JPH07294585A - Electric continuity inspection method of electronic parts - Google Patents

Electric continuity inspection method of electronic parts

Info

Publication number
JPH07294585A
JPH07294585A JP6083143A JP8314394A JPH07294585A JP H07294585 A JPH07294585 A JP H07294585A JP 6083143 A JP6083143 A JP 6083143A JP 8314394 A JP8314394 A JP 8314394A JP H07294585 A JPH07294585 A JP H07294585A
Authority
JP
Japan
Prior art keywords
adhesive
electrodes
electrode
inspection
adhesive layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6083143A
Other languages
Japanese (ja)
Inventor
Isao Tsukagoshi
功 塚越
Toshishige Uehara
寿茂 上原
Tomohisa Ota
共久 太田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Showa Denko Materials Co Ltd
Original Assignee
Hitachi Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Chemical Co Ltd filed Critical Hitachi Chemical Co Ltd
Priority to JP6083143A priority Critical patent/JPH07294585A/en
Publication of JPH07294585A publication Critical patent/JPH07294585A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To provide an economical adhesive for inspecting electronic parts without requiring much labor and time which can be peeled and eliminated when performing the conduction inspection of a high-density electrode such as a semiconductor chip. CONSTITUTION:An adhesive layer which can be eliminated after an inspection process is formed between an electrode where at least one of opposing electrodes protrudes from a substrate surface and the other opposing electrode, and then is pressed to cause a surplus adhesive layer to flow out to be eliminated from the opposing electrode part and, at the same time, the electrodes to obtain contact state with each other. Both electrodes are adhered and fixed so that they do not deviate in that state and then a conduction inspection is performed. then, the adhesive layer is eliminated from a substrate surface containing the electrodes.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は、半導体チップ等およ
び高密度電極を有する電子部品の通電検査方法に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for inspecting electrical conduction of electronic parts having semiconductor chips and high density electrodes.

【0002】[0002]

【従来の技術】従来、半導体チップ等および高密度電極
を有する電子部品の検査法としては、電気特性が未知の
電子部品の電極から、電気特性が既知の電極を経由し
て、抵抗計などの測定器により電気特性を評価する通電
検査法が行われている。通電検査は、供試体の回路の断
線や隣接回路との絶縁性などの電気特性の把握や、部品
の駆動性や出力特性などの機能チェックなどの点から極
めて重要である。
2. Description of the Related Art Conventionally, as a method of inspecting an electronic component having a semiconductor chip or the like and a high-density electrode, an electrode of an electronic component whose electrical characteristic is unknown is passed through an electrode whose electrical characteristic is known, and a resistance meter, etc. An electric current inspection method for evaluating electric characteristics by a measuring instrument is performed. The energization inspection is extremely important from the viewpoints of grasping the electrical characteristics such as the disconnection of the circuit of the test piece and the insulation with the adjacent circuit, and the function check such as the driveability and output characteristics of the parts.

【0003】このとき、異なる部品間の電気的導通を得
る方法としては、接触端子を有するプローブによる触針
法や、硬化性の接着剤を両電極間に配し、未硬化もしく
は半硬化状態で通電検査を行う方法、あるいは導電体が
表裏もしくは一方の面に露出、もしくは突出した異方導
電性シート類を用いる方法が知られている。
At this time, as a method for obtaining electrical continuity between different parts, a stylus method using a probe having a contact terminal or a curable adhesive is placed between both electrodes to obtain an uncured or semi-cured state. There is known a method of conducting an electric current inspection, or a method of using anisotropically conductive sheets in which a conductor is exposed or projected on the front and back or one surface.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、上記プ
ローブによる触針法は、最近の電極の高密度化に対応で
きないという分解能の不足や、微細なプローブが各端子
ごとに必要なため高価になるという問題がある。
However, the stylus method using the above probe is expensive because it cannot cope with the recent high density of electrodes and lacks resolution and requires a fine probe for each terminal. There's a problem.

【0005】また、接着剤の硬化が不十分な状態下で検
査を行う方法は、不良部品を取り除く際に、熱や溶剤に
より比較的簡単に行うことが可能である。ところが接着
剤の硬化状態が過剰であると剥離が困難となり、硬化が
不足であると不良部品に未剥離部や板面汚染などの移行
を生じるため、硬化状態の厳密なコントロールが必要で
あるという問題が生じている。さらにこの方法では、部
品を加熱することにより接着剤の未硬化分の硬化が促進
され部品の剥離が困難となるため、所定温度に加熱した
半導体チップなどの電子部品に電圧を印加し初期不良部
品を取り除く、いわゆるバーンイン試験が採用できない
という問題もある。
Further, the method of inspecting under the condition where the adhesive is not sufficiently cured can be relatively easily carried out by using heat or a solvent when removing defective parts. However, if the adhesive is hardened excessively, peeling becomes difficult, and if the adhesive is insufficiently hardened, strict control of the hardened state is necessary because defective parts may migrate to unpeeled parts or plate surface contamination. There is a problem. Furthermore, in this method, by heating the component, the curing of the uncured portion of the adhesive is promoted and peeling of the component becomes difficult, so a voltage is applied to an electronic component such as a semiconductor chip heated to a predetermined temperature to cause an initial defective component. There is also a problem that the so-called burn-in test cannot be adopted.

