JPH0659269A - Method for testing electric connection of liquid crystal display panel unit - Google Patents

Method for testing electric connection of liquid crystal display panel unit

Info

Publication number
JPH0659269A
JPH0659269A JP20934092A JP20934092A JPH0659269A JP H0659269 A JPH0659269 A JP H0659269A JP 20934092 A JP20934092 A JP 20934092A JP 20934092 A JP20934092 A JP 20934092A JP H0659269 A JPH0659269 A JP H0659269A
Authority
JP
Japan
Prior art keywords
display panel
electrode
liquid crystal
dummy
crystal display
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP20934092A
Other languages
Japanese (ja)
Inventor
Takashi Yuda
孝 湯田
Toshio Sakata
敏夫 坂田
Kenichi Kuroiwa
健一 黒岩
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP20934092A priority Critical patent/JPH0659269A/en
Publication of JPH0659269A publication Critical patent/JPH0659269A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0266Marks, test patterns or identification means
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/11Printed elements for providing electric connections to or between printed circuits
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/36Assembling printed circuits with other printed circuits
    • H05K3/361Assembling flexible printed circuits with other printed circuits

Abstract

PURPOSE:To test connection resistance between an electrode terminal formed on a liquid crystal panel and a conductive pattern terminal formed on an insula tion film before a unit is completed. CONSTITUTION:A lot of pieces of electrode terminals 2 and dummy terminals 7 are formed on the liquid crystal panel 1. On a TAB film (insulation film) 3, conductive patterns opposite to the electrode terminals 2, the dummy electrodes 8 opposite to the dummy electrodes 7 and pads 9 communicating with time dummy electrodes 8 are formed by connection parts (one ends) 4. The display panel 1 and the TAB film 3 are connected with an anisotropy conductive film. Instead of measuring a contact resistance between the electrode terminal 2 and the conductive pattern connection part 4, the contact resistance between the dummy electrodes 7, 8 is measured.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は液晶表示パネルユニット
の電気接続の試験方法、特に、液晶表示パネルに形成し
た電極端子と絶縁フィルムに形成した導体パターンとの
接触抵抗を間接測定する試験方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for testing the electrical connection of a liquid crystal display panel unit, and more particularly to a method for indirectly measuring the contact resistance between electrode terminals formed on a liquid crystal display panel and conductor patterns formed on an insulating film. .

【0002】[0002]

【従来の技術】液晶表示パネルとその駆動用回路とを接
続させる方法には幾つかある。現在最も広く行われてい
る方法は、多数の導体パターンを形成した絶縁フィルム
(TABフィルム)に液晶駆動用ICを実装し、液晶表
示パネルとTABフィルムとの間に、多数の微細導電性
粒子を樹脂に拡散させた異方導電性フィルムを挟み、熱
圧着により接合している。
2. Description of the Related Art There are several methods for connecting a liquid crystal display panel and its driving circuit. The most widely used method at present is to mount a liquid crystal driving IC on an insulating film (TAB film) formed with a large number of conductor patterns, and to form a large number of fine conductive particles between the liquid crystal display panel and the TAB film. Anisotropic conductive films diffused in resin are sandwiched and joined by thermocompression bonding.

【0003】図7は異方導電性フィルムを使用した回路
接続の断面図である。液晶表示パネル1には多数本の電
極端子2を形成し、図示しない液晶駆動用ICを実装し
たTABフィルム(絶縁フィルム)3には、電極端子2
のそれぞれに対向する導体パターン(4) を形成し、多数
の微細導電性粒子5を拡散させた異方導電性フィルム6
を、表示パネル1とTABフィルム3とで挟む。
FIG. 7 is a sectional view of a circuit connection using an anisotropic conductive film. A large number of electrode terminals 2 are formed on the liquid crystal display panel 1, and the electrode terminals 2 are formed on a TAB film (insulating film) 3 on which a liquid crystal driving IC (not shown) is mounted.
Anisotropic conductive film 6 in which conductive patterns (4) facing each other are formed and a large number of fine conductive particles 5 are diffused
Is sandwiched between the display panel 1 and the TAB film 3.

【0004】しかるのち、異方導電性フィルム6の樹脂
母剤が溶融する温度に加熱すると共に、TABフィルム
3を表示パネル1に押圧し常温に冷却すると、電極端子
2と導体パターンの一端(接続部)4とは、その間に挟
挿した導電性粒子5によって電気的に接続し、その接続
は導電性フィルム6が有する接着力と硬化に伴う圧縮応
力によって維持される。
Thereafter, when the TAB film 3 is pressed against the display panel 1 and cooled to room temperature while being heated to a temperature at which the resin base material of the anisotropic conductive film 6 is melted, the electrode terminal 2 and one end of the conductor pattern (connection) are connected. Part 4) is electrically connected by conductive particles 5 sandwiched therebetween, and the connection is maintained by the adhesive force of the conductive film 6 and the compressive stress associated with curing.

【0005】[0005]

【発明が解決しようとする課題】一般に異方導電性フィ
ルムの接触抵抗はその種類によっても多少異なるが、正
常に接続したものは数百 mΩ〜数Ωである。しかし、異
方導電性フィルムの樹脂の硬化反応が進んでいたり、熱
圧着装置の平行度が悪く液晶表示パネルとTABフィル
ムとがその厚さ方向に傾斜する等の場合の接触抵抗は、
数Ω〜数十Ωになる。 このような差異を検出する必要
があるが従来の測定系の抵抗は、液晶表示パネルの電極
端子の抵抗, TABフィルムの端子抵抗, テスターのプ
ローブの抵抗等を全て含むと数十Ω〜数百Ωになる。
Generally, the contact resistance of the anisotropic conductive film is somewhat different depending on its type, but normally connected films are several hundred mΩ to several Ω. However, the contact resistance when the curing reaction of the resin of the anisotropic conductive film is advanced, the parallelism of the thermocompression bonding device is poor, and the liquid crystal display panel and the TAB film are inclined in the thickness direction,
It becomes several Ω to several tens Ω. It is necessary to detect such a difference, but the resistance of the conventional measurement system is several tens of Ω to several hundreds if all of the resistance of the electrode terminals of the liquid crystal display panel, the terminal resistance of the TAB film, the resistance of the probe of the tester, etc. are included. Becomes Ω.

