JPS6325500B2 - - Google Patents

Info

Publication number
JPS6325500B2
JPS6325500B2 JP56159281A JP15928181A JPS6325500B2 JP S6325500 B2 JPS6325500 B2 JP S6325500B2 JP 56159281 A JP56159281 A JP 56159281A JP 15928181 A JP15928181 A JP 15928181A JP S6325500 B2 JPS6325500 B2 JP S6325500B2
Authority
JP
Japan
Prior art keywords
wafer
wafer holder
wafers
holder
main body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56159281A
Other languages
Japanese (ja)
Other versions
JPS5860552A (en
Inventor
Akira Uehara
Isamu Hijikata
Hisashi Nakane
Muneo Nakayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Ohka Kogyo Co Ltd
Original Assignee
Tokyo Ohka Kogyo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Ohka Kogyo Co Ltd filed Critical Tokyo Ohka Kogyo Co Ltd
Priority to JP15928181A priority Critical patent/JPS5860552A/en
Priority to US06/424,503 priority patent/US4550239A/en
Publication of JPS5860552A publication Critical patent/JPS5860552A/en
Publication of JPS6325500B2 publication Critical patent/JPS6325500B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67778Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/20Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support

Description

【発明の詳細な説明】 本発明はLSI或いは超LSI等の大集積回路を形
成したチツプの製造に用いる半導体ウエハーのエ
ツチング、クリーニング或いはウエハー表面のホ
トレジスト層のアツシング(灰化剥離)等に用い
るプラズマ処理装置のうち、特にプラズマ発生用
チヤンバーを縦方向に設置した縦型自動プラズマ
処理装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention is a plasma processing method used for etching and cleaning semiconductor wafers used in the manufacture of chips forming large integrated circuits such as LSIs or VLSIs, or for ashing (ashing and peeling) photoresist layers on wafer surfaces. Among processing apparatuses, the present invention particularly relates to a vertical automatic plasma processing apparatus in which a plasma generation chamber is installed vertically.

一般にLSI等の大集積回路を形成したチツプを
製造するには、半導体ウエハーに微細パターンを
形成したレジスト膜によつて被覆されていない導
体ウエハー上に作成された絶縁膜、半導体膜又は
金属膜をエツチングする工程、上記膜をクリーニ
ングする工程及びエツチングに使用したレジスト
膜をウエハー表面から除去するアツシング工程を
必要としている。
Generally, in order to manufacture chips with large integrated circuits such as LSIs, an insulating film, a semiconductor film, or a metal film created on a conductive wafer that is not covered with a resist film with a fine pattern formed on the semiconductor wafer is used. It requires an etching step, a cleaning step for the film, and an ashing step to remove the resist film used for etching from the wafer surface.

そして従来にあつては、上記各工程を、無機
酸、有機溶剤等の種々の液体化学薬品を用いた湿
式処理によつて行なつてきたが、湿式処理による
場合には廃液処理の問題の他に、加工精度が低い
という問題がある。特に最近では超LSIの開発に
伴ないパターンはますます微細化する傾向にあ
り、このような超LSIを製造するにあたつて従来
の湿式処理を施すことはできなくなつてきてい
る。
Conventionally, each of the above steps has been carried out by wet processing using various liquid chemicals such as inorganic acids and organic solvents. Another problem is that machining accuracy is low. Particularly in recent years, with the development of ultra-LSIs, patterns have become increasingly finer, and it has become impossible to use conventional wet processing to manufacture such ultra-LSIs.

このため現在では加工精度の高いプラズマを用
いた乾式処理に移行しつつあり、この乾式処理を
行なうプラズマ処理装置を種々提案されるに至つ
ている。
For this reason, there is currently a shift to dry processing using plasma with high processing accuracy, and various plasma processing apparatuses for performing this dry processing have been proposed.

しかしながら多くのプラズマ処理装置は単にプ
ラズマ発生用チヤンバーを備えたものに過ぎず、
該チヤンバー内へのウエハーの出し入れは専ら手
作業によつて行なつている。
However, many plasma processing devices are simply equipped with a chamber for plasma generation.
Wafers are moved in and out of the chamber exclusively by hand.

