JPH0650787Y2 - Ic試験用入出力回路 - Google Patents
Ic試験用入出力回路Info
- Publication number
- JPH0650787Y2 JPH0650787Y2 JP16604587U JP16604587U JPH0650787Y2 JP H0650787 Y2 JPH0650787 Y2 JP H0650787Y2 JP 16604587 U JP16604587 U JP 16604587U JP 16604587 U JP16604587 U JP 16604587U JP H0650787 Y2 JPH0650787 Y2 JP H0650787Y2
- Authority
- JP
- Japan
- Prior art keywords
- input
- output
- switch
- driver
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16604587U JPH0650787Y2 (ja) | 1987-10-28 | 1987-10-28 | Ic試験用入出力回路 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16604587U JPH0650787Y2 (ja) | 1987-10-28 | 1987-10-28 | Ic試験用入出力回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0170175U JPH0170175U (fr) | 1989-05-10 |
JPH0650787Y2 true JPH0650787Y2 (ja) | 1994-12-21 |
Family
ID=31453079
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16604587U Expired - Lifetime JPH0650787Y2 (ja) | 1987-10-28 | 1987-10-28 | Ic試験用入出力回路 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0650787Y2 (fr) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001183431A (ja) * | 1999-04-06 | 2001-07-06 | Advantest Corp | 試験装置および試験方法 |
US7102375B2 (en) * | 2004-12-23 | 2006-09-05 | Teradyne, Inc. | Pin electronics with high voltage functionality |
-
1987
- 1987-10-28 JP JP16604587U patent/JPH0650787Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH0170175U (fr) | 1989-05-10 |
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