JPH10111252A - Detecting equipment of flaw of glass plate - Google Patents

Detecting equipment of flaw of glass plate

Info

Publication number
JPH10111252A
JPH10111252A JP8262183A JP26218396A JPH10111252A JP H10111252 A JPH10111252 A JP H10111252A JP 8262183 A JP8262183 A JP 8262183A JP 26218396 A JP26218396 A JP 26218396A JP H10111252 A JPH10111252 A JP H10111252A
Authority
JP
Japan
Prior art keywords
light source
glass plate
band
glass
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP8262183A
Other languages
Japanese (ja)
Inventor
Haruki Kobayashi
陽樹 小林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AGC Inc
Original Assignee
Asahi Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Glass Co Ltd filed Critical Asahi Glass Co Ltd
Priority to JP8262183A priority Critical patent/JPH10111252A/en
Publication of JPH10111252A publication Critical patent/JPH10111252A/en
Withdrawn legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To enhance the sensitivity in detection of a thread line flaw by a method wherein a light source part which is made up of a plurality of strip-shaped light sources and of which the longitudinal direction of the strip forms an angle of specific degrees or below to the direction of drawing-out of a glass ribbon at the time of molding thereof is provided and a signal from an image pickup device disposed on the opposite side of the glass ribbon is subjected to an image processing. SOLUTION: The direction of drawing-out of a glass ribbon 4 at the time of molding thereof is so set as to form an angle of 20 degrees or below to the longitudinal direction of the strip of a strip-shaped light source. A strip width of a plurality of strip-shaped light sources and an interval between them are set to be in a range of 5-50mm. In other words, the widths of a light-transmitting part 7 and a light-intercepting part 8 of a slit plate 2 are set to be in the range of 5-50mm respectively. The light from a light source box 1 is projected to the glass ribbon 4 through the slit plate 2. When a thread line flaw 11 is present, the course of the light is deflected slightly and the thread line flaw 11 is recognized as a line having a brightness different from the one of the background when it is viewed from the side opposite side to the light source. The image thereof is picked up by a two-dimensional CCD camera 5 and an image signal is sent to an image processing device 6 and subjected to an image processing, whereby the flaw is detected.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、ガラス板の欠点検
出装置、特にガラス板のスレッドライン欠点を検出でき
る検出装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for detecting a defect on a glass sheet, and more particularly to an apparatus for detecting a thread line defect on a glass sheet.

【0002】[0002]

【従来の技術】ガラス板の製造時に問題となる欠点には
多くの種類があり、そのなかでも比較的検出しにくい欠
点として、スレッドライン欠点と呼ばれるものがある。
2. Description of the Related Art There are many types of defects which are problematic in the production of glass sheets, and among them, a defect which is relatively difficult to detect is a so-called thread line defect.

【0003】スレッドライン欠点とは、フロート法など
で熔融ガラスがリボン状に成形される際、ガラスリボン
の引き出し方向に平行に現れる筋状欠点である。その幅
は、数10μm〜数100μmときわめて細いものであ
るうえ、ディストーションをほとんど伴わないため、光
学的に検出しにくい。
[0003] The thread line defect is a streak defect that appears parallel to the drawing direction of the glass ribbon when the molten glass is formed into a ribbon shape by a float method or the like. The width is as thin as several tens of μm to several hundreds of μm, and it is hardly optically detected because it has almost no distortion.

【0004】[0004]

【発明が解決しようとする課題】したがって、従来、ス
レッドライン欠点は、人手による検査によって検出を行
っており、手間のかかるものであった。また、後工程の
切断工程などに迅速に欠点発生の情報を送ることが困難
であった。
Therefore, conventionally, the thread line defect has been detected by manual inspection, which has been troublesome. Further, it has been difficult to quickly send information on the occurrence of defects to a cutting process and the like in a subsequent process.

