JPH0677689A - Recognizing method for position of circuit substrate - Google Patents

Recognizing method for position of circuit substrate

Info

Publication number
JPH0677689A
JPH0677689A JP4230463A JP23046392A JPH0677689A JP H0677689 A JPH0677689 A JP H0677689A JP 4230463 A JP4230463 A JP 4230463A JP 23046392 A JP23046392 A JP 23046392A JP H0677689 A JPH0677689 A JP H0677689A
Authority
JP
Japan
Prior art keywords
circuit board
recognition
position data
circuit substrate
laser displacement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4230463A
Other languages
Japanese (ja)
Inventor
Futoshi Hosoya
太 細谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP4230463A priority Critical patent/JPH0677689A/en
Publication of JPH0677689A publication Critical patent/JPH0677689A/en
Pending legal-status Critical Current

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  • Supply And Installment Of Electrical Components (AREA)

Abstract

PURPOSE:To obtain a method for recognizing a circuit substrate which can obtain the position data of a circuit substrate regardless of the base of the circuit substrate and the material of a recognition pattern, etc. CONSTITUTION:The step between a base 4 of a circuit substrate 2 and a circuit pattern 3 and a recognition mark 5a, etc., is detected by the use of a laser type displacement meter 6 and position data on the circuit substrate 2 is calculated based on the position data.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、回路基板への部品実装
工程及びワイヤボンディング工程等において使用される
位置データを得るための回路基板の位置認識方法に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a circuit board position recognition method for obtaining position data used in a step of mounting components on a circuit board, a wire bonding step and the like.

【0002】[0002]

【従来の技術】図4は従来の回路基板の位置認識装置を
示す斜視図である。この位置認識装置は、回路基板2を
載置するためのテーブル1と、このテーブル1上に載置
された回路基板2を撮影するテレビカメラ9と、このテ
レビカメラ9を水平方向(X方向及びY方向)に移動可
能に支持するテレビカメラ支持手段と、テレビカメラ9
により撮影した映像を処理して所定のパターンの位置デ
ータを検出するデータ処理手段とを備えている。一方、
回路基板2は、絶縁性の基材4上に設けられた回路パタ
ーン3と特定の形状の複数個の認識マーク5とを備えて
いる。
2. Description of the Related Art FIG. 4 is a perspective view showing a conventional circuit board position recognition device. This position recognition device includes a table 1 on which a circuit board 2 is placed, a television camera 9 that captures an image of the circuit board 2 placed on the table 1, and the television camera 9 in the horizontal direction (X direction and A television camera supporting means for movably supporting in the Y direction), and a television camera 9
And a data processing unit that processes the video image captured by the device and detects the position data of a predetermined pattern. on the other hand,
The circuit board 2 includes a circuit pattern 3 provided on an insulating base material 4 and a plurality of recognition marks 5 having a specific shape.

【0003】この位置認識装置においては、テーブル1
上に回路基板2を載置し、テレビカメラ9により回路基
板2を撮影する。このときのテレビカメラ9の位置はデ
ータ処理手段に与えられており、データ処理手段はテレ
ビカメラ9から与えられた映像を処理し各認識マーク5
を認識して、その位置データに基づき、位置認識装置内
における回路基板2の位置データを算出する(特開昭62
-2691 号)。
In this position recognition device, the table 1
The circuit board 2 is placed on the top, and the circuit board 2 is photographed by the television camera 9. The position of the television camera 9 at this time is given to the data processing means, and the data processing means processes the image given from the television camera 9 to process each recognition mark 5
Is recognized, and the position data of the circuit board 2 in the position recognition device is calculated based on the position data (JP-A-62-62).
-2691).

【0004】この位置データは、その直後の部品搭載工
程及びワイヤボンディング工程等において、高い位置精
度を確保するために使用される。
This position data is used to ensure high position accuracy in the component mounting process and wire bonding process immediately after that.

【0005】なお、通常、認識マーク5は、回路パター
ン3との位置関係を正確にするために、回路パターン3
と同時に導体薄膜により形成されている。
It should be noted that the recognition mark 5 is usually formed in the circuit pattern 3 in order to make the positional relationship with the circuit pattern 3 accurate.
At the same time, it is formed of a conductor thin film.

