JPH07283589A - Substrate transfer and loading mechanism - Google Patents

Substrate transfer and loading mechanism

Info

Publication number
JPH07283589A
JPH07283589A JP6087381A JP8738194A JPH07283589A JP H07283589 A JPH07283589 A JP H07283589A JP 6087381 A JP6087381 A JP 6087381A JP 8738194 A JP8738194 A JP 8738194A JP H07283589 A JPH07283589 A JP H07283589A
Authority
JP
Japan
Prior art keywords
substrate
chuck
mounting table
inspection
moving
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6087381A
Other languages
Japanese (ja)
Other versions
JP3282699B2 (en
Inventor
Takashi Okawa
隆志 大川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi Electronics Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Electronics Engineering Co Ltd filed Critical Hitachi Electronics Engineering Co Ltd
Priority to JP08738194A priority Critical patent/JP3282699B2/en
Publication of JPH07283589A publication Critical patent/JPH07283589A/en
Application granted granted Critical
Publication of JP3282699B2 publication Critical patent/JP3282699B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Supply And Installment Of Electrical Components (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Automatic Assembly (AREA)

Abstract

PURPOSE:To provide a transfer loading mechanism having improved throughput of a substrate inspection device. CONSTITUTION:This substrate transfer loading mechanism is formed of a relay base 5 being provided between a robot mechanism 2 and an inspection optical base 4 and consisting of two sets of chuck parts 55a, 55b having two pieces of chuck arms 551, an elevation mechanism 51, a rotary mechanism 52 and a mobile mechanism 55 and a flexible loading base 6 being provided opposedly to the inspection optical base 4 to be loaded with various kinds of sizes of substrates 1 after respective positioning.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は、基板検査装置におい
て、基板を搬送して載置台に載置する機構に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a mechanism for conveying a substrate and mounting it on a mounting table in a substrate inspection apparatus.

【0002】[0002]

【従来の技術】液晶パネルの素材として使用される方形
のガラス基板や、これより製作されたマスク基板など
は、表面に欠陥や付着異物などがあると品質が低下する
ので、基板検査装置により表面が検査されている。図4
は基板検査装置の基本構成を示す。基板検査装置は、ベ
ースB上に、図示のように配列された、被検査の基板1
と検査済み基板1を、それぞれを収容するカセット1a,
1b と、基板1を搬送するロボット機構2、これを載置
する載置台3、および載置台3の上部に設けた検査光学
系4とにより構成され、ロボット機構2は、昇降機構2
1,回転機構22,駆動機構23、およびロボットハンド24
よりなる。検査においては、ロボットハンド24は、カセ
ット1a 内の被検査の基板1をチャックし、90度回転
して載置台3の位置に停止し、ついで下降して基板1が
載置台3に位置決めして載置される。載置された基板1
は検査光学系4により検査され、検査が終了した基板1
は、ロボットハンド24により上記の逆順に搬送されてカ
セット1b に収納される。
2. Description of the Related Art A square glass substrate used as a material for a liquid crystal panel or a mask substrate manufactured from it has a poor quality due to defects or adhered foreign substances. Is being inspected. Figure 4
Shows the basic configuration of the board inspection apparatus. The board inspecting apparatus is a board 1 to be inspected, which is arranged on the base B as shown in the drawing.
And the inspected substrate 1 are cassettes 1a for accommodating them,
1b, a robot mechanism 2 that conveys the substrate 1, a mounting table 3 that mounts the substrate 1, and an inspection optical system 4 provided on the mounting table 3. The robot mechanism 2 includes an elevating mechanism 2
1, rotation mechanism 22, drive mechanism 23, and robot hand 24
Consists of. In the inspection, the robot hand 24 chucks the substrate 1 to be inspected in the cassette 1a, rotates 90 degrees and stops at the position of the mounting table 3, and then descends to position the substrate 1 on the mounting table 3. Placed. Placed substrate 1
Is inspected by the inspection optical system 4 and the inspection is completed
Are transported in the reverse order by the robot hand 24 and stored in the cassette 1b.