【0006】従って、液晶表示パネルとTABフィルム
とを接続する熱圧着,異方導電性フィルム,TABフィ
ルム,液晶表示パネル等の異常により、接続不良(接触
抵抗過大)が発生してもその確認方法がなく、ユニット
として完成するまで接続不良の有無が分からなかった。
Therefore, even if a connection failure (excessive contact resistance) occurs due to an abnormality in the thermocompression bonding for connecting the liquid crystal display panel and the TAB film, the anisotropic conductive film, the TAB film, the liquid crystal display panel, etc. I couldn't tell if there was a poor connection until the unit was completed.

【0007】また、ユニットの駆動試験で表示不良とな
っても液晶表示パネルとTABフィルムとの接続不良か
どうかを確認する有効な方法がなく、顕微鏡で各接続箇
所の外観を光学的に観察し不良かどうかを判断していた
が、液晶表示パネルの電極端子には不透明なものもあ
り、これらは光学的に検出し難い。
Further, even if a display failure occurs in the drive test of the unit, there is no effective method for checking whether the connection between the liquid crystal display panel and the TAB film is poor, and the appearance of each connection portion is optically observed with a microscope. Although it was determined whether or not it was defective, some of the electrode terminals of the liquid crystal display panel are opaque, and these are difficult to detect optically.

【0008】以上説明したように、液晶表示パネルとT
ABフィルムとの接続部の試験は、作業上のロスタイム
が大きく、生産性が損なわれるという問題点があり、液
晶表示パネルの量産化に伴ってその対策が要望されるよ
うになった。
As described above, the liquid crystal display panel and the T
The test of the connection portion with the AB film has a problem that the work time is large and the productivity is impaired. With the mass production of the liquid crystal display panel, countermeasures against it have been demanded.

【0009】[0009]

【課題を解決するための手段】図1は本発明方法の基本
構成の説明図であり、液晶表示パネル1には多数本の電
極端子2とダミー電極7を形成し、TABフィルム(絶
縁フィルム)3には、接続部(一端)4が電極端子2に
対向する導体パターンと、ダミー電極7に対向するダミ
ー電極8と、ダミー電極8に連通する一対のパッド9を
形成する。
FIG. 1 is an explanatory view of the basic constitution of the method of the present invention. A large number of electrode terminals 2 and dummy electrodes 7 are formed on a liquid crystal display panel 1, and a TAB film (insulating film) is formed. 3, a connection part (one end) 4 is formed with a conductor pattern facing the electrode terminal 2, a dummy electrode 8 facing the dummy electrode 7, and a pair of pads 9 communicating with the dummy electrode 8.

【0010】そこで、表示パネル1とTABフィルム3
との間に異方導電性フィルム(6) を挟み、加熱押子にて
TABフィルム3を表示パネル1に向けて押圧する。す
ると、表示パネル1とTABフィルム3とは異方導電性
フィルムにより接合し、電極端子2と導体パターン接続
部4との接触抵抗測定に替え、一対のパッド9を使用し
ダミー電極7と8の接触抵抗を測定する。
Therefore, the display panel 1 and the TAB film 3
An anisotropically conductive film (6) is sandwiched between and, and the TAB film 3 is pressed toward the display panel 1 with a heating presser. Then, the display panel 1 and the TAB film 3 are joined by an anisotropic conductive film, and instead of measuring the contact resistance between the electrode terminal 2 and the conductor pattern connecting portion 4, a pair of pads 9 is used to replace the dummy electrodes 7 and 8 with each other. Measure the contact resistance.

【0011】その測定値Rは、異方導電性部材を介して
接続するダミー電極7と8の接触抵抗をRS , ダミー電
極7の固有抵抗をRP ,連通するダミー電極8の固有抵
抗をRT としたとき、R=RS +RP +RT となる。
The measured value R is the contact resistance between the dummy electrodes 7 and 8 connected through the anisotropic conductive member R S , the specific resistance of the dummy electrode 7 R P , and the specific resistance of the dummy electrode 8 communicating with it. When R T , R = R S + R P + R T.

【0012】従って、固有抵抗RP とRT を予め測定し
ておけば、抵抗測定値Rより接触抵抗RS を知ることが
可能である。なお、接触抵抗RS はダミー電極7,8の
構成(材質)により異なるため、ダミー電極7の構成を
電極端子2と同じとしダミー電極8の構成を接続部4と
同じにする、さらにはそれらの形状,寸法を共通化する
ことにより、電極端子2と導体パターン4との接触抵抗
を接触抵抗RS から推定する精度が向上するようにな
る。
Therefore, if the specific resistances R P and R T are measured in advance, it is possible to know the contact resistance R S from the measured resistance value R. Since the contact resistance R S differs depending on the configuration (material) of the dummy electrodes 7 and 8, the dummy electrode 7 has the same configuration as the electrode terminal 2, and the dummy electrode 8 has the same configuration as the connection portion 4. By using the same shape and size, the accuracy of estimating the contact resistance between the electrode terminal 2 and the conductor pattern 4 from the contact resistance R S is improved.

【0013】[0013]

【作用】上記手段によれば、液晶表示パネルユニットに
回路接続しないダミー電極を形成し、表示パネルとTA
Bフィルムとの接続に替えてダミー電極の接触抵抗を測
定する。従って、測定器のプローブを当接する一対のパ
ッドの形成, 接触抵抗測定用電流を流すこと, 測定すべ
き接触抵抗を除く測定系の抵抗値測定を可能とし、表示
パネルとTABフィルムとの接触部の良否を正確かつ速
やかに判定できるようにする。
According to the above means, the dummy electrodes not connected to the circuit are formed in the liquid crystal display panel unit, and the display panel and the TA are connected.
The contact resistance of the dummy electrode is measured instead of the connection with the B film. Therefore, it is possible to form a pair of pads that contact the probe of the measuring instrument, flow a current for contact resistance measurement, and measure the resistance value of the measurement system excluding the contact resistance to be measured, and the contact portion between the display panel and the TAB film. To be able to accurately and swiftly judge the quality of.

