JPH0717022Y2 - Ｉｃ試験装置 - Google Patents

Ｉｃ試験装置

Info

Publication number
JPH0717022Y2
JPH0717022Y2 JP13027789U JP13027789U JPH0717022Y2 JP H0717022 Y2 JPH0717022 Y2 JP H0717022Y2 JP 13027789 U JP13027789 U JP 13027789U JP 13027789 U JP13027789 U JP 13027789U JP H0717022 Y2 JPH0717022 Y2 JP H0717022Y2
Authority
JP
Japan
Prior art keywords
air
spacing frame
constant temperature
temperature bath
socket
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP13027789U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0369236U (enrdf_load_stackoverflow
Inventor
義仁 小林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP13027789U priority Critical patent/JPH0717022Y2/ja
Publication of JPH0369236U publication Critical patent/JPH0369236U/ja
Application granted granted Critical
Publication of JPH0717022Y2 publication Critical patent/JPH0717022Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP13027789U 1989-11-08 1989-11-08 Ｉｃ試験装置 Expired - Lifetime JPH0717022Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13027789U JPH0717022Y2 (ja) 1989-11-08 1989-11-08 Ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13027789U JPH0717022Y2 (ja) 1989-11-08 1989-11-08 Ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPH0369236U JPH0369236U (enrdf_load_stackoverflow) 1991-07-09
JPH0717022Y2 true JPH0717022Y2 (ja) 1995-04-19

Family

ID=31677862

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13027789U Expired - Lifetime JPH0717022Y2 (ja) 1989-11-08 1989-11-08 Ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JPH0717022Y2 (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPH0369236U (enrdf_load_stackoverflow) 1991-07-09

Similar Documents

Publication Publication Date Title
TWI351768B (en) Burn-in testing apparatus and method
TWI405970B (zh) Interface elements, test unit and electronic components test device
JP3388271B2 (ja) プローブ装置
JPH0717022Y2 (ja) Ｉｃ試験装置
GB2203835A (en) Monitoring skin temperature
TWI567401B (zh) Processor device and test device (2)
JP2000180502A (ja) 電子部品試験装置
JPH01157544A (ja) プローブ装置
US6956390B1 (en) Method and apparatus for verifying temperature during integrated circuit thermal testing
JP4202492B2 (ja) 電子部品試験装置
JPS6068646U (ja) ウエ−ハ試験用試料台
JPH05121598A (ja) Ｉｃソケツト
JP2001242216A (ja) 低温ハンドラとテストヘッドの接続機構
JPH06130121A (ja) 半導体装置の試験装置
JPS6138189Y2 (enrdf_load_stackoverflow)
JPH075425Y2 (ja) 測定部の結露防止装置
JPH0424459Y2 (enrdf_load_stackoverflow)
JPS60253884A (ja) 恒温装置
CN222280773U (zh) 用于晶圆测试的卡具
KR20200111539A (ko) 디바이스 검사용 리드 장치
KR200179993Y1 (ko) 패키지 테스트 장치
CN223179966U (zh) 一种织物挺度自动测试仪器
JPH02129876U (enrdf_load_stackoverflow)
JPH0943312A (ja) Ｉｃハンドラのテスト部
JPH0548053Y2 (enrdf_load_stackoverflow)

Legal Events

Date Code Title Description
R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term