JPH0719015Y2 - Ｉｃ試験用恒温槽装置 - Google Patents
Ｉｃ試験用恒温槽装置Info
- Publication number
- JPH0719015Y2 JPH0719015Y2 JP14671389U JP14671389U JPH0719015Y2 JP H0719015 Y2 JPH0719015 Y2 JP H0719015Y2 JP 14671389 U JP14671389 U JP 14671389U JP 14671389 U JP14671389 U JP 14671389U JP H0719015 Y2 JPH0719015 Y2 JP H0719015Y2
- Authority
- JP
- Japan
- Prior art keywords
- constant temperature
- head
- tray
- tested
- base
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical group C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims 2
- 230000005494 condensation Effects 0.000 description 2
- 238000009833 condensation Methods 0.000 description 2
- 230000008602 contraction Effects 0.000 description 2
- 230000009977 dual effect Effects 0.000 description 1
- 239000012210 heat-resistant fiber Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14671389U JPH0719015Y2 (ja) | 1989-12-20 | 1989-12-20 | Ｉｃ試験用恒温槽装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14671389U JPH0719015Y2 (ja) | 1989-12-20 | 1989-12-20 | Ｉｃ試験用恒温槽装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0385586U JPH0385586U (enExample) | 1991-08-29 |
| JPH0719015Y2 true JPH0719015Y2 (ja) | 1995-05-01 |
Family
ID=31693260
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14671389U Expired - Lifetime JPH0719015Y2 (ja) | 1989-12-20 | 1989-12-20 | Ｉｃ試験用恒温槽装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0719015Y2 (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101222505B1 (ko) * | 2008-07-14 | 2013-01-15 | 가부시키가이샤 아드반테스트 | 소켓 가이드, 소켓, 푸셔 및 전자부품 시험장치 |
-
1989
- 1989-12-20 JP JP14671389U patent/JPH0719015Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0385586U (enExample) | 1991-08-29 |
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