【0003】さて、液晶パネルには種々のサイズがあ
り、従って素材のガラス基板またはマスク基板のサイズ
にも各種がある。これに対して上記の載置台3は1種の
サイズに固定されており、各種のサイズの基板に対して
は、それぞれに対応する載置台を用意し、これらが交換
して使用されている。
There are various sizes of liquid crystal panels, and therefore, there are various sizes of glass substrates or mask substrates as raw materials. On the other hand, the mounting table 3 is fixed to one size, and for substrates of various sizes, the corresponding mounting tables are prepared and used by exchanging them.

【0004】[0004]

【発明が解決しようとする課題】最近における液晶パネ
ルの需要の増加に伴って、被検査の基板1は数量が増大
しており、これらの各種のサイズに対する載置台3の交
換には、かなりの時間を要するので検査スループットは
良好でなく、また交換作業には塵埃が発生して基板に付
着し、その品質を劣化する問題がある。さらに、上記の
ロボット機構2の搬送手順は、被検査の基板1を載置台
3に載置した後、検査終了までその位置に待機し、終了
後、カセット1b まで搬送して収納するもので、これま
たスループットが良好でないなど、種々の欠点があり、
これらの各欠点を解消することが要請されている。この
発明は上記に鑑みてなされたもので、検査スループット
を向上した基板搬送載置機構を提供することを目的とす
る。
With the recent increase in demand for liquid crystal panels, the number of substrates 1 to be inspected is increasing, and it is considerably necessary to replace the mounting tables 3 for these various sizes. Since it takes time, the inspection throughput is not good, and there is a problem that dust is generated during the replacement work and adheres to the substrate, which deteriorates the quality. Further, the transfer procedure of the robot mechanism 2 is such that after the substrate 1 to be inspected is placed on the mounting table 3, it stands by at that position until the inspection is completed, and after that, it is transferred to the cassette 1b and stored. This also has various drawbacks such as poor throughput,
It is required to eliminate each of these drawbacks. The present invention has been made in view of the above, and an object of the present invention is to provide a substrate transfer mounting mechanism with improved inspection throughput.

【0005】[0005]

【課題を解決するための手段】この発明は上記の目的を
達成する基板搬送載置機構であって、前記の基板検査装
置のロボット機構と検査光学系の間に設けた中継台と、
検査光学系に対向して設けたフレキシブル載置台とによ
り構成される。中継台は、基板の対応する2辺をチャッ
クする2本のチャックアームを有する2組のチャック部
と、2組のチャック部を昇降し、水平面内で回動する昇
降回動機構、および2組のチャック部の両チャックアー
ムを、別個に、互いに接近または離間する移動機構より
なる。また、フレキシブル載置台は、各種のサイズの基
板の、それぞれの2辺に対応する複数の段差と複数の傾
斜面を有し、互いに対向した固定ブロックと移動ブロッ
ク、および移動ブロックを押圧して、両ブロックの傾斜
面に載置された基板の2辺の側面を、両段差に当接させ
る押圧機構よりなる。
SUMMARY OF THE INVENTION The present invention is a substrate transfer / mounting mechanism that achieves the above object, which comprises a relay stand provided between the robot mechanism of the substrate inspection apparatus and the inspection optical system.
It is configured by a flexible mounting table provided so as to face the inspection optical system. The relay stand includes two sets of chuck parts having two chuck arms for chucking corresponding two sides of the substrate, an elevating and lowering mechanism for elevating and lowering the two sets of chuck parts in a horizontal plane, and two sets. Each of the chuck arms of the chuck section is separately provided with a moving mechanism that approaches or separates from each other. In addition, the flexible mounting table has a plurality of steps and a plurality of inclined surfaces corresponding to the two sides of substrates of various sizes, and presses the fixed block, the moving block, and the moving block facing each other, The pressing mechanism is configured to bring the side surfaces of the two sides of the substrate placed on the inclined surfaces of both blocks into contact with both steps.

