JPH0650756B2 - Heat treatment equipment for thin plate - Google Patents
Heat treatment equipment for thin plateInfo
- Publication number
- JPH0650756B2 JPH0650756B2 JP57148583A JP14858382A JPH0650756B2 JP H0650756 B2 JPH0650756 B2 JP H0650756B2 JP 57148583 A JP57148583 A JP 57148583A JP 14858382 A JP14858382 A JP 14858382A JP H0650756 B2 JPH0650756 B2 JP H0650756B2
- Authority
- JP
- Japan
- Prior art keywords
- chamber
- thin plate
- processed
- wafer
- heat treatment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000010438 heat treatment Methods 0.000 title claims description 28
- 235000012431 wafers Nutrition 0.000 description 44
- 230000003028 elevating effect Effects 0.000 description 6
- 230000006698 induction Effects 0.000 description 6
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 210000002105 tongue Anatomy 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- FGRBYDKOBBBPOI-UHFFFAOYSA-N 10,10-dioxo-2-[4-(N-phenylanilino)phenyl]thioxanthen-9-one Chemical compound O=C1c2ccccc2S(=O)(=O)c2ccc(cc12)-c1ccc(cc1)N(c1ccccc1)c1ccccc1 FGRBYDKOBBBPOI-UHFFFAOYSA-N 0.000 description 1
- 239000004809 Teflon Substances 0.000 description 1
- 229920006362 Teflon® Polymers 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000013007 heat curing Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000012495 reaction gas Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67778—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
- H01L21/67781—Batch transfer of wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67778—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
Description
【発明の詳細な説明】 本発明は半導体ウエハーなどを加熱して、CVD(Chem
ical Vapor Deposition)熱硬化或いは拡散処理を行な
う装置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention heats a semiconductor wafer or the like to perform CVD (Chem
ical Vapor Deposition) An apparatus for performing thermosetting or diffusion treatment.
反応室内で予じめ加熱した基板上に膜形成のための元素
を含んだ混合反応ガスを送り込み、基板上の熱化学反応
を利用して所望の膜を形成するようにしたCVDは減圧
状態下、或いはプラズマ状態下で行なわれるようになつ
てきている。このため、最近では内部を減圧に保つて且
つプラズマ発生用の電極を内部に配したチヤンバーの周
囲に加熱コイルを巻回した装置が提供されている。A mixed reaction gas containing an element for forming a film is fed onto a substrate that has been preheated in the reaction chamber, and a desired film is formed by utilizing a thermochemical reaction on the substrate. Or, it has come to be performed under a plasma state. For this reason, recently, there has been provided an apparatus in which a heating coil is wound around a chamber in which an electrode for plasma generation is arranged inside while maintaining a reduced pressure inside.
しかしながら、従来の装置は基板等の被処理物を1枚ず
つチヤンバー内に入れ、加熱処理を行なうようにしてい
るので非能率的であり、処理時間も多く要し、処理後の
チヤンバー内が高温となつている場合があるので被処理
材を取り出す際に細心の注意を払わなければならない。
またこれを自動化して行なう場合には装置自体が大型化
し且つ機構も複雑となる。そのため自動的に加熱処理が
行なえ且つコンパクトな加熱処理装置が望まれている。However, the conventional device is inefficient because it takes heat treatment by putting the objects to be processed such as substrates into the chamber one by one, and it takes a lot of processing time, and the temperature inside the chamber after processing is high. Therefore, it is necessary to be very careful when taking out the material to be processed.
Further, when this is automated, the apparatus itself becomes large and the mechanism becomes complicated. Therefore, a compact heat treatment apparatus that can automatically perform heat treatment is desired.
本発明は上記要望に応えるべくなされたものであり、そ
の目的とするところは、手作業によることなく自動的に
多数枚の薄板状被処理物を短時間で加熱処理でき、且つ
コンパクトな加熱処理装置を提供するにある。The present invention has been made to meet the above-mentioned demand, and an object thereof is to perform a heat treatment on a large number of thin plate-shaped objects automatically in a short time without a manual work, and a compact heat treatment. To provide the equipment.