【0006】さらに異方導電性シート類を用いる方法
は、該異方導電性シート類の製造が、例えばレーザ光な
どで微細な貫通孔を設け、そこにめっき等により導電体
を形成するために、高分解能品は得られるものの製造コ
ストが高くなるため、高価で実用化しにくいという問題
がある。また、電極対応部に導電体が形成されたシート
の場合、両電極と異方導電性シート類の導電体との面倒
な位置合わせが必要となる等、工程的にも高価となって
しまう。
Further, the method of using anisotropically conductive sheets is such that the anisotropically conductive sheets are manufactured by forming fine through holes with, for example, a laser beam and forming conductors thereon by plating or the like. However, although a high-resolution product can be obtained, the manufacturing cost becomes high, and there is a problem that it is expensive and difficult to put into practical use. Further, in the case of a sheet in which a conductor is formed in the electrode corresponding portion, it is necessary to perform troublesome alignment between both electrodes and the conductor of the anisotropic conductive sheet, which makes the process expensive.

【0007】そこで、この発明は上記問題を解決すべく
なされたもので、半導体チップなどの高密度電極の通電
検査に剥離除去でき、手間のかからない経済的な電子部
品の通電検査方法を提供することを目的をする。
Therefore, the present invention has been made to solve the above-mentioned problems, and provides an economical method for conducting electricity inspection of electronic parts, which can be removed by peeling and removing for electricity inspection of high density electrodes such as semiconductor chips. To the purpose.

【0008】[0008]

【課題を解決するための手段】上記目的を達成するた
め、相対峙する電極の少なくとも一方が基板面より突出
した電極と、他方の対向する電極との間に下記(イ)〜
(ニ)群より選ばれた1種もしくは2種以上の複合系か
らなる接着剤層を形成し、加圧により相対峙する電極の
接触を得た状態で両電極を固定して、電気特性が未知の
電子部品の通電検査を行い、検査終了後に電子部品の電
極を含む基板面から上記接着剤層を除去することを特徴
とする。 (イ)界面活性剤を含有もしくは、表面層に形成した粘
接着剤 (ロ)親水性物質を含有もしくは、表面層に形成した粘
接着剤 (ハ)剥離剤を含有もしくは、表面層に形成した粘接着
剤 (ニ)ガラス転移点が室温近辺の粘接着剤 この発明に用いる接着剤は、加圧により対向電極の接触
とその保持が可能であり、検査終了後に電子部品の電極
を含む基板面から接着剤層を剥離除去できることを特徴
とするものである。除去の方法は、室温で剥離可能なこ
とが好ましいが、加熱、超音波、強制攪拌、紫外線や電
子線などのエネルギー線照射、水や溶剤に浸漬や噴射な
どを、単独もしくは組み合わせて適用できる。
In order to achieve the above object, the following (a) to (b) are provided between an electrode in which at least one of the electrodes facing each other protrudes from the substrate surface and the other opposing electrode.
An adhesive layer made of a composite system of one or more selected from the group (d) is formed, and both electrodes are fixed in a state of contacting the electrodes facing each other by pressurization, and the electrical characteristics are A feature of the present invention is that an unknown electronic component is inspected for electricity, and after the inspection is completed, the adhesive layer is removed from the surface of the substrate including the electrodes of the electronic component. (A) Adhesive containing a surfactant or formed on the surface layer (b) containing a hydrophilic substance or forming an adhesive on the surface layer (c) containing a peeling agent or forming a surface layer Adhesive adhesive formed (d) Adhesive adhesive having a glass transition point near room temperature The adhesive used in the present invention can contact and hold the counter electrode by pressurization, and after completion of the inspection, the electrode of the electronic component It is characterized in that the adhesive layer can be peeled and removed from the surface of the substrate including. The method of removal is preferably peelable at room temperature, but heating, ultrasonic waves, forced agitation, irradiation with energy rays such as ultraviolet rays and electron beams, immersion in water or a solvent, and spraying can be applied alone or in combination.

【0009】この発明に用いる検査終了後に除去可能な
接着剤層は、上記(イ)〜(ニ)群より選ばれた一種も
しくはそれ以上の複合系として、電極の接触条件や剥離
の方法を考慮して決定する。
The adhesive layer that can be removed after the inspection used in the present invention is one or more composite systems selected from the above groups (a) to (d), and the contact conditions of the electrodes and the peeling method are taken into consideration. And decide.

【0010】これらのなかで(イ)や(ロ)の場合、特
に水を媒体として除去する場合に、これらが接着界面に
水溶性の層を形成し簡単に剥離できるので好ましい。こ
の場合、粘接着剤の吸水率(JIS、K7209)を
0.5%以上と大きくすることが剥離性を向上できるの
で好ましく、1〜20%とすることがより好ましい。
Of these, the cases (a) and (b) are preferable, especially when water is removed as a medium, because they form a water-soluble layer at the adhesive interface and can be easily peeled off. In this case, it is preferable to increase the water absorption rate (JIS, K7209) of the adhesive agent to 0.5% or more because the releasability can be improved, and it is more preferably 1 to 20%.