【0006】[0006]

【作用】上記の基板搬送載置機構の中継台においては、
ロボットハンドにチャックされている基板に対して、一
方のチャック部の2本のチャックアームが、移動機構に
より互いに接近して基板の2辺をチャックする。ついで
2組のチャック部は、昇降回動機構により水平面内を1
80°回動し、基板をチャックしたチャック部はフレキ
シブル載置台に対して下降し、その両チャックアームが
移動機構により互いに離間して基板を解放し、フレキシ
ブル載置台に載置する。フレキシブル載置台において
は、各種のサイズの基板は、それぞれの2辺が、まず、
固定ブロックと移動ブロックの対応する両傾斜面に載置
され、ついで、押圧機構により移動ブロックを押圧する
と、傾斜面に載置された基板は、その2辺の側面が対応
する両段差に当接して位置決めされ、これに対向した検
査光学系により検査される。この場合、両傾斜面に載置
された基板は、その側面の下側エッジのみが傾斜面に接
触しているので、基板が押圧されて移動するとき、エッ
ジ以外の部分は傾斜面と摩擦せず、従ってこの部分に摩
擦キズが付かないことが有利である。上記のように、フ
レキシブル載置台は各種のサイズの基板に共通に使用さ
れるので、従来の載置台のように、サイズごとの交換が
不必要でスループットが向上し、さらにこれに伴う発塵
の問題が解消される。次に、上記による基板の検査中
は、他方のチャック部はロボットハンドに対応している
ので、これがロボットハンドより次位の基板をチャック
して待機し、当該基板の検査が終了すると両チャック部
は180°回動し、次位の基板はフレキシブル載置台に
位置決めして載置されて検査され、検査済みの基板はロ
ボットハンドに渡される。この待機方式により、検査装
置の稼働率と検査スループットがともに向上する。
In the relay stand of the above-mentioned substrate transfer and placement mechanism,
With respect to the substrate chucked by the robot hand, the two chuck arms of the one chuck portion approach each other by the moving mechanism and chuck two sides of the substrate. Then, the two sets of chucks are moved in the horizontal plane by the lifting / lowering rotation mechanism.
The chuck part that has rotated the substrate by 80 ° and chucked the substrate descends with respect to the flexible mounting table, both chuck arms are separated from each other by the moving mechanism to release the substrate, and the substrate is mounted on the flexible mounting table. In the flexible mounting table, substrates of various sizes have two sides,
When the movable block is placed on both the corresponding inclined surfaces of the fixed block and the moving block, and then the moving block is pushed by the pressing mechanism, the two sides of the substrate placed on the inclined surface come into contact with the corresponding steps. Is positioned and the inspection is performed by the inspection optical system facing this. In this case, since the substrates placed on both inclined surfaces are in contact with the inclined surface only at the lower edges of their side surfaces, when the substrate is pressed and moves, the parts other than the edges do not rub against the inclined surface. Therefore, it is advantageous that this part is not scratched. As described above, since the flexible mounting table is commonly used for substrates of various sizes, unlike the conventional mounting table, it is not necessary to replace each size and throughput is improved. The problem goes away. Next, during the inspection of the substrate by the above, since the other chuck portion corresponds to the robot hand, it chucks the next substrate from the robot hand and waits, and when the inspection of the substrate is completed, both chuck portions are held. Rotates 180 °, the next substrate is positioned and placed on the flexible mounting table for inspection, and the inspected substrate is passed to the robot hand. This standby method improves both the operating rate of the inspection apparatus and the inspection throughput.