【0005】筋状欠点を検出する装置としては、特開平
6−74907に開示されたものがある。しかし、この
装置は、比較的太くかつディストーションを伴う欠点の
検出を対象にしており、本発明の欠点検出の対象となる
スレッドライン欠点は検出できない。
As an apparatus for detecting streak defects, there is an apparatus disclosed in Japanese Patent Application Laid-Open No. Hei 6-74907. However, this apparatus is aimed at detecting a defect which is relatively thick and involves distortion, and cannot detect a thread line defect which is a target of the defect detection of the present invention.

【0006】本発明は、上述の課題を解決し、ガラス板
の欠点検出装置、特にガラスリボンのスレッドライン欠
点を検出できる検出装置を提供することを目的とする。
SUMMARY OF THE INVENTION An object of the present invention is to solve the above-mentioned problems and to provide a device for detecting a defect of a glass plate, particularly a device capable of detecting a thread line defect of a glass ribbon.

【0007】[0007]

【課題を解決するための手段】本発明は、ガラス板の欠
点を検出する検出装置であって、ガラス板を成形時の引
き出し方向に略平行に搬送する搬送手段と、複数の帯状
光源からなりその帯の長手方向がガラス板の成形時の引
き出し方向と20度以下の角度をなす光源部と、ガラス
板を挟んで光源部と反対側に配置されガラス板の位置も
しくはその近傍に焦点を合わせてなる撮像装置と、前記
撮像装置からの信号を受けて画像処理する画像処理装置
とを備え、前記複数の帯状光源の帯幅、及び互いの間隔
が5〜50mmの範囲に設定されていることを特徴とす
るガラス板の欠点検出装置を提供する。
SUMMARY OF THE INVENTION The present invention relates to a detecting device for detecting a defect of a glass sheet, comprising a conveying means for conveying the glass sheet substantially in parallel with a drawing direction at the time of molding, and a plurality of belt-like light sources. A light source section whose longitudinal direction forms an angle of not more than 20 degrees with the drawing direction at the time of molding the glass sheet, and a light source section disposed on the opposite side of the glass sheet and focused on or near the position of the glass sheet. And an image processing apparatus for performing image processing by receiving a signal from the imaging apparatus, wherein the band widths of the plurality of band-shaped light sources and the distance between each other are set in a range of 5 to 50 mm. Provided is a device for detecting a defect of a glass plate, characterized by the following.

【0008】[0008]

【発明の実施の形態】以下、図面に従って、本発明の実
施形態の1例を説明する。図1、図2は本発明の装置の
概略を示す斜視図及び側面図である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings. 1 and 2 are a perspective view and a side view showing the outline of the apparatus of the present invention.

【0009】本実施形態においては、帯状光源は、蛍光
灯などの光源を内部に配置した光源ボックス1とその上
に配置されたスリット板2から形成される。スリット板
2は、板の上に帯状の透光部7と遮光部8とが交互に形
成されているものであり、透光部7を透過する光が上記
帯状光源として機能する。ガラス板に光を均一に照射す
るには、光源は拡散光源とすることが好ましい。このた
めに、別途、拡散板などの光を拡散する部材をスリット
板2と光源ボックス1の間に配置できる。
In the present embodiment, the belt-like light source is formed by a light source box 1 in which a light source such as a fluorescent lamp is disposed, and a slit plate 2 disposed thereon. The slit plate 2 is formed by alternately forming strip-shaped light-transmitting portions 7 and light-shielding portions 8 on the plate, and light transmitted through the light-transmitting portion 7 functions as the strip light source. In order to uniformly irradiate the glass plate with light, the light source is preferably a diffusion light source. For this purpose, a member for diffusing light, such as a diffusion plate, can be separately arranged between the slit plate 2 and the light source box 1.

【0010】本実施形態では、光源部として、光源ボッ
クスとスリット板とからなるものを用いているが、これ
に限らず、複数並んだ帯状の光源が実現できるものであ
れば使用できる。
In this embodiment, the light source section is composed of a light source box and a slit plate. However, the present invention is not limited to this. Any light source section can be used as long as a plurality of strip-shaped light sources can be realized.

