JPH0726361Y2 - Substrate inversion mechanism of vapor deposition equipment - Google Patents

Substrate inversion mechanism of vapor deposition equipment

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Publication number
JPH0726361Y2
JPH0726361Y2 JP3528489U JP3528489U JPH0726361Y2 JP H0726361 Y2 JPH0726361 Y2 JP H0726361Y2 JP 3528489 U JP3528489 U JP 3528489U JP 3528489 U JP3528489 U JP 3528489U JP H0726361 Y2 JPH0726361 Y2 JP H0726361Y2
Authority
JP
Japan
Prior art keywords
substrate
vapor deposition
rotation
jig
rotary
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP3528489U
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Japanese (ja)
Other versions
JPH02125968U (en
Inventor
勇人 天久
真一 山辺
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shinmaywa Industries Ltd
Original Assignee
Shinmaywa Industries Ltd
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Filing date
Publication date
Application filed by Shinmaywa Industries Ltd filed Critical Shinmaywa Industries Ltd
Priority to JP3528489U priority Critical patent/JPH0726361Y2/en
Publication of JPH02125968U publication Critical patent/JPH02125968U/ja
Application granted granted Critical
Publication of JPH0726361Y2 publication Critical patent/JPH0726361Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【考案の詳細な説明】 (産業上の利用分野) 本考案は蒸着装置の基板反転機構に関する。DETAILED DESCRIPTION OF THE INVENTION (Industrial field of application) The present invention relates to a substrate reversing mechanism of a vapor deposition apparatus.

(従来の技術) 電子ビーム蒸着等により基板の表裏に成膜を行なう場
合、真空槽内に蒸発源を通る中心線まわりを回転可能な
回転治具を設け、これに基板ホルダーを反転可能に保持
するということが行なわれている。
(Prior Art) When forming a film on the front and back of a substrate by electron beam evaporation, etc., a rotation jig that can rotate around the center line passing through the evaporation source is provided in the vacuum chamber, and the substrate holder is held in a reversible manner. It is being done.

例えば、特開昭63−307260号公報には、上述のような回
転治具に、複数の回転支軸を頂角の大きな円錐面(蒸発
源は上記円錐の中心線上にくる)に沿って放射状に配置
し、この各回転支軸にそれぞれ基板ホルダーを1枚ずつ
固定したものが記載されている。この場合、上記回転支
軸の回転によって基板ホルダーが反転することになる。
また、基板ホルダーは扇形の平板状のものであって、複
数の基板を保持することができるようになされている。
For example, in Japanese Laid-Open Patent Publication No. 63-307260, a plurality of rotating spindles are radially arranged on a rotating jig as described above along a conical surface with a large apex angle (the evaporation source is on the center line of the cone). , And one substrate holder is fixed to each of the rotation spindles. In this case, the substrate holder is turned over by the rotation of the rotation support shaft.
Further, the substrate holder is a fan-shaped flat plate, and can hold a plurality of substrates.

(考案が解決しようとする課題) ところで、1回の蒸着での基板の処理量を多くするに
は、回転治具の半径を大きくし、つまり、回転軸を長く
してこれに固定する基板ホルダーを縦長にすることによ
り、基板ホルダーに保持し得る基板の数を増やせばよ
い。しかし、上述のように回転支軸を円錐面に沿って配
置するものでは、回転治具の半径が大きくなると、つま
り、回転軸が長くなって、それに固定する基板ホルダー
が縦長になると、その両端に位置する基板と、中央部に
位置する基板とでは蒸発源からの距離rの差が大きくな
り、蒸着形成される膜の厚さが違ったものになる。これ
は、膜厚(蒸着量)が1/r2に比例するからである。
(Problems to be solved by the invention) By the way, in order to increase the throughput of the substrate in one deposition, the radius of the rotating jig is increased, that is, the rotating shaft is lengthened and fixed to the substrate holder. The number of substrates that can be held in the substrate holder may be increased by making the vertically long. However, in the case where the rotation support shaft is arranged along the conical surface as described above, when the radius of the rotating jig becomes large, that is, when the rotation shaft becomes long and the substrate holder fixed to it becomes vertically long, both ends of the rotation holder shaft are fixed. The difference in the distance r from the evaporation source becomes large between the substrate located at and the substrate located at the center, and the thickness of the film formed by vapor deposition becomes different. This is because the film thickness (vapor deposition amount) is proportional to 1 / r 2 .

