is not limited to these and various applications can be made without departing from the technical idea of the present invention.
Deformation is possible.
【0017】図1は本発明の外観検査方法および検査装
置の一実施例を示す構成の概略図である。FIG. 1 is a schematic diagram of a configuration showing an embodiment of the appearance inspection method and inspection apparatus of the present invention.
【0018】図1において光線照射手段としての検査光
源は、例えば高周波蛍光灯などの可視光源4、および高
周波紫外線蛍光灯などの紫外光源5,6を用いることが
できる。In FIG. 1, as the inspection light source as the light beam irradiation means, for example, a visible light source 4 such as a high frequency fluorescent lamp and ultraviolet light sources 5 and 6 such as a high frequency ultraviolet fluorescent lamp can be used.
【0019】可視光源4からの可視光線を、表面保護フ
ィルム2および3を貼付した偏光フィルム1に照射し、
透過光を可視光線透過フィルタ10を通して撮像手段と
してのてCCDカメラ7で撮像し、CCDカメラ7から
の画像信号を画像処理部15に入力する。Visible light from the visible light source 4 is applied to the polarizing film 1 to which the surface protective films 2 and 3 are attached,
The transmitted light is imaged by the CCD camera 7 as an image pickup means through the visible light transmission filter 10, and the image signal from the CCD camera 7 is input to the image processing unit 15.
【0020】一方、紫外光源5からの紫外光線を、表面
保護フィルム2を貼付した偏光フィルム1の片面(図
中、上側)に照射し、反射光を紫外光線反射鏡11で反
射させ、紫外光線透過フィルタ13を通して撮像手段と
してのCCDカメラ8で撮像し、CCDカメラ8からの
画像信号を画像処理部15に入力する。On the other hand, an ultraviolet ray from the ultraviolet light source 5 is applied to one side (upper side in the figure) of the polarizing film 1 to which the surface protective film 2 is attached, and the reflected light is reflected by the ultraviolet ray reflecting mirror 11 to emit the ultraviolet ray. An image is taken by the CCD camera 8 as an imaging means through the transmission filter 13, and the image signal from the CCD camera 8 is input to the image processing unit 15.
【0021】同様にして、紫外光線6の紫外光線を、表
面保護フィルム3を貼付した偏光フィルム1の他面(図
中、下側)に照射し、反射光を紫外光線反射鏡12で反
射させ、紫外光線透過フィルタ14を通して撮像手段と
してのCCDカメラ9で撮像し、CCDカメラ9からの
画像信号を画像処理部15に入力する。Similarly, the ultraviolet ray of the ultraviolet ray 6 is applied to the other surface (the lower side in the figure) of the polarizing film 1 to which the surface protection film 3 is attached, and the reflected light is reflected by the ultraviolet ray reflecting mirror 12. An image is captured by the CCD camera 9 as an image capturing unit through the ultraviolet ray transmitting filter 14, and the image signal from the CCD camera 9 is input to the image processing unit 15.
【0022】各CCDカメラ7,8,9から画像処理部
15に入力された画像信号に対して、それぞれ閾値処理
を施して二値画像を得、それぞれの画像を比較処理する
ことによって偏光フィルム1のみの欠陥の有無を検査す
る。The image signals input from the CCD cameras 7, 8 and 9 to the image processing section 15 are each subjected to threshold value processing to obtain a binary image, and the respective images are compared, whereby the polarizing film 1 is processed. Only inspect for defects.
【0023】図2は上記図1においてCCDカメラ7,
8,9で撮像して得られた二値画像、および画像処理し
て得られた二値画像である。FIG. 2 shows the CCD camera 7 in FIG.
8A and 8B are a binary image obtained by imaging and a binary image obtained by image processing.
【0024】図2(a)は可視光源4を照射することに
よって得られた透過光を撮像し、閾値処理して得られた
二値画像である。この画像には偏光フィルム1の欠陥
と、偏光フィルム1の表面に貼付された表面保護フィル
ム2,3の欠陥が検出されている。FIG. 2A is a binary image obtained by imaging the transmitted light obtained by irradiating the visible light source 4 and performing threshold processing. In this image, defects of the polarizing film 1 and defects of the surface protective films 2 and 3 attached to the surface of the polarizing film 1 are detected.
【0025】図2(b)は紫外光源5を照射することに
よって得られた反射光を撮像し、閾値処理して得られた
二値画像である。この画像には偏光フィルム1の片面
(図中、上側)に貼付された表面保護フィルム2のみの
欠陥が検出されており、偏光フィルム1の欠陥は検出さ
れていない。FIG. 2B is a binary image obtained by imaging the reflected light obtained by irradiating the ultraviolet light source 5 and performing threshold processing. In this image, the defect of only the surface protection film 2 attached to one surface (upper side in the drawing) of the polarizing film 1 is detected, and the defect of the polarizing film 1 is not detected.
【0026】図2(c)は紫外光源6を照射することに
よって得られた反射光を撮像し、閾値処理して得られた
二値画像である。この画像には偏光フィルム1の片面
(図中、下側)に貼付された表面保護フィルム3のみの
欠陥が検出されており、偏光フィルム1の欠陥は検出さ
れていない。FIG. 2C is a binary image obtained by imaging the reflected light obtained by irradiating the ultraviolet light source 6 and performing threshold processing. In this image, the defect of only the surface protective film 3 attached to one surface (lower side in the figure) of the polarizing film 1 is detected, and the defect of the polarizing film 1 is not detected.
【0027】図2(d)は、図2(a)〜(c)の3つ
の二値画像を比較処理して得られた画像であり、図2
(a)の画像から図2(b)および図2(c)の画像を
差し引くことによって、偏光フィルム1の表面に貼付さ
れた表面保護フィルム2,3の欠陥が除去され、偏光フ
ィルム1の欠陥のみが検出されている。FIG. 2D is an image obtained by comparing the three binary images of FIGS. 2A to 2C, and FIG.