【0011】本発明では、複数の帯状光源の帯幅、及び
その互いの間隔を5〜50mmの範囲に設定する。すな
わち、本実施形態においては、スリット板の透光部7と
遮光部8の幅がそれぞれ5〜50mmの範囲に設定され
る。これらの幅が5mm未満であると透光部からの光量
不足又は遮光部の遮光効果減少のため、欠点部分が背景
に埋もれて検出できない。一方、50mm超であると、
ガラスリボンで光源からの光が届きにくい部分が生じ、
明暗差が大きくなるため、欠点の見落としを生じやすく
なる。
In the present invention, the band widths of the plurality of band-like light sources and the distance between the band light sources are set in the range of 5 to 50 mm. That is, in the present embodiment, the width of each of the light transmitting portion 7 and the light shielding portion 8 of the slit plate is set in the range of 5 to 50 mm. If these widths are less than 5 mm, the defective portion is buried in the background and cannot be detected due to insufficient light quantity from the light transmitting portion or a decrease in the light shielding effect of the light shielding portion. On the other hand, if it is more than 50 mm,
Some parts of the glass ribbon are hard to reach from the light source,
Since the contrast is large, it is easy to overlook the defect.

【0012】光源ボックス1からの光はスリット2を介
して、ガラスリボン(ガラス板)4に投写される。この
際に、ガラスリボン4にスレッドライン欠点11がある
と、光の進路がわずかに偏向する。したがって、光源と
反対側からガラスリボンを見ると、スレッドライン欠点
は背景と異なる明るさの線として認識される。
Light from the light source box 1 is projected on a glass ribbon (glass plate) 4 through a slit 2. At this time, if the glass ribbon 4 has the thread line defect 11, the light path is slightly deflected. Therefore, when the glass ribbon is viewed from the side opposite to the light source, the thread line defect is recognized as a line having a different brightness from the background.

【0013】ガラスリボン4は、搬送ロール3(図1に
は図示せず)で、ガラスリボン4の成形時の引き出し方
向に搬送される。なお、本実施形態では、搬送手段とし
て搬送ロール3を用いたが、エアーテーブルなど他の搬
送手段によってもよい。
The glass ribbon 4 is transported by a transport roll 3 (not shown in FIG. 1) in a drawing direction at the time of forming the glass ribbon 4. In this embodiment, the transport roll 3 is used as the transport unit, but another transport unit such as an air table may be used.

【0014】また、搬送方向(すなわち成形時の引き出
し方向)は帯状光源の帯の長手方向と20度以下の角度
をなす。スレッドライン欠点11はガラス板の成形時の
引き出し方向に沿って筋状に発生するため、帯状光源の
帯の長手方向がガラス板の引き出し方向と20度を超え
た角度をなす場合は、スレッドライン欠点11を検出す
ることが困難になる。
The conveying direction (that is, the drawing direction during molding) forms an angle of not more than 20 degrees with the longitudinal direction of the band of the band light source. Since the thread line defect 11 occurs in a streak shape along the drawing direction at the time of forming the glass plate, if the longitudinal direction of the band of the band light source makes an angle exceeding 20 degrees with the drawing direction of the glass plate, the thread line It becomes difficult to detect the defect 11.

【0015】ガラスリボン4の像は、ガラスリボン4を
挟んで光源ボックス1と反対側に配置された2次元CC
Dカメラ(撮像装置)5によって撮像される。本実施形
態では、撮像装置として2次元CCDカメラを用いた
が、他の撮像装置も使用できる。たとえばビデオカメラ
や1次元ラインセンサなども使用できる。また、撮像装
置は複数用いてもよい。ガラス板の全幅を写野に入れる
ことができるのに充分な数を用いることが好ましい。
An image of the glass ribbon 4 is a two-dimensional CC arranged on the opposite side of the light source box 1 with the glass ribbon 4 interposed therebetween.
An image is captured by a D camera (imaging device) 5. In the present embodiment, a two-dimensional CCD camera is used as an imaging device, but other imaging devices can be used. For example, a video camera or a one-dimensional line sensor can be used. Further, a plurality of imaging devices may be used. It is preferable to use a number sufficient to allow the entire width of the glass plate to be included in the field.

