JP2006054463A - Electric conduction inspection method of electronic component - Google Patents

Electric conduction inspection method of electronic component Download PDF

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JP2006054463A
JP2006054463A JP2005232133A JP2005232133A JP2006054463A JP 2006054463 A JP2006054463 A JP 2006054463A JP 2005232133 A JP2005232133 A JP 2005232133A JP 2005232133 A JP2005232133 A JP 2005232133A JP 2006054463 A JP2006054463 A JP 2006054463A
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adhesive
electrode
electrodes
electronic component
inspection
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Isao Tsukagoshi
功 塚越
Toshishige Uehara
寿茂 上原
Tomohisa Ota
共久 太田
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Showa Denko Materials Co Ltd
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Hitachi Chemical Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide an adhesive for inspection of an electronic component which can be peeled and removed at electrical conduction inspection of a high-density electrode, such as a semiconductor chip, which does not require the time or trouble, and which is economical. <P>SOLUTION: An adhesive layer, having a water absorption of 0.5% or more and consisting of the composite system of one kind of or two or more kinds of substance selected from the following (A) to (B) groups, is formed between electrodes, facing each other, at least one of which protruding from the surface of a substrate, and then, in a state in which the electrodes facing each other come into contact by an applied pressure. Both the electrodes are fixed at the adhesive layer and an electrical conduction inspection of an electronic component with unknown electrical characteristics is performed. After the inspection, the adhesive is removed from the substrate surface, including the electrode of the electronic component using water as a solvent. The material (A) is a viscous adhesive containing a surfactant or that formed in the surface layer, and the material (B) is a viscous adhesive containing a hydrophilic substance or that formed in the surface layer. The surfactant in (A) is nonionic, or the hydrophilic substance in (B) is a substance of a polar group or a deliquescent material. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

この発明は、半導体チップ等および高密度電極を有する電子部品の通電検査方法に関する。   The present invention relates to an energization inspection method for an electronic component having a semiconductor chip or the like and a high-density electrode.

従来、半導体チップ等および高密度電極を有する電子部品の検査法としては、電気特性が未知の電子部品の電極から、電気特性が既知の電極を経由して、抵抗計などの測定器により電気特性を評価する通電検査法が行われている。通電検査は、供試体の回路の断線や隣接回路との絶縁性などの電気特性の把握や、部品の駆動性や出力特性などの機能チェックなどの点から極めて重要である。   Conventionally, as an inspection method for an electronic component having a semiconductor chip or the like and a high-density electrode, an electrical property is measured by an instrument such as an ohmmeter from an electrode of an electronic component whose electrical property is unknown through an electrode whose electrical property is known. A current inspection method is being evaluated. The energization inspection is extremely important in terms of grasping electrical characteristics such as disconnection of the circuit of the specimen and insulation from adjacent circuits, and checking functions such as driveability and output characteristics of components.

このとき、異なる部品間の電気的導通を得る方法としては、接触端子を有するプローブによる触針法や、硬化性の接着剤を両電極間に配し、未硬化もしくは半硬化状態で通電検査を行う方法、あるいは導電体が表裏もしくは一方の面に露出、もしくは突出した異方導電性シート類を用いる方法が知られている。
特開平 3−16147号公報
At this time, as a method of obtaining electrical continuity between different parts, a stylus method using a probe having a contact terminal or a curable adhesive is disposed between both electrodes, and an electric current inspection is performed in an uncured or semi-cured state. There are known methods for carrying out the method, or methods using anisotropic conductive sheets whose conductors are exposed or protruded on the front or back side or one side.
Japanese Patent Laid-Open No. 3-16147

しかしながら、上記プローブによる触針法は、最近の電極の高密度化に対応できないという分解能の不足や、微細なプローブが各端子ごとに必要なため高価になるという問題がある。   However, the stylus method using the probe has a problem that the resolution is inadequate to cope with the recent increase in the density of electrodes, and that a fine probe is required for each terminal, resulting in an increase in cost.