【0007】[0007]

【実施例】図1〜図3は、この発明の一実施例を示し、
図1は基板搬送載置機構10の構成を示す斜視外観図、
図2は中継台5の詳細図、図3はフレキシブル載置台6
の詳細図である。図1において、基板搬送載置機構10
は、前記した図4における両カセット1a,1b と、ロボ
ット機構2、および検査光学系4を具備する。この発明
においては、ロボット機構2と検査光学系4の間に中継
台5を、また検査光学系4の下部に従来の載置台3の代
わりに、フレキシブル載置台6をそれぞれ設ける。中継
台5は、昇降機構51と、回動機構52、移動機構53、2本
のボールねじ54a,54b 、および、2本のチャックアーム
551 を有する2組のチャック部55a,55b よりなる。両チ
ャック部55a,55b はともに、昇降機構51により昇降し、
回動機構52により水平面内で回動する。各チャックアー
ム(以下単にアームという)551 は、図2(a) に示すよ
うに、各ボールねじ54a,54b にそれぞれ歯合し、各ボー
ルねじ54a,54b は、中央よりの両側は逆ねじとされ、移
動機構53の2個のモータ(M)により別個に回転し、こ
れらに歯合した両アーム551,551 は、各チャック部55a,
55b ごとに独立して、互いに接近しまたは離間する。ま
た、各アーム551 の下面には、チャックローラ56が2個
づつ取り付けられ、各チャックローラー56は、図2(b)
に示すように、基板1のエッジが嵌入する溝561 を有
し、基板1は両側の溝561 に挟持されて安定にチャック
される。次にフレキシブル載置台6は、2条のガイドレ
ール62a,62b を有する固定板61と、モータ63によりガイ
ドレール62a,62b に沿ってX方向に移動する移動板64、
移動板64に固定された固定ブロック65a 、これに対向
し、押圧機構66によりY方向に移動する移動ブロック65
b よりなる。両ブロック65a,65b には、各種のサイズの
基板に対応して、図3に示すように、複数段(例えば3
段)の段差651 と、各段差ごとの傾斜面652 がそれぞれ
形成される。
1 to 3 show an embodiment of the present invention,
FIG. 1 is a perspective external view showing the configuration of the substrate transfer mounting mechanism 10.
2 is a detailed view of the relay stand 5, and FIG. 3 is a flexible mounting stand 6.
FIG. In FIG. 1, the substrate transfer mounting mechanism 10
Includes the cassettes 1a and 1b in FIG. 4, the robot mechanism 2, and the inspection optical system 4. In the present invention, a relay table 5 is provided between the robot mechanism 2 and the inspection optical system 4, and a flexible mounting table 6 is provided below the inspection optical system 4 instead of the conventional mounting table 3. The relay stand 5 includes an elevating mechanism 51, a rotating mechanism 52, a moving mechanism 53, two ball screws 54a and 54b, and two chuck arms.
It consists of two sets of chuck portions 55a and 55b having 551. Both chuck parts 55a, 55b are lifted and lowered by the lifting mechanism 51,
The rotation mechanism 52 rotates in a horizontal plane. As shown in FIG. 2 (a), each chuck arm (hereinafter simply referred to as arm) 551 meshes with each ball screw 54a, 54b, and each ball screw 54a, 54b has a reverse screw on both sides from the center. The two arms (551, 551) meshed with the two motors (M) of the moving mechanism 53 and individually meshed with the chucks 55a,
Each 55b independently approaches or separates from each other. Also, two chuck rollers 56 are attached to the lower surface of each arm 551, and each chuck roller 56 is shown in FIG.
As shown in FIG. 5, the substrate 1 has a groove 561 into which the edge of the substrate 1 is fitted, and the substrate 1 is sandwiched between the grooves 561 on both sides and stably chucked. Next, the flexible mounting table 6 includes a fixed plate 61 having two guide rails 62a and 62b, and a moving plate 64 which is moved by the motor 63 in the X direction along the guide rails 62a and 62b.
A fixed block 65a fixed to the moving plate 64, a moving block 65 which faces the fixed block 65a and moves in the Y direction by a pressing mechanism 66.
consists of b. Both blocks 65a and 65b have a plurality of stages (for example, 3 stages) as shown in FIG. 3 corresponding to substrates of various sizes.
A step 651 and a sloped surface 652 for each step are formed.