【0016】2次元CCDカメラ5の焦点は、ガラスリ
ボン4の位置もしくはその近傍に合わせる。カメラの焦
点がガラスリボンの位置から大きくはずれると、スレッ
ドライン欠点の検出が困難になる。
The focus of the two-dimensional CCD camera 5 is adjusted to the position of the glass ribbon 4 or its vicinity. If the focus of the camera deviates greatly from the position of the glass ribbon, it becomes difficult to detect a thread line defect.

【0017】図3は2次元CCDカメラ5による撮像で
得られる像の概念図を示す。背景に、帯状拡散光源が焦
点のぼけた像9として写っており、スレッドライン欠点
のある場合は、背景と明るさの異なる線10として写
る。
FIG. 3 is a conceptual diagram of an image obtained by imaging with the two-dimensional CCD camera 5. In the background, the band-like diffused light source is shown as an out-of-focus image 9, and when there is a thread line defect, it is shown as a line 10 having a different brightness from the background.

【0018】本発明では、この像を画像処理することに
より強調し、欠点検出する。すなわち、2次元CCDカ
メラ5による撮像で得られた映像信号は、画像処理装置
6に送られ、所定の画像処理を施される。
In the present invention, this image is emphasized by image processing to detect a defect. That is, a video signal obtained by imaging with the two-dimensional CCD camera 5 is sent to the image processing device 6 and subjected to predetermined image processing.

【0019】図4は本実施形態での画像処理のフローを
示すチャートである。フローは、光源異常の有無判定、
欠点信号の微分処理、2値化、ヒストグラム処理、スラ
イスレベルの決定、スレッドライン欠点の有無の判定の
順で行われる。
FIG. 4 is a chart showing a flow of image processing in this embodiment. The flow determines whether there is a light source abnormality,
Defect signal differentiation processing, binarization, histogram processing, slice level determination, and thread line defect determination are performed in this order.

【0020】まず、取り込まれた画像の平均輝度値から
光源異常の有無を判定する。画像の平均輝度が所定の範
囲内にない場合は、光源に何らかの異常があるものと判
断し、欠点検出を中止して光源ボックスやスリット板の
交換など、必要な措置をとる。
First, the presence or absence of a light source abnormality is determined from the average luminance value of the captured image. If the average luminance of the image is not within the predetermined range, it is determined that there is some abnormality in the light source, the defect detection is stopped, and necessary measures such as replacement of the light source box and the slit plate are taken.

【0021】光源に異常がないと判断されると、輝度信
号をガラスリボンの幅方向に微分する。この微分処理に
より、スレッドライン欠点が強調される。なお、スレッ
ドライン欠点は、背景に対して、明るい線及び暗い線の
一対の線として認識される場合が多いため、微分処理に
よる強調は非常に有効である。
If it is determined that there is no abnormality in the light source, the luminance signal is differentiated in the width direction of the glass ribbon. This differentiation process emphasizes thread line defects. It should be noted that the thread line defect is often recognized as a pair of a bright line and a dark line with respect to the background, so that the enhancement by the differential processing is very effective.

【0022】次いで、微分された信号の2値化を行う。
すなわち、背景よりも所定値以上に明るい信号もしくは
暗い信号を”1”とし、それ以外の信号を”0”とする
処理を行う。
Next, the differentiated signal is binarized.
That is, a process is performed in which a signal brighter or darker than the background by a predetermined value or more is set to “1”, and other signals are set to “0”.

【0023】次いで幅方向にヒストグラム処理を行う。
すなわち、ガラス板の搬送方向の所定の数の画素につい
て上記の2値化後の信号を積算し、積算値の幅方向の分
布を求める。スレッドライン欠点は、ガラスの搬送方向
に沿って現れるので、上記積算処理により、欠点信号が
さらに強調される。
Next, histogram processing is performed in the width direction.
That is, the binarized signal is integrated for a predetermined number of pixels in the transport direction of the glass plate, and the distribution of the integrated value in the width direction is obtained. Since the thread line defect appears along the glass transport direction, the defect signal is further emphasized by the integration processing.