また、接着剤の硬化が不十分な状態下で検査を行う方法は、不良部品を取り除く際に、熱や溶剤により比較的簡単に行うことが可能である。ところが接着剤の硬化状態が過剰であると剥離が困難となり、硬化が不足であると不良部品に未剥離部や板面汚染などの移行を生じるため、硬化状態の厳密なコントロールが必要であるという問題が生じている。さらにこの方法では、部品を加熱することにより接着剤の未硬化分の硬化が促進され部品の剥離が困難となるため、所定温度に加熱した半導体チップなどの電子部品に電圧を印加し初期不良部品を取り除く、いわゆるバーンイン試験が採用できないという問題もある。   Further, the method of inspecting under a state where the adhesive is not sufficiently cured can be relatively easily performed by heat or a solvent when removing defective parts. However, if the adhesive is in an excessively cured state, peeling becomes difficult, and if the curing is insufficient, defective parts will be transferred to unexfoliated parts or plate surface contamination, which means that strict control of the cured state is required. There is a problem. Furthermore, in this method, since the curing of the uncured portion of the adhesive is accelerated by heating the component and it becomes difficult to peel off the component, a voltage is applied to an electronic component such as a semiconductor chip heated to a predetermined temperature, thereby causing an initial defective component. There is also a problem that a so-called burn-in test cannot be adopted.

さらに異方導電性シート類を用いる方法は、該異方導電性シート類の製造が、例えばレーザ光などで微細な貫通孔を設け、そこにめっき等により導電体を形成するために、高分解能品は得られるものの製造コストが高くなるため、高価で実用化しにくいという問題がある。また、電極対応部に導電体が形成されたシートの場合、両電極と異方導電性シート類の導電体との面倒な位置合わせが必要となる等、工程的にも高価となってしまう。   Furthermore, the method using anisotropic conductive sheets is a high resolution because the manufacture of anisotropic conductive sheets is provided with fine through-holes by, for example, laser light and a conductor is formed by plating or the like. Although the product can be obtained, the manufacturing cost is high, so there is a problem that it is expensive and difficult to put into practical use. Further, in the case of a sheet in which a conductor is formed in the electrode corresponding part, it is expensive in terms of process, for example, troublesome alignment between both electrodes and the conductor of the anisotropic conductive sheet is necessary.

そこで、この発明は上記問題を解決すべくなされたもので、半導体チップなどの高密度電極の通電検査に剥離除去でき、手間のかからない経済的な電子部品の通電検査方法を提供することを目的をする。   Accordingly, the present invention has been made to solve the above problems, and an object of the present invention is to provide an economical method of inspecting electronic parts that can be peeled and removed during energization inspection of a high-density electrode such as a semiconductor chip, and does not require time. To do.

(1) 上記目的を達成するため、相対峙する電極の少なくとも一方が基板面より突出した電極と、他方の対向する電極との間に下記(イ)〜(ロ)群より選ばれた1種もしくは2種以上の複合系からなる吸水率0.5%以上の接着剤層を形成し、その後、加圧により相対峙する電極の接触を得た状態で、前記接着剤層で両電極を固定して、電気特性が未知の電子部品の通電検査を行い、検査終了後に電子部品の電極を含む基板面から水を媒体として接着剤を除去することを特徴とする。
(イ)界面活性剤を含有もしくは、表面層に形成した粘接着剤
(ロ)親水性物質を含有もしくは、表面層に形成した粘接着剤
(2) また、(1)項において、(イ)の界面活性剤がノニオン性、または(ロ)の親水性物質が極性基含有物質、あるいは潮解性物質であることを特徴とする。
この発明に用いる接着剤は、加圧により対向電極の接触とその保持が可能であり、検査終了後に電子部品の電極を含む基板面から接着剤層を剥離除去できることを特徴とするものである。
(1) One type selected from the following groups (a) to (b) between an electrode in which at least one of the electrodes facing each other protrudes from the substrate surface and the other opposing electrode in order to achieve the above object Alternatively, an adhesive layer composed of two or more composites with a water absorption rate of 0.5% or more is formed, and then both electrodes are fixed with the adhesive layer in a state in which contact is made between the opposing electrodes by pressing. Then, an electrical current inspection of an electronic component with unknown electrical characteristics is performed, and after the inspection is finished, the adhesive is removed from the substrate surface including the electrodes of the electronic component using water as a medium.
(B) Adhesive containing surfactant or formed on surface layer (b) Adhesive containing hydrophilic substance or formed on surface layer (2) In item (1), ( The surfactant (a) is nonionic, or the (b) hydrophilic substance is a polar group-containing substance or a deliquescent substance.
The adhesive used in the present invention is capable of contacting and holding the counter electrode by pressurization, and is characterized in that the adhesive layer can be peeled off from the substrate surface including the electrode of the electronic component after the inspection is completed.