また、上記膜厚(蒸着量)は、当該基板と蒸発源とを結
ぶ線と、上記中心線とのなす角度をθとすると、蒸発源
が点源の場合にはcosθに比例し、蒸発源が小さい平面
ではcos2θに比例する。従って、蒸発源から基板ホルダ
ーの両端に位置する基板までの距離を等しくしても、こ
の両者の膜厚は異なったものになる。
Further, the film thickness (vapor deposition amount) is proportional to cos θ when the evaporation source is a point source, where θ is the angle formed by the line connecting the substrate and the evaporation source and the center line. On the small plane, is proportional to cos 2 θ. Therefore, even if the distances from the evaporation source to the substrates located at both ends of the substrate holder are the same, the film thicknesses of the two become different.

要するに、膜厚はcosθ/r2ないしはcos2θ/r2に比例
するから、各基板の膜厚の均一化を図ろうとすれば、各
基板を所定の曲面上に配置する必要があるものである
が、上記従来の技術では回転治具の半径が大きくなる
と、上記曲面からの基板の位置ずれが大きくなってしま
うものである。
In short, since the film thickness is proportional to cos θ / r 2 or cos 2 θ / r 2 , it is necessary to arrange each substrate on a predetermined curved surface in order to make the film thickness of each substrate uniform. However, in the above-mentioned conventional technique, when the radius of the rotating jig becomes large, the displacement of the substrate from the curved surface becomes large.

すなわち、本考案の課題は、回転治具の半径を大きくし
て基板の処理量を増やしても、各基板の膜厚を均一にで
きるようにすることにある。
That is, an object of the present invention is to make the film thickness of each substrate uniform even if the radius of the rotating jig is increased to increase the processing amount of the substrate.

(課題を解決するための手段) 本考案は、このような課題に対して、回転治具の放射方
向に配設される複数の基板を1つの基板ホルダーに保持
せしめるのではなく、複数の基板ホルダーに分けて保持
し、各基板ホルダーを各々の基板の膜厚が互いに略等し
くなるような位置に配設できるようにするものである。
そして、その場合に、上述の如く分けられた各基板ホル
ダーを上記放射方向もしくは周方向に延ばした別個の回
転支軸に支持して、その延設方向に隣り合わせた回転支
軸同士を自在継手で連結することにより、それによって
一連になった基板を同時に反転できるようにするもので
ある。
(Means for Solving the Problems) In order to solve such a problem, the present invention does not hold a plurality of substrates arranged in the radial direction of a rotating jig in a single substrate holder but rather a plurality of substrates. The substrates are divided into holders, and the respective substrate holders can be arranged at positions where the film thicknesses of the respective substrates are substantially equal to each other.
Then, in that case, each of the substrate holders divided as described above is supported by a separate rotation support shaft extending in the radial direction or the circumferential direction, and the rotation support shafts adjacent to each other in the extending direction are connected by a universal joint. By connecting them, a series of substrates can be inverted at the same time.

すなわち、そのための具体的な手段は、 基板への蒸着を行なう真空槽内において、蒸発源を通る
中心線まわりを回転可能な回転治具に、基板を保持する
複数の基板ホルダーをその表側及び裏側からの基板への
蒸着のために反転可能に支持する機構であって、 上記複数の基板ホルダーは上記回転治具の放射方向と周
方向とのそれぞれに間隔をおいて配置されていて、 上記回転治具の放射方向もしくは周方向に沿って延び、
各基板ホルダーをそれぞれ支持して回転する回転支軸
と、 上記各回転支軸を回転治具に回転自在に支持する軸受部
材と、 上記回転支軸の延設方向に隣り合わせた回転支軸同士を
連結する自在継手と、 上記自在継手にて連結された一連の回転支軸に回転力を
付与する回転力付与手段と、 を備えていることを特徴とする蒸着装置の基板反転機構
である。
In other words, the specific means for doing this is to use a rotating jig that is rotatable around the center line passing through the evaporation source in a vacuum chamber for vapor deposition on the substrate, and attach a plurality of substrate holders to the front and back sides of the holder. A mechanism for reversibly supporting for vapor deposition from a substrate to a substrate, wherein the plurality of substrate holders are arranged at intervals in a radial direction and a circumferential direction of the rotating jig, and Extending along the radial or circumferential direction of the jig,
A rotation spindle that supports and rotates each substrate holder, a bearing member that rotatably supports each rotation spindle on a rotating jig, and rotation spindles that are adjacent to each other in the extending direction of the rotation spindle. A substrate reversing mechanism of a vapor deposition apparatus, comprising: a universal joint to be connected, and a rotational force applying means for applying a rotational force to a series of rotary support shafts connected by the universal joint.