【0014】[0014]

【実施例】図2は本発明方法の第1の実施例における要
部構成の説明図、図3は本発明方法の第2の実施例にお
ける要部構成の説明図、図4は本発明方法の第3の実施
例における要部構成の説明図、図5は本発明方法の第4
の実施例に係わる電極端子の説明図、図6は本発明方法
の第5の実施例に係わる電極端子の説明図である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 2 is an explanatory view of the essential parts of the first embodiment of the method of the present invention, FIG. 3 is an explanatory drawing of the essential parts of the second embodiment of the present invention, and FIG. Of the third embodiment of the present invention, FIG. 5 shows the fourth embodiment of the method of the present invention.
6 is an explanatory view of an electrode terminal according to the embodiment of the present invention, and FIG. 6 is an explanatory view of an electrode terminal according to the fifth embodiment of the method of the present invention.

【0015】図2において、(A) は液晶表示パネルに形
成した電極端子とダミー電極の平面図,(B)はTABフィ
ルムに形成した導体パターンの接続部とダミー電極の平
面図、(C) はダミー電極を使用した接触抵抗測定系の等
価回路である。
In FIG. 2, (A) is a plan view of the electrode terminals and the dummy electrodes formed on the liquid crystal display panel, (B) is a plan view of the connection portions of the conductor patterns and the dummy electrodes formed on the TAB film, and (C). Is an equivalent circuit of a contact resistance measuring system using dummy electrodes.

【0016】図2(A) において、一対のガラス基板を接
合しその接合間隙に液晶を充填した液晶表示パネル1に
は、ガラス基板に形成したTFT方式の場合画素電極は
透明だがそれ以外は不透明である電極に連通する多数の
電極端子2と、一定ピッチで整列する電極端子2の両整
列端に配設し電極端子2より幅広の第1のダミー電極7
1,72 を形成する。
In FIG. 2A, in a liquid crystal display panel 1 in which a pair of glass substrates are bonded and liquid crystal is filled in the bonding gap, the pixel electrodes are transparent in the case of the TFT system formed on the glass substrates, but the others are opaque. A plurality of electrode terminals 2 communicating with the electrodes and a first dummy electrode 7 which is arranged at both ends of the electrode terminals 2 aligned at a constant pitch and wider than the electrode terminals 2.
Form 1 , 7 2 .

【0017】図2(B) において、図示しないICチップ
を実装したTABフィルム(絶縁フィルム)3には、一
端(接続部)4が電極端子2に対向し他端が図示しない
ICチップに接続する多数の導体パターンと、ダミー電
極71,72 のそれぞれに対向する一対の第2のダミー電
極81,82 と、各ダミー電極81,82 に連通するパッド
1,92 を形成する。
In FIG. 2B, a TAB film (insulating film) 3 on which an IC chip (not shown) is mounted has one end (connecting portion) 4 facing the electrode terminal 2 and the other end connected to an IC chip (not shown). a plurality of conductive patterns, the dummy electrodes 7 1, 7 2 of the pair of second dummy electrodes 8 opposite to each 1, 8 2, the pad 9 1, 9 2 communicating with each dummy electrode 81, 82 Form.

【0018】電極端子2と導体パターン接続部4とを接
続する異方導電性接続部材(例えば異方導電性フィル
ム)によりダミー電極71,72 と81,82 を接続した接
続系の抵抗値R1 をパッド91,92 にて測定すると、図
2(C) に示す如く、異方導電性接続部材を介して接触す
るダミー電極71,72 と81,82 の接触抵抗をRS
し、ダミー電極71,72 の固有抵抗をRP とし、ダミー
電極81,82 の固有抵抗をRT としたとき、抵抗値R1
=RS +RP +RT となる。
A connection system in which dummy electrodes 7 1 , 7 2 and 8 1 , 8 2 are connected by an anisotropic conductive connecting member (for example, an anisotropic conductive film) for connecting the electrode terminal 2 and the conductor pattern connecting portion 4 When the resistance value R 1 is measured with the pads 9 1 and 9 2 , as shown in FIG. 2C, the dummy electrodes 7 1 and 7 2 and 8 1 and 8 2 which are in contact with each other through the anisotropic conductive connecting member are connected. When the contact resistance is R S , the specific resistance of the dummy electrodes 7 1 and 7 2 is R P, and the specific resistance of the dummy electrodes 8 1 and 8 2 is R T , the resistance value R 1
= R S + R P + R T.

【0019】従って、抵抗値RP とRT を予め測定して
おけば、測定値Rより接触抵抗RSを知ること可能とな
り、接触抵抗RS より電極端子2と接続部4の接続抵抗
が推定される。
[0019] Therefore, if the resistance value R P and R T measured in advance, it becomes possible to know the contact resistance R S than the measured value R, connection resistance of the connection portion 4 electrode terminal 2 and from the contact resistance R S is Presumed.

【0020】接触抵抗RS はダミー電極71,72 ,81,
2 の構成(材質)により異なる。そこで、ダミー電極
1,72 の構成を電極端子2と同じとし、ダミー電極8
1,8 2 の構成を接続部4と同じにする、さらにはそれら
の形状,寸法を共通化することにより、電極端子2と接
続部4との接触抵抗を接触抵抗RS から推定する精度が
向上する。
Contact resistance RSIs the dummy electrode 71, 72, 81,
82Depends on the configuration (material). Therefore, the dummy electrode
71, 72And the dummy electrode 8
1, 8 2Make the configuration of the connection part 4 the same, and further they
By sharing the shape and dimensions of the
The contact resistance with the connecting portion 4 is the contact resistance RSThe accuracy estimated from
improves.

【0021】なお、図2の実施例においてダミー電極7
1,72 ,81,82 は、電極端子2および接続部4の両整
列端に設けている。これは、表示パネル1と絶縁フィル
ム3を圧着にて接続したとき、それらの厚さ方向の傾斜
を検出するためであり、かかる傾斜に対し圧着装置の保
証が十分であれば、一方のダミー電極71 または72
それに接続すべき81,82 が不要になる。
In the embodiment of FIG. 2, the dummy electrode 7
1 , 7 2 , 8 1 , and 8 2 are provided at both aligned ends of the electrode terminal 2 and the connecting portion 4. This is because when the display panel 1 and the insulating film 3 are connected by crimping, the inclination in the thickness direction thereof is detected. 7 1 or 7 2 and 8 1 and 8 2 to be connected thereto are unnecessary.