By subtracting the images of FIGS. 2B and 2C from the image of FIG. 2A, the defects of the surface protective films 2 and 3 attached to the surface of the polarizing film 1 are removed, and the defects of the polarizing film 1 are removed. Only detected.
【0028】なお、本発明における被検査体としての透
明フィルムは上記偏光フィルムに限らず、可視光を透過
して紫外光を透過しないフィルムを含み、可視光帯域の
光透過度が20%以上程度のものであれば本発明の検査
に供することができる。また、本発明の外観検査方法
は、上記の透明フィルムに表面保護フィルムなどを貼付
した被覆構造体でなくとも適用することができることは
云うまでもないことである。The transparent film as an object to be inspected in the present invention is not limited to the above-mentioned polarizing film, and includes a film that transmits visible light and does not transmit ultraviolet light, and has a light transmittance in the visible light band of about 20% or more. Any of the above can be used for the inspection of the present invention. Further, it goes without saying that the appearance inspection method of the present invention can be applied even if it is not a covering structure in which a surface protective film or the like is attached to the transparent film.
【0029】[0029]
【発明の効果】以上のように、本発明の検査方法および
検査装置によれば、表面に保護フィルムなどが被覆積層
されている透明フィルムの外観検査を、保護フィルムを
剥離除去しなくとも保護フィルムの外観不良の影響を受
けずに検査することができるものである。従って、従来
の検査員による目視検査に代わって、検査工程の機械化
や自動化が容易になるという優れた効果を発揮するもの
である。As described above, according to the inspection method and the inspection apparatus of the present invention, the appearance inspection of the transparent film having the surface covered with the protective film or the like can be inspected without peeling and removing the protective film. It can be inspected without being affected by the poor appearance. Therefore, in place of the conventional visual inspection by an inspector, the mechanization and automation of the inspection process can be facilitated, which is an excellent effect.
【図1】 本発明の外観検査方法および検査装置の一実
施例を示す構成の概略図である。FIG. 1 is a schematic diagram of a configuration showing an embodiment of an appearance inspection method and an inspection apparatus of the present invention.
【図2】 図2(a)〜図2(c)は図1においてCC
Dカメラ7,8,9で撮像して得られた二値画像、図2
(d)はこれらの画像を比較処理して得られた二値画像
である。2 (a) to 2 (c) are CCs in FIG.
Binary image obtained by imaging with D cameras 7, 8 and 9, FIG.
(D) is a binary image obtained by comparing these images.
1 偏光フィルム 2,3 表面保護フィルム 4 可視光線照射手段(可視光源) 5,6 紫外光線照射手段(紫外光源) 7,8,9 撮像手段(CCDカメラ) 10 可視光線透過フィルタ 11,12 紫外光線反射鏡 13,14 紫外光線透過フィルタ 15 画像処理部 1 Polarizing Film 2, 3 Surface Protection Film 4 Visible Light Irradiation Means (Visible Light Source) 5, 6 Ultraviolet Light Irradiation Means (Ultraviolet Light Source) 7, 8, 9 Imaging Means (CCD Camera) 10 Visible Light Transmission Filters 11, 12 Ultraviolet Light Reflector 13, 14 UV ray transmission filter 15 Image processing unit
Claims (4)
射する紫外光線を撮像した画像と、前記透明シートの表
面に可視光線を照射し透過する可視光線を撮像した画像
とを、画像処理により比較解析することを特徴とする外
観検査方法。1. An image obtained by irradiating an ultraviolet ray on the surface of a transparent sheet with an image of an ultraviolet ray reflected and an image obtained by irradiating a visible ray on the surface of the transparent sheet with a visible ray transmitted through the image processing. A visual inspection method characterized by comparative analysis.
1記載の外観検査方法。2. The appearance inspection method according to claim 1, wherein the transparent sheet is a polarizing film.
貼付した被覆構造体である請求項1または2記載の外観
検査方法。3. The appearance inspection method according to claim 1, wherein the transparent sheet is a covering structure having a protective film attached to the surface thereof.
を照射する紫外光線照射手段と、反射した紫外光線を撮
像する紫外光線撮像手段と、被検査体としての透明シー
トに可視光線を照射する可視光線照射手段と、透過した
可視光線を撮像する可視光線撮像手段と、紫外光線撮像
手段と可視光線撮像手段によって得られた画像信号を比
較判定する画像処理部とを具備してなる検査装置。4. An ultraviolet ray irradiating means for irradiating a transparent sheet as an inspected object with an ultraviolet ray, an ultraviolet ray imaging means for picking up an image of a reflected ultraviolet ray, and a visible ray for irradiating a transparent sheet as an inspected object. An inspection apparatus comprising: a visible light irradiating means, a visible light imaging means for imaging a transmitted visible light, and an ultraviolet ray imaging means and an image processing section for comparing and judging an image signal obtained by the visible light imaging means.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10522394A JPH07311160A (en) | 1994-05-19 | 1994-05-19 | Method and device for preforming visual inspection |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10522394A JPH07311160A (en) | 1994-05-19 | 1994-05-19 | Method and device for preforming visual inspection |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH07311160A true JPH07311160A (en) | 1995-11-28 |
Family
ID=14401676
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10522394A Pending JPH07311160A (en) | 1994-05-19 | 1994-05-19 | Method and device for preforming visual inspection |
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Country | Link |
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JP (1) | JPH07311160A (en) |
Cited By (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10300688A (en) * | 1997-04-25 | 1998-11-13 | Fujimori Kogyo Kk | Optical monitoring device |
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