(作用) 上記基板反転機構では、各基板ホルダーは、回転治具の
放射方向と周方向とにそれぞれ間隔をおき、それぞれ専
用の回転支軸に支持せしめるようにしているから、上述
の基板の膜厚が一定となる曲面に沿って配設することが
できるものである。そして、各基板ホルダーを支持する
回転支軸はその延設方向に隣り合わせたもの同士が自在
継手で連結されているから、それによって一連になった
基板は回転支軸に回転力を付与する1つの手段にて同時
に反転できることになる。
(Operation) In the substrate reversing mechanism, the substrate holders are spaced from each other in the radial direction and the circumferential direction of the rotating jig so that they are supported by the respective dedicated rotation spindles. It can be arranged along a curved surface having a constant thickness. Further, since the rotation support shafts supporting the respective substrate holders are adjacent to each other in the extending direction and are connected by the universal joint, a series of substrates thereby is provided with one rotation support shaft that applies a rotational force. The means can be reversed at the same time.

(考案の効果) 従って、本考案によれば、各基板ホルダーは、回転治具
の放射方向と周方向とにそれぞれ間隔をおき、それぞれ
専用の回転支軸に支持せしめるようにし、且つ互いに延
設方向に隣り合わせた回転支軸同士を自在継手で連結し
たから、多数の基板を同時に反転できるようにしなが
ら、すべての基板ホルダーを所定の曲面に沿って配設し
て、各基板の膜厚を互いに等しくすることができるよう
になる。
(Effect of the Invention) Therefore, according to the present invention, the respective substrate holders are spaced from each other in the radial direction and the circumferential direction of the rotating jig so that they can be supported by the respective dedicated rotation spindles and extend from each other. Since the rotating spindles that are adjacent to each other in the direction are connected with a universal joint, all the substrate holders are arranged along a predetermined curved surface so that multiple substrates can be turned over at the same time, and the film thickness of each substrate is adjusted to Will be able to equalize.

(実施例) 以下、本考案の実施例を図面に基づいて説明する。Embodiment An embodiment of the present invention will be described below with reference to the drawings.

本実施例は電子ビーム蒸着方式の蒸着装置に関するもの
であって、その全体構成が第1図に示されている。
The present embodiment relates to an electron beam evaporation type vapor deposition apparatus, and its entire configuration is shown in FIG.

同図において、1は基板2への蒸着を行なう真空槽であ
って、その底部に電子銃3からの電子ビームによって加
熱蒸発される蒸発源4が設けられている。そして、真空
槽1の内壁面にリング状の基台5が支持され、この基台
5に第1乃至第3の各基板ホルダー6a〜6cを反転可能に
支持する回転治具7が上記蒸発源4を通る垂直線を中心
に回転可能に支持されている。
In the figure, reference numeral 1 is a vacuum chamber for vapor deposition on a substrate 2, and an evaporation source 4 which is heated and vaporized by an electron beam from an electron gun 3 is provided at the bottom of the vacuum chamber. A ring-shaped base 5 is supported on the inner wall surface of the vacuum chamber 1, and the rotary jig 7 that supports the first to third substrate holders 6a to 6c on the base 5 in a reversible manner is the evaporation source. It is rotatably supported around a vertical line passing through 4.