【0022】図3において、(A) は液晶表示パネルに形
成した電極端子とダミー電極の平面図,(B)はTABフィ
ルムに形成した導体パターンの接続部とダミー電極の平
面図、(C) はダミー電極を使用した接触抵抗測定系の等
価回路である。
In FIG. 3, (A) is a plan view of the electrode terminals and the dummy electrodes formed on the liquid crystal display panel, (B) is a plan view of the connection portions of the conductor patterns and the dummy electrodes formed on the TAB film, and (C). Is an equivalent circuit of a contact resistance measuring system using dummy electrodes.

【0023】図3(A) において、一対のガラス基板を接
合しその接合間隙に液晶を充填した液晶表示パネル1に
は、ガラス基板に形成した透明電極に連通する多数の電
極端子2と、一定ピッチで整列する電極端子2の両整列
端に配設し電極端子2と同幅の第1のダミー電極711,71
2 とダミー電極711,712 に連通する一対のパッド101,10
2 を形成する。
In FIG. 3A, a liquid crystal display panel 1 in which a pair of glass substrates are bonded and liquid crystal is filled in the bonding gap is provided with a large number of electrode terminals 2 communicating with transparent electrodes formed on the glass substrates. First dummy electrodes 71 1 and 71 having the same width as the electrode terminals 2 are provided at both ends of the electrode terminals 2 aligned at a pitch.
2 and the dummy electrodes 71 1 and 71 2 communicate with a pair of pads 10 1 and 10
Form 2 .

【0024】図3(B) において、図示しないICチップ
を実装したTABフィルム(絶縁フィルム)3には、一
端(接続部)4が電極端子2に対向し他端が図示しない
ICチップに接続する多数の導体パターンと、ダミー電
極71に対向する一対の第2のダミー電極81,82 と、ダ
ミー電極81,82 に連通する一対のパッド91,92 を形
成する。
In FIG. 3B, a TAB film (insulating film) 3 on which an IC chip (not shown) is mounted has one end (connecting portion) 4 facing the electrode terminal 2 and the other end connected to an IC chip (not shown). a plurality of conductive patterns are formed with a pair of opposed second dummy electrodes 81, 82 to the dummy electrodes 71, the dummy electrodes 8 1, a pair of pads 9 which communicates with the 8 2 1 9 2.

【0025】電極端子2と導体パターン接続部4とを接
続する異方導電性接続部材(例えば異方導電性フィル
ム)によりダミー電極711,712 と81,82 を接続した接
続系の抵抗値R2 は、図3(C) に示す如く、異方導電性
接続部材を介して接触するダミー電極711,712 と81,8
2 の接触抵抗をRS とし、ダミー電極711,712 の固有抵
抗をRP1,RP2とし、ダミー電極81,82 の固有抵抗を
T1, T2とし、例えばパッド92 からパッド101 に定
電流I1 を流し、パッド91,102 にて電圧を測定する
と、パッド91 と中間点91 ′との間, パッド102 と中
間点102 ′との間には電流が流れないため、パッド91
と中間点91 , パッド102 と中間点102′は同電位と
なる。
A connection system in which the dummy electrodes 71 1 , 71 2 and 8 1 , 8 2 are connected by an anisotropic conductive connecting member (for example, an anisotropic conductive film) for connecting the electrode terminal 2 and the conductor pattern connecting portion 4 The resistance value R 2 is, as shown in FIG. 3 (C), the dummy electrodes 71 1 , 71 2 and 8 1 , 8 which are in contact with each other through the anisotropic conductive connecting member.
2 of the contact resistance and R S, the resistivity of the dummy electrodes 71 1, 71 2 and R P1, R P2, the dummy electrodes 81, 82 of the resistivity and R T1, R T2, for example from the pad 9 2 When a constant current I 1 is passed through the pad 10 1 and the voltage is measured at the pads 9 1 and 10 2 , the pad 9 1 and the intermediate point 9 1 ′, and the pad 10 2 and the intermediate point 10 2 ′ are measured. Current does not flow through pad 9 1
And the intermediate point 9 1, the pad 10 2 and the intermediate point 10 2 ′ have the same potential.

【0026】従って、パッド91 とパッド102 とで測定
した電圧は、中間点91 ′と102 ′との間の電圧と等し
くなり、この時の電圧をV1 とすると、 RS =V1 /I1 により接触抵抗RS が正確に測定される。
Therefore, the voltage measured at the pads 9 1 and 10 2 becomes equal to the voltage between the intermediate points 9 1 ′ and 10 2 ′, and if the voltage at this time is V 1 , then R S = The contact resistance R S is accurately measured by V 1 / I 1 .

【0027】接触抵抗RS はダミー電極711,712,81,8
2 の構成(材質)により異なる。そこで、ダミー電極71
1,712 の構成を電極端子2と同じとし、ダミー電極81,
2の構成を接続部4と同じにする、さらにはそれらの
形状,寸法を共通化することが望ましい。
The contact resistance R S is the dummy electrodes 71 1 , 71 2 , 8 1 , 8
Depends on the configuration (material) of 2 . Therefore, the dummy electrode 71
The configuration of 1 , 71 2 is the same as that of the electrode terminal 2, and the dummy electrodes 8 1 ,
It is desirable that the structure of 8 2 be the same as that of the connecting portion 4 and that their shapes and dimensions are made common.

【0028】なお、図3の実施例においてダミー電極71
1,712,81,82 は、電極端子2および接続部4の両整列
端に設けている。これは、表示パネル1と絶縁フィルム
3を圧着にて接続したとき、それらの厚さ方向の傾斜
(平行度)を検出するためであり、かかる傾斜に対し圧
着装置の保証が十分であれば、ダミー電極711,712 の一
方とそれに接続すべきダミー電極81 または82 が不要
になる。
In the embodiment of FIG. 3, the dummy electrode 71
1 , 71 2 , 8 1 , and 8 2 are provided at both aligned ends of the electrode terminal 2 and the connecting portion 4. This is to detect the inclination (parallelism) in the thickness direction of the display panel 1 and the insulating film 3 when they are connected by pressure bonding. One of the dummy electrodes 71 1 and 71 2 and the dummy electrode 8 1 or 8 2 to be connected thereto are unnecessary.