【0024】図5に、ヒストグラム処理した結果の1例
を示す。欠点が存在する場合、欠点部分の積算値がその
他の部分に比べて突出していることがわかる。
FIG. 5 shows an example of the result of the histogram processing. When there is a defect, it can be seen that the integrated value of the defect part is more prominent than other parts.

【0025】次いでヒストグラムデータを用いてスライ
スレベルを決定する。スライスレベルは、欠点の有無の
判別の基準となるレベルである。実際には装置の光学系
やその配置によっても異なるため、実機でテストのう
え、適宜の方法で定めればよい。2種以上のスライスレ
ベルを用いてもよい。1例としてたとえば、第1のスラ
イスレベルとしてヒストグラムデータの平均値を所定倍
数したレベルを用い、第2のスライスレベルとして第1
のスライスレベルにさらに所定の値を加算したレベルを
採用できる。こうすると、スレッドライン欠点の程度ま
で判別することも可能になる。
Next, the slice level is determined using the histogram data. The slice level is a level serving as a reference for determining whether or not there is a defect. Actually, it differs depending on the optical system of the apparatus and the arrangement thereof, so that it may be determined by an appropriate method after testing with an actual machine. Two or more slice levels may be used. As an example, for example, a level obtained by multiplying the average value of the histogram data by a predetermined multiple is used as the first slice level, and the first slice level is set as the first slice level.
And a level obtained by further adding a predetermined value to the slice level of. This makes it possible to determine the degree of the thread line defect.

【0026】次いでヒストグラムデータとスライスレベ
ルとを比較し、スレッドライン欠点の有無を判定する。
スレッドライン欠点があると判断された場合は、後段の
ガラスリボン切断工程に情報を流し、欠点部分を避けて
切断するなどの処置を採ることができる。
Next, the histogram data is compared with the slice level to determine whether there is a thread line defect.
When it is determined that there is a thread line defect, information can be sent to the subsequent glass ribbon cutting step, and a measure such as cutting can be taken while avoiding the defect part.

【0027】本実施形態においては、ガラス板としてガ
ラスリボンを用いたが、所定形状に切断された板ガラス
の検査にも本発明は適用できる。この場合は、板ガラス
の成形時の引き出し方向と、板ガラスの搬送方向とを一
致させる必要がある。前述のようにスレッドライン欠点
は、板ガラスの成形時の引き出し方向に沿って発生する
ためである。
In this embodiment, a glass ribbon is used as the glass plate, but the present invention can be applied to inspection of a plate glass cut into a predetermined shape. In this case, it is necessary to match the drawing direction at the time of forming the sheet glass with the conveying direction of the sheet glass. As described above, the drawback of the thread line is that it occurs along the drawing direction at the time of forming the glass sheet.

【0028】図1のように帯状光源の帯の長手方向とガ
ラス板の搬送方向とを平行にすると、スレッドライン欠
点検出の感度を特に高めうるため、きわめて好ましい。
しかし、帯状光源の帯の長手方向とガラス板の搬送方向
とを平行から若干ずらすことが好ましい場合もある。
As shown in FIG. 1, it is extremely preferable to make the longitudinal direction of the band of the band light source parallel to the conveying direction of the glass plate because the sensitivity of detecting a thread line defect can be particularly enhanced.
However, in some cases, it is preferable that the longitudinal direction of the band of the band-shaped light source and the conveying direction of the glass plate be slightly shifted from parallel.

【0029】図6は、このような場合のスリット板2の
態様を示す平面図である。この態様では、ガラス板の搬
送方向と帯状光源の帯の長手方向とは完全に平行ではな
く、若干の角度をなしている。こうすると、ヒストグラ
ム処理を行う際に背景輝度の変動を抑え、画像処理をよ
り単純化できる場合がある。具体的には、ガラス板の搬
送方向と帯状光源の帯の長手方向とが5〜20度程度の
角度をなすようにすればよい。
FIG. 6 is a plan view showing an embodiment of the slit plate 2 in such a case. In this embodiment, the direction of conveyance of the glass plate and the longitudinal direction of the band of the band-shaped light source are not completely parallel but form a slight angle. In this case, when performing the histogram processing, the fluctuation of the background luminance may be suppressed, and the image processing may be further simplified. Specifically, the direction in which the glass plate is conveyed and the longitudinal direction of the band of the band-shaped light source may form an angle of about 5 to 20 degrees.