上記基板ホルダー6a〜6cは、それぞれ基板2を支持する
複数の取付孔を有するものである。そして、基板2はそ
の両面に成膜が行われるものであり、上記取付孔に取り
付けられた状態で基板ホルダー6a〜6cの反転によりその
両面が上記蒸発源4に向けられることになる。
Each of the substrate holders 6a to 6c has a plurality of mounting holes for supporting the substrate 2. The substrate 2 is formed on both sides thereof, and both sides thereof are directed to the evaporation source 4 by reversing the substrate holders 6a to 6c in the state of being attached to the attachment holes.

まず、上記回転治具7は、上記基台5の周面に水平軸で
支持された支持ローラ8と基台5の上面の周縁部に垂直
軸で支持された回転位置規制ローラ9とにより回転自在
に支持されたリングギヤ11と、このリングギヤ11の上に
支持されたベッド12とからなる。そして、リングギヤ11
の回転駆動のために、その側方に駆動モータ13が設けら
れていて、その動力を駆動ギヤ14と中間ギヤ15を介して
リングギヤ11に伝達できるようになっている。
First, the rotating jig 7 is rotated by a support roller 8 supported by a horizontal axis on the peripheral surface of the base 5 and a rotation position regulating roller 9 supported by a vertical axis on the peripheral edge of the upper surface of the base 5. The ring gear 11 is freely supported, and the bed 12 is supported on the ring gear 11. And the ring gear 11
A drive motor 13 is provided to the side of the ring gear 11 for driving the rotation of the ring gear 11, and the power thereof can be transmitted to the ring gear 11 via the drive gear 14 and the intermediate gear 15.

上記ベッド12は、上記リングギヤ11に支持したリング状
のベース16と、そのの上に固定したリング部材17とを備
え、このリング部材17とその中心部の高い位置に設けた
センター部材18との間に第2図に示すように放射状に配
置した複数の放射フレーム19が渡されている。そして、
隣り合う放射フレーム19間にはそれぞれ放射方向に間隔
をおいて第1と第2の横フレーム21,22が渡されてい
る。
The bed 12 includes a ring-shaped base 16 supported by the ring gear 11 and a ring member 17 fixed on the ring-shaped base 16, and the ring member 17 and a center member 18 provided at a high position in the center thereof. A plurality of radiating frames 19 arranged radially as shown in FIG. 2 are passed between them. And
The first and second horizontal frames 21 and 22 are provided between the adjacent radiating frames 19 at intervals in the radiating direction.

そうして、上記センター部材18と第1横フレーム21との
間に,第1と第2の横フレーム21,22間,第2横フレー
ム22とリング部材17との間に、それぞれ放射方向に延び
る第1乃至第3の回転支軸23〜25が設けられている。す
なわち、これら回転支軸23〜35は上記第1乃至第3の基
板ホルダー6a〜6cをそれぞれ支持して回転するものであ
り、回転治具7の周方向に3列になって配置されてい
る。そして、第1回転支軸は23はセンター部材18と第1
横フレーム21とに設けた軸受部材26,27に、第2回転支
軸24は第1と第2の横フレーム21,22に設けた軸受部材2
7,28に、第3回転支軸25は第2横フレーム22とリング部
材17とに設けた軸受部材28,29にそれぞれ回転自在に支
持されている。
Then, between the center member 18 and the first horizontal frame 21, between the first and second horizontal frames 21 and 22, and between the second horizontal frame 22 and the ring member 17 in the radial direction, respectively. First to third rotation support shafts 23 to 25 are provided to extend. That is, these rotation support shafts 23 to 35 support and rotate the first to third substrate holders 6a to 6c, respectively, and are arranged in three rows in the circumferential direction of the rotating jig 7. . The first rotation support shaft 23 is the center member 18 and the first rotation support shaft 23.
The bearing members 26 and 27 provided on the horizontal frame 21 and the second rotary support shaft 24 have the bearing members 2 provided on the first and second horizontal frames 21 and 22, respectively.
7, 28, the third rotation support shaft 25 is rotatably supported by bearing members 28, 29 provided on the second horizontal frame 22 and the ring member 17, respectively.