【0029】図4において、(A) は液晶表示パネルに形
成した電極端子とダミー電極の平面図,(B)はTABフィ
ルムに形成した導体パターンの接続部とダミー電極の平
面図、(C) はダミー電極を使用した接触抵抗測定系の等
価回路である。
In FIG. 4, (A) is a plan view of the electrode terminals and the dummy electrodes formed on the liquid crystal display panel, (B) is a plan view of the connection portions of the conductor patterns and the dummy electrodes formed on the TAB film, and (C). Is an equivalent circuit of a contact resistance measuring system using dummy electrodes.

【0030】図4(A) において、一対のガラス基板を接
合しその接合間隙に液晶を充填した液晶表示パネル1に
は、ガラス基板に形成した透明電極に連通する多数の電
極端子2と、一定ピッチで整列する電極端子2の両整列
端に配設し電極端子2より広幅の第1のダミー電極721,
722 とダミー電極721,722 を形成する。
In FIG. 4 (A), a liquid crystal display panel 1 in which a pair of glass substrates are bonded and liquid crystal is filled in the bonding gap is provided with a large number of electrode terminals 2 communicating with transparent electrodes formed on the glass substrates. First dummy electrodes 72 1 , which are arranged at both ends of the electrode terminals 2 aligned at a pitch and are wider than the electrode terminals 2,
72 2 and dummy electrodes 72 1 and 72 2 are formed.

【0031】図4(B) において、図示しないICチップ
を実装したTABフィルム(絶縁フィルム)3には、一
端(接続部)4が電極端子2に対向し他端が図示しない
ICチップに接続する多数の導体パターンと、ダミー電
極721,722 のそれぞれに対向する3本の第2のダミー電
極81,82,83 と、ダミー電極81,82,83 のそれぞれ
に連通するパッド91,92,93 を形成する。
In FIG. 4B, a TAB film (insulating film) 3 on which an IC chip (not shown) is mounted has one end (connecting portion) 4 facing the electrode terminal 2 and the other end connected to an IC chip (not shown). A large number of conductor patterns, three second dummy electrodes 8 1 , 8 2 and 8 3 facing the dummy electrodes 72 1 and 72 2 respectively, and communication with the dummy electrodes 8 1 , 8 2 and 8 3 respectively. Pads 9 1 , 9 2 and 9 3 are formed.

【0032】電極端子2と導体パターン接続部4とを接
続する異方導電性接続部材(例えば異方導電性フィル
ム)によりダミー電極711,712 と81,82,83 を接続し
た接続系の抵抗値R3 は、図4(C) に示す如く、異方導
電性接続部材を介して接触するダミー電極711,712 と8
1,82,83 の接触抵抗をRS1, RS2, RS3とし、ダミー
電極81 と82 の対向間におけるダミー電極711,712
固有抵抗をRP1とし、ダミー電極82 と83 の対向間に
おけるダミー電極711,712 の固有抵抗をRP2(≒RP1
とし、ダミー電極81,82,83 の固有抵抗をRT1,
T2, T3とし、例えばパッド93 からパッド92 に定電
流I2 を流し、パッド91,92 にて電圧を測定すると、
パッド91 と中間点91 ′との間は電流が流れず同電位
となり、パッド91,92 で測定した電圧は、パッド92
と中間点91 ′との間の電圧と等しくなり、この時の電
圧をV2 とすると、 R3 =V2 /I2 となる。
The dummy electrodes 71 1 , 71 2 and 8 1 , 8 2 , 8 3 are connected by an anisotropic conductive connecting member (for example, an anisotropic conductive film) which connects the electrode terminal 2 and the conductor pattern connecting portion 4. As shown in FIG. 4C, the resistance value R 3 of the connection system is the dummy electrodes 71 1 , 71 2 and 8 which are in contact with each other through the anisotropic conductive connection member.
The contact resistances of 1 , 8, 2 and 8 3 are R S1 , R S2 and R S3, and the specific resistance of the dummy electrodes 71 1 and 71 2 between the opposing dummy electrodes 8 1 and 8 2 is R P1 and the dummy electrode 8 The specific resistance of the dummy electrodes 71 1 and 71 2 between 2 and 8 3 facing each other is R P2 (≈R P1 ).
And the specific resistance of the dummy electrodes 8 1 , 8 2 , and 8 3 is R T1, R
Let T2 and R T3 , for example, when a constant current I 2 is passed from the pad 9 3 to the pad 9 2 and the voltage is measured at the pads 9 1 and 9 2 ,
Between the pad 9 1 and the midpoint 9 1 'becomes the same potential, no current flows, the voltage measured at the pad 9 1, 9 2, the pad 9 2
Is equal to the voltage between the intermediate point 9 1 ′ and the intermediate point 9 1 ′. If the voltage at this time is V 2 , then R 3 = V 2 / I 2 .

【0033】また、R3 =RS2+RT2となるため、RT2
を予め測定しておけば、接触抵抗R S2が推定される。接
触抵抗RS1, RS2, RS3はダミー電極721,722,81,82,
3 の構成(材質)により異なる。そこで、ダミー電極
721,722 の構成を電極端子2と同じとし、ダミー電極8
1,82,83 の構成を接続部4と同じにする、さらにはそ
れらの形状,寸法を共通化することにより、電極端子2
と接続部4との接触抵抗を接触抵抗R S から推定する精
度が向上する。
Also, R3= RS2+ RT2Therefore, RT2
If you measure in advance, contact resistance R S2Is estimated. Contact
Touch resistance RS1, RS2, RS3Is the dummy electrode 721, 722, 81, 82,
83Depends on the configuration (material). Therefore, the dummy electrode
721, 722And the dummy electrode 8
1, 82, 83The same as the connection section 4, and
By making their shapes and dimensions common, the electrode terminal 2
And the contact resistance between the connection part 4 and the contact resistance R SEstimated from
The degree improves.

【0034】なお、図4の実施例においてダミー電極72
1,722,81,82,83 は、電極端子2および接続部4の両
整列端に設けている。これは、表示パネル1と絶縁フィ
ルム3を圧着にて接続したとき、それらの厚さ方向の傾
斜(平行度)を検出するためであり、かかる傾斜に対し
圧着装置の保証が十分であれば、ダミー電極721,722
一方とそれに接続すべきダミー電極81,82,83 が不要
になる。
In the embodiment of FIG. 4, the dummy electrode 72
1 , 72 2 , 8 1 , 8 2 , and 8 3 are provided at both aligned ends of the electrode terminal 2 and the connecting portion 4. This is to detect the inclination (parallelism) in the thickness direction of the display panel 1 and the insulating film 3 when they are connected by pressure bonding. One of the dummy electrodes 72 1 and 72 2 and the dummy electrodes 8 1 , 8 2 and 8 3 to be connected thereto are unnecessary.