上記目的を達成すべく本発明に係る加熱処理装置は、装
置本体内にチヤンバーを縦方向に配設し、このチヤンバ
ーの周囲に高周波誘導加熱コイルなどの加熱部材を設
け、該チヤンバーに対して複数の薄板状被処理物を保持
し得る保持体を挿抜可能としたことをその要旨としてい
る。In order to achieve the above object, the heat treatment apparatus according to the present invention has a chamber vertically arranged in the apparatus body, and a heating member such as a high frequency induction heating coil is provided around the chamber, and a plurality of chambers are provided for the chamber. The gist of the present invention is that the holder capable of holding the thin plate-shaped object can be inserted and removed.
以下に本発明の実施例を添付図面に基いて詳述する。Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings.
第1図は本発明に係る加熱処理装置をプラズマCVD用
の装置として適用した例を示すものであり、略々ボツク
ス状をなす装置本体1内には石英からなる円筒状のプラ
ズマ発生用のチヤンバー2を縦方向、即ちチヤンバー2
の軸が上下方向となるように配設し、このチヤンバー2
の上端部を閉塞し、下端部を開口するとともに、外周部
には加熱部材である高周波誘導加熱コイル3を巻回して
いる。そしてチヤンバー2の周囲には図示しない電極板
を固定し、本体1内に高周波電源4を配設し、高周波を
印加することでチヤンバー2内にプラズマを発生せしめ
るようにしている。FIG. 1 shows an example in which the heat treatment apparatus according to the present invention is applied as an apparatus for plasma CVD. A cylindrical plasma generating chamber made of quartz is provided in the apparatus body 1 having a substantially box shape. 2 in the vertical direction, that is, chamber 2
This chamber 2 is installed so that the axis of is vertical.
The upper end is closed and the lower end is opened, and a high frequency induction heating coil 3 serving as a heating member is wound around the outer periphery. Then, an electrode plate (not shown) is fixed around the chamber 2, a high frequency power source 4 is arranged in the main body 1, and plasma is generated in the chamber 2 by applying a high frequency.
また、本体1の前面下半部には張り出し部5を一体的に
形成し、この張り出し部5の上面6に各種操作ボタン7
…を設けるとともに、上面6の左右に薄板状の被処理物
である半導体ウエハー8を25枚収納し得る収納カセツ
ト9,9を配設している。Further, a projecting portion 5 is integrally formed on the lower front half of the main body 1, and various operation buttons 7 are formed on the upper surface 6 of the projecting portion 5.
.., and storage cassettes 9, 9 capable of storing 25 semiconductor wafers 8 which are thin plate-shaped objects are disposed on the left and right of the upper surface 6.
この収納カセツト9は第2図の内部構造図にも示すよう
に、アルミ或いはテフロンなどからなる2枚の板体9
a,9aを対向し上端部を棒材10,10で接続してな
り、板体9aの下端を板状の支持部材11上に載置し、
この支持部材11の昇降動につれて収納カセツト9が上
面6に形成した孔12を介して張り出し部5に対し昇降
動するようにしている。As shown in the internal structure diagram of FIG. 2, this storage cassette 9 has two plate bodies 9 made of aluminum or Teflon.
a and 9a are opposed to each other and upper ends thereof are connected by bar members 10 and 10, and the lower end of the plate body 9a is placed on a plate-shaped support member 11.
As the support member 11 moves up and down, the storage cassette 9 moves up and down with respect to the projecting portion 5 through the hole 12 formed in the upper surface 6.
また上記張り出し部5の上面6には左右方向に伸びる開
口13を形成し、この開口13内に一対の搬送部材であ
る無端ベルト14,14を配設している。無端ベルト1
4の基部14aは上記収納カセツト9の下部に位置し、
夫々の無端ベルト14の先部14bは離間して対向して
いる。そして無端ベルト14の上面は張り出し部5の上
面6よりも若干上方に位置し、収納カセツト9が下降し
た際に最下段のウエハー8が無端ベルト14上に載るよ
うにしている。Further, an opening 13 extending in the left-right direction is formed on the upper surface 6 of the projecting portion 5, and a pair of endless belts 14, 14 which are conveying members are arranged in the opening 13. Endless belt 1
The base portion 14a of 4 is located at the lower portion of the storage cassette 9,
The front ends 14b of the respective endless belts 14 are spaced apart and face each other. The upper surface of the endless belt 14 is located slightly above the upper surface 6 of the projecting portion 5, and the lowermost wafer 8 is placed on the endless belt 14 when the storage cassette 9 descends.