また、上記各軸受部材26〜29は所定の曲面S上に配置さ
れているものである。すなわち、この曲面Sは上記蒸発
源4からの蒸着量が一定になる面であって、具体的に
は、蒸着量が上述の如くcosθ/r2ないしはcos2θ/r2
に比例するとした場合、蒸発源4からの距離rがh・co
s1/2θないしはh・cosθとなる曲面である(hは蒸発
源4から第1軸受部材26までの高さ)。従って、上記第
1乃至第3の回転支持す23〜25は一直線上にはなく上記
曲面Sに沿うよう所定角度をなして配置されている。
The bearing members 26 to 29 are arranged on a predetermined curved surface S. That is, the curved surface S is a surface on which the amount of vapor deposition from the evaporation source 4 is constant. Specifically, the amount of vapor deposition is cos θ / r 2 or cos 2 θ / r 2 as described above.
If the distance r from the evaporation source 4 is h · co
The curved surface is s 1/2 θ or h · cos θ (h is the height from the evaporation source 4 to the first bearing member 26). Therefore, the first to third rotary supports 23 to 25 are arranged not at a straight line but at a predetermined angle along the curved surface S.

この場合、第3図に第1と第2の回転支軸23,24を示す
ように、これらの回転支軸23,24は、基板ホルダー6a,6b
の上記放射方向における両端部に軸部材23a,24aを固定
して構成されている。そして、この両回転支軸23,24の
軸部材23a,24aは上記第1横フレーム21の軸受部材27に
設けた軸受31,32に支持されていて、この軸受31、32よ
り突出した端部同士が自在継手33にて連結されている。
この回転支軸の構成は第3回転支軸25においても同様で
あり、また、第2と第3の回転支軸24,25同士も上記第
1と第2の回転支軸23,24と同様の構造で連結されてい
る。
In this case, as shown in FIG. 3 by the first and second rotary support shafts 23, 24, these rotary support shafts 23, 24 are attached to the substrate holders 6a, 6b.
The shaft members 23a, 24a are fixed to both ends in the above radial direction. The shaft members 23a, 24a of the both rotary support shafts 23, 24 are supported by bearings 31, 32 provided on the bearing member 27 of the first horizontal frame 21, and end portions protruding from the bearings 31, 32 are supported. The two are connected by a universal joint 33.
The configuration of this rotation support shaft is the same for the third rotation support shaft 25, and the second and third rotation support shafts 24, 25 are similar to the first and second rotation support shafts 23, 24. Are connected by the structure.

また、上記基板ホルダー6a〜6cを反転せしめるため、上
記回転支軸23〜25に回転力を付与する手段34として、第
3回転支軸25に結合して上記リング部材17の軸受部材29
から放射方向に突出せしめたアーム部材35と、真空槽1
側の駆動部材36とが設けられている。
Further, in order to turn over the substrate holders 6a to 6c, as a means 34 for applying a rotational force to the rotary support shafts 23 to 25, the bearing member 29 of the ring member 17 coupled to the third rotary support shaft 25 is provided.
From the arm member 35 which is projected radially from the vacuum chamber 1
Side drive member 36 is provided.

すなわち、アーム部材35は、上記第3回転支軸25に結合
した軸に、第4図に示すように、アーム35aを十字状に
設けるとともにカム35bを設けたものである。そして、
カム35bはその周面に90度の角度間隔をおいて凹部が形
成されていて、このカム35bに対して、上記凹部に嵌ま
り得るボール37がスプリング38でカム35bに向けて付勢
して設けられている。一方、駆動部材36は上記アーム部
材34の回転軌跡に対応する位置に設けられていて、ソレ
ノイド36aで上記アーム35aへ向けて進退操作されるロッ
ド36bを備えている。
That is, as shown in FIG. 4, the arm member 35 is provided with a cam 35b and a cross-shaped arm 35a on the shaft connected to the third rotation support shaft 25. And
The cam 35b is formed with recesses at an angular interval of 90 degrees on its circumferential surface, and a ball 37 that can fit in the recess is biased toward the cam 35b by a spring 38 with respect to the cam 35b. It is provided. On the other hand, the drive member 36 is provided at a position corresponding to the rotation locus of the arm member 34, and includes a rod 36b which is operated to move back and forth toward the arm 35a by a solenoid 36a.

また、上記基台5には回転治具7の回転位置を検出する
ためのリミットスイッチ39が設けられている。
Further, the base 5 is provided with a limit switch 39 for detecting the rotational position of the rotary jig 7.

