JPH0645259Y2 - プローブカード - Google Patents

プローブカード

Info

Publication number
JPH0645259Y2
JPH0645259Y2 JP7427889U JP7427889U JPH0645259Y2 JP H0645259 Y2 JPH0645259 Y2 JP H0645259Y2 JP 7427889 U JP7427889 U JP 7427889U JP 7427889 U JP7427889 U JP 7427889U JP H0645259 Y2 JPH0645259 Y2 JP H0645259Y2
Authority
JP
Japan
Prior art keywords
card
probe
movable plate
stylus
card substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP7427889U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0312172U (enrdf_load_stackoverflow
Inventor
憲二郎 坂東
Original Assignee
武田産業株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 武田産業株式会社 filed Critical 武田産業株式会社
Priority to JP7427889U priority Critical patent/JPH0645259Y2/ja
Publication of JPH0312172U publication Critical patent/JPH0312172U/ja
Application granted granted Critical
Publication of JPH0645259Y2 publication Critical patent/JPH0645259Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP7427889U 1989-06-22 1989-06-22 プローブカード Expired - Lifetime JPH0645259Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7427889U JPH0645259Y2 (ja) 1989-06-22 1989-06-22 プローブカード

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7427889U JPH0645259Y2 (ja) 1989-06-22 1989-06-22 プローブカード

Publications (2)

Publication Number Publication Date
JPH0312172U JPH0312172U (enrdf_load_stackoverflow) 1991-02-07
JPH0645259Y2 true JPH0645259Y2 (ja) 1994-11-16

Family

ID=31613831

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7427889U Expired - Lifetime JPH0645259Y2 (ja) 1989-06-22 1989-06-22 プローブカード

Country Status (1)

Country Link
JP (1) JPH0645259Y2 (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2571516B2 (ja) * 1993-05-20 1997-01-16 フレッシュクエストコーポレーション プローブカード

Also Published As

Publication number Publication date
JPH0312172U (enrdf_load_stackoverflow) 1991-02-07

Similar Documents

Publication Publication Date Title
US4151465A (en) Variable flexure test probe for microelectronic circuits
EP3139181B1 (en) Test and measurement probe with adjustable test point contact
US6937039B2 (en) Tip and tip assembly for a signal probe
JP2709570B2 (ja) 電気試験プローブ用位置決め装置
US3537000A (en) Electrical probe including pivotable contact elements
US6069480A (en) Kelvin contact-type testing device
EP1326078B1 (en) Testing fixture
JPH0645259Y2 (ja) プローブカード
US6222378B1 (en) Probe adapter for a ball-grid-array package
US4055805A (en) Multi-point test probe
US6459287B1 (en) Attachable/detachable probing point
US4812745A (en) Probe for testing electronic components
JPH0623977Y2 (ja) プローブカード
JPH07254468A (ja) Ｉｃ測定用ソケット
JPS6236139Y2 (enrdf_load_stackoverflow)
JPH0145029B2 (enrdf_load_stackoverflow)
US6717424B2 (en) Electrode and fixture for measuring electronic components
JP2533430Y2 (ja) Ｉｃウエーハ試験用プローブカード
JP2725285B2 (ja) Ｉｃリード測定装置
JPS5822144Y2 (ja) プロ−ブカ−ド
JP2528910Y2 (ja) コンタクトプローブ支持カバー
JPS62276846A (ja) プロ−ブ装置
JP2003297506A (ja) 検査用電気的接続装置
JPS5914773Y2 (ja) グランドプレ−ト
JP3056088B2 (ja) 電子部品特性測定用治具