【0011】(ハ)や(ニ)の場合、空気中で剥離除去
することが可能である。(ハ)の場合、接着界面の表面
張力を低くして剥離を容易にする。(ニ)の場合は、ガ
ラス転移点(以下、Tgという)以下で硬く脆くなりT
g以上で軟化する高分子の性質を利用することで、電極
の接触と剥離の条件を満足させるものである。
In the case of (c) and (d), it is possible to peel and remove in air. In the case of (c), the surface tension of the adhesive interface is lowered to facilitate peeling. In the case of (d), it becomes hard and brittle below the glass transition point (hereinafter referred to as Tg), and T
By utilizing the property of the polymer that is softened at g or more, the conditions of contact and peeling of the electrode are satisfied.

【0012】界面活性剤を含有もしくは表面層に形成し
た粘接着剤としては、水などの媒体中にアクリル酸エス
テルや、ゴム類、オレフィン類などの接着性樹脂を界面
活性剤で分散したエマルジョン系が代表的である。界面
活性剤としてはアニオン性、ノニオン性、カチオン性、
両性の各種のものが適用できる。これらは水溶性である
と、水を媒体として剥離する場合に好ましい。また電極
の腐食性を考慮すると、ポリオキシエチレンアルキルエ
ーテル類、ソルビタン脂肪酸エステル類、ポリオキシエ
チレンアシルエステル類などのノニオン性であることが
好ましい。
The tacky adhesive containing a surface active agent or formed in the surface layer is an emulsion prepared by dispersing an acrylic acid ester or an adhesive resin such as rubbers or olefins in a medium such as water with a surface active agent. The system is typical. As the surfactant, anionic, nonionic, cationic,
Various types of both sexes can be applied. It is preferable that these are water-soluble when peeling using water as a medium. Further, in consideration of the corrosiveness of the electrode, it is preferably nonionic such as polyoxyethylene alkyl ethers, sorbitan fatty acid esters, and polyoxyethylene acyl esters.

【0013】親水性物質としては、アルコール類や、グ
リコール系やグリセリンなどの多価アルコール類、カル
ボキシル基や水酸基などの極性基含有物質、あるいはC
3COOK、CaCl2 などの潮解性物質などを例示
できる。
As the hydrophilic substance, alcohols, polyhydric alcohols such as glycol and glycerin, polar group-containing substances such as carboxyl group and hydroxyl group, or C
Examples include deliquescent substances such as H 3 COOK and CaCl 2 .

【0014】また、例えば多価アルコール類などの親水
性基を有する光硬化性液状樹脂などを、電極間に介在さ
せ未硬化状態で電極の接触を得た後に、硬化させて凝集
力の上昇による電極の固定を得て、導通検査後に剥離す
る方法などもある。
Further, for example, a photocurable liquid resin having a hydrophilic group such as polyhydric alcohol is interposed between the electrodes to obtain contact with the electrodes in an uncured state, and then cured to increase cohesive force. There is also a method in which the electrodes are fixed and then peeled off after the continuity test.

【0015】剥離剤としては、例えばシリコーンやフッ
ソ系などの低表面張力物質が代表的であり、これらは表
面張力35dyn/cm以下であるものが好ましい。
Typical examples of the release agent are low surface tension substances such as silicone and fluorine, and those having a surface tension of 35 dyn / cm or less are preferable.

【0016】Tgが室温近辺(0〜50℃、好ましくは
15〜35℃)の粘接着剤としては、Tgの異なるモノ
マの共重合で任意に設定可能なアクリル酸エステル類な
どがある。特にエステルの炭素数が12以上の長鎖状で
あるとTgが融点的に作用するので、温度活性がシャー
プとなり貼付けと剥離の温度差をわずかとすることが可
能であり好ましい。
Examples of the adhesive having Tg around room temperature (0 to 50 ° C., preferably 15 to 35 ° C.) include acrylic acid esters which can be arbitrarily set by copolymerization of monomers having different Tg. In particular, when the ester has a long-chain form having 12 or more carbon atoms, Tg acts like a melting point, so that temperature activity becomes sharp and a temperature difference between pasting and peeling can be made small, which is preferable.

【0017】この発明に用いる基板面より突出した電極
とは、基板面よりわずかでも突出していればよく、いわ
ゆるバンプ付半導体チップ類が代表的である。また、絶
縁基板上に銅箔などの突出した電極を有する印刷回路板
などもある。
The electrode projecting from the substrate surface used in the present invention is only required to project slightly from the substrate surface, and so-called bumped semiconductor chips are typical. There is also a printed circuit board having protruding electrodes such as copper foil on an insulating substrate.

【0018】相対峙する電極の少なくとも一方が基板面
より突出していれば、他の対向する電極は、例えば薄膜
法やアディティブ法などで得た、いわゆる平面電極やバ
ンプレス半導体チップ類の場合のような凹状電極でもよ
い。バンプレス半導体チップ類の電極は、表面絶縁層か
ら数ミクロン程度凹状に形成されるが、この場合も相対
峙する電極が基板面より突出する(例えば転写バンプな
ど)ことで適用可能である。
If at least one of the electrodes facing each other is projected from the surface of the substrate, the other opposing electrodes are, for example, so-called flat electrodes and bumpless semiconductor chips obtained by a thin film method or an additive method. A concave electrode may be used. The electrodes of the bumpless semiconductor chips are formed in a concave shape of about several microns from the surface insulating layer, but in this case as well, the electrodes facing each other can be applied by projecting from the substrate surface (for example, transfer bumps or the like).