【0035】図5において、一対のガラス基板を接合し
その接合間隙に液晶を充填した液晶表示パネル1には、
ガラス基板に形成した透明電極に連通する多数の電極端
子2と、一定ピッチで整列する電極端子2の両整列端に
コ字形のダミー電極731,732を形成する。
In FIG. 5, a liquid crystal display panel 1 in which a pair of glass substrates are bonded and liquid crystal is filled in the bonding gap is
U-shaped dummy electrodes 73 1 and 73 2 are formed at both aligned ends of a large number of electrode terminals 2 communicating with transparent electrodes formed on a glass substrate and the electrode terminals 2 aligned at a constant pitch.

【0036】図2(B) に示すダミー電極81,82 が接続
するダミー電極731 と732 は、電極端子2と同幅かつ同
ピッチの一対の導体片11を連結したコ字形であり、導体
片11とダミー電極81,82 とを利用して、液晶表示パネ
ル1とTABフィルム3との位置合わせが容易となる。
Dummy electrodes 73 1 and 73 2 connected to the dummy electrodes 8 1 and 8 2 shown in FIG. 2B are U-shaped in which a pair of conductor pieces 11 having the same width and pitch as the electrode terminals 2 are connected. Therefore, by using the conductor piece 11 and the dummy electrodes 8 1 and 8 2 , it becomes easy to align the liquid crystal display panel 1 and the TAB film 3.

【0037】図6において、一対のガラス基板を接合し
その接合間隙に液晶を充填した液晶表示パネル1には、
ガラス基板に形成した透明電極に連通する多数の電極端
子2と、一定ピッチで整列する電極端子2の両整列端に
コ字形のダミー電極741,742を形成する。
In FIG. 6, a liquid crystal display panel 1 in which a pair of glass substrates are bonded and liquid crystal is filled in the bonding gap is
U-shaped dummy electrodes 74 1 and 74 2 are formed at both aligned ends of a large number of electrode terminals 2 communicating with transparent electrodes formed on a glass substrate and the electrode terminals 2 aligned at a constant pitch.

【0038】図4(B) に示すダミー電極81,82,83
接続するダミー電極741 と742 は、電極端子2と同幅か
つ同ピッチの3本の導体片11を連結したヨ字形であり、
導体片11とダミー電極81,82,83 とを利用して、液晶
表示パネル1とTABフィルム3との位置合わせが容易
となる。
The dummy electrodes 74 1 and 74 2 to which the dummy electrodes 8 1 , 8 2 and 8 3 shown in FIG. 4B are connected are connected to three conductor pieces 11 having the same width and pitch as the electrode terminals 2. It is a Y-shaped
By using the conductor piece 11 and the dummy electrodes 8 1 , 8 2 , and 8 3 , it becomes easy to align the liquid crystal display panel 1 and the TAB film 3 with each other.

【0039】[0039]

【発明の効果】以上説明したように本発明方法によれ
ば、液晶表示パネルユニットに回路接続しないダミー電
極を形成し、表示パネルとTABフィルムとの接続に替
えてダミー電極の接触抵抗を測定する構成とし、表示パ
ネルとTABフィルムとの接触部の良否を正確かつ速や
かに判定できるようにし、液晶表示パネルユニットの生
産性を改善し、表示品質の向上に寄与した効果がある。
As described above, according to the method of the present invention, the dummy electrode not connected to the circuit is formed in the liquid crystal display panel unit, and the contact resistance of the dummy electrode is measured in place of the connection between the display panel and the TAB film. With this configuration, it is possible to accurately and promptly determine the quality of the contact portion between the display panel and the TAB film, improve the productivity of the liquid crystal display panel unit, and contribute to the improvement of display quality.

【図面の簡単な説明】[Brief description of drawings]

【図1】 本発明方法の基本構成の説明図である。FIG. 1 is an explanatory diagram of a basic configuration of a method of the present invention.

【図2】 本発明方法の第1の実施例における要部構成
の説明図である。
FIG. 2 is an explanatory diagram of a main part configuration in a first embodiment of the method of the present invention.

【図3】 本発明方法の第2の実施例における要部構成
の説明図である。
FIG. 3 is an explanatory diagram of a main part configuration in a second embodiment of the method of the present invention.

【図4】 本発明方法の第3の実施例における要部構成
の説明図である。
FIG. 4 is an explanatory diagram of a main part configuration in a third embodiment of the method of the present invention.

【図5】 本発明方法の第4の実施例に係わる電極端子
の説明図である。
FIG. 5 is an explanatory view of an electrode terminal according to a fourth embodiment of the method of the present invention.

【図6】 本発明方法の第5の実施例に係わる電極端子
の説明図である。
FIG. 6 is an explanatory view of an electrode terminal according to a fifth embodiment of the method of the present invention.

【図7】 異方導電性フィルムを使用した回路接続の断
面図である。
FIG. 7 is a cross-sectional view of a circuit connection using an anisotropic conductive film.

【符号の説明】[Explanation of symbols]

1は液晶表示パネル 2は表示パネルに形成した電極端子 3は絶縁フィルム(TABフィルム) 4はTABフィルムに形成した導体パターンの一端(接
続端) 6は異方導電性部材(異方導電性フィルム) 7,71,72,711,712,721,722,731,732,741,742 は第1のダ
ミー電極 8,81,82,83は第2のダミー電極 9,91,92,101,102,はパッド
1 is a liquid crystal display panel 2 is an electrode terminal formed on the display panel 3 is an insulating film (TAB film) 4 is one end (connection end) of a conductor pattern formed on the TAB film 6 is an anisotropic conductive member (anisotropic conductive film) ) is 7,7 1, 7 2, 71 1, 71 2, 72 1, 72 2, 73 1, 73 2, 74 1, 74 2 1 first dummy electrodes 8, 8, 8 2, 8 3 a 2 dummy electrodes 9,9 1 , 9, 2 , 10 1 , 10 2 , are pads