【0006】[0006]

【発明が解決しようとする課題】しかしながら、上述し
た従来の回路基板の位置認識方法においては、基材4と
認識マーク5との光の反射率の差を利用して認識マーク
5を検出する方式であるため、基材4の光の反射率と認
識マーク5の光の反射率との差が小さい場合、又は基材
4若しくは認識マーク5での光の反射が不均一である場
合に、認識マーク5を正確に認識することができないこ
とがあるという問題点がある。回路基板の下側に光源を
配置して、基材を透過した光により認識マークを識別す
ることも考えられるが、この場合は光の透過率が低い基
材に適用することができないという難点がある。
However, in the above-mentioned conventional position recognition method for the circuit board, the recognition mark 5 is detected by utilizing the difference in the light reflectance between the base material 4 and the recognition mark 5. Therefore, when the difference between the light reflectance of the base material 4 and the light reflectance of the recognition mark 5 is small, or when the light reflection on the base material 4 or the recognition mark 5 is uneven, the recognition is performed. There is a problem that the mark 5 may not be recognized accurately. It is possible to arrange a light source on the lower side of the circuit board and identify the recognition mark by the light transmitted through the base material, but in this case, there is a drawback that it cannot be applied to the base material having low light transmittance. is there.

【0007】本発明はかかる問題点に鑑みてなされたも
のであって、回路基板の基材及び認識パターン等の材質
に拘らず、回路基板の位置データをより確実に得ること
ができる回路基板の位置認識方法を提供することを目的
とする。
The present invention has been made in view of the above problems, and it is possible to more reliably obtain the position data of the circuit board regardless of the material of the substrate and the recognition pattern of the circuit board. An object is to provide a position recognition method.

【0008】[0008]

【課題を解決するための手段】本発明に係る回路基板の
位置認識方法は、回路基板に設けられた所定の凹凸を検
出し、その凹凸の位置データに基づいて前記回路基板の
位置認識を行なうことを特徴とする。
A circuit board position recognizing method according to the present invention detects a predetermined unevenness provided on a circuit board and recognizes the position of the circuit board based on the position data of the unevenness. It is characterized by

【0009】[0009]

【作用】本発明においては、回路基板に設けられた所定
の凹凸を例えばレーザー光による変位計測により検出
し、その凹凸の位置データに基づいて前記回路基板の位
置を認識する。前記所定の凹凸としては、回路基板の表
面に回路パターンと共に導体薄膜で形成された認識マー
クであってもよいし、ドリル等で形成された穴であって
もよい。
In the present invention, the predetermined unevenness provided on the circuit board is detected by displacement measurement using, for example, a laser beam, and the position of the circuit board is recognized based on the position data of the unevenness. The predetermined unevenness may be a recognition mark formed on the surface of the circuit board together with the circuit pattern by a conductive thin film, or may be a hole formed by a drill or the like.

【0010】本発明においては、光の反射又は透過を利
用して基準パターンを検出するのではなく、基板表面に
選択的に設けられた凹凸を検出して回路基板を認識する
方式であるため、回路基板の基材及び認識マーク等の材
質等に拘らず、前記所定の凹凸を確実に検出することが
できる。
In the present invention, since the reference pattern is not detected by utilizing the reflection or transmission of light, the circuit board is recognized by detecting irregularities selectively provided on the surface of the board. It is possible to reliably detect the predetermined irregularities regardless of the material of the substrate of the circuit board and the recognition mark.

【0011】[0011]

【実施例】次に、本発明の実施例について添付の図面を
参照して説明する。
Embodiments of the present invention will now be described with reference to the accompanying drawings.

【0012】図1は本発明の第1の実施例に係る回路基
板の位置認識方法において使用する位置認識装置を示す
斜視図である。この位置認識装置は、回路基板2を載置
するためのテーブル1と、このテーブル1の上方に配設
され回路基板2の表面の変位(凹凸)を走査計測するレ
ーザー式変位計6と、このレーザー式変位計6を水平方
向(X方向及びY方向)に移動可能に支持する変位計支
持手段と、レーザー式変位計6から出力された信号を処
理して所定の凹凸の位置データを検出するデータ処理手
段とを備えている。一方、回路基板2は、絶縁性の基材
2上に設けられた回路パターン3と特定の形状の複数の
認識マーク5aとを備えている。この回路パターン3及
び認識マーク5aは、いずれも導体薄膜により形成され
てものである。
FIG. 1 is a perspective view showing a position recognizing device used in a position recognizing method for a circuit board according to a first embodiment of the present invention. This position recognition device includes a table 1 on which a circuit board 2 is placed, a laser displacement meter 6 arranged above the table 1 for scanning and measuring displacement (irregularities) of the surface of the circuit board 2, and Displacement gauge supporting means for movably supporting the laser displacement gauge 6 in the horizontal direction (X direction and Y direction) and a signal output from the laser displacement gauge 6 are processed to detect position data of a predetermined unevenness. And data processing means. On the other hand, the circuit board 2 includes a circuit pattern 3 provided on the insulating base material 2 and a plurality of recognition marks 5a having a specific shape. The circuit pattern 3 and the recognition mark 5a are both formed of a conductive thin film.