【0019】加圧により相対峙する電極の接触を得る方
法は、剥離可能な接着剤層が液状であれば室温で可能で
あるが、高分子量物を基本材料とした場合には加熱や超
音波を併用することもできる。電極の接触を得るために
は、加熱などによりその粘度を100ポイズ以下とする
ことが好ましい。
The method of contacting the electrodes facing each other by pressurization can be carried out at room temperature as long as the peelable adhesive layer is liquid, but when a high molecular weight material is used as a basic material, heating or ultrasonic wave is used. Can also be used together. In order to obtain contact with the electrodes, it is preferable to set the viscosity to 100 poise or less by heating or the like.

【0020】接着固定は、例えば接着剤層がフィルム状
であれば加熱溶融後の冷却により、液状物の場合は架橋
によるなどして接着剤の凝集力を向上すればよい。また
必要に応じて、検査装置などの加圧手段を併用すること
ができる。
The adhesive fixing may be carried out by, for example, improving the cohesive force of the adhesive by cooling after heating and melting when the adhesive layer is in the form of a film and by crosslinking in the case of a liquid material. If necessary, a pressurizing means such as an inspection device can be used together.

【0021】剥離可能な接着剤層がフィルム状の場合、
塗工工程が不要であり一定厚みの連続状で供給可能なこ
とから、工程の自動化が図れるのでコスト低減にも有効
である。また、例えば検査用電極を有する配線板上に事
前に形成しておくことも可能であり、当該フィルム付回
路板も貼付等で簡単に得られる。このとき接着剤が粘着
性を有すると電極の位置合わせや仮固定が容易となり好
ましい。
When the peelable adhesive layer is in the form of a film,
Since the coating process is not required and the product can be continuously supplied with a constant thickness, the process can be automated, which is effective for cost reduction. Further, it can be formed in advance on a wiring board having an inspection electrode, for example, and the circuit board with film can be easily obtained by pasting or the like. At this time, it is preferable that the adhesive has tackiness because the electrodes can be easily aligned and temporarily fixed.

【0022】さらに、接着剤中に導電性粒子を添加する
ことで、相対峙する電極の接触をより効率的に得ること
も可能である。この場合に注意すべきことは、粒径を隣
接電極間距離よりも小さくすることや、添加量を15体
積%以下好ましくは12体積%以下として、隣接電極と
ショートさせないことである。
Furthermore, by adding conductive particles to the adhesive, it is possible to more efficiently obtain contact between the electrodes facing each other. In this case, it should be noted that the particle size is made smaller than the distance between the adjacent electrodes, and the addition amount is set to 15% by volume or less, preferably 12% by volume or less so as not to short-circuit with the adjacent electrodes.

【0023】通電検査の後、電極を含む基板面から接着
剤層を除去することで、次工程で正常品のみを基板に実
装できる。このとき剥離可能な条件として、剥離時の引
っ張り強度を5kg/cm2 以上、好ましく15kg/
cm2 以上とすることで、取扱いが容易なフィルム状態
での剥離が可能となり好ましい。
By removing the adhesive layer from the surface of the substrate including the electrodes after the electric current inspection, only normal products can be mounted on the substrate in the next step. At this time, the peelable condition is that the peeling strength is 5 kg / cm 2 or more, preferably 15 kg / cm 2.
When it is at least 2 cm 2 , peeling in a film state that is easy to handle is possible, which is preferable.

【0024】実装の方法は、いわゆるフリップチップ
や、ワイヤボンディングなどの一般的な方法が採用可能
であるが、前工程でこの発明の接着剤による導通検査を
行っているので、同様な工程や材料を用いることが可能
な、例えばエポキシ系などの接着剤による接合法である
と作業が簡略化できるので好ましい。
As a mounting method, a general method such as so-called flip chip or wire bonding can be adopted. However, since the continuity test is performed by the adhesive of the present invention in the previous step, the same steps and materials are used. It is preferable to use a bonding method using an adhesive such as an epoxy resin because the work can be simplified.

【0025】接着剤層には、上述の除去可能な接着剤層
と同様に導電性粒子を添加することが相対峙する電極と
の接触が得やすいので好ましいが、電極との接触が可能
であれば必ずしも必要でない。
Like the above-mentioned removable adhesive layer, it is preferable to add conductive particles to the adhesive layer, because it is easy to obtain contact with the electrodes facing each other, but contact with the electrodes is possible. If not necessary.

【0026】[0026]

【作用】この発明によれば、相対峙する電極の少なくと
も一方が基板面より突出した電極と他方の対向する電極
との間に検査工程後に除去可能な接着剤層を形成し、加
圧すると相対峙する電極部より接着剤層が流動排除され
るとともに、電極の接触が得られ、その状態で両電極が
ずれない程度に接着固定される。そのため、両電極の接
触のみの低抵抗下で通電検査を行えるので、正確な電気
特性の判定が可能となる。また、両電極がずれない程度
に接着固定されるので、通電検査時における外部からの
加圧に対しても、電極のずれがなく正確な電気特性の判
定が可能となる。
According to the present invention, an adhesive layer which can be removed after the inspection step is formed between at least one of the electrodes facing each other and the other of the electrodes protruding from the substrate surface and the other facing electrode. The flow of the adhesive layer is eliminated from the facing electrode portion, the electrodes are brought into contact with each other, and in that state, the two electrodes are adhesively fixed to such an extent that they do not shift. For this reason, since the energization inspection can be performed under the low resistance of only the contact of both electrodes, it is possible to accurately determine the electrical characteristics. Further, since both electrodes are bonded and fixed to the extent that they do not shift, even if pressure is applied from the outside during the energization test, there is no displacement of the electrodes, and accurate electrical characteristics can be determined.