例えば、未処理ウエハー収納カセツトからウエ
ハーを1枚毎取り出し石英またはアルミニウム製
のウエハー治具にピンセツトにより移し替えを行
なつている。このためウエハーの欠け、割れ、保
持不良による落下または汚染等により生産歩留り
が非常に低く、さらに近年の如くウエハー径も4
インチから5インチそして6インチと大型化する
につれ上記した欠点は増大する。そしてさらにプ
ラズマ処理中は高温度となるため、処理後の取り
出しを手作業で行なうことは避けなければならず
作業能率は極めて低い。
For example, wafers are taken out one by one from an unprocessed wafer storage cassette and transferred to a wafer jig made of quartz or aluminum using tweezers. For this reason, production yields are extremely low due to wafer chips, cracks, dropping due to poor holding, and contamination.Furthermore, as in recent years, wafer diameters have increased to 4.
As the size increases from 1 inch to 5 inches to 6 inches, the above-mentioned disadvantages increase. Furthermore, since the temperature is high during plasma processing, manual removal after processing must be avoided, resulting in extremely low work efficiency.

斯る不利を解消する自動プラズマ処理装置とし
て、特開昭53−90870号に示される装置があるが、
この装置は極めて構造が複雑であるとともに、プ
ラズマ発生用チヤンバーを横向きに設置してい
る。このため装置自体の占有面積が大きくなり、
コンパクト化を図ることができない。
As an automatic plasma processing apparatus that eliminates such disadvantages, there is an apparatus disclosed in Japanese Patent Application Laid-Open No. 53-90870.
This device has an extremely complex structure, and the plasma generation chamber is installed horizontally. This increases the area occupied by the device itself,
It is not possible to make it more compact.

本発明者等は上述の如き従来の技術的課題に鑑
み、これを有効に解決すべく本発明を成したもの
であり、その目的とする処は、簡単な構造により
多数枚のウエハーを連続して自動的に処理でき、
且つコンパクト化を達成し得る縦型自動プラズマ
処理装置を提供するにある。
In view of the above-mentioned conventional technical problems, the present inventors have created the present invention to effectively solve the problems. can be processed automatically,
Another object of the present invention is to provide a vertical automatic plasma processing apparatus that can be made compact.

斯る目的を達成すべく本発明は装置本体内にプ
ラズマ発生用チヤンバーを縦方向に配置するとと
もに、多数枚のウエハーを保持し得るウエハー保
持体を上記プラズマ発生用チヤンバー内に挿抜自
在となるように支持する一方、第1の搬送部材に
よつてウエハー収納カセツトからウエハーを一枚
毎取り出して送り出すとともに、1枚毎取り出
し、ウエハー保持体方向に移動可能とされた第2
の搬送部材を送り出し、続いて第2の搬送部材に
よつて上記ウエハー保持体内に送り込むようにし
た装置であつて、第1の搬送部材先端部は第2の
搬送基端部近傍に位置したことをその要旨として
いる。
In order to achieve such an object, the present invention arranges a plasma generation chamber vertically within an apparatus main body, and a wafer holder capable of holding a large number of wafers can be freely inserted into and removed from the plasma generation chamber. At the same time, the first conveying member takes out the wafers one by one from the wafer storage cassette and sends them out, while the second conveying member is able to take out the wafers one by one and move them toward the wafer holder.
The apparatus is configured to send out a conveying member, and then feed the wafer into the wafer holder by a second conveying member, wherein the leading end of the first conveying member is located near the base end of the second conveying member. Its gist is:

以下に本発明の好適一実施例を添付図面に基い
て詳述する。
A preferred embodiment of the present invention will be described in detail below with reference to the accompanying drawings.