【0013】この位置認識装置においては、テーブル1
上に回路基板2をある程度位置決めして載置し、レーザ
ー式変位計6により回路基板2の表面の変位を走査計測
する。データ処理手段は、このレーザー式変位計6の出
力を処理して、回路パターン3及び認識マーク5a等を
認識する。また、このデータ処理手段にはレーザー式変
位計6の位置データが与えられており、データ処理手段
はこのレーザー式変位計6の位置データに基づいて回路
パターン3及び認識マーク5aの位置を算出する。これ
により、回路基板2の位置データを高精度で得ることが
できる。
In this position recognition device, the table 1
The circuit board 2 is mounted on the circuit board to some extent, and the displacement of the surface of the circuit board 2 is scanned and measured by the laser displacement meter 6. The data processing means processes the output of the laser displacement meter 6 to recognize the circuit pattern 3 and the recognition mark 5a. Further, the position data of the laser displacement meter 6 is given to the data processing means, and the data processing means calculates the positions of the circuit pattern 3 and the recognition mark 5a based on the position data of the laser displacement meter 6. . Thereby, the position data of the circuit board 2 can be obtained with high accuracy.

【0014】図2は、認識マークの近傍におけるレーザ
ー式変位計6の出力の変化を示す図である。レーザー式
変位計6が基板表面をX方向に走査すると、認識マーク
5aに対応してレーザー式変位計6の出力が変化する。
これと同様に、レーザー式変位計6が基板表面をY方向
に走査すると、認識マーク5aに対応してレーザー式変
位計6の出力が変化する。データ処理手段は、このレー
ザー式変位計6の出力変化により凹凸を認識し、その位
置データを算出する。
FIG. 2 is a diagram showing changes in the output of the laser displacement meter 6 near the recognition mark. When the laser displacement meter 6 scans the substrate surface in the X direction, the output of the laser displacement meter 6 changes corresponding to the recognition mark 5a.
Similarly, when the laser displacement meter 6 scans the surface of the substrate in the Y direction, the output of the laser displacement meter 6 changes corresponding to the recognition mark 5a. The data processing means recognizes the unevenness based on the change in the output of the laser displacement meter 6 and calculates the position data.

【0015】本実施例においては、回路基板2に設けら
れた凹凸をレーザー式変位計により検出し、その凹凸の
位置データに基づいて回路基板の位置データを得るか
ら、基材、回路パターン及び認識マークの材質に拘ら
ず、回路基板の位置データを高精度で得ることができ
る。なお、レーザー式変位計による走査計測は、回路基
板上での走査位置がある程度ずれていても回路基板設計
におけるデータとの比較により回路基板の位置が算出で
きる場所を複数箇所行うことが好ましい。
In this embodiment, the unevenness provided on the circuit board 2 is detected by the laser displacement meter, and the position data of the circuit board is obtained based on the position data of the unevenness. Therefore, the base material, the circuit pattern and the recognition are recognized. The position data of the circuit board can be obtained with high accuracy regardless of the material of the mark. It should be noted that the scanning measurement by the laser displacement meter is preferably performed at a plurality of places where the position of the circuit board can be calculated by comparison with the data in the circuit board design even if the scanning position on the circuit board is displaced to some extent.

【0016】図3は、本発明の第2の実施例に係る回路
基板の位置認識方法を示す斜視図である。
FIG. 3 is a perspective view showing a method of recognizing the position of a circuit board according to the second embodiment of the present invention.

【0017】本実施例が第1の実施例と異なる点は導体
薄膜により形成された認識マークに替えてドリル等によ
り形成された認識穴7又は部品挿入穴8を位置認識の基
準として使用することにあり、その他の構成は基本的に
は第1の実施例と同様であるので、図3において図1と
同一物には同一符号を付してその詳しい説明は省略す
る。
The difference between this embodiment and the first embodiment is that the recognition hole 7 or the component insertion hole 8 formed by a drill or the like is used as a reference for position recognition instead of the recognition mark formed by the conductor thin film. Since the other configurations are basically the same as those of the first embodiment, the same components as those in FIG. 1 are designated by the same reference numerals in FIG. 3 and their detailed description is omitted.