【0008】以下、図1に図2および図3を併用して基
板搬送載置機構10の動作を説明する。カセット1a に
収容されている被検査の基板1は、従来と同様に、ロボ
ットハンド24にチャックされ、ついで90度回転する。
一方の、例えばチャック部55aがロボットハンド24に対
応しているとし、その両アーム551,551 を、予め、昇降
機構51により所定の高さまで上昇し、移動機構53によ
り、図2(a) に点線で示すように互いに離間しておく。
これに対してロボットハンド24を、矢印X1 のように伸
長して両アーム551,551 の下部に停止し、これらを下降
し、ついで互いに接近すると、それぞれのチャックロー
ラー56が基板1のエッジをチャックし、さらに回動機構
52により両チャック部56a,56b を180度回動する。一
方、フレキシブル載置台6は、検査光学系4の下部を定
位置とし、押圧機構66により移動ブロック65b を逆方向
に移動して、固定ブロック65a との間隔を、図3(イ) に
示すように、当該基板1のサイズよりやや広い間隔に設
定する。モータ63により両ブロック65a,65b を基板1の
下部まで移動し、両アーム551,551 を下降して離間させ
ると、基板1の2辺が両ブロック65a,65b の対応する傾
斜面652,652 に載置される。ついで、押圧機構66により
移動ブロック65b を押圧すると、図3(ロ) のように、基
板1の2辺の側面が対応する両段差651,651 に当接して
位置決めされる。位置決めされた基板1は、モータ53に
より検査光学系4の下部に復旧して検査される。上記の
検査中は、反対側のチャック部55b はロボットハンド24
に対応しており、これにチャックされている次位の基板
1は、このチャック部55b にチャックされて待機する。
これに対して前位の基板1は検査が終了すると、チャッ
ク部55aにチャックされて180°回動し、ロボットハ
ンド24に渡されてカセット1b に収納され、待機中の次
位の基板1はフレキシブル載置台6に載置されて検査さ
れる。以上の待機方式とフレキシブル載置台とにより、
各種のサイズを有する基板は迅速に搬送されて効率的に
検査される。
The operation of the substrate transfer and mounting mechanism 10 will be described below with reference to FIGS. The substrate 1 to be inspected, which is accommodated in the cassette 1a, is chucked by the robot hand 24 and then rotated 90 degrees, as in the conventional case.
On the other hand, assuming that, for example, the chuck portion 55a corresponds to the robot hand 24, both arms 551 and 551 thereof are lifted up to a predetermined height by the elevating mechanism 51 in advance, and are moved by the moving mechanism 53 by a dotted line in FIG. 2 (a). Keep away from each other as shown.
On the other hand, the robot hand 24 is extended as shown by the arrow X 1 and stopped under the arms 551 and 551, and they are lowered. Then, when they approach each other, each chuck roller 56 chucks the edge of the substrate 1. , Further rotation mechanism
Both chuck parts 56a and 56b are rotated by 180 degrees by 52. On the other hand, in the flexible mounting table 6, the lower portion of the inspection optical system 4 is set at a fixed position, and the moving block 65b is moved in the opposite direction by the pressing mechanism 66, so that the distance from the fixed block 65a is set as shown in FIG. In addition, the interval is set to be slightly wider than the size of the substrate 1. When both blocks 65a and 65b are moved to the lower part of the board 1 by the motor 63 and both arms 551 and 551 are lowered and separated, the two sides of the board 1 are placed on the corresponding inclined surfaces 652 and 652 of the blocks 65a and 65b. . Then, when the moving block 65b is pressed by the pressing mechanism 66, as shown in FIG. 3B, the side surfaces of the two sides of the substrate 1 are brought into contact with the corresponding steps 651, 651 and positioned. The substrate 1 thus positioned is restored to the lower portion of the inspection optical system 4 by the motor 53 and is inspected. During the above inspection, the chuck part 55b on the opposite side is
The next substrate 1 that is chucked by this is chucked by this chuck portion 55b and stands by.
On the other hand, when the inspection of the front substrate 1 is completed, the front substrate 1 is chucked by the chuck portion 55a and rotated by 180 °, passed to the robot hand 24 and stored in the cassette 1b. It is mounted on the flexible mounting table 6 and inspected. With the above standby method and flexible mounting table,
Substrates with various sizes are quickly transported and inspected efficiently.