第1図は本発明に係る縦型自動プラズマ装置の
全体斜視図であり、図中1は略々ボツクス状をし
た装置本体である。この装置本体1内には石英か
らなる円筒状のプラズマ発生用チヤンバー2を縦
方向即ちチヤンバー2の軸が上下方向となるよう
に配設し、このチヤンバー2の上端部を閉塞し下
端部を開口することで、該開口から半導体ウエハ
ー3をチヤンバー2内に装填及び取り出すように
している。また上記チヤンバー2の外周部には電
極板が固定されており、本体1内に設けた高周波
電源4によつて高周波を印加するようにしてい
る。
FIG. 1 is an overall perspective view of a vertical automatic plasma apparatus according to the present invention, and numeral 1 in the figure is a roughly box-shaped apparatus main body. A cylindrical plasma generation chamber 2 made of quartz is arranged in the device main body 1 in a vertical direction, that is, with the axis of the chamber 2 in the vertical direction.The upper end of the chamber 2 is closed and the lower end is open. By doing so, the semiconductor wafer 3 is loaded into and taken out from the chamber 2 through the opening. Further, an electrode plate is fixed to the outer periphery of the chamber 2, and a high frequency power source 4 provided in the main body 1 applies high frequency waves.

また本体1の前面下半部には張出し部5を付設
し、この張出し部5の上面6に各種操作ボタン7
…を取り付けるとともに、上面6の左右の端部に
は半導体ウエハー3…を25枚収納し得る収納カセ
ツト8,8を設けている。この収納カセツト8は
アルミ或いはテフロンなどからなる2枚の板体8
a,8aを対向し上端部を棒状8b,8bで接続
してなり、第2図に示すように一方の板体8aの
下端をアングル状の支持部材9に載置し、支持部
材9の昇降動につれて収納カセツト8が上記上面
6に形成した孔10を介して、張出し部5内へ下
降動し、また張出し部5から上方へ持ち上がるよ
うになつている。
In addition, an overhang 5 is attached to the lower front half of the main body 1, and various operation buttons 7 are provided on the upper surface 6 of this overhang 5.
... are attached, and storage cassettes 8, 8 capable of storing 25 semiconductor wafers 3 are provided at the left and right ends of the upper surface 6. This storage cassette 8 is made up of two plates 8 made of aluminum or Teflon.
a, 8a are opposed to each other and their upper ends are connected by rods 8b, 8b. As shown in FIG. As the storage cassette 8 moves, the storage cassette 8 moves downward into the overhang 5 through the hole 10 formed in the upper surface 6, and lifts upward from the overhang 5.

そして収納カセツト8を構成する板体8aの内
面には、第3図に示す如く水平方向に一定間隔で
突条11…を設け、この突条11…によつて形成
される肩部にウエハー3の端部が係止するように
なつている。
The inner surface of the plate 8a constituting the storage cassette 8 is provided with protrusions 11 at regular intervals in the horizontal direction, as shown in FIG. The end is designed to lock.

また上記張出し部の上面6の中央には左右方向
に伸びる開口12を形成し、この開口12内に一
対の第1の搬送部材13,13を配設している。
即ち搬送部材13は無端ベルトによつて構成さ
れ、その基端部13aは上記収納カセツト8の下
部に位置し、夫々の搬送部材13,13の先端部
13b,13bは上面6の中央部において離間し
て対向している。また搬送部材13である無端ベ
ルトの上面は張出し部の上面6よりも若干上方へ
突出し、収納カセツト8が下降した際に最下段の
ウエハー3が無端ベルト上に載るようにしてい
る。
Further, an opening 12 extending in the left-right direction is formed in the center of the upper surface 6 of the overhang, and a pair of first conveying members 13, 13 are disposed within this opening 12.
That is, the conveying member 13 is constituted by an endless belt, the base end 13a of which is located below the storage cassette 8, and the distal ends 13b, 13b of the respective conveying members 13, 13 are spaced apart from each other at the center of the upper surface 6. and facing each other. Further, the upper surface of the endless belt, which is the conveying member 13, protrudes slightly above the upper surface 6 of the overhanging portion, so that when the storage cassette 8 is lowered, the lowest wafer 3 is placed on the endless belt.