また上記開口13の中央から装置本体1内に伸びる開口
15が形成され、この開口15にシリンダユニツト16
によつて昇降動せしめられる昇降部材17の基部を臨ま
せている。この昇降部材17はシリンダユニツト16が
引込み動をした場合にはその上面が無端ベルト14の上
面よりも若干下方に位置するようにしている。そして昇
降部材17の基部には窓18を形成し、この窓18内に
ウエハー8を昇降部材17上に容易に乗り移らすための
ローラ19を設け、更に昇降部材17の両側には昇降部
材17の基部に乗り移つたウエハーを先部に移送するた
めの無端ベルト20設けている。そしてこの無端ベルト
20の外側にはアーム部材21を設けている。このアー
ム部材21はその基部の上端から棒状部21aを延出す
るとともに基部下端に取り出けたキヤスター22によつ
てガイドレール23上を移動可能とされている。Further, an opening 15 extending from the center of the opening 13 into the apparatus main body 1 is formed, and a cylinder unit 16 is formed in the opening 15.
The base of the elevating member 17 that can be moved up and down is exposed. When the cylinder unit 16 retracts, the upper and lower members of the elevating member 17 are positioned slightly below the upper surface of the endless belt 14. A window 18 is formed at the base of the lifting member 17, and a roller 19 for easily transferring the wafer 8 onto the lifting member 17 is provided in the window 18, and the lifting member 17 is provided on both sides of the lifting member 17. An endless belt 20 is provided for transferring the wafer transferred to the base of the above to the front. An arm member 21 is provided outside the endless belt 20. The arm member 21 has a rod-shaped portion 21a extending from the upper end of its base portion, and is movable on a guide rail 23 by a caster 22 taken out at the lower end of the base portion.
一方、本体1の底面には2本のガイド棒24,24が立
設され、このガイド棒24,24に前記プラズマ発生用
チヤンバー2の蓋体25を摺動自在に挿着している。こ
の蓋体25にはネジ部を刻設したロツド26が螺合挿通
され、このロツド26をモータ27で回転せしめること
で、蓋体25がガイド棒24,24に沿つて昇降動する
ようにしている。On the other hand, two guide rods 24, 24 are erected on the bottom surface of the main body 1, and the lid 25 of the plasma generating chamber 2 is slidably attached to the guide rods 24, 24. A rod 26 having a threaded portion is threadedly inserted into the lid body 25, and the rod 26 is rotated by a motor 27 so that the lid body 25 moves up and down along the guide rods 24, 24. There is.
そして、蓋体25の上面にはウエハー保持体28を立設
している。この保持体28は4本の柱29…とこれら柱
29…の上端部を結合する棒材30…とからなり、保持
体28は平面から見て台形をなすようにしている。そし
て上記柱29…には上下方向に等間隔で溝部31…を複
数(本実施例では50本)を穿設し、この溝部31にウ
エハー8の端部が嵌り込んで係止するようにしている。A wafer holder 28 is erected on the upper surface of the lid 25. The holding body 28 is composed of four pillars 29 ... And a rod member 30 connecting the upper ends of the pillars 29. The holding body 28 is trapezoidal in plan view. A plurality of grooves 31 (50 in this embodiment) are formed in the pillars 29 at equal intervals in the vertical direction, and the ends of the wafer 8 are fitted and locked in the grooves 31. There is.
以上において、先ず25枚のウエハー8…を収納した左
側のカセツト9を若干降下せしめ、カセツト9に収納さ
れているウエハー8…のうち最下段に位置するウエハー
を無端ベルト14上に載せる。するとウエハー8は無端
ベルト14によつて昇降部材17上まで送り出される。
このときリミツトスイツチによつてシリンダユニツト1
6が作動し、昇降部材17が上昇し、無端ベルト20に
よつてウエハー8が昇降部材17の先端部まで搬送され
る。In the above, first, the cassette 9 on the left side, which accommodates 25 wafers 8 ... Is slightly lowered, and the wafer located at the lowermost stage among the wafers 8 ... Then, the wafer 8 is sent to the upper and lower members 17 by the endless belt 14.