【0027】この発明の接着剤は、検査工程後に除去可
能な接着剤層を用いることから、バーンイン試験などの
加熱条件下でも適用可能である。通電通検査の後、正常
品について電極を含む基板面から接着剤層を剥離除去す
ることで、正常品のみを基板に実装できるので、工程が
簡単である。実装が接着剤による接合法の場合には、通
電検査と同様な工程や有機接着材料を用いることができ
るので、低価格化や信頼性向上も合わせて得られる。
Since the adhesive of the present invention uses an adhesive layer that can be removed after the inspection step, it can be applied even under heating conditions such as a burn-in test. After the current-carrying inspection, by removing the adhesive layer from the surface of the substrate including the electrodes of the normal product, only the normal product can be mounted on the substrate, so that the process is simple. When the mounting is a bonding method using an adhesive, the same process as that for the current inspection and the organic adhesive material can be used, so that the cost can be reduced and the reliability can be improved.

【0028】この発明によれば、相対峙する電極の少な
くとも一方が基板面より突出した電極と他の対向する電
極との位置合わせにより通電検査が可能である。そのた
め、突起電極を有する半導体ウエハのような大面積状の
場合も、これに対応する回路基板を準備するだけで対応
できるので低コストな検査が可能となる。この場合の回
路基板として、高精細加工が容易な平面電極を採用でき
るメリットがある。
According to the present invention, the conduction inspection can be performed by aligning the electrode in which at least one of the electrodes facing each other protrudes from the surface of the substrate and the other facing electrode. Therefore, even in the case of a large area such as a semiconductor wafer having a protruding electrode, it is possible to deal with it by simply preparing a circuit board corresponding to it, so that a low cost inspection can be performed. As a circuit board in this case, there is an advantage that a plane electrode that can be easily processed with high precision is adopted.

【0029】[0029]

【実施例】以下、この発明を実施例に基づいて詳細に説
明するが、この発明は以下に記載する実施例に限定され
るものではない。
EXAMPLES The present invention will now be described in detail based on examples, but the present invention is not limited to the examples described below.

【0030】まず、この発明の第1実施例を説明する。First, a first embodiment of the present invention will be described.

【0031】電気特性が未検査のICチップ(2×10
mm、厚さ0.5mm、4辺周囲にバンプと呼ばれる5
0μm角、高さ20μmの金電極が200個形成、バン
プ部以外の表面はポリイミドの絶縁膜)と、導電性が検
査済のガラス電極(厚さ1.1mmのガラス上にNi/
Au=0.5/0.1μmの薄膜回路を上記ICチップ
のバンプ電極のサイズに対応して形成し、ガラス周縁に
リードとして延出させ周辺部の回路幅を200μmに拡
大した測定パッドを有する平面電極)との間に、次に述
べる剥離可能な接着剤層を形成した。
An IC chip (2 × 10
mm, thickness 0.5 mm, 5 around the four sides called bumps
200 gold electrodes of 0 μm square and 20 μm in height are formed. A polyimide insulating film is formed on the surface other than the bump portion, and a glass electrode whose conductivity has been tested (1.1 / mm thick glass is Ni /
A thin film circuit of Au = 0.5 / 0.1 μm is formed corresponding to the size of the bump electrode of the IC chip, and has a measurement pad that extends as a lead on the periphery of the glass and expands the circuit width of the peripheral portion to 200 μm. A peelable adhesive layer described below was formed between the adhesive layer and the flat electrode.

【0032】アクリル系粘着剤(Tg35℃、分子量5
0万、自己架橋型、ノニオン系界面活性剤含有)のエマ
ルジョン液(固形分45%)を、セパレータ(シリコー
ン処理ポリエチレンテレフタレートフィルム、厚み40
μm)にロールコータで塗布し、120℃20分乾燥し
架橋した厚み20μmの粘着剤フィルムを得た。このフ
ィルムの吸水率(JIS、K7209)は2.4%であ
った。
Acrylic adhesive (Tg 35 ° C., molecular weight 5
An emulsion liquid (solid content: 45%) of 0,000, self-crosslinking type, containing a nonionic surfactant was used as a separator (silicone-treated polyethylene terephthalate film, thickness 40).
μm) was coated with a roll coater and dried at 120 ° C. for 20 minutes to obtain a crosslinked adhesive film having a thickness of 20 μm. The water absorption rate (JIS, K7209) of this film was 2.4%.

【0033】このフィルムをガラス電極上のICチップ
搭載部に貼り付け、セパレータを剥離し、ICチップを
のせて電極の位置合わせを行った後、50℃、20kg
f/mm2 、5秒で加熱加圧した。この接続体につい
て、ガラス電極リードを用いて未検査のICチップの通
電検査が可能であった。また通電検査は、市販のTAB
検査用のソケット装置付属のシリコーンゴム製クッショ
ン材を用いて加圧下で行う事でより有効であり、この装
置を用いて100℃で加熱し5ボルトを印加したバーン
イン評価も可能であった。
This film was attached to the IC chip mounting portion on the glass electrode, the separator was peeled off, the IC chip was placed and the electrodes were aligned, and then 50 ° C. and 20 kg.
It was heated and pressed at f / mm 2 for 5 seconds. With respect to this connection body, it was possible to carry out an electrical inspection of an uninspected IC chip using a glass electrode lead. In addition, the current test is a commercially available TAB
It is more effective to perform under pressure using a silicone rubber cushion material attached to the socket device for inspection, and burn-in evaluation in which 5 V is applied by heating at 100 ° C. using this device was also possible.