また上記張出し部の上面6には上記開口12と
連続し後方へ伸びる開口14を形成し、この開口
14内に基端部が上記搬送部材13,13の先端
部13b,13b間に位置し、先端部が前記本体
1の前面に形成した開口15から本体1内に入つ
た第2の搬送部材16を設けている。
Further, an opening 14 is formed in the upper surface 6 of the overhanging portion and extends rearward and is continuous with the opening 12, and the base end portion is located within the opening 14 between the tip portions 13b, 13b of the conveying members 13, 13, A second conveying member 16 is provided, the tip of which enters into the main body 1 through an opening 15 formed in the front surface of the main body 1.

この第2の搬送部材16は昇降部材17とアー
ム部材18とからなり、昇降部材17は略々板状
をなし、その基端部は第2図及び第4図に示す如
く、第1の搬送部材13,13の先端部のプーリ
19,19を支持するチヤンネル状の支持ブロツ
ク20内に位置し、その下面を該支持ブロツク2
0の下方に配設したシリンダユニツト21のロツ
ド22に固着し、シリンダユニツト21の作動に
より昇降動せしめられるとともに、ロツド22が
引き込まれた状態にあつては昇降部材17の上面
は第1の搬送部材13の上面よりも若干低く位置
するようになつている。そして昇降部材17の基
端部には窓部23が穿設されており、この窓部2
3にローラ24を嵌着し、第1の搬送部材13上
を移送されてきたウエハー3が昇降部材17上に
容易に乗り移れるようにしている。
The second conveyance member 16 is composed of an elevating member 17 and an arm member 18, and the elevating member 17 is approximately plate-shaped, and its base end is connected to the first conveyor as shown in FIGS. 2 and 4. It is located within a channel-shaped support block 20 that supports the pulleys 19, 19 at the tips of the members 13, 13, and its lower surface is connected to the support block 2.
It is fixed to a rod 22 of a cylinder unit 21 disposed below 0, and is moved up and down by the operation of the cylinder unit 21, and when the rod 22 is retracted, the upper surface of the elevating member 17 is in the first conveying position. It is positioned slightly lower than the upper surface of the member 13. A window 23 is bored at the base end of the elevating member 17.
3 is fitted with a roller 24 so that the wafer 3 transferred on the first conveying member 13 can be easily transferred onto the elevating member 17.

また昇降部材17の両側部には無端ベルト2
5,25を取り付け、ウエハー3を昇降部材17
の上面に沿つて移送するようにしている。
Also, endless belts 2 are provided on both sides of the elevating member 17.
5 and 25, and lift the wafer 3 to the lifting member 17.
The material is transported along the top surface of the container.

そして上記無端ベルト25,25の外側に近接
してアーム部材18,18が設けられている。ア
ーム部材18は第2図に示す如く矩形状の基端部
18aの上端部から棒状部18bを延出し、且つ
基端部18aの下端に取り付けたキヤスター26
によつてガイドレール27上を移動可能とされて
いる。
Arm members 18, 18 are provided close to the outside of the endless belts 25, 25. As shown in FIG. 2, the arm member 18 has a rod-shaped portion 18b extending from the upper end of a rectangular base end 18a, and a caster 26 attached to the lower end of the base end 18a.
It is made movable on the guide rail 27 by.

また第2図に示す如く、本体1の底面には2本
のガイド棒28,28を立設し、このガイド棒2
8,28に前記プラズマ発生用チヤンバー2の蓋
体29を摺動自在に挿着している。そして蓋体2
9に雄ネジ部を形成したロツド30を螺合挿通
し、このロツド30の下端部に嵌着した歯車31
と本体1の底面に固設したモータ32の歯車33
とを噛合せしめ、モータ32の駆動により蓋体2
9がガイド棒28,28に沿つて昇降動するよう
にしている。
Further, as shown in FIG. 2, two guide rods 28, 28 are provided on the bottom surface of the main body 1,
8 and 28, the lid 29 of the plasma generating chamber 2 is slidably inserted therein. and lid body 2
A gear 31 fitted into the lower end of the rod 30 is screwed and inserted into the gear 30.
and the gear 33 of the motor 32 fixed to the bottom of the main body 1.
The lid body 2 is engaged with the lid body 2 by driving the motor 32.
9 is moved up and down along guide rods 28, 28.