この発明によれば、相対峙する電極との間に容易に剥離除去できる接着剤で両電極を接触させ、該両電極の接触のみという低抵抗下で通電検査を行えるので、正確な電気特性の判定が可能となる。   According to the present invention, since both electrodes are brought into contact with an adhesive that can be easily peeled and removed between the electrodes facing each other, and an electric current inspection can be performed under a low resistance of only contact between the two electrodes, accurate electrical characteristics can be obtained. Judgment is possible.

また、両電極がずれない程度に接着固定されるので、通電検査時における外部からの加圧に対しても、電極のずれがなく正確な電気特性の判定が可能となる。   Further, since both electrodes are bonded and fixed to such an extent that they do not deviate from each other, it is possible to accurately determine the electric characteristics without any electrode deviating even when externally applied during the energization inspection.

この発明に用いる検査終了後に除去可能な接着剤層は、上記(イ)、(ロ)群より選ばれた一種もしくはそれ以上の複合系として、電極の接触条件や剥離の方法を考慮して決定する。   The adhesive layer that can be removed after completion of the inspection used in the present invention is determined in consideration of electrode contact conditions and peeling method as one or more composite systems selected from the groups (a) and (b) above. To do.

(イ)や(ロ)の場合、特に水を媒体として除去する場合に、これらが接着界面に水溶性の層を形成し簡単に剥離できるので好ましい。この場合、接着剤の吸水率(JIS、K7209)を0.5%以上と大きくすることが剥離性を向上できるので好ましく、1〜20%とすることがより好ましい。   In the case of (A) and (B), particularly when water is removed as a medium, these are preferable because they form a water-soluble layer at the adhesive interface and can be easily peeled off. In this case, it is preferable to increase the water absorption rate (JIS, K7209) of the adhesive to 0.5% or more because the peelability can be improved, and more preferably 1 to 20%.

界面活性剤を含有もしくは表面層に形成した接着剤としては、水などの媒体中にアクリル酸エステルや、ゴム類、オレフィン類などの接着性樹脂を界面活性剤で分散したエマルジョン系が代表的である。界面活性剤としてはアニオン性、ノニオン性、カチオン性、両性の各種のものが適用できる。これらは水溶性であると、水を媒体として剥離する場合に好ましい。また電極の腐食性を考慮すると、ポリオキシエチレンアルキルエーテル類、ソルビタン脂肪酸エステル類、ポリオキシエチレンアシルエステル類などのノニオン性であることが好ましい。   A typical example of the adhesive containing a surfactant or formed on the surface layer is an emulsion system in which an adhesive resin such as an acrylate ester, rubber or olefin is dispersed with a surfactant in a medium such as water. is there. As the surfactant, various anionic, nonionic, cationic, and amphoteric ones can be applied. These are preferably water-soluble when peeled off using water as a medium. In consideration of the corrosiveness of the electrode, nonionic properties such as polyoxyethylene alkyl ethers, sorbitan fatty acid esters, and polyoxyethylene acyl esters are preferable.

親水性物質としては、アルコール類や、グリコール系やグリセリンなどの多価アルコール類、カルボキシル基や水酸基などの極性基含有物質、あるいはCHCOOK、CaClなどの潮解性物質などを例示できる。 Examples of hydrophilic substances include alcohols, polyhydric alcohols such as glycols and glycerin, polar group-containing substances such as carboxyl groups and hydroxyl groups, or deliquescent substances such as CH 3 COOK and CaCl 2 .

また、例えば多価アルコール類などの親水性基を有する光硬化性液状樹脂などを、電極間に介在させ未硬化状態で電極の接触を得た後に、硬化させて凝集力の上昇による電極の固定を得て、導通検査後に剥離する方法などもある。   In addition, for example, a photocurable liquid resin having a hydrophilic group such as a polyhydric alcohol is interposed between the electrodes to obtain contact with the electrode in an uncured state, and then cured to fix the electrode by increasing the cohesive force. There is also a method of peeling after the continuity test.

この発明に用いる基板面より突出した電極とは、基板面よりわずかでも突出していればよく、いわゆるバンプ付半導体チップ類が代表的である。また、絶縁基板上に銅箔などの突出した電極を有する印刷回路板などもある。   The electrode protruding from the substrate surface used in the present invention only needs to protrude even slightly from the substrate surface, and so-called bumped semiconductor chips are typical. There are also printed circuit boards having protruding electrodes such as copper foil on an insulating substrate.