【0030】[0030]

【発明の効果】本発明の欠点検出装置によれば、特にガ
ラスリボンのスレッドライン欠点などのディストーショ
ンを伴わない微小筋状欠点を検出できる。
According to the defect detecting apparatus of the present invention, it is possible to detect a minute streak-like defect which does not involve distortion, such as a thread line defect of a glass ribbon.

【0031】また、帯状光源の帯の長手方向とガラス板
の成形時の引き出し方向とのなす角を20度以下とする
ことにより、スレッドライン欠点検出の感度を高めう
る。この角度が、ほぼ平行であると、特にスレッドライ
ン欠点検出の感度が高まる。一方、ガラス板の搬送方向
と帯状光源の帯の長手方向とが5〜20度程度の角度を
なすようすると、画像処理を単純化できる。
Further, by making the angle between the longitudinal direction of the band of the band-shaped light source and the drawing direction at the time of forming the glass plate equal to or less than 20 degrees, the sensitivity of thread line defect detection can be increased. If the angles are substantially parallel, the sensitivity for detecting a thread line defect in particular increases. On the other hand, image processing can be simplified if the transport direction of the glass plate and the longitudinal direction of the band of the band light source form an angle of about 5 to 20 degrees.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の装置の構成の概略を示す斜視図FIG. 1 is a perspective view showing an outline of the configuration of an apparatus of the present invention.

【図2】本発明の装置の構成の概略を示す側面図FIG. 2 is a side view schematically showing the configuration of the apparatus of the present invention.

【図3】2次元CCDカメラ5による撮像で得られる像
の概念図
FIG. 3 is a conceptual diagram of an image obtained by imaging with a two-dimensional CCD camera 5;

【図4】画像処理のフローを示すチャートFIG. 4 is a chart showing a flow of image processing.

【図5】ヒストグラム処理した結果の1例を示すグラフFIG. 5 is a graph showing an example of a result of the histogram processing;

【図6】スリット板の別の態様を示す平面図FIG. 6 is a plan view showing another embodiment of the slit plate.

【符号の説明】[Explanation of symbols]

1:光源ボックス 2:スリット板 3:搬送ロール 4:ガラスリボン 5:2次元CCDカメラ 6:画像処理装置 1: light source box 2: slit plate 3: transport roll 4: glass ribbon 5: two-dimensional CCD camera 6: image processing device

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】ガラス板の欠点を検出する検出装置であっ
て、 ガラス板を成形時の引き出し方向に略平行に搬送する搬
送手段と、 複数の帯状光源からなりその帯の長手方向がガラス板の
成形時の引き出し方向と20度以下の角度をなす光源部
と、 ガラス板を挟んで光源部と反対側に配置されガラス板の
位置もしくはその近傍に焦点を合わせてなる撮像装置
と、 前記撮像装置からの信号を受けて画像処理する画像処理
装置とを備え、 前記複数の帯状光源の帯幅、及び互いの間隔が5〜50
mmの範囲に設定されていることを特徴とするガラス板
の欠点検出装置。
1. A detecting device for detecting a defect of a glass plate, comprising: conveying means for conveying the glass plate substantially in parallel with a drawing direction at the time of molding; A light source unit at an angle of 20 degrees or less with respect to the drawing direction at the time of molding, an imaging device arranged on the opposite side of the light source unit with the glass plate interposed therebetween, and focusing on or near the position of the glass plate; An image processing device that receives a signal from the device and performs image processing, wherein the band widths of the plurality of band-shaped light sources and the distance between each other are 5 to 50.
A defect detecting device for a glass plate, which is set in the range of mm.
【請求項2】帯状光源の帯の長手方向とガラス板の成形
時の引き出し方向とが実質的に平行である請求項1記載
のガラス板の欠点検出装置。
2. The glass sheet defect detecting apparatus according to claim 1, wherein the longitudinal direction of the band of the band-shaped light source is substantially parallel to the drawing direction at the time of forming the glass plate.
【請求項3】帯状光源の帯の長手方向とガラス板の成形
時の引き出し方向とが5〜20度の角度をなす請求項1
記載のガラス板の欠点検出装置。
3. The method according to claim 1, wherein the longitudinal direction of the band of the band-shaped light source and the drawing direction at the time of molding the glass plate form an angle of 5 to 20 degrees.
A defect detecting device for the glass plate described in the above.
【請求項4】ガラス板がガラス板成形装置から引き出さ
れたガラスリボンである請求項1、2又は3記載のガラ
ス板の欠点検出装置。
4. The apparatus according to claim 1, wherein the glass sheet is a glass ribbon drawn from a glass sheet forming apparatus.
JP8262183A 1996-10-02 1996-10-02 Detecting equipment of flaw of glass plate Withdrawn JPH10111252A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8262183A JPH10111252A (en) 1996-10-02 1996-10-02 Detecting equipment of flaw of glass plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8262183A JPH10111252A (en) 1996-10-02 1996-10-02 Detecting equipment of flaw of glass plate