更に上記蓋体29の上面にはウエハー保持体3
4を立設している。このウエハー保持体34は4
本のロツド34a,34b,34c,34dと、
これらロツドの上端部を結合する部材34eとか
らなり、ロツド34a及び34bは平面からみて
台形の底辺の両端に位置し、ロツド34c及び3
4dは台形の上辺の両端に位置する形状をしてい
る。そして夫々のロツド34a,34b,34
c,34dの内側部には上下方向に亘つて等間隔
でウエハー3の端部が嵌り込む溝部35…を本実
施例にあつては50本穿設している。而して、上記
アーム部材18,18の先端部間に載置されたウ
エハー3が、アーム部材18,18の移動によつ
てウエハー保持体34内に送り込まれ、上記溝部
35…にその端部が係止することで、ウエハー保
持体34によつてウエハー3が保持されるように
なつている。
Furthermore, a wafer holder 3 is provided on the upper surface of the lid 29.
4 have been set up. This wafer holder 34 has four
Book rods 34a, 34b, 34c, 34d,
The rods 34a and 34b are located at both ends of the base of the trapezoid when viewed from above, and the rods 34c and 3
4d has a shape located at both ends of the upper side of the trapezoid. and each rod 34a, 34b, 34
In this embodiment, 50 grooves 35, into which the ends of the wafer 3 fit, are formed at equal intervals in the vertical direction on the inner sides of the grooves 34c and 34d. Thus, the wafer 3 placed between the tips of the arm members 18, 18 is fed into the wafer holder 34 by the movement of the arm members 18, 18, and its end is placed in the groove 35... By being locked, the wafer 3 is held by the wafer holder 34.

以上の如き構成からなる縦型自動プラズマ装置
の作用を以下に述べる。
The operation of the vertical automatic plasma apparatus constructed as described above will be described below.

先ず25枚のウエハー3…を収納した左側のカセ
ツト8を若干降下せしめると、カセツト8に収納
されているウエハー3…のうち最下段に位置する
ものが、第1の搬送部材13上に載り、次いで搬
送部材13によつて送り出される。そして搬送部
材13の先端部13bまで搬送されてきたウエハ
ー3は第2の搬送部材16の一部を構成する昇降
部材17上に乗り移る。すると、リミツトスイツ
チによつてシリンダユニツト21が作動し、昇降
部材17が若干上昇し、これと同時に無端ベルト
25,25が駆動しウエハー3を昇降部材17の
先端部まで搬送する。
First, when the left cassette 8 containing 25 wafers 3 is lowered slightly, the lowest one of the wafers 3 stored in the cassette 8 is placed on the first transport member 13. Then, it is sent out by the conveying member 13. The wafer 3 that has been transported to the tip end 13b of the transport member 13 is transferred onto the elevating member 17 that constitutes a part of the second transport member 16. Then, the cylinder unit 21 is actuated by the limit switch, the elevating member 17 rises slightly, and at the same time, the endless belts 25, 25 are driven to transport the wafer 3 to the tip of the elevating member 17.

そしてウエハー3が昇降部材の先端部までくる
とリミツトスイツチにより無端ベルト25,25
の駆動が停止し、次いで昇降部材17がもとの位
置まで若干降下する。するとウエハー3はアーム
部材18,18の先端部に乗り移り、更にアーム
部材18,18がウエハー保持体34に向つて移
動する。その結果ウエハー3はウエハー保持体3
4内に送り込まれ、保持体のロツド34a,34
b,34c,34dに形成した溝部35…にその
端部が係止する。この場合ウエハー保持体34は
最も下方に位置しているので、ウエハー3はウエ
ハー保持体34の最上段に保持されることにな
る。
When the wafer 3 reaches the tip of the elevating member, the limit switch activates the endless belts 25, 25.
stops, and then the elevating member 17 descends slightly to its original position. Then, the wafer 3 is transferred to the tips of the arm members 18, 18, and the arm members 18, 18 further move toward the wafer holder 34. As a result, the wafer 3 is attached to the wafer holder 3.
4, and the rods 34a, 34 of the holding body
The ends thereof are locked in grooves 35 formed in b, 34c, 34d. In this case, since the wafer holder 34 is located at the lowest position, the wafer 3 is held at the uppermost stage of the wafer holder 34.