相対峙する電極の少なくとも一方が基板面より突出していれば、他の対向する電極は、例えば薄膜法やアディティブ法などで得た、いわゆる平面電極やバンプレス半導体チップ類の場合のような凹状電極でもよい。バンプレス半導体チップ類の電極は、表面絶縁層から数ミクロン程度凹状に形成されるが、この場合も相対峙する電極が基板面より突出する(例えば転写バンプなど)ことで適用可能である。   If at least one of the opposing electrodes protrudes from the substrate surface, the other opposing electrode is a concave electrode obtained by, for example, a thin film method or an additive method, as in the case of so-called planar electrodes or bumpless semiconductor chips. But you can. The electrodes of the bumpless semiconductor chips are formed in a concave shape about several microns from the surface insulating layer. In this case as well, the electrodes facing each other can be applied by protruding from the substrate surface (for example, transfer bumps).

加圧により相対峙する電極の接触を得る方法は、剥離可能な接着剤層が液状であれば室温で可能であるが、高分子量物を基本材料とした場合には加熱や超音波を併用することもできる。電極の接触を得るためには、加熱などによりその粘度を100ポイズ以下とすることが好ましい。   The method of obtaining contact of electrodes facing each other by pressurization is possible at room temperature if the peelable adhesive layer is liquid. However, when a high molecular weight material is used as a basic material, heating and ultrasonic waves are used in combination. You can also. In order to obtain contact of the electrode, the viscosity is preferably set to 100 poise or less by heating or the like.

接着固定は、例えば接着剤層がフィルム状であれば加熱溶融後の冷却により、液状物の場合は架橋によるなどして接着剤の凝集力を向上すればよい。また必要に応じて、検査装置などの加圧手段を併用することができる。   For example, when the adhesive layer is in the form of a film, the adhesive fixation may be improved by cooling after heating and melting, and in the case of a liquid material by crosslinking or the like to improve the cohesive force of the adhesive. Moreover, pressurization means, such as an inspection apparatus, can be used together as needed.

剥離可能な接着剤層がフィルム状の場合、塗工工程が不要であり一定厚みの連続状で供給可能なことから、工程の自動化が図れるのでコスト低減にも有効である。また、例えば検査用電極を有する配線板上に事前に形成しておくことも可能であり、当該フィルム付回路板も貼付等で簡単に得られる。このとき接着剤が粘着性を有すると電極の位置合わせや仮固定が容易となり好ましい。   In the case where the peelable adhesive layer is in the form of a film, the coating process is not required, and it can be supplied in a continuous state with a constant thickness, so that the process can be automated and effective in reducing costs. Further, for example, it can be formed in advance on a wiring board having an inspection electrode, and the circuit board with a film can be easily obtained by pasting or the like. At this time, it is preferable that the adhesive has tackiness because the positioning and temporary fixing of the electrodes are facilitated.

さらに、接着剤中に導電性粒子を添加することで、相対峙する電極の接触をより効率的に得ることも可能である。この場合に注意すべきことは、粒径を隣接電極間距離よりも小さくすることや、添加量を15体積%以下好ましくは12体積%以下として、隣接電極とショートさせないことである。   Further, by adding conductive particles in the adhesive, it is possible to more efficiently obtain contact between the opposing electrodes. In this case, it should be noted that the particle size is made smaller than the distance between adjacent electrodes, and the addition amount is set to 15% by volume or less, preferably 12% by volume or less so as not to cause a short circuit with the adjacent electrode.

通電検査の後、電極を含む基板面から接着剤層を除去することで、次工程で正常品のみを基板に実装できる。このとき剥離可能な条件として、剥離時の引っ張り強度を5kg/cm以上、好ましく15kg/cm以上とすることで、取扱いが容易なフィルム状態での剥離が可能となり好ましい。 After the energization inspection, by removing the adhesive layer from the substrate surface including the electrodes, only normal products can be mounted on the substrate in the next process. In this case, it is preferable that the peeling strength is 5 kg / cm 2 or more, preferably 15 kg / cm 2 or more because the film can be easily handled in a peelable state.