【0009】[0009]

【発明の効果】以上の説明のとおり、この発明の基板搬
送載置機構においては、2組のチャック部を有する中継
台を設け、一方のチャック部により基板を搬送し、フレ
キシブル載置台に載置して検査し、この検査中に、他方
のチャック部により、ロボットハンドより次位の基板を
受け取る待機方式とし、またフレキシブル載置台は、各
種のサイズの基板に共通に使用され、それぞれを摩擦キ
ズが付くことなく位置決めして載置するもので、従来の
ように、サイズごとの載置台の交換が不必要で、これに
伴う発塵の問題が解消されるとともに、載置台交換の不
必要と待機方式とにより、基板検査装置の稼働率と検査
スループットとを向上する効果には、大きいものがあ
る。
As described above, in the substrate transfer / placing mechanism of the present invention, the relay table having two sets of chuck portions is provided, and the substrate is transferred by one of the chuck portions and placed on the flexible mounting table. Then, during this inspection, the other chuck part uses the standby method to receive the next substrate from the robot hand, and the flexible mounting table is commonly used for substrates of various sizes, and each of them has a friction scratch. Positioning and mounting is performed without attaching the mounting table, and unlike the conventional method, it is unnecessary to replace the mounting table for each size, the problem of dust generation accompanying this is eliminated, and the mounting table is not required to be replaced. The standby system has a great effect of improving the operating rate and the inspection throughput of the substrate inspection apparatus.

【図面の簡単な説明】[Brief description of drawings]

【図1】図1は、この発明による基板搬送載置機構の一
実施例の斜視外観図である。
FIG. 1 is a perspective external view of an embodiment of a substrate transfer mounting mechanism according to the present invention.

【図2】図2は中継台5の詳細図で、(a) は平面図、
(b) は側面図である。
FIG. 2 is a detailed view of the relay stand 5, (a) is a plan view,
(b) is a side view.

【図3】図3はフレキシブル載置台6の詳細図である。FIG. 3 is a detailed view of a flexible mounting table 6.

【図4】図4は基板検査装置の基本構成図である。FIG. 4 is a basic configuration diagram of a substrate inspection device.

【符号の説明】[Explanation of symbols]