従って、上記蒸着装置での成膜にあたっては、回転治具
7の基板ホルダー6a〜6cに基板2を保持し、駆動部材36
のロッド36bを突出せしめた状態で回転治具7を1回転
させる。これにより、各第3回転支軸25に結合されてい
るアーム部材35がアーム35aへの上記ロッド36bの当接に
より、回転治具7の回転に伴って90度以下の角度で回転
し、上記第3回転支軸25とこれに自在継手33を介して連
結されている残り2つの回転支軸23,24とが同角度回転
することになる。
Therefore, when forming a film with the vapor deposition apparatus, the substrate 2 is held by the substrate holders 6a to 6c of the rotating jig 7 and the driving member 36 is used.
The rotating jig 7 is rotated once while the rod 36b of 1 is projected. As a result, the arm member 35 coupled to each of the third rotation support shafts 25 is rotated by an angle of 90 degrees or less with the rotation of the rotating jig 7 due to the contact of the rod 36b with the arm 35a. The third rotation support shaft 25 and the remaining two rotation support shafts 23 and 24 connected to the third rotation support shaft 25 via the universal joint 33 rotate at the same angle.

すなわち、回転支軸23〜35に支持された各基板ホルダー
6a〜6cが同角度回転することになり、この回転を1回な
いしは2回行なうことにより、各基板ホルダー6a〜6cを
同時に蒸発源4に向けた状態にすることができる。そし
て、上記回転支軸23〜25は蒸着量が一定になる曲面Sに
沿って配置されているから、この回転支軸23〜25に支持
されている第1乃至第3の基板ホルダー6a〜6cは上記曲
面Sに沿って配設された状態となる。
That is, each substrate holder supported by the rotation spindles 23 to 35
6a to 6c rotate at the same angle, and by performing this rotation once or twice, the substrate holders 6a to 6c can be simultaneously directed to the evaporation source 4. Since the rotary support shafts 23 to 25 are arranged along the curved surface S where the deposition amount is constant, the first to third substrate holders 6a to 6c supported by the rotary support shafts 23 to 25 are provided. Is arranged along the curved surface S.

そうして、真空槽1内を所定の真空度にし、上記駆動部
材36のロッド36bを引っ込めた状態で、回転治具7を回
転させながら、蒸発源4に電子ビームを照射して成膜材
料を蒸発せしめ、蒸発粒子を各基板2に沈着せしめる。
その際、第1乃至第3の基板ホルダー6a〜6cは上記曲面
Sに沿って配設されているから、これら各基板ホルダー
6a〜6cに保持されている基板2への蒸着量は略等しくな
り、各基板2の膜厚の均一化が図れることになる。
Then, the inside of the vacuum chamber 1 is set to a predetermined degree of vacuum, and while the rod 36b of the drive member 36 is retracted, the evaporation source 4 is irradiated with an electron beam while the rotating jig 7 is rotated to form a film forming material. Are evaporated, and evaporated particles are deposited on each substrate 2.
At this time, since the first to third substrate holders 6a to 6c are arranged along the curved surface S, each of these substrate holders
The amounts of vapor deposition on the substrates 2 held by 6a to 6c become substantially equal, and the film thickness of each substrate 2 can be made uniform.

上記基板2の片面への成膜が終わると、駆動部材36のロ
ッド36bを突出せしめた状態で回転治具7を2回転さ
せ、これにより、回転支軸23〜25を90度ずつ2回転せし
めて基板ホルダー6a〜6cを反転させた状態にする。そし
て、先程と同様に回転治具7を回転させながら、蒸発粒
子を各基板2に沈着せしめる。
When the film formation on one surface of the substrate 2 is completed, the rotary jig 7 is rotated twice with the rod 36b of the driving member 36 being projected, whereby the rotary support shafts 23 to 25 are rotated 90 degrees each. To bring the substrate holders 6a to 6c into an inverted state. Then, while rotating the rotating jig 7 in the same manner as described above, evaporated particles are deposited on each substrate 2.

第5図には他の実施例が示されている。Another embodiment is shown in FIG.