At this time, the cylinder unit 1 is set by the limit switch.
6 is operated, the elevating member 17 is elevated, and the wafer 8 is conveyed by the endless belt 20 to the tip of the elevating member 17.
そしてウエハー8が昇降部材17の先端部までくるとリ
ミツトスイツチにより無端ベルト20の駆動が停止し、
昇降部材17がもとの位置まで下降する。すると、ウエ
ハー8はアーム部材21,21の先端部に乗り移る。次
いでアーム部材21,21はウエハー保持体28に向つ
て移動し、ウエハーを保持体28の柱29に形成した溝
部31に係止せしめる。この場合、保持体28は最も下
つた位置とし、最初のウエハー8は保持体28の最上段
に保持されるようにする。Then, when the wafer 8 reaches the tip of the elevating member 17, the drive of the endless belt 20 is stopped by the limit switch,
The elevating member 17 descends to the original position. Then, the wafer 8 is transferred onto the tips of the arm members 21 and 21. Next, the arm members 21 and 21 move toward the wafer holder 28 and lock the wafer in the groove 31 formed in the column 29 of the holder 28. In this case, the holding body 28 is at the lowest position, and the first wafer 8 is held on the uppermost stage of the holding body 28.
次いでモータ27を駆動して保持体28を一段分、即ち
溝部31の一間隔分だけ上昇せしめる。すると、アーム
部材21の先端部からウエハー8が離れ、この後アーム
部材21はもとの位置まで戻り、装置は最初の状態にな
る。Next, the motor 27 is driven to raise the holding body 28 by one step, that is, by one interval of the groove portion 31. Then, the wafer 8 is separated from the tip of the arm member 21, and then the arm member 21 returns to its original position, and the apparatus is in the initial state.
この後、左側のカセツト9が更に一段分降下し2枚目の
ウエハーを送り出し、このウエハーを前記同様の操作で
保持体28の2段目の溝部に保持せしめる。そしてこの
操作を繰り返し、左側のカセツト9内のウエハー8…の
全て(25枚)を保持体28内に保持せしめたら、今度
は右側のカセツト9についても同様の操作を行なつて合
計50枚のウエハー8…を保持体28内に保持せしめ
る。Thereafter, the cassette 9 on the left side is further lowered by one step and the second wafer is sent out, and this wafer is held in the groove part of the second step of the holder 28 by the same operation as described above. When this operation is repeated and all the wafers 8 (... 25) in the left cassette 9 are held in the holder 28, the same operation is performed for the right cassette 9 to make a total of 50 wafers. The wafers 8 are held in the holder 28.
次いで、モータ27を駆動して保持体28をチヤンバー
2内に収納するとともに蓋体25によつてチヤンバー2
の下端開口部を塞ぐ。この後、高周波電源4によつてチ
ヤンバー2内にプラズマを発生せしめるとともに、高周
波誘導加熱コイル3によつて被処理物であるウエハー8
にプラズマCVD処理を行なう。Next, the motor 27 is driven to house the holder 28 in the chamber 2 and the lid 25 is used to move the holder 2 into the chamber 2.
Close the bottom opening of the. After that, plasma is generated in the chamber 2 by the high frequency power source 4, and the wafer 8 which is the object to be processed is generated by the high frequency induction heating coil 3.
Then, plasma CVD processing is performed.
この後、前記した操作と逆の操作によつてチヤンバー2
内で処理したウエハー8…をカセツト9内に一枚ずつ戻
す。After this, by performing the reverse operation to the above operation, the chamber 2
The wafers 8 processed in the inside are returned to the cassette 9 one by one.
第3図乃至第6図は別実施例を示すものであり、前記実
施例と同一の部材については同一の番号を付している。FIGS. 3 to 6 show another embodiment, and the same members as those in the above embodiment are designated by the same reference numerals.