次いでモータ32の駆動によりウエハー保持体
34が一段分、即ち溝部35…の一間隔分だけ上
昇し、アーム部材18,18の先端部からウエハ
ー3が離れ、またアーム部材はもとの位置まで移
動し、装置は最初の状態となる。
Next, by driving the motor 32, the wafer holder 34 is raised by one step, that is, by one space between the grooves 35..., the wafer 3 is separated from the tips of the arm members 18, 18, and the arm members are moved back to their original positions. Then, the device returns to its initial state.

この後、左側のカセツト8が更に一段分降下し
て2枚目のウエハーを送り出し、このウエハーを
前記同様の作用によつてウエハー保持体34の2
段目の溝部に保持せしめる。このようにして順次
ウエハー3…をウエハー保持体34内に送り込
み、左側のカセツト内のウエハーを全て保持体3
4に収納したならば、今度は右側のカセツト8の
ウエハーを同様にしてウエハー保持体34内に保
持せしめ、最終的に50枚のウエハーを保持体34
に送り込む。
Thereafter, the left cassette 8 is further lowered by one stage to deliver the second wafer, and this wafer is transferred to the second wafer holder 34 by the same action as described above.
It is held in the groove of the step. In this way, the wafers 3 are sequentially fed into the wafer holder 34, and all the wafers in the left cassette are transferred to the holder 3.
4, the wafers in the right cassette 8 are held in the wafer holder 34 in the same way, and finally 50 wafers are placed in the wafer holder 34.
send to.

そして更にモータ32に駆動せしめて蓋体29
を上昇し、プラズマ発生用チヤンバー2の下端開
口部を閉塞し、内部を密閉状態とした後、真空ポ
ンプによりチヤンバー2内を真空状態としプラズ
マを発生せしめ、エツチング、クリーニング或い
はアツシング処理を行なう。
Then, the lid body 29 is further driven by the motor 32.
After the chamber 2 is raised, the lower end opening of the plasma generating chamber 2 is closed and the inside is sealed, the chamber 2 is evacuated by a vacuum pump and plasma is generated to perform etching, cleaning or ashing processing.

そして所定時間プラズマ処理を施したならば、
モータ32を駆動せしめウエハー保持体34内の
最下段のウエハー3が、アーム部材18,18の
上端部よりも若干高い位置にくるまで、保持体3
4を降下せしめる。次いでアーム部材18,18
を保持体34方向に移動せしめてアーム部材の先
端部が最下段のウエハーの直下に位置するように
する。そして更にモータ32を駆動せしめること
で保持体を降下せしめ、アーム部材上にウエハー
を載せ、前記と逆の動作によりウエハーをカセツ
ト8内に収納する。以後同様の作用によりプラズ
マ処理を終了する。
After plasma treatment for a predetermined period of time,
Drive the motor 32 and move the wafer holder 3 until the lowest wafer 3 in the wafer holder 34 is at a position slightly higher than the upper ends of the arm members 18, 18.
4 to descend. Next, arm members 18, 18
is moved in the direction of the holder 34 so that the tip of the arm member is positioned directly below the wafer at the lowest stage. Then, by further driving the motor 32, the holder is lowered, the wafer is placed on the arm member, and the wafer is stored in the cassette 8 by the reverse operation. Thereafter, the plasma treatment is completed by the same action.

尚、以上は本発明の単なる一実施例に過ぎず、
本発明は上記のものに限られない。例えば、図示
例においては第2の搬送部材16を昇降部材17
とアーム部材18の2つの部材によつて構成した
が、昇降動作とウエハー保持体方向への移動動作
の両方を行なう1つの部材によつて第2の搬送部
材を構成することもできる。
It should be noted that the above is just one embodiment of the present invention,
The present invention is not limited to the above. For example, in the illustrated example, the second conveying member 16 is connected to the elevating member 17.
Although the second conveying member is composed of two members, ie, the arm member 18 and the arm member 18, it is also possible to construct the second conveying member by a single member that performs both the lifting operation and the moving operation toward the wafer holder.