すなわち、このものは、回転治具41の周方向に沿って延
ばした第1乃至第3の回転支軸42a〜42cを内周側から外
周側へと順に配置し、周方向に3列になるようにしたも
のである。この場合、この3列の回転支軸42a〜42cは、
蒸着量が一定になる曲面Sに沿って配置されているま
た、これら回転支軸42a〜42cに支持せしめた基板ホルダ
ー45はすべて同形状の円盤になっている。
That is, in this product, the first to third rotation support shafts 42a to 42c extending along the circumferential direction of the rotating jig 41 are arranged in order from the inner peripheral side to the outer peripheral side, and there are three rows in the circumferential direction. It was done like this. In this case, the three rows of rotation support shafts 42a to 42c are
The substrate holders 45, which are arranged along the curved surface S where the amount of vapor deposition is constant, and which are supported by the rotary support shafts 42a to 42c, are all disks of the same shape.

そうして、回転支軸42a〜42cは、各列で隣り合うもの同
士が第3図に示すものと同様に自在継手と軸受とを組み
込んだ軸受部材46を介して連結されている。また、上記
回転支軸42a〜42cに対する回転力付与手段49として、そ
れぞれベベルギヤ51を有し自在継手と軸受とを組み込ん
だ軸受部材54にて連結して回転治具41の放射方向に配設
した伝動軸57〜59と、それぞれ上記各ベベルギヤ51〜53
に噛合せしめたベベルギヤ61を有し自在継手と軸受とを
組み込んだ軸受部材46にて回転支軸42a〜42c連結して回
転治具41のの周方向に配設した伝動軸67〜69とが設けら
れている。そして、上記放射方向の伝動軸59に第4図に
示すものと同様のアーム部材71が連結されている。
Then, the rotary support shafts 42a to 42c are connected such that adjacent ones in each row are connected via a bearing member 46 incorporating a universal joint and a bearing, as in the case shown in FIG. Further, as the rotational force imparting means 49 for the rotary support shafts 42a to 42c, they are connected in the radial direction of the rotary jig 41 by connecting them with a bearing member 54 having a bevel gear 51 and a universal joint and a bearing incorporated therein. Transmission shafts 57-59 and the above bevel gears 51-53, respectively
A bearing member 46 having a bevel gear 61 meshed with a bearing and a bearing incorporated with a bearing is connected to the rotary support shafts 42a to 42c and the transmission shafts 67 to 69 arranged in the circumferential direction of the rotary jig 41. It is provided. An arm member 71 similar to that shown in FIG. 4 is connected to the radial transmission shaft 59.

従って、上記第5図に示す実施例のものでは、回転治具
41の1箇所に設けたアーム部材71を回転せしめると、す
べての回転支軸42a〜42cが同時に回転することになる。
Therefore, in the embodiment shown in FIG.
When the arm member 71 provided at one position of 41 is rotated, all the rotation support shafts 42a to 42c are simultaneously rotated.

他の構成は先程の実施例と実質的には同じであり、その
詳細説明は省略する。
Other configurations are substantially the same as those of the above-mentioned embodiment, and detailed description thereof will be omitted.

なお、先に説明した実施例では、回転支軸が基板ホルダ
ーの両端に結合された一対の軸部材からなっているが、
回転支軸を1本ものの軸部材で構成して、これに基板ホ
ルダーを支持せしめてもよい。また、上記実施例は基板
の表裏に蒸着を行なう例であるが、本考案が基板の片面
のみに蒸着を行なう場合にも適用できることはもちろん
である。すなわち、その場合には、基板ホルダーの両面
にそれぞれ基板を保持し、一方の面の基板に蒸着を行な
った後、基板ホルダーを反転せしめて他方の面の基板に
蒸着を行なうことになる。
In the embodiment described above, the rotation support shaft is composed of a pair of shaft members coupled to both ends of the substrate holder,
The rotation support shaft may be configured by one shaft member, and the substrate holder may be supported by this. Further, although the above embodiment is an example in which vapor deposition is performed on the front and back surfaces of the substrate, the present invention can of course be applied to the case where vapor deposition is performed on only one side of the substrate. That is, in that case, the substrates are respectively held on both sides of the substrate holder, vapor deposition is performed on the substrate on one side, and then the substrate holder is inverted and vapor deposition is performed on the substrate on the other side.