即ち装置本体1内には縦方向にチヤンバー2を配設し、
このチヤンバー2の周囲に高周波誘導加熱コイル3を巻
回している。そして本体1内には高周波電源4を設け電
極板を介してチヤンバー2内にプラズマを発生せしめる
ようにしている。That is, the chamber 2 is vertically arranged in the device body 1,
A high frequency induction heating coil 3 is wound around the chamber 2. A high frequency power source 4 is provided in the main body 1 so that plasma can be generated in the chamber 2 via an electrode plate.
また本体1の前面には張り出し部5を形成するととも
に、本体1の内部には支持板32を固着し、この支持板
322の上下端にブラケツト33,33を取付け、これ
らブラケツト33,33間にネジ部を形成したロツド3
4をモータによつて回転せしめられるように支持してい
る。そして、上記ロツド34に支持台35を螺合し、ロ
ツド34の回転によつて支持台35が図示しない案内ロ
ツドに沿つて昇降動するようにしている。そして支持台
35には前記実施例と同様の蓋体25が設けられてお
り、この蓋体25の上面にウエハーの保持体28が立設
されている。Further, an overhanging portion 5 is formed on the front surface of the main body 1, a support plate 32 is fixed inside the main body 1, and brackets 33, 33 are attached to the upper and lower ends of the support plate 322, and between the brackets 33, 33. Rod 3 with threads
4 is supported so that it can be rotated by a motor. A support base 35 is screwed onto the rod 34, and the rotation of the rod 34 causes the support base 35 to move up and down along a guide rod (not shown). A lid 25 similar to that of the above-described embodiment is provided on the support base 35, and a wafer holder 28 is erected on the upper surface of the lid 25.
また、本体1内の中央には横方向に支持板36を架設
し、この支持板36の上面左右に一対の回転板37,3
7を設け、この回転板37,37の先端にウエハー収納
用のカセツト9を載置するようにしている。In addition, a support plate 36 is horizontally installed in the center of the main body 1, and a pair of rotating plates 37, 3 are provided on the left and right of the upper surface of the support plate 36.
7 is provided, and a cassette 9 for accommodating a wafer is placed on the tips of the rotary plates 37, 37.
そして回転板37の下方には移し換え部材38を配設し
ている。この移し換え部材38は第4図及び第5図に示
す如く、アングル片39の起立部39aの裏面に多数の
先端二股状となつた舌状片40…を上下方向に連続的に
取り付けており、該アングル片39の基部を本体1内に
配設したシリンダユニツト41のロツド42に固着して
いる。一方シリンダユニツト41は本体1内の前後方向
に架設された案内ロツド43,43に摺動自在に挿通し
た支持台44に固設され、この支持台44をシリンダユ
ニツト45で案内ロツド43,43に沿つて移動せしめ
るようにしている。而して、移し換え部材38はシリン
ダユニツト41の作動で昇降動し、シリンダユニツト4
5の作動で前後動するようになつている。A transfer member 38 is arranged below the rotary plate 37. As shown in FIGS. 4 and 5, the transfer member 38 has a large number of tongue-shaped pieces 40 ... The base portion of the angle piece 39 is fixed to the rod 42 of the cylinder unit 41 arranged in the main body 1. On the other hand, the cylinder unit 41 is fixedly mounted on a support base 44 slidably inserted in guide rods 43, 43 installed in the main body 1 in the front-rear direction, and the support base 44 is connected to the guide rods 43, 43 by a cylinder unit 45. I am trying to move along. Thus, the transfer member 38 moves up and down by the operation of the cylinder unit 41, and the cylinder unit 4
It is designed to move back and forth with the action of 5.
以上において、ウエハー8…を収納したカセツト9をカ
セツト9の板体9aが本体1の前面と平行となるように
して回転板37上に載置して第4図の状態とする。次い
でモータを駆動してロツド34を回転し、支持台35、
蓋体25及び保持体28を一体的に降下せしめ最下端に
位置せしめる。そしてこれと同時に一方の回転板37を
約90゜回転せしめ、カセツト9を保持体28の上部近
傍に位置せしめる。In the above, the cassette 9 accommodating the wafers 8 is placed on the rotary plate 37 so that the plate 9a of the cassette 9 is parallel to the front surface of the main body 1 and the state shown in FIG. Next, the motor is driven to rotate the rod 34, and the support base 35,
The lid body 25 and the holding body 28 are integrally lowered to be positioned at the lowermost end. At the same time, one of the rotary plates 37 is rotated about 90 ° to position the cassette 9 near the upper part of the holder 28.