また第1の搬送部材として無端ベルトを示した
が、これに限らず、スイング動作によつてウエハ
ーを送り出すようにしてもよく、更に昇降手段と
してシリンダを用いずにモータとロツドとを組合
せるようにしてもよい。
Further, although an endless belt is shown as the first conveying member, the wafers are not limited to this, and the wafers may be sent out by a swing motion.Furthermore, a motor and a rod may be combined as the lifting means instead of using a cylinder. You may also do so.

以上の説明で明らかな如く、本発明によれば、
多数枚のウエハーを保持し得るウエハー保持体
を、装置本体内に縦方向に配置したプラズマ発生
用チヤンバーに対し挿抜自在に設ける一方、装置
本体に多数枚のウエハーを収納し得るカセツトを
装着し、このカセツトに収納されたウエハーを取
り出して搬送する第1の搬送部材を装置本体に設
け、更に上記第1の搬送部材の先端部近傍に基端
部が位置し且つ上記ウエハー保持体方向へ移動可
能とされた第2の搬送部材によりウエハーをウエ
ハー保持体内に送り込むようにしたので、手作業
によらず確実にウエハーをチヤンバー内に装填す
ることができ、作業効率の大巾な向上が図れ、且
つ作業中にウエハーを破損する虞れがなく、製品
歩留りを向上せしめることができる。
As is clear from the above description, according to the present invention,
A wafer holder capable of holding a large number of wafers is provided so as to be freely inserted into and removed from a plasma generation chamber arranged vertically within the main body of the apparatus, while a cassette capable of storing a large number of wafers is installed in the main body of the apparatus, A first transport member for taking out and transporting the wafers stored in the cassette is provided in the main body of the apparatus, and further, a base end is located near the tip of the first transport member and is movable in the direction of the wafer holder. Since the wafer is fed into the wafer holder by the second conveying member, the wafer can be reliably loaded into the chamber without manual work, and work efficiency can be greatly improved. There is no risk of damaging the wafer during work, and product yield can be improved.

そして本発明の機構は極めて簡単であり、且つ
チヤンバーは縦型であるので、装置全体のコンパ
クト化を達成し得る等多大な効果を奏する。
Since the mechanism of the present invention is extremely simple and the chamber is vertical, it has great effects such as making the entire device more compact.

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本発明の好適一実施例を示すものであ
り、第1図は本発明に係る縦型自動プラズマ処理
装置の全体斜視図、第2図は同装置の内部機構を
示す斜視図、第3図はウエハー収納カセツトの一
部を示す側面図、第4図はウエハーの搬送機構の
要部を示す正面図である。 尚、図面中1は装置本体、2はプラズマ発生用
チヤンバー、3はウエハー、8はウエハー収納カ
セツト、13は第1の搬送部材、16は第2の搬
送部材、34はウエハー保持体である。
The drawings show a preferred embodiment of the present invention, and FIG. 1 is an overall perspective view of a vertical automatic plasma processing apparatus according to the present invention, FIG. 2 is a perspective view showing the internal mechanism of the apparatus, and FIG. This figure is a side view showing a part of the wafer storage cassette, and FIG. 4 is a front view showing the main part of the wafer transport mechanism. In the drawings, 1 is the main body of the apparatus, 2 is a plasma generation chamber, 3 is a wafer, 8 is a wafer storage cassette, 13 is a first transport member, 16 is a second transport member, and 34 is a wafer holder.