【0034】通電検査終了後の接続体を、70℃純水中
に10分浸漬したところ、フィルムはガラス電極および
ICチップから綺麗に剥離した。
After the completion of the electric current inspection, the connection body was immersed in pure water at 70 ° C. for 10 minutes, whereby the film was peeled off from the glass electrode and the IC chip.

【0035】その後、ICチップを純水およびエタノー
ルで洗浄および乾燥し、液晶パネル用ガラス電極にアニ
ソルムAC−7144(異方導電フィルム、分解能14
本/mm,エポキシ系熱硬化系接着剤に粒径5μmのプ
ラスチックにめっきした導電粒子含有、日立化成工業株
式会社の商品名)で160℃、30kgf/mm2 、1
5秒で接続したところ、良好な表示特性を得た。
After that, the IC chip was washed with pure water and ethanol and dried, and anisorum AC-7144 (anisotropic conductive film, resolution 14) was formed on the glass electrode for the liquid crystal panel.
Book / mm, containing conductive particles plated with epoxy thermosetting adhesive on a plastic having a particle size of 5 μm, trade name of Hitachi Chemical Co., Ltd.) 160 ° C., 30 kgf / mm 2 , 1
When connected in 5 seconds, good display characteristics were obtained.

【0036】この実施例では、エマルジョン型アクリル
系粘着制に含有された界面活性剤が加熱された純水に浸
漬されたことで、界面力を低下させて剥離可能となった
と見られる。また粘着剤の有するタックにより、電極の
位置合わせが容易であった。さらに接続を通電検査と同
様な工程や有機材料を用いることができ、160℃とい
う比較的低温下の接続作業が可能であった。
In this example, it is considered that the surfactant contained in the emulsion type acrylic pressure-sensitive adhesive was immersed in the heated pure water to reduce the interfacial force and enable the peeling. In addition, the tack of the pressure-sensitive adhesive facilitated the alignment of the electrodes. Further, the connection can use the same process as that for the electric current inspection and the organic material, and the connection work at a relatively low temperature of 160 ° C. was possible.

【0037】次に、第2実施例を説明する。この第2実
施例では、剥離可能な接着剤層を変更したが、他の条件
は第1実施例と同様とした。
Next, a second embodiment will be described. In this second embodiment, the peelable adhesive layer was changed, but the other conditions were the same as in the first embodiment.

【0038】アクリルゴム(Tg10℃、分子量60
万、官能基としてカルボキシル基2%含有)100重量
部とメチル化メラミン2部,とよりなる組成物をトルエ
ンに溶解した後セパレータ上に形成し、120℃10分
乾燥し、厚み10μmの粘着剤フィルムを得た。このフ
ィルムのセパレータを剥離し表面にグリセリンの1%メ
タノール液を均一にスプレして表面処理した。第1実施
例と同様に評価したところ、ICチップの通電検査が可
能であり、その後の剥離や接着剤による接続も良好であ
った。この実施例では、グリセリンが水溶性なので剥離
後の廃水処理が容易であり、接続時の洗浄も容易であっ
た。
Acrylic rubber (Tg 10 ° C., molecular weight 60
100 parts by weight of a functional group containing 2% of a carboxyl group) and 2 parts of methylated melamine are dissolved in toluene and then formed on a separator, dried at 120 ° C. for 10 minutes, and an adhesive having a thickness of 10 μm. I got a film. The separator of this film was peeled off, and a 1% methanol solution of glycerin was uniformly sprayed on the surface for surface treatment. When evaluated in the same manner as in the first example, it was possible to carry out an electric current inspection of the IC chip, and the subsequent peeling and connection with an adhesive were also good. In this example, since glycerin was water-soluble, wastewater treatment after peeling was easy, and cleaning at the time of connection was easy.

【0039】次に、第3実施例を説明する。この第3実
施例では、上記グリセリンに変えて縮合型シリコーン剥
離剤を用い、通電検査後の剥離は大気下の室温(25
℃)で行った。他の条件は第2実施例と同様とした。
Next, a third embodiment will be described. In the third embodiment, a condensation type silicone release agent is used in place of the glycerin, and the release after the electric current test is performed at room temperature (25
C.). Other conditions were the same as those in the second embodiment.

【0040】表面処理後のフィルム表面の表面張力は3
2dyn/cm(JIS、K6768)であった。この
場合もICチップの通電検査が可能であり、その後の剥
離も良好であった。この実施例では、フィルム面の表面
張力を32dyn/cmとすることで、大気中の室温で
の剥離が可能なため、作業が容易であった。シリコーン
剥離剤は、粘着剤と架橋されているので電極面に移行せ
ず、接続に支障無かった。
The surface tension of the film surface after the surface treatment is 3
It was 2 dyn / cm (JIS, K6768). In this case as well, it was possible to inspect the electric conduction of the IC chip, and the subsequent peeling was also good. In this example, by setting the surface tension of the film surface to 32 dyn / cm, peeling at room temperature in the atmosphere was possible, so the work was easy. Since the silicone release agent was cross-linked with the adhesive, it did not migrate to the electrode surface and there was no problem in connection.