次いでシリンダユニツト41を作動して移し換え部材3
8を上昇せしめ、移し換え部材38の舌状片40…の夫
々がカセツト9内に収納したウエハー8…の中間に位置
する高さで停止する。この状態を第6図で示している。Next, the cylinder unit 41 is operated to move the transfer member 3
8 are raised, and the tongues 40 ... Of the transfer member 38 are stopped at a height positioned in the middle of the wafers 8 ... Stored in the cassette 9. This state is shown in FIG.
次いでシリンダユニツト45を作動せしめて移し換え部
材を図中右方へ移動せしめる。すると、各舌状片40…
はウエハー8…の間に挿入されることとなる。そしてこ
の状態となつた時点でシリンダ45の作動を停止し、シ
リンダユニツト41を再度作動し、移し換え部材38を
若干上昇せしめる。すると、舌状片40…がカセツト9
内のウエハー8…を持ち上げることとなる。Then, the cylinder unit 45 is operated to move the transfer member to the right in the figure. Then, each tongue 40 ...
Will be inserted between the wafers 8 ... When this state is reached, the operation of the cylinder 45 is stopped, the cylinder unit 41 is operated again, and the transfer member 38 is slightly raised. Then, the tongue 40 ...
The inner wafers 8 are lifted.
そして、舌状片40…上にウエハー8…が載置されたな
らば、シリンダユニツト41の作動を停止し、再度シリ
ンダユニツト45を作動せしめる。すると、ウエハー8
…は移し換え部材38によつて保持体28内に送られ、
保持体28の柱29に形成した溝部31内にウエハー8
の端部が嵌り込み、複数(例えば25枚)のウエハー8
…は同時に保持体28に係止されることとなる。この後
シリンダユニツト41,45を作動せしめることで移し
換え部材38を元の位置に戻す。そして、上記と同様の
操作を他方の回転板37上に載置したカセツト9内のウ
エハーにも行なうことで、保持体28内にカセツト2個
分(例えば50枚)のウエハー8を保持せしめる。When the wafers 8 are placed on the tongue-shaped pieces 40, the operation of the cylinder unit 41 is stopped and the cylinder unit 45 is operated again. Then, wafer 8
Are sent into the holding body 28 by the transfer member 38,
The wafer 8 is placed in the groove 31 formed in the pillar 29 of the holder 28.
The end portions of the wafers 8 fit into each other, and a plurality of wafers 8 (for example, 25 wafers)
At the same time, the ... Is locked to the holder 28. Then, the cylinder units 41 and 45 are operated to return the transfer member 38 to the original position. Then, the same operation as described above is performed on the wafer in the cassette 9 placed on the other rotary plate 37, so that the two wafers 8 (for example, 50) can be held in the holder 28.
この状態から更にロツド34を回転せしめ、蓋体25が
チヤンバー2の下端開口部を塞ぐまで支持台35を上昇
せしめる。これにより保持体28はウエハー8を保持し
た状態で密閉状態のチヤンバー2内に装填されることと
なる。From this state, the rod 34 is further rotated to raise the support base 35 until the lid body 25 closes the lower end opening of the chamber 2. As a result, the holding body 28 is loaded into the chamber 2 in a hermetically sealed state while holding the wafer 8.
斯る状態にて高周波電源4によつてチヤンバー2内にプ
ラズマを発生せしめ且つ高周波誘導コイル3によつて、
チヤンバー2内のウエハー8にプラズマCVD処理を行
なう。In such a state, plasma is generated in the chamber 2 by the high frequency power source 4 and by the high frequency induction coil 3,
Plasma CVD processing is performed on the wafer 8 in the chamber 2.
そして斯る処理が終了したならば、前記と逆の操作によ
り、チヤンバー2内のウエハー8を半分ずつカセツト9
内に戻して処理が完了する。Then, when such processing is completed, the wafer 8 in the chamber 2 is cut into halves by the operation reverse to the above.