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】 液晶表示パネル(1) と、該表示パネル
(1) の電極端子(2) に一端(4) が接続する導体パターン
を形成した絶縁フィルム(3) とを、異方導電性部材によ
って接続する液晶表示デバイスユニットにおいて、該表
示パネル(1) には第1のダミー電極(7,71,72) を設け、
該絶縁フィルム(3) には該異方導電性部材を介して該第
1のダミー電極に接続する一対の第2のダミー電極(8,8
1,82) を設け、該電極端子(2) と該導体パターンの一端
(4) との接触抵抗測定に替えて、該第1のダミー電極
(7,71,72) と該第2のダミー電極(8,81,82) との接触抵
抗を測定することを特徴とする液晶表示パネルユニット
の電気接続の試験方法。
1. A liquid crystal display panel (1) and the display panel
In the liquid crystal display device unit in which an insulating film (3) having a conductor pattern whose one end (4) is connected to the electrode terminal (2) of (1) is connected by an anisotropic conductive member, the display panel (1) a first dummy electrode (7,7 1, 7 2) provided on,
The insulating film (3) has a pair of second dummy electrodes (8, 8) connected to the first dummy electrode via the anisotropic conductive member.
1 , 8 2 ), and the electrode terminal (2) and one end of the conductor pattern
(4) Instead of measuring contact resistance with the first dummy electrode
A method for testing electrical connection of a liquid crystal display panel unit, comprising measuring the contact resistance between (7,7 1 , 7 2 ) and the second dummy electrode (8,8 1 , 8 2 ).
【請求項2】 液晶表示パネル(1) と、該表示パネル
(1) の電極端子(2) に一端(4) が接続する導体パターン
を形成した絶縁フィルム(3) とを、異方導電性部材によ
って接続する液晶表示デバイスユニットにおいて、該表
示パネル(1) には第1のダミー電極(711,712) と該第1
のダミー電極(711,712) に連通する一対のパッド(101,1
02) とを設け、該絶縁フィルム(3) には該異方導電性部
材を介して該第1のダミー電極(711,712) に接続する第
2のダミー電極(81,82) と該第2のダミー電極(81,82)
に連通する一対のパッド(91,92) とを設け、該第1のダ
ミー電極(711,712) に連通する該パッド(101,102) の一
方と該第2のダミー電極(8 1,82) に連通する該パッド(9
1,92) の一方とに接触抵抗測定用電流を流し、該電極端
子(2) と該導体パターンの一端(4) との接触抵抗測定に
替えて、該第1のダミー電極(711,712) に連通する該パ
ッド(101,102) の他方と該第2のダミー電極(81,82) に
連通する該パッド(91,92) の一方とを使用して該第1の
ダミー電極(711,712) と該第2のダミー電極(81,82) と
の接触抵抗を測定することを特徴とする液晶表示パネル
ユニットの電気接続の試験方法。
2. A liquid crystal display panel (1) and the display panel
Conductor pattern where one end (4) connects to the electrode terminal (2) of (1)
The insulating film (3) on which the
In the liquid crystal display device unit connected by
The display panel (1) has a first dummy electrode (711, 712) And the first
Dummy electrode (711, 712) To a pair of pads (101, 1
02) Is provided, and the anisotropic conductive portion is provided on the insulating film (3).
The first dummy electrode (711, 712) To connect to
2 dummy electrodes (81, 82) And the second dummy electrode (81, 82)
A pair of pads (91, 92) And the first da
Me electrode (711, 712) To the pad (101,Ten2)
And the second dummy electrode (8 1, 82) To the pad (9
1, 92) Apply a current for contact resistance measurement to one of the
For measuring the contact resistance between the child (2) and one end (4) of the conductor pattern
Instead, the first dummy electrode (711, 712) To the
Dead (101,Ten2) And the second dummy electrode (81, 82)
The pad in communication (91, 92) Using one of the first
Dummy electrode (711, 712) And the second dummy electrode (81, 82) When
LCD panel characterized by measuring contact resistance of
Test method for electrical connection of units.
【請求項3】 液晶表示パネル(1) と、該表示パネル
(1) の電極端子(2) に一端(4) が接続する導体パターン
を形成した絶縁フィルム(3) とを、異方導電性部材によ
って接続する液晶表示デバイスユニットにおいて、該表
示パネル(1) には第1のダミー電極(721,722) を設け、
該絶縁フィルム(3) には該異方導電性部材を介して該第
1のダミー電極(721,722) に接続する3本の第2のダミ
ー電極(8 1,82,83)を設け、該3本の第2のダミー電極(8
1,82,83)の中の2本(82,83) に接触抵抗測定用電流を流
し、該電極端子(2) と該導体パターンの一端(4) との接
触抵抗に替えて、該2本の第2のダミー電極の中の1本
(82)と該電流を流さない1本の該第2のダミー電極(81)
を使用して該第1のダミー電極(721,722) と該第2のダ
ミー電極(81,82,83)との接触抵抗を測定することを特徴
とする液晶表示パネルユニットの電気接続の試験方法。
3. A liquid crystal display panel (1) and the display panel
Conductor pattern where one end (4) connects to the electrode terminal (2) of (1)
The insulating film (3) on which the
In the liquid crystal display device unit connected by
The display panel (1) has a first dummy electrode (721, 722),
The insulating film (3) is connected to the insulating film (3) through the anisotropic conductive member.
1 dummy electrode (721, 722) 3 second dams connected to
ー Electrode (8 1, 82, 83) Are provided, and the three second dummy electrodes (8
1, 82, 832 in ()2, 83) Through the contact resistance measurement current.
The electrode terminal (2) and one end (4) of the conductor pattern.
One of the two second dummy electrodes instead of the tactile resistance
(82) And one of the second dummy electrodes (81)
Using the first dummy electrode (721, 722) And the second da
Me electrode (81, 82, 83) Is characterized by measuring the contact resistance with
Test method for electrical connection of liquid crystal display panel unit.
【請求項4】 液晶表示パネル(1) には該表示パネル
(1) に形成し整列する電極端子(2) の両整列端に第1の
ダミー電極(7,71,72,711,712,721,722,731,732,741,7
42) を設け、絶縁フィルム(3) には一対の該第1のダミ
ー電極に対向する第2のダミー電極(8,81,82,83)を設け
ることを特徴とする前記請求項1または請求項2または
請求項3記載の液晶表示パネルユニットの電気接続の試
験方法。
4. The liquid crystal display panel (1) includes the display panel.
(1) first dummy electrodes on both aligned ends of the electrode terminals (2) to form aligned (7,7 1, 7 2, 71 1, 71 2, 72 1, 72 2, 73 1, 73 2, 74 1 , 7
4 2 ) is provided, and the second dummy electrode (8, 8 1 , 8 2 , 8 3 ) facing the pair of first dummy electrodes is provided on the insulating film (3). A method for testing electrical connection of a liquid crystal display panel unit according to claim 1, claim 2 or claim 3.
【請求項5】 液晶表示パネル(1) に形成した第1のダ
ミー電極(731,732,741,742) が、該表示パネル(1) に形
成した電極端子(2) と同幅かつ同ピッチの導体片を連結
したコ字形またはヨ字形とすることを特徴とする前記請
求項2または請求項3記載の液晶表示パネルユニットの
電気接続の試験方法。
5. The first dummy electrodes (73 1 , 73 2 , 74 1 , 74 2 ) formed on the liquid crystal display panel (1) are the same as the electrode terminals (2) formed on the display panel (1). The test method for electrical connection of a liquid crystal display panel unit according to claim 2 or claim 3, wherein the conductor pieces having a width and the same pitch are connected to each other to form a U-shape or a Y-shape.
【請求項6】 液晶表示パネル(1) に形成した第1のダ
ミー電極(7,71,72,711,712,721,722,731,732,741,742)
を該表示パネル(1) に形成した電極端子(2)と同一構成
とし、絶縁フィルム(3) に形成した第2のダミー電極
(8,81,82,83)を該絶縁フィルム(3) に形成した導体パタ
ーンの一端(4) と同一構成とすることを特徴とする前記
請求項1または請求項2または請求項3記載の液晶表示
パネルユニットの電気接続の試験方法。
6. 1 first dummy electrode (7, 7 formed on the liquid crystal display panel (1), 7 2, 71 1, 71 2, 72 1, 72 2, 73 1, 73 2, 74 1, 74 2 )
A second dummy electrode formed on the insulating film (3) with the same structure as the electrode terminal (2) formed on the display panel (1).
(8,8 1, 8 2, 8 3) of claim 1 or claim 2 or claim to one end of the conductor pattern formed on the insulating film (3) and (4), characterized in that the same configuration The method for testing the electrical connection of the liquid crystal display panel unit according to item 3.
JP20934092A 1992-08-06 1992-08-06 Method for testing electric connection of liquid crystal display panel unit Withdrawn JPH0659269A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20934092A JPH0659269A (en) 1992-08-06 1992-08-06 Method for testing electric connection of liquid crystal display panel unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20934092A JPH0659269A (en) 1992-08-06 1992-08-06 Method for testing electric connection of liquid crystal display panel unit