Claims (1)

【特許請求の範囲】[Claims] 1 装置本体内に縦方向に配設されたプラズマ発
生チヤンバーと、このチヤンバー内に昇降機構を
介して挿抜自在とされたウエハー保持体と、ウエ
ハー収納カセツトからウエハーを一枚毎取り出し
てこのウエハーを上記ウエハー保持体内に送り込
む搬送部材とからなる縦型自動プラズマ処理装置
において、前記ウエハー保持体は上下方向に伸び
る複数のロツドからなり、これらのロツドには上
下方向に離間してウエハーの端部が嵌り込む溝部
が形成され、また前記搬送部材は前記ウエハー保
持体のロツドで囲まれた空間内に進退可能とされ
たアーム部材を備えていることを特徴とする縦型
自動プラズマ処理装置。
1 A plasma generation chamber arranged vertically inside the apparatus main body, a wafer holder that can be freely inserted into and removed from the chamber via an elevating mechanism, and a wafer storage cassette in which wafers are taken out one by one and the wafers are In the vertical automatic plasma processing apparatus, the wafer holder is comprised of a plurality of rods extending vertically, and these rods have end portions of the wafer spaced apart in the vertical direction. A vertical automatic plasma processing apparatus characterized in that a groove into which the wafer holder is fitted is formed, and the transfer member is provided with an arm member capable of moving forward and backward into a space surrounded by a rod of the wafer holder.
JP15928181A 1981-10-05 1981-10-05 Vertical-type automatic plasma processing device Granted JPS5860552A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP15928181A JPS5860552A (en) 1981-10-05 1981-10-05 Vertical-type automatic plasma processing device
US06/424,503 US4550239A (en) 1981-10-05 1982-09-27 Automatic plasma processing device and heat treatment device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15928181A JPS5860552A (en) 1981-10-05 1981-10-05 Vertical-type automatic plasma processing device

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP62125192A Division JPS63260047A (en) 1987-05-22 1987-05-22 Wafer holder

Publications (2)

Publication Number Publication Date
JPS5860552A JPS5860552A (en) 1983-04-11
JPS6325500B2 true JPS6325500B2 (en) 1988-05-25

Family

ID=15690362

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15928181A Granted JPS5860552A (en) 1981-10-05 1981-10-05 Vertical-type automatic plasma processing device

Country Status (1)

Country Link
JP (1) JPS5860552A (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60258459A (en) * 1984-06-04 1985-12-20 Deisuko Saiyaa Japan:Kk Transferring apparatus of wafer for vertical type heat-treating furnace
JPS63260047A (en) * 1987-05-22 1988-10-27 Tokyo Ohka Kogyo Co Ltd Wafer holder
KR960001161B1 (en) * 1987-09-29 1996-01-19 도오교오 에레구토론 사가미 가부시끼가이샤 Heat treatment apparatus
JPH0195730U (en) * 1987-12-18 1989-06-26
KR0139816B1 (en) * 1988-02-26 1998-07-15 노보루 후세 Heat-treating apparatus and heat-treating method
JPH0268923A (en) * 1988-09-02 1990-03-08 Tel Sagami Ltd Vertical heat treatment device
JPH0825151B2 (en) * 1988-09-16 1996-03-13 東京応化工業株式会社 Handling unit
JPH0754999Y2 (en) * 1989-05-17 1995-12-18 エム・シー・エレクトロニクス株式会社 Reactor of vertical plasma processor
JPH0735393Y2 (en) * 1989-07-25 1995-08-09 ラムコ株式会社 Wafer transfer device for vertical plasma processing machine
JP3530986B2 (en) * 1995-06-22 2004-05-24 東京エレクトロン株式会社 Transfer arm teaching method and heat treatment apparatus

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49107678A (en) * 1973-02-05 1974-10-12
JPS50126175A (en) * 1974-03-22 1975-10-03
JPS513743U (en) * 1974-06-25 1976-01-12
JPS5342575B2 (en) * 1973-12-10 1978-11-13
JPS5691417A (en) * 1979-12-26 1981-07-24 Fujitsu Ltd Heating treatment device for wafer

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5633149Y2 (en) * 1976-12-16 1981-08-06

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49107678A (en) * 1973-02-05 1974-10-12
JPS5342575B2 (en) * 1973-12-10 1978-11-13
JPS50126175A (en) * 1974-03-22 1975-10-03
JPS513743U (en) * 1974-06-25 1976-01-12
JPS5691417A (en) * 1979-12-26 1981-07-24 Fujitsu Ltd Heating treatment device for wafer

Also Published As

Publication number Publication date
JPS5860552A (en) 1983-04-11

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