Then, the process is completed.
尚、以上に示したものは本発明の実施の一例に過ぎず、
チヤンバー2の周囲に巻回する加熱部材は高周波誘導加
熱コイルに限らず、抵抗加熱コイル或いは加熱ランプ等
を配設してもよい。また実施例にあつてはプラズマCV
D処理用として本発明に係る装置を示したが、本発明に
係る装置は薄板状の被処理物に熱硬化処理或いは拡散処
理する場合にも用いることができるのは勿論である。It should be noted that what has been shown above is merely an example of the implementation of the present invention,
The heating member wound around the chamber 2 is not limited to the high frequency induction heating coil, and a resistance heating coil or a heating lamp may be provided. Further, in the embodiment, plasma CV
Although the apparatus according to the present invention is shown for the D treatment, it goes without saying that the apparatus according to the present invention can also be used in the case of subjecting a thin plate-shaped object to heat curing treatment or diffusion treatment.
また、図示例にあつてはチヤンバー2の開口を下にし、
下方から保持体28を挿入するものを示したが、チヤン
バー2の開口を上にし、上方から保持体28を挿入する
ようにしてもよい。Also, in the illustrated example, the opening of the chamber 2 is turned down,
Although the holder 28 is inserted from below, the holder 2 may be inserted from above so that the opening of the chamber 2 is upward.
以上の説明で明らかな如く本発明によれば、チヤンバー
を縦方向に配置するようにしたので、コンパクト化が図
れ、またチヤンバー内で多数枚の被処理物を同時に処理
するようにしたので、処理時間を大巾に短縮することが
でき、更に被処理物の保持体への被処理物の送り、及び
取り出し等を自動的に行なうようにしたので、従来の手
作業に比べ作業能率が向上するとともに被処理物を傷付
けるおそれも少なくなり、製品歩留りも大巾に向上する
等多くの効果を発揮する。As apparent from the above description, according to the present invention, since the chambers are arranged in the vertical direction, it is possible to achieve compactness, and it is possible to simultaneously process a large number of objects to be processed in the chambers. The time can be greatly shortened, and the object to be processed is automatically fed to and removed from the holder of the object to be processed, so that the work efficiency is improved as compared with the conventional manual work. At the same time, the possibility of damaging the object to be treated is reduced, and the product yield is greatly improved.
更に、本発明は、4本の柱に上下方向に等間隔に複数の
溝部を穿設して構成した保持体で複数枚のウェハーをチ
ャンバー内に保持するようにしたので、ウェハーの加熱
処理において、加熱の温度分布を均一にし、かつ加熱効
率の優れた加熱処理を施すことができるという効果を奏
する。Further, according to the present invention, since a plurality of wafers are held in the chamber by a holder configured by forming a plurality of grooves at equal intervals in the vertical direction on four pillars, the wafer heating process Further, it is possible to make the heating temperature distribution uniform and to perform the heat treatment with excellent heating efficiency.
図面は本発明の実施例を示すものであり、第1図は本発
明に係る加熱処理装置の概略構造を示す斜視図、第2図
は同加熱処理装置の内部構造を示す斜視図、第3図は別
実施例の正面図、第4図は同別実施例の内部構造を示す
側面図、第5図は移し換え部材の斜視図、第6図は同別
実施例の作用を説明した側面図である。 尚、図面中1は装置本体、2はチヤンバー、3は加熱部
材、8は薄板状被処理物、9は収納カセット、28は保
持体、29は柱、31は溝部、38は移し換え部材であ
る。The drawings show an embodiment of the present invention. FIG. 1 is a perspective view showing a schematic structure of a heat treatment apparatus according to the present invention, FIG. 2 is a perspective view showing an internal structure of the heat treatment apparatus, and FIG. FIG. 4 is a front view of another embodiment, FIG. 4 is a side view showing the internal structure of the other embodiment, FIG. 5 is a perspective view of a transfer member, and FIG. 6 is a side view for explaining the operation of the other embodiment. It is a figure. In the drawings, 1 is a main body of the apparatus, 2 is a chamber, 3 is a heating member, 8 is a thin plate-shaped object to be processed, 9 is a storage cassette, 28 is a holder, 29 is a pillar, 31 is a groove, and 38 is a transfer member. is there.