Publications (1)

Publication Number Publication Date
JPH10111252A true JPH10111252A (en) 1998-04-28

Family

ID=17372228

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8262183A Withdrawn JPH10111252A (en) 1996-10-02 1996-10-02 Detecting equipment of flaw of glass plate

Country Status (1)

Country Link
JP (1) JPH10111252A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002507742A (en) * 1998-03-25 2002-03-12 ラゾー ラザー ゾルター ゲーエムベーハー Method and apparatus for detecting defects in sheet glass, especially drips, threads and lines
JP2002286656A (en) * 2001-01-22 2002-10-03 Hitachi Electronics Eng Co Ltd Substrate inspection apparatus
JP2013524192A (en) * 2010-04-01 2013-06-17 サン−ゴバン グラス フランス Apparatus and method for analyzing optical quality of transparent substrate
JP2013124863A (en) * 2011-12-13 2013-06-24 Smics Co Ltd Line light source
JP2014169977A (en) * 2013-03-05 2014-09-18 Mecc Co Ltd Defect inspection apparatus, defect inspection method and lighting device
JP2021092504A (en) * 2019-12-12 2021-06-17 日本電気硝子株式会社 Transparent pipe inspection device and transparent pipe inspection method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0674907A (en) * 1992-06-26 1994-03-18 Central Glass Co Ltd Detection method for defect of tranparent plate-like body
JPH07110302A (en) * 1993-10-13 1995-04-25 Hajime Sangyo Kk Defect detector for transparent board

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0674907A (en) * 1992-06-26 1994-03-18 Central Glass Co Ltd Detection method for defect of tranparent plate-like body
JPH07110302A (en) * 1993-10-13 1995-04-25 Hajime Sangyo Kk Defect detector for transparent board

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002507742A (en) * 1998-03-25 2002-03-12 ラゾー ラザー ゾルター ゲーエムベーハー Method and apparatus for detecting defects in sheet glass, especially drips, threads and lines
JP2002286656A (en) * 2001-01-22 2002-10-03 Hitachi Electronics Eng Co Ltd Substrate inspection apparatus
JP2013524192A (en) * 2010-04-01 2013-06-17 サン−ゴバン グラス フランス Apparatus and method for analyzing optical quality of transparent substrate
EP2553439B1 (en) * 2010-04-01 2019-08-14 Saint-Gobain Glass France Method and device for the analysis of the optical quality of a transparent substrate
JP2013124863A (en) * 2011-12-13 2013-06-24 Smics Co Ltd Line light source
JP2014169977A (en) * 2013-03-05 2014-09-18 Mecc Co Ltd Defect inspection apparatus, defect inspection method and lighting device
JP2021092504A (en) * 2019-12-12 2021-06-17 日本電気硝子株式会社 Transparent pipe inspection device and transparent pipe inspection method

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