【0018】本実施例においては、ドリル等で回路基板
2に穿設された認識穴7又は部品挿入穴8による段差を
レーザー式変位計6で検出し、この認識穴7又は部品挿
入穴8の位置データに基づいて回路基板2の位置データ
を算出する。
In this embodiment, the laser displacement meter 6 detects a step due to the recognition hole 7 or the component insertion hole 8 formed in the circuit board 2 with a drill or the like, and the recognition hole 7 or the component insertion hole 8 is detected. The position data of the circuit board 2 is calculated based on the position data.

【0019】例えば、電子部品を基材4に設けられた部
品挿入穴8に挿入するための位置データを得る場合に
は、本実施例のように、認識穴7又は部品挿入穴8の位
置データに基づいて回路基板2を位置認識することによ
り、部品実装時の精度をより一層向上させることができ
る。
For example, when obtaining position data for inserting an electronic component into the component insertion hole 8 provided in the base material 4, the position data of the recognition hole 7 or the component insertion hole 8 is obtained as in this embodiment. By recognizing the position of the circuit board 2 on the basis of, it is possible to further improve the accuracy at the time of component mounting.

【0020】[0020]

【発明の効果】以上説明したように本発明によれば、回
路基板に設けられた所定の凹凸を検出し、その凹凸の位
置データに基づいて前記回路基板の位置認識を行うか
ら、回路基板の基材及び認識パターンの材質等に拘ら
ず、高精度な位置認識が可能である。
As described above, according to the present invention, the predetermined unevenness provided on the circuit board is detected, and the position of the circuit board is recognized based on the position data of the unevenness. Highly accurate position recognition is possible regardless of the material of the base material and the recognition pattern.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1の実施例に係る回路基板の位置認
識方法において使用する位置認識装置を示す斜視図であ
る。
FIG. 1 is a perspective view showing a position recognition device used in a circuit board position recognition method according to a first embodiment of the present invention.

【図2】認識マークの近傍におけるレーザー式変位計の
出力の変化を示す図である。
FIG. 2 is a diagram showing a change in output of a laser displacement meter in the vicinity of a recognition mark.

【図3】本発明の第2の実施例に係る回路基板の位置認
識方法を示す斜視図である。
FIG. 3 is a perspective view showing a method of recognizing a position of a circuit board according to a second embodiment of the present invention.

【図4】従来の回路基板の位置認識装置を示す斜視図で
ある。
FIG. 4 is a perspective view showing a conventional circuit board position recognition device.

【符号の説明】[Explanation of symbols]

1;テーブル 2;回路基板 3;回路パターン 4;基材 5,5a;認識マーク 6;レーザー式変位計 7;認識穴 8;部品挿入穴 9;テレビカメラ 1; Table 2; Circuit board 3; Circuit pattern 4; Base material 5, 5a; Recognition mark 6; Laser displacement meter 7; Recognition hole 8; Component insertion hole 9; Television camera

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 回路基板に設けられた所定の凹凸を検出
し、その凹凸の位置データに基づいて前記回路基板の位
置認識を行なうことを特徴とする回路基板の位置認識方
法。
1. A method for recognizing the position of a circuit board, which comprises detecting a predetermined unevenness provided on the circuit board and recognizing the position of the circuit board based on the position data of the unevenness.
JP4230463A 1992-08-28 1992-08-28 Recognizing method for position of circuit substrate Pending JPH0677689A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4230463A JPH0677689A (en) 1992-08-28 1992-08-28 Recognizing method for position of circuit substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4230463A JPH0677689A (en) 1992-08-28 1992-08-28 Recognizing method for position of circuit substrate

Publications (1)

Publication Number Publication Date
JPH0677689A true JPH0677689A (en) 1994-03-18

Family

ID=16908242

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4230463A Pending JPH0677689A (en) 1992-08-28 1992-08-28 Recognizing method for position of circuit substrate

Country Status (1)

Country Link
JP (1) JPH0677689A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017216867A1 (en) * 2016-06-14 2017-12-21 富士機械製造株式会社 Component mounting position calculation system and component mounting position calculation method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0477000A (en) * 1990-07-18 1992-03-11 Fujitsu Ltd Positional deviation measuring apparatus for board

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0477000A (en) * 1990-07-18 1992-03-11 Fujitsu Ltd Positional deviation measuring apparatus for board

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017216867A1 (en) * 2016-06-14 2017-12-21 富士機械製造株式会社 Component mounting position calculation system and component mounting position calculation method

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