実装の方法は、いわゆるフリップチップや、ワイヤボンディングなどの一般的な方法が採用可能であるが、前工程でこの発明の接着剤による導通検査を行っているので、同様な工程や材料を用いることが可能な、例えばエポキシ系などの接着剤による接合法であると作業が簡略化できるので好ましい。   As a mounting method, a general method such as so-called flip chip or wire bonding can be adopted. However, since the conduction test using the adhesive of the present invention is performed in the previous process, the same process or material should be used. For example, a bonding method using an adhesive such as an epoxy is preferable because the operation can be simplified.

接着剤層には、上述の除去可能な接着剤層と同様に導電性粒子を添加することが相対峙する電極との接触が得やすいので好ましいが、電極との接触が可能であれば必ずしも必要でない。   It is preferable to add conductive particles to the adhesive layer, as in the case of the above-described removable adhesive layer, because it is easy to obtain contact with the opposite electrode, but it is always necessary if contact with the electrode is possible. Not.

この発明によれば、相対峙する電極の少なくとも一方が基板面より突出した電極と他方の対向する電極との間に検査工程後に除去可能な接着剤層を形成し、加圧すると相対峙する電極部より接着剤層が流動排除されるとともに、電極の接触が得られ、その状態で両電極がずれない程度に接着固定される。そのため、両電極の接触のみの低抵抗下で通電検査を行えるので、正確な電気特性の判定が可能となる。また、両電極がずれない程度に接着固定されるので、通電検査時における外部からの加圧に対しても、電極のずれがなく正確な電気特性の判定が可能となる。   According to the present invention, an adhesive layer that can be removed after the inspection process is formed between an electrode in which at least one of the opposing electrodes protrudes from the substrate surface and the other opposing electrode, and the electrodes are opposed when pressed. The adhesive layer is flow-excluded from the part, and contact between the electrodes is obtained, and in this state, both electrodes are bonded and fixed to such an extent that they do not shift. For this reason, an electrical current inspection can be performed under a low resistance of only contact between both electrodes, and thus accurate electrical characteristics can be determined. Further, since both electrodes are bonded and fixed to such an extent that they do not deviate from each other, it is possible to accurately determine the electric characteristics without any electrode deviating even when externally applied during an energization inspection.

この発明の接着剤は、検査工程後に除去可能な接着剤層を用いることから、バーンイン試験などの加熱条件下でも適用可能である。通電通検査の後、正常品について電極を含む基板面から接着剤層を剥離除去することで、正常品のみを基板に実装できるので、工程が簡単である。実装が接着剤による接合法の場合には、通電検査と同様な工程や有機接着材料を用いることができるので、低価格化や信頼性向上も合わせて得られる。   Since the adhesive of the present invention uses an adhesive layer that can be removed after the inspection process, it can also be applied under heating conditions such as a burn-in test. After the energization inspection, the normal product can be mounted on the substrate by peeling and removing the adhesive layer from the substrate surface including the electrodes, so that the process is simple. In the case of mounting using an adhesive bonding method, the same process and organic adhesive material as those used in the electric current inspection can be used, so that cost reduction and improved reliability can be obtained.

この発明によれば、相対峙する電極の少なくとも一方が基板面より突出した電極と他の対向する電極との位置合わせにより通電検査が可能である。そのため、突起電極を有する半導体ウエハのような大面積状の場合も、これに対応する回路基板を準備するだけで対応できるので低コストな検査が可能となる。この場合の回路基板として、高精細加工が容易な平面電極を採用できるメリットがある。   According to the present invention, it is possible to conduct an energization inspection by aligning an electrode in which at least one of the opposed electrodes protrudes from the substrate surface and the other opposing electrode. Therefore, even in the case of a large area such as a semiconductor wafer having a protruding electrode, it can be dealt with only by preparing a circuit board corresponding to this, so that low-cost inspection is possible. As a circuit board in this case, there is an advantage that a planar electrode that can be easily processed with high definition can be adopted.

以下、この発明を実施例に基づいて詳細に説明するが、この発明は以下に記載する実施例に限定されるものではない。   EXAMPLES Hereinafter, although this invention is demonstrated in detail based on an Example, this invention is not limited to the Example described below.

まず、この発明の第1実施例を説明する。   First, a first embodiment of the present invention will be described.

