JPH0729637Y2 - 半導体素子測定用治具 - Google Patents
半導体素子測定用治具Info
- Publication number
- JPH0729637Y2 JPH0729637Y2 JP1987069228U JP6922887U JPH0729637Y2 JP H0729637 Y2 JPH0729637 Y2 JP H0729637Y2 JP 1987069228 U JP1987069228 U JP 1987069228U JP 6922887 U JP6922887 U JP 6922887U JP H0729637 Y2 JPH0729637 Y2 JP H0729637Y2
- Authority
- JP
- Japan
- Prior art keywords
- tape
- chip
- wafer ring
- wafer
- attached
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000004065 semiconductor Substances 0.000 title claims description 17
- 238000005259 measurement Methods 0.000 title claims description 15
- 239000000523 sample Substances 0.000 claims description 13
- 230000000295 complement effect Effects 0.000 claims description 4
- 239000004615 ingredient Substances 0.000 claims 1
- 238000000034 method Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 230000006866 deterioration Effects 0.000 description 2
- 229910003460 diamond Inorganic materials 0.000 description 2
- 239000010432 diamond Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000002950 deficient Effects 0.000 description 1
- 230000002542 deteriorative effect Effects 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987069228U JPH0729637Y2 (ja) | 1987-05-09 | 1987-05-09 | 半導体素子測定用治具 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987069228U JPH0729637Y2 (ja) | 1987-05-09 | 1987-05-09 | 半導体素子測定用治具 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63178333U JPS63178333U (en, 2012) | 1988-11-18 |
| JPH0729637Y2 true JPH0729637Y2 (ja) | 1995-07-05 |
Family
ID=30909767
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987069228U Expired - Lifetime JPH0729637Y2 (ja) | 1987-05-09 | 1987-05-09 | 半導体素子測定用治具 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0729637Y2 (en, 2012) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5243101B2 (ja) * | 2008-05-14 | 2013-07-24 | 株式会社ディスコ | 破断装置 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5378173A (en) * | 1976-12-22 | 1978-07-11 | Toshiba Corp | Manufacture of semiconductor device |
| JPS5478080A (en) * | 1977-12-05 | 1979-06-21 | Toshiba Corp | Production of semiconductor element |
| JPS5483774A (en) * | 1977-12-16 | 1979-07-04 | Nec Corp | Manufacture of semiconductor device |
| JPS59130437A (ja) * | 1983-01-17 | 1984-07-27 | Nec Home Electronics Ltd | 半導体装置の選別方法 |
| JPS61187247A (ja) * | 1985-02-14 | 1986-08-20 | Nec Kansai Ltd | 半導体装置の製造方法 |
-
1987
- 1987-05-09 JP JP1987069228U patent/JPH0729637Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63178333U (en, 2012) | 1988-11-18 |
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