【図面の簡単な説明】[Brief description of drawings]

図面は本考案の実施例を示し、第1図は基板反転機構の
全体構成を示す一部断面にした正面図、第2図は同機構
を一部書略して示す平面図、第3図は回転支軸の連結部
分の構造を示す断面図、第4図は回転力付与手段の正面
図、第5図は他の実施例における第2図と同様の図であ
る。 1……真空槽 2……基板 4……蒸発源 6a〜6c,42a〜42c……回転支軸 7……回転治具 26〜29,46……軸受部材 33……自在継手 34,49……回転力付与手段
FIG. 1 shows an embodiment of the present invention, FIG. 1 is a partially sectional front view showing the entire structure of a substrate reversing mechanism, FIG. 2 is a plan view showing a part of the mechanism, and FIG. FIG. 4 is a sectional view showing a structure of a connecting portion of a rotary support shaft, FIG. 4 is a front view of a rotational force applying means, and FIG. 5 is a view similar to FIG. 2 in another embodiment. 1 ... Vacuum tank 2 ... Substrate 4 ... Evaporation source 6a-6c, 42a-42c ... Rotating spindle 7 ... Rotating jig 26-29,46 ... Bearing member 33 ... Universal joint 34,49 ... ... Rotational force applying means

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】基板への蒸着を行なう真空槽内において、
蒸発源を通る中心線まわりを回転可能な回転治具に、基
板を保持する複数の基板ホルダーをその表側及び裏側か
らの基板への蒸着のために反転可能に支持する機構であ
って、 上記複数の基板ホルダーは上記回転治具の放射方向と周
方向とのそれぞれに間隔をおいて配置されていて、 上記回転治具の放射方向もしくは周方向に沿って延び、
各基板ホルダーをそれぞれ支持して回転する回転支軸
と、 上記各回転支軸を回転治具に回転自在に支持する軸受部
材と、 上記回転支軸の延設方向に隣り合わせた回転支軸同士を
連結する自在継手と、 上記自在継手にて連結された一連の回転支軸に回転力を
付与する回転力付与手段と、 を備えていることを特徴とする蒸着装置の基板反転機
構。
1. A vacuum chamber for vapor deposition on a substrate,
A mechanism for rotatably supporting a plurality of substrate holders for holding a substrate on a rotation jig rotatable around a center line passing through an evaporation source for vapor deposition on the substrate from the front side and the back side thereof. Substrate holders are arranged at intervals in the radial direction and the circumferential direction of the rotary jig, and extend along the radial direction or the circumferential direction of the rotary jig,
A rotation spindle that supports and rotates each substrate holder, a bearing member that rotatably supports each rotation spindle on a rotating jig, and rotation spindles that are adjacent to each other in the extending direction of the rotation spindle. A substrate reversing mechanism of a vapor deposition apparatus, comprising: a universal joint to be connected, and a rotational force applying means for applying a rotational force to a series of rotary support shafts connected by the universal joint.
JP3528489U 1989-03-27 1989-03-27 Substrate inversion mechanism of vapor deposition equipment Expired - Lifetime JPH0726361Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3528489U JPH0726361Y2 (en) 1989-03-27 1989-03-27 Substrate inversion mechanism of vapor deposition equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3528489U JPH0726361Y2 (en) 1989-03-27 1989-03-27 Substrate inversion mechanism of vapor deposition equipment

Publications (2)

Publication Number Publication Date
JPH02125968U JPH02125968U (en) 1990-10-17
JPH0726361Y2 true JPH0726361Y2 (en) 1995-06-14

Family

ID=31540500

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3528489U Expired - Lifetime JPH0726361Y2 (en) 1989-03-27 1989-03-27 Substrate inversion mechanism of vapor deposition equipment

Country Status (1)

Country Link
JP (1) JPH0726361Y2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006058473A (en) * 2004-08-18 2006-03-02 Oyokoden Lab Co Ltd Dielectric multilayered film filter and its manufacturing method
CN115216738A (en) * 2022-07-20 2022-10-21 聚灿光电科技(宿迁)有限公司 Rotatable plating ring plate pot mechanism and evaporator

Also Published As

Publication number Publication date
JPH02125968U (en) 1990-10-17

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