電気特性が未検査のICチップ(2×10mm、厚さ0.5mm、4辺周囲にバンプと呼ばれる50μm角、高さ20μmの金電極が200個形成、バンプ部以外の表面はポリイミドの絶縁膜)と、導電性が検査済のガラス電極(厚さ1.1mmのガラス上にNi/Au=0.5/0.1μmの薄膜回路を上記ICチップのバンプ電極のサイズに対応して形成し、ガラス周縁にリードとして延出させ周辺部の回路幅を200μmに拡大した測定パッドを有する平面電極)との間に、次に述べる剥離可能な接着剤層を形成した。   IC chip (2 × 10 mm, thickness 0.5 mm, 4 sides, 50 μm square, 20 μm high gold electrodes called bumps are formed on the sides, polyimide insulating film on the surface other than the bumps And a conductively inspected glass electrode (a thin film circuit of Ni / Au = 0.5 / 0.1 μm is formed on a 1.1 mm thick glass corresponding to the size of the bump electrode of the IC chip). Then, a peelable adhesive layer described below was formed between the glass periphery and a planar electrode having a measurement pad extending as a lead on the periphery of the glass and expanding the circuit width of the peripheral portion to 200 μm.

アクリル系粘着剤(Tg35℃、分子量50万、自己架橋型、ノニオン系界面活性剤含有)のエマルジョン液(固形分45%)を、セパレータ(シリコーン処理ポリエチレンテレフタレートフィルム、厚み40μm)にロールコータで塗布し、120℃20分乾燥し架橋した厚み20μmの粘着剤フィルムを得た。このフィルムの吸水率(JIS、K7209)は2.4%であった。   An acrylic adhesive (Tg 35 ° C, molecular weight 500,000, self-crosslinking type, containing nonionic surfactant) emulsion (solid content 45%) is applied to a separator (silicone-treated polyethylene terephthalate film, thickness 40 µm) with a roll coater. And dried at 120 ° C. for 20 minutes to obtain a crosslinked adhesive film having a thickness of 20 μm. The water absorption rate (JIS, K7209) of this film was 2.4%.

このフィルムをガラス電極上のICチップ搭載部に貼り付け、セパレータを剥離し、ICチップをのせて電極の位置合わせを行った後、50℃、20kgf/mm、5秒で加熱加圧した。この接続体について、ガラス電極リードを用いて未検査のICチップの通電検査が可能であった。また通電検査は、市販のTAB検査用のソケット装置付属のシリコーンゴム製クッション材を用いて加圧下で行う事でより有効であり、この装置を用いて100℃で加熱し5ボルトを印加したバーンイン評価も可能であった。 This film was attached to the IC chip mounting portion on the glass electrode, the separator was peeled off, the IC chip was placed and the electrode was aligned, and then heated and pressurized at 50 ° C., 20 kgf / mm 2 for 5 seconds. With respect to this connection body, it was possible to inspect an uninspected IC chip using a glass electrode lead. In addition, the energization inspection is more effective by performing under pressure using a silicone rubber cushioning material attached to a socket device for TAB inspection on the market, and burn-in in which 5 volts is applied by heating at 100 ° C. using this device. Evaluation was also possible.

通電検査終了後の接続体を、70℃純水中に10分浸漬したところ、フィルムはガラス電極およびICチップから綺麗に剥離した。   When the connected body after completion of the energization test was immersed in pure water at 70 ° C. for 10 minutes, the film was peeled cleanly from the glass electrode and the IC chip.

その後、ICチップを純水およびエタノールで洗浄および乾燥し、液晶パネル用ガラス電極にアニソルムAC−7144(異方導電フィルム、分解能14本/mm,エポキシ系熱硬化系接着剤に粒径5μmのプラスチックにめっきした導電粒子含有、日立化成工業株式会社の商品名)で160℃、30kgf/mm、15秒で接続したところ、良好な表示特性を得た。 Thereafter, the IC chip is washed and dried with pure water and ethanol, and anisolum AC-7144 (anisotropic conductive film, resolution 14 / mm, plastic with a particle size of 5 μm on epoxy thermosetting adhesive) is used for glass electrodes for liquid crystal panels. When it was connected at 160 ° C., 30 kgf / mm 2 , for 15 seconds with a conductive particle plated on, a product name of Hitachi Chemical Co., Ltd.), good display characteristics were obtained.

この実施例では、エマルジョン型アクリル系粘着制に含有された界面活性剤が加熱された純水に浸漬されたことで、界面力を低下させて剥離可能となったと見られる。また粘着剤の有するタックにより、電極の位置合わせが容易であった。さらに接続を通電検査と同様な工程や有機材料を用いることができ、160℃という比較的低温下の接続作業が可能であった。   In this example, it is considered that the surfactant contained in the emulsion-type acrylic adhesive system was immersed in heated pure water, thereby reducing the interfacial force and making it peelable. In addition, the position of the electrode was easy due to the tack of the adhesive. Furthermore, the connection can be performed at a relatively low temperature of 160 ° C. by using the same process and organic material as in the current inspection.