Publications (1)

Publication Number Publication Date
JPH0659269A true JPH0659269A (en) 1994-03-04

Family

ID=16571333

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20934092A Withdrawn JPH0659269A (en) 1992-08-06 1992-08-06 Method for testing electric connection of liquid crystal display panel unit

Country Status (1)

Country Link
JP (1) JPH0659269A (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08184646A (en) * 1994-12-28 1996-07-16 Nec Ic Microcomput Syst Ltd Semiconductor integrated circuit
WO2000054098A1 (en) * 1999-03-08 2000-09-14 Matsushita Electric Industrial Co., Ltd. Liquid crystal display and its inspecting method
JP2002229053A (en) * 2001-01-31 2002-08-14 Matsushita Electric Ind Co Ltd Liquid crystal display module
CN100419438C (en) * 2004-06-22 2008-09-17 瀚宇彩晶股份有限公司 Connected impedance measurement and structure
JP2008241748A (en) * 2007-03-23 2008-10-09 Sharp Corp Display panel, liquid crystal display device and driving circuit packaging substrate
JP2011056919A (en) * 2009-09-14 2011-03-24 Ricoh Co Ltd Liquid delivering head and image forming apparatus
KR101143633B1 (en) * 2010-09-08 2012-05-09 에스케이하이닉스 주식회사 Test pattern of semiconductor device
US8351009B2 (en) 2009-06-22 2013-01-08 Sharp Kabushiki Kaisha Display panel, liquid crystal display device and drive-circuit-mounted board
JP2017087599A (en) * 2015-11-12 2017-05-25 キヤノン株式会社 Liquid discharge head, liquid discharge device and inspection method
CN111223431A (en) * 2018-11-16 2020-06-02 罗姆股份有限公司 Semiconductor device, display driver, and display device

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08184646A (en) * 1994-12-28 1996-07-16 Nec Ic Microcomput Syst Ltd Semiconductor integrated circuit
US6407795B1 (en) 1998-03-08 2002-06-18 Matsushita Electric Industrial Co., Ltd. Liquid crystal display and its inspecting method
WO2000054098A1 (en) * 1999-03-08 2000-09-14 Matsushita Electric Industrial Co., Ltd. Liquid crystal display and its inspecting method
JP2002229053A (en) * 2001-01-31 2002-08-14 Matsushita Electric Ind Co Ltd Liquid crystal display module
CN100419438C (en) * 2004-06-22 2008-09-17 瀚宇彩晶股份有限公司 Connected impedance measurement and structure
JP2008241748A (en) * 2007-03-23 2008-10-09 Sharp Corp Display panel, liquid crystal display device and driving circuit packaging substrate
US8351009B2 (en) 2009-06-22 2013-01-08 Sharp Kabushiki Kaisha Display panel, liquid crystal display device and drive-circuit-mounted board
JP2011056919A (en) * 2009-09-14 2011-03-24 Ricoh Co Ltd Liquid delivering head and image forming apparatus
KR101143633B1 (en) * 2010-09-08 2012-05-09 에스케이하이닉스 주식회사 Test pattern of semiconductor device
JP2017087599A (en) * 2015-11-12 2017-05-25 キヤノン株式会社 Liquid discharge head, liquid discharge device and inspection method
CN111223431A (en) * 2018-11-16 2020-06-02 罗姆股份有限公司 Semiconductor device, display driver, and display device
JP2020085476A (en) * 2018-11-16 2020-06-04 ローム株式会社 Semiconductor device, display driver, and display device

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