【0041】第4実施例では、ポリエチレングリコール
のジアクリレート100重量部と、ベンゾフェノン3
部、ミヒラーケトン1部よりなる光硬化性樹脂(25℃
粘度、20ポイズ)をガラス電極上のICチップ搭載部
にディスペンサで形成し、ICチップをのせて電極の位
置合わせを行った後、ガラス下面から紫外線を照射(1
J/cm2 )して硬化させた。この場合もICチップの
通電検査が可能であり、その後の剥離や接着剤による接
続も良好であった。
In the fourth embodiment, 100 parts by weight of polyethylene glycol diacrylate and benzophenone 3 are used.
Part, photocurable resin consisting of 1 part of Michler's ketone (25 ° C
Viscosity, 20 poise) is formed on the glass electrode on the IC chip mounting part with a dispenser, the IC chip is placed and the electrodes are aligned, and then ultraviolet rays are irradiated from the lower surface of the glass (1
J / cm 2 ) and cured. In this case as well, it was possible to carry out an electric test of the IC chip, and the subsequent peeling and connection with an adhesive were also good.

【0042】この実施例では、材料が液状のため低粘度
であり室温下で電極の接触が得られた。また、セパレー
タを剥離する工程がなく簡単であり、透明な回路基板に
光不透過層を形成したところ、硬化の際に不要部の硬化
が甘くなり剥離がさらに容易となった。
In this example, since the material was liquid, the viscosity was low, and contact of the electrodes was obtained at room temperature. In addition, the step of peeling the separator was simple, and when the light-impermeable layer was formed on the transparent circuit board, the unnecessary portion was hardened during curing, and peeling became easier.

【0043】第5実施例では、エステルの炭素数が13
を主体とする粘着剤のTgを室温近辺とし、nヘプタン
/メチルエチルケトンの混合溶媒系のアクリル系粘着剤
(Tg25℃、分子量110万)とし、他の条件は第1
実施例と同様とした。この場合もICチップの通電通検
査が可能であり、その後も剥離も良好であった。
In the fifth embodiment, the ester has 13 carbon atoms.
The Tg of the pressure-sensitive adhesive mainly composed of is around room temperature, and it is an acrylic pressure-sensitive adhesive of mixed solvent system of n-heptane / methyl ethyl ketone (Tg 25 ° C., molecular weight 1.1 million), and other conditions are the first
The same as in the example. In this case as well, it was possible to carry out an electric conduction inspection of the IC chip, and the peeling was good after that.

【0044】この実施例では、Tgが室温近辺なので4
0℃加熱で電極の接触が得られ、剥離は10℃の環境下
で容易であった。さらにこの実施例の場合、分子量が大
きなことやTg以下の温度で剥離したことから、無架橋
でも剥離時の移行が発生しなかった。またTgが融点的
に作用し温度活性がシャープであるため、貼付けと剥離
の温度差をわずかとすることが可能となった。
In this embodiment, since Tg is near room temperature, 4
Contact of the electrodes was obtained by heating at 0 ° C, and peeling was easy under an environment of 10 ° C. Further, in the case of this example, since the molecular weight was large and peeling was carried out at a temperature of Tg or lower, migration did not occur during peeling even without crosslinking. Further, since Tg acts like a melting point and the temperature activity is sharp, it is possible to make the temperature difference between pasting and peeling small.

【0045】第6実施例では、粒径5μmのプラスチッ
クにめっきした導電粒子を1体積%添加し、他の条件は
第1実施例と同様とした。この実施例では、50℃、5
kgf/mm2 、5秒と加熱加圧と比較的低圧で導通が
得られ、通電検査が可能であった。また接着剤の凝集力
が大きいので剥離も容易であり粘着剤からの導電性粒子
の脱落がなく、剥離後の水中からフィルタにより回収し
再使用することも可能であった。
In the sixth embodiment, 1% by volume of conductive particles plated on plastic having a particle diameter of 5 μm was added, and the other conditions were the same as in the first embodiment. In this example, 50 ° C., 5
It was possible to conduct electricity at a relatively low pressure by heating and pressurizing at a pressure of kgf / mm 2 , 5 seconds, and it was possible to carry out an electrical inspection. Further, since the adhesive has a large cohesive force, it can be easily peeled off, the conductive particles do not fall off from the pressure-sensitive adhesive, and it was possible to collect and reuse from the water after peeling with a filter.

【0046】第7実施例は、上記アニソルムAC−71
44の表面を第3実施例と同様に縮合型シリコーン剥離
剤で処理し、他の条件は第1実施例と同様とした。この
実施例では、80℃、5kgf/mm2 、5秒で加熱加
圧した。この実施例の場合も通電検査が可能であり、硬
化性接着剤であるにもかかわらず剥離剤により室温での
剥離が可能であった。
The seventh embodiment is based on the above Anisorum AC-71.
The surface of No. 44 was treated with the condensation type silicone release agent as in the third example, and the other conditions were the same as in the first example. In this example, heating and pressing were performed at 80 ° C., 5 kgf / mm 2 , and 5 seconds. In the case of this example as well, it was possible to carry out an electric current inspection, and it was possible to peel at room temperature with a release agent even though it was a curable adhesive.