次に、第2実施例を説明する。この第2実施例では、剥離可能な接着剤層を変更したが、他の条件は第1実施例と同様とした。   Next, a second embodiment will be described. In this second embodiment, the peelable adhesive layer was changed, but the other conditions were the same as in the first embodiment.

アクリルゴム(Tg10℃、分子量60万、官能基としてカルボキシル基2%含有)100重量部とメチル化メラミン2部,とよりなる組成物をトルエンに溶解した後セパレータ上に形成し、120℃10分乾燥し、厚み10μmの粘着剤フィルムを得た。このフィルムのセパレータを剥離し表面にグリセリンの1%メタノール液を均一にスプレして表面処理した。第1実施例と同様に評価したところ、ICチップの通電検査が可能であり、その後の剥離や接着剤による接続も良好であった。この実施例では、グリセリンが水溶性なので剥離後の廃水処理が容易であり、接続時の洗浄も容易であった。   A composition composed of 100 parts by weight of acrylic rubber (Tg 10 ° C., molecular weight 600,000, containing 2% carboxyl group as a functional group) and 2 parts of methylated melamine was dissolved in toluene, and then formed on a separator, 120 ° C. for 10 minutes It dried and obtained the 10-micrometer-thick adhesive film. The separator of this film was peeled off, and a surface treatment was performed by uniformly spraying a 1% methanol solution of glycerin on the surface. When evaluated in the same manner as in the first example, it was possible to inspect the energization of the IC chip, and subsequent peeling and connection with an adhesive were also good. In this example, since glycerin is water-soluble, waste water treatment after peeling is easy, and cleaning at the time of connection is easy.

第3実施例では、ポリエチレングリコールのジアクリレート100重量部と、ベンゾフェノン3部、ミヒラーケトン1部よりなる光硬化性樹脂(25℃粘度、20ポイズ)をガラス電極上のICチップ搭載部にディスペンサで形成し、ICチップをのせて電極の位置合わせを行った後、ガラス下面から紫外線を照射(1J/cm)して硬化させた。この場合もICチップの通電検査が可能であり、その後の剥離や接着剤による接続も良好であった。 In the third embodiment, a photocurable resin (25 ° C. viscosity, 20 poise) composed of 100 parts by weight of polyethylene glycol diacrylate, 3 parts of benzophenone and 1 part of Michler's ketone is formed on the IC chip mounting part on the glass electrode by a dispenser. Then, after placing the IC chip and aligning the electrodes, ultraviolet rays were irradiated (1 J / cm 2 ) from the lower surface of the glass and cured. Also in this case, the IC chip was inspected for current, and the subsequent peeling and connection with an adhesive were also good.

この実施例では、材料が液状のため低粘度であり室温下で電極の接触が得られた。また、セパレータを剥離する工程がなく簡単であり、透明な回路基板に光不透過層を形成したところ、硬化の際に不要部の硬化が甘くなり剥離がさらに容易となった。   In this example, since the material was liquid, the viscosity was low, and electrode contact was obtained at room temperature. In addition, it was simple because there was no process for peeling the separator, and when a light-impermeable layer was formed on a transparent circuit board, curing of unnecessary parts was sweetened during curing, and peeling was further facilitated.

第4実施例では、エステルの炭素数が13を主体とする粘着剤のTgを室温近辺とし、nヘプタン/メチルエチルケトンの混合溶媒系のアクリル系粘着剤(Tg25℃、分子量110万)とし、他の条件は第1実施例と同様とした。この場合もICチップの通電通検査が可能であり、その後も剥離も良好であった。   In the fourth example, the Tg of the pressure-sensitive adhesive mainly composed of 13 carbon atoms of the ester is set to around room temperature, and a mixed solvent type acrylic pressure-sensitive adhesive (Tg 25 ° C., molecular weight 1.1 million) of n-heptane / methyl ethyl ketone is used. The conditions were the same as in the first example. In this case as well, the IC chip was inspected for energization and the peeling was good thereafter.