1…方形の基板、1a …被検査基板用のカセット、1b
…検査済み基板用のカセット、2…ロボット機構、21…
昇降機構、22…回転機構、23…駆動機構、24…ロボット
ハンド、3…従来の載置台、4…検査光学系、5…中継
台、51…昇降機構、52…回動機構、53…移動機構、54a,
54b …ボールねじ、55a,55b …チャック部、551 …チャ
ックアーム、56…チャックローラー、561 …チャックロ
ーラーの溝、6…フレキシブル載置台、61…固定板、62
a,62b …ガイドレール、63…モータ、94…移動板、65a
…固定ブロック、65b …移動ブロック、651 …段差、65
2 …傾斜面、66…押圧機構、B…ベース。
1 ... Square substrate, 1a ... Cassette for inspected substrate, 1b
… Cassette for inspected substrate, 2… Robot mechanism, 21…
Lifting mechanism, 22 ... Rotating mechanism, 23 ... Driving mechanism, 24 ... Robot hand, 3 ... Conventional mounting table, 4 ... Inspection optical system, 5 ... Relay stand, 51 ... Lifting mechanism, 52 ... Rotating mechanism, 53 ... Moving Mechanism, 54a,
54b ... Ball screw, 55a, 55b ... Chuck part, 551 ... Chuck arm, 56 ... Chuck roller, 561 ... Chuck roller groove, 6 ... Flexible mounting table, 61 ... Fixing plate, 62
a, 62b ... Guide rail, 63 ... Motor, 94 ... Moving plate, 65a
… Fixed block, 65b… Moving block, 651… Step, 65
2 ... Slope, 66 ... Pressing mechanism, B ... Base.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】方形の基板をロボット機構により搬送して
載置台に載置し、検査光学系により検査する基板検査装
置において、該ロボット機構と検査光学系の間に設けた
中継台と、該検査光学系に対向して設けたフレキシブル
載置台とにより構成され、 前記中継台は、前記基板の対応する2辺をチャックする
2本のチャックアームを有する2組のチャック部と、該
2組のチャック部を昇降し、水平面内で回動する昇降回
動機構、および該2組のチャック部の両チャックアーム
を、別個に、互いに接近または離間する移動機構よりな
り、 前記フレキシブル載置台は、各種のサイズの前記基板
の、それぞれの前記2辺に対応する複数の段差と複数の
傾斜面を有し、互いに対向した固定ブロックと移動ブロ
ック、および該移動ブロックを押圧し、該両ブロックの
傾斜面に載置された前記基板の2辺の側面を、該両段差
に当接させる押圧機構よりなることを特徴とする、基板
搬送載置機構。
1. A substrate inspection apparatus that conveys a rectangular substrate by a robot mechanism, places it on a mounting table, and inspects it by an inspection optical system, and a relay table provided between the robot mechanism and the inspection optical system. A flexible mounting table provided so as to face the inspection optical system, and the relay table includes two sets of chuck portions having two chuck arms that chuck two corresponding sides of the substrate, and the two sets. The lifting and lowering mechanism for moving the chuck part up and down and rotating in a horizontal plane, and the moving mechanism for separately moving the two chuck arms of the two chuck parts toward or away from each other, the flexible mounting table is Of the substrate having a size of, each of which has a plurality of steps and a plurality of inclined surfaces corresponding to each of the two sides, faces a fixed block and a moving block, and presses the moving block, The two sides side of the substrate placed on the inclined surface of the block, characterized by comprising from pressing mechanism is brought into contact with both said stepped substrate transport mounting mechanism.
JP08738194A 1994-04-01 1994-04-01 Substrate transport mounting mechanism Expired - Fee Related JP3282699B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP08738194A JP3282699B2 (en) 1994-04-01 1994-04-01 Substrate transport mounting mechanism

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP08738194A JP3282699B2 (en) 1994-04-01 1994-04-01 Substrate transport mounting mechanism

Publications (2)

Publication Number Publication Date
JPH07283589A true JPH07283589A (en) 1995-10-27
JP3282699B2 JP3282699B2 (en) 2002-05-20

Family

ID=13913327

Family Applications (1)

Application Number Title Priority Date Filing Date
JP08738194A Expired - Fee Related JP3282699B2 (en) 1994-04-01 1994-04-01 Substrate transport mounting mechanism

Country Status (1)

Country Link
JP (1) JP3282699B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7300084B2 (en) 2002-03-23 2007-11-27 L.G.Philips Lcd Co., Ltd. Apparatus for conveying liquid crystal display panel
WO2019054345A1 (en) * 2017-09-14 2019-03-21 日本電産サンキョー株式会社 Inspection device
KR20200134105A (en) * 2019-05-21 2020-12-01 주식회사 지에스엠 Cleaning System for Cleaning System
CN114500788A (en) * 2020-10-26 2022-05-13 日本电产三协株式会社 Imaging device and inspection device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7300084B2 (en) 2002-03-23 2007-11-27 L.G.Philips Lcd Co., Ltd. Apparatus for conveying liquid crystal display panel
US7616289B2 (en) 2002-03-23 2009-11-10 Lg Display Co., Ltd. Apparatus for conveying liquid crystal display panel
WO2019054345A1 (en) * 2017-09-14 2019-03-21 日本電産サンキョー株式会社 Inspection device
CN111065903A (en) * 2017-09-14 2020-04-24 日本电产三协株式会社 Inspection apparatus
KR20200134105A (en) * 2019-05-21 2020-12-01 주식회사 지에스엠 Cleaning System for Cleaning System
CN114500788A (en) * 2020-10-26 2022-05-13 日本电产三协株式会社 Imaging device and inspection device

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