【0047】第8実施例は、接着剤として上記アニソル
ムAC−7144の導電粒子を添加せず、他の条件は第
1実施例と同様とした。この実施例の場合も両電極の接
触により通電検査が可能であり、その後の剥離や接着剤
による接続も良好で、接着固定による信頼性に優れた接
続が得られた。
In the eighth embodiment, the conductive particles of Anisolum AC-7144 described above were not added as an adhesive, and the other conditions were the same as in the first embodiment. In the case of this embodiment as well, it is possible to conduct an electric current test by contacting both electrodes, and the subsequent peeling and connection with an adhesive are also good, and a connection with excellent reliability by adhesive fixation was obtained.

【0048】[0048]

【発明の効果】以上説明したように、この発明によれ
ば、相対峙する電極との間に容易に剥離除去できる接着
剤で両電極を接触させ、該両電極の接触のみという低抵
抗下で通電検査を行えるので、正確な電気特性の判定が
可能となる。
As described above, according to the present invention, both electrodes are brought into contact with each other with an adhesive that can be easily peeled and removed from the electrodes facing each other, and only a contact between the both electrodes is performed under low resistance. Since the energization inspection can be performed, it is possible to accurately determine the electrical characteristics.

【0049】また、両電極がずれない程度に接着固定さ
れるので、通電検査時における外部からの加圧に対して
も、電極のずれがなく正確な電気特性の判定が可能とな
る。
Further, since both electrodes are adhered and fixed to the extent that they do not shift, even if pressure is applied from the outside during the energization inspection, there is no displacement of the electrodes and it is possible to accurately determine the electrical characteristics.

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 FI 技術表示箇所 H01L 21/66 S 7630−4M ─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 6 Identification code Office reference number FI technical display location H01L 21/66 S 7630-4M

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 相対峙する電極の少なくとも一方が基板
面より突出した電極と、 他方の対向する電極との間に下記(イ)〜(ニ)群より
選ばれた1種もしくは2種以上の複合系からなる接着剤
層を形成し、加圧により相対峙する電極の接触を得た状
態で両電極を固定して、電気特性が未知の電子部品の通
電検査を行い、検査終了後に電子部品の電極を含む基板
面から上記接着剤層を除去することを特徴とする電子部
品の通電検査方法。 (イ)界面活性剤を含有もしくは、表面層に形成した粘
接着剤 (ロ)親水性物質を含有もしくは、表面層に形成した粘
接着剤 (ハ)剥離剤を含有もしくは、表面層に形成した粘接着
剤 (ニ)ガラス転移点が室温近辺の粘接着剤
1. One or two or more kinds selected from the following groups (a) to (d) are provided between an electrode in which at least one of the electrodes facing each other protrudes from the substrate surface and the other facing electrode. An adhesive layer consisting of a composite system is formed, and both electrodes are fixed in a state where contact between the electrodes facing each other is obtained by pressurization, and an electric component is inspected for electrical characteristics. A method for inspecting electrical conduction of an electronic component, characterized in that the adhesive layer is removed from the surface of the substrate including the electrode. (A) Adhesive containing a surfactant or formed on the surface layer (b) containing a hydrophilic substance or forming an adhesive on the surface layer (c) containing a peeling agent or forming a surface layer Formed adhesive / adhesive (d) Adhesive / adhesive with glass transition temperature around room temperature
JP6083143A 1994-04-21 1994-04-21 Electric continuity inspection method of electronic parts Pending JPH07294585A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6083143A JPH07294585A (en) 1994-04-21 1994-04-21 Electric continuity inspection method of electronic parts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6083143A JPH07294585A (en) 1994-04-21 1994-04-21 Electric continuity inspection method of electronic parts

Related Child Applications (2)

Application Number Title Priority Date Filing Date
JP2005232134A Division JP2005338103A (en) 2005-08-10 2005-08-10 Energization test method of electronic component
JP2005232133A Division JP2006054463A (en) 2005-08-10 2005-08-10 Electric conduction inspection method of electronic component

Publications (1)

Publication Number Publication Date
JPH07294585A true JPH07294585A (en) 1995-11-10

Family

ID=13794000

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6083143A Pending JPH07294585A (en) 1994-04-21 1994-04-21 Electric continuity inspection method of electronic parts

Country Status (1)

Country Link
JP (1) JPH07294585A (en)

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US8048690B2 (en) 2007-11-08 2011-11-01 Nitto Denko Corporation Pressure-sensitive adhesive sheet and process for producing semiconductor device having same
WO2019151194A1 (en) * 2018-02-05 2019-08-08 日東電工株式会社 Adhesive sheet and peeling method for adhesive sheet
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CN101568610A (en) * 2007-11-08 2009-10-28 日东电工株式会社 Adhesive sheet for inspection
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JP2010010142A (en) * 2009-10-07 2010-01-14 Hitachi Chem Co Ltd Thermosetting circuit connection member and connection structure of electrode using it and connecting method of electrode
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JPWO2019235562A1 (en) * 2018-06-08 2021-06-24 昭和電工マテリアルズ株式会社 Adhesive sheet manufacturing method, dicing / die bonding integrated tape manufacturing method, semiconductor device manufacturing method, adhesive processing method, adherend immobilization method, and adherend peeling method

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