この実施例では、Tgが室温近辺なので40℃加熱で電極の接触が得られ、剥離は10℃の環境下で容易であった。さらにこの実施例の場合、分子量が大きなことやTg以下の温度で剥離したことから、無架橋でも剥離時の移行が発生しなかった。またTgが融点的に作用し温度活性がシャープであるため、貼付けと剥離の温度差をわずかとすることが可能となった。   In this example, since Tg was near room temperature, electrode contact was obtained by heating at 40 ° C., and peeling was easy under an environment of 10 ° C. Furthermore, in the case of this Example, since the molecular weight was large and the film was peeled off at a temperature of Tg or less, no transition occurred at the time of peeling even without crosslinking. Moreover, since Tg acts like a melting point and the temperature activity is sharp, it becomes possible to make the temperature difference between sticking and peeling slight.

第5実施例では、粒径5μmのプラスチックにめっきした導電粒子を1体積%添加し、他の条件は第1実施例と同様とした。この実施例では、50℃、5kgf/mm、5秒と加熱加圧と比較的低圧で導通が得られ、通電検査が可能であった。また接着剤の凝集力が大きいので剥離も容易であり粘着剤からの導電性粒子の脱落がなく、剥離後の水中からフィルタにより回収し再使用することも可能であった。 In the fifth example, 1% by volume of conductive particles plated on a plastic having a particle size of 5 μm was added, and other conditions were the same as in the first example. In this example, conduction was obtained at a relatively low pressure at 50 ° C., 5 kgf / mm 2 , 5 seconds, heating and pressurization, and an energization test was possible. Moreover, since the cohesive force of the adhesive is large, it is easy to peel off, and the conductive particles do not fall off from the pressure-sensitive adhesive, and can be recovered from the water after peeling with a filter and reused.

第6実施例は、接着剤として上記アニソルムAC−7144の導電粒子を添加せず、他の条件は第1実施例と同様とした。この実施例の場合も両電極の接触により通電検査が可能であり、その後の剥離や接着剤による接続も良好で、接着固定による信頼性に優れた接続が得られた。






































In the sixth example, the conductive particles of the above-mentioned Anisol AC-7144 were not added as an adhesive, and other conditions were the same as those in the first example. In the case of this example as well, it was possible to inspect the energization by contacting both electrodes, the subsequent peeling and the connection with an adhesive were good, and a connection with excellent reliability by adhesion fixation was obtained.






































Claims (2)

相対峙する電極の少なくとも一方が基板面より突出した電極と、他方の対向する電極との間に下記(イ)〜(ロ)群より選ばれた1種もしくは2種以上の複合系からなる吸水率0.5%以上の接着剤層を形成し、その後、加圧により相対峙する電極の接触を得た状態で、前記接着剤層で両電極を固定して、電気特性が未知の電子部品の通電検査を行い、検査終了後に電子部品の電極を含む基板面から水を媒体として接着剤を除去することを特徴とする電子部品の通電検査方法。
(イ)界面活性剤を含有もしくは、表面層に形成した粘接着剤
(ロ)親水性物質を含有もしくは、表面層に形成した粘接着剤
Water absorption comprising one or two or more composite systems selected from the following groups (a) to (b) between an electrode in which at least one of the opposing electrodes protrudes from the substrate surface and the other opposing electrode An electronic component with an unknown electrical characteristic is formed by forming an adhesive layer with a rate of 0.5% or more, and then fixing both electrodes with the adhesive layer in a state in which contact is made between the opposing electrodes by pressing. An electronic component energization inspection method comprising: removing an adhesive from a substrate surface including an electrode of an electronic component using water as a medium after completion of the inspection.
(B) Adhesive containing surfactant or formed on surface layer (b) Adhesive containing hydrophilic substance or formed on surface layer
請求項1の(イ)界面活性剤がノニオン性、または(ロ)親水性物質が極性基含有物質、あるいは潮解性物質であることを特徴とする請求項1記載の通電検査方法。



























The method of claim 1, wherein the surfactant in (a) is nonionic, or (b) the hydrophilic substance is a polar group-containing substance or a deliquescent substance.



























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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024029621A1 (en) * 2022-08-05 2024-02-08 日東電工株式会社 Electrical conductivity testing method, peeling method, electrically peelable adhesive layer, and adhesive sheet

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024029621A1 (en) * 2022-08-05 2024-02-08 日東電工株式会社 Electrical conductivity testing method, peeling method, electrically peelable adhesive layer, and adhesive sheet

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