───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭56−91417(JP,A) ─────────────────────────────────────────────────── ─── Continuation of the front page (56) References JP-A-56-91417 (JP, A)
Claims (1)
ーと、このチャンバーの外周に配設された加熱部材と、 上記チャンバー内に挿抜可能とされ、4本の柱に上下方
向に等間隔に複数の溝部を穿設してなるとともにこれら
溝部で薄板状被処理物の端部を保持するものであって、
かつ上記4本の柱が平面から見て台形をなすよう配列さ
れた保持体と、 上記チャンバー外に配置され、処理前若しくは処理済の
薄板状被処理物を複数枚収納する収納カセットと、 この収納カセットから1枚若しくは複数枚の薄板状被処
理物を取出し、前記保持体の柱で囲われた空間に送り込
み、柱の溝部に係止するとともに柱の溝部から1枚若し
くは複数枚の薄板状被処理物を取出して収納カセットへ
送り込む移し換え部材と、 からなる薄板状被処理物の加熱処理装置。1. A chamber vertically arranged in a main body of the apparatus, a heating member arranged at an outer periphery of the chamber, and a chamber which can be inserted into and removed from the chamber and are vertically spaced apart by four columns. A plurality of groove portions are formed in the groove, and the end portions of the thin plate-shaped object to be processed are held by these groove portions,
And a holder in which the four columns are arranged in a trapezoidal shape when viewed from above, a storage cassette which is disposed outside the chamber and stores a plurality of thin plate-shaped objects to be processed or processed. One or more thin plate-shaped objects to be processed are taken out from the storage cassette, fed into the space surrounded by the pillar of the holding body, locked in the groove of the pillar, and one or more thin plate-shaped objects from the groove of the pillar. A heat treatment device for a thin plate-shaped object to be processed, which comprises a transfer member that takes out the object to be processed and sends it to a storage cassette.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57148583A JPH0650756B2 (en) | 1982-08-27 | 1982-08-27 | Heat treatment equipment for thin plate |
US06/424,503 US4550239A (en) | 1981-10-05 | 1982-09-27 | Automatic plasma processing device and heat treatment device |
US06/424,287 US4550242A (en) | 1981-10-05 | 1982-09-27 | Automatic plasma processing device and heat treatment device for batch treatment of workpieces |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57148583A JPH0650756B2 (en) | 1982-08-27 | 1982-08-27 | Heat treatment equipment for thin plate |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5939341A JPS5939341A (en) | 1984-03-03 |
JPH0650756B2 true JPH0650756B2 (en) | 1994-06-29 |
Family
ID=15455985
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57148583A Expired - Lifetime JPH0650756B2 (en) | 1981-10-05 | 1982-08-27 | Heat treatment equipment for thin plate |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0650756B2 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60258459A (en) * | 1984-06-04 | 1985-12-20 | Deisuko Saiyaa Japan:Kk | Transferring apparatus of wafer for vertical type heat-treating furnace |
JPH04127532A (en) * | 1990-09-19 | 1992-04-28 | Nec Yamagata Ltd | Heat treatment of semiconductor wafer |
KR100407725B1 (en) * | 2001-03-14 | 2003-12-01 | 주식회사 엘리아테크 | Plasma treatment system |
JP2011212560A (en) * | 2010-03-31 | 2011-10-27 | Equos Research Co Ltd | Reactor for saccharification |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5222073B2 (en) * | 1973-06-13 | 1977-06-15 | ||
JPS5691417A (en) * | 1979-12-26 | 1981-07-24 | Fujitsu Ltd | Heating treatment device for wafer |
JPS56165317A (en) * | 1980-05-26 | 1981-12-18 | Fujitsu Ltd | Manufacture of semiconductor device |
JPS57107235A (en) * | 1980-12-25 | 1982-07-03 | Fujitsu Ltd | Vacuum vapor growth device |
-
1982
- 1982-08-27 JP JP57148583A patent/JPH0650756B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPS5939341A (en) | 1984-03-03 |
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