JPH0639350Y2 - Ｉｃ試験装置 - Google Patents

Ｉｃ試験装置

Info

Publication number
JPH0639350Y2
JPH0639350Y2 JP16290787U JP16290787U JPH0639350Y2 JP H0639350 Y2 JPH0639350 Y2 JP H0639350Y2 JP 16290787 U JP16290787 U JP 16290787U JP 16290787 U JP16290787 U JP 16290787U JP H0639350 Y2 JPH0639350 Y2 JP H0639350Y2
Authority
JP
Japan
Prior art keywords
test
timing
pattern
timing selection
register
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP16290787U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0167581U (zh
Inventor
一男 高野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP16290787U priority Critical patent/JPH0639350Y2/ja
Publication of JPH0167581U publication Critical patent/JPH0167581U/ja
Application granted granted Critical
Publication of JPH0639350Y2 publication Critical patent/JPH0639350Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
JP16290787U 1987-10-23 1987-10-23 Ｉｃ試験装置 Expired - Lifetime JPH0639350Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16290787U JPH0639350Y2 (ja) 1987-10-23 1987-10-23 Ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16290787U JPH0639350Y2 (ja) 1987-10-23 1987-10-23 Ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPH0167581U JPH0167581U (zh) 1989-05-01
JPH0639350Y2 true JPH0639350Y2 (ja) 1994-10-12

Family

ID=31447160

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16290787U Expired - Lifetime JPH0639350Y2 (ja) 1987-10-23 1987-10-23 Ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JPH0639350Y2 (zh)

Also Published As

Publication number Publication date
JPH0167581U (zh) 1989-05-01

Similar Documents

Publication Publication Date Title
US4682330A (en) Hierarchical test system architecture
US5610925A (en) Failure analyzer for semiconductor tester
US5107205A (en) Semiconductor device tester with a test waveform monitoring circuit
US4888715A (en) Semiconductor test system
KR100295702B1 (ko) 반도체디바이스시험장치
JPH0639350Y2 (ja) Ｉｃ試験装置
KR100336907B1 (ko) 메모리 시험장치
JPS59122972A (ja) 論理回路試験装置
JP2846383B2 (ja) 集積回路試験装置
JPS6110214Y2 (zh)
JP3633881B2 (ja) 半導体装置及びそのａｃスペック検査方法
JPS5814989B2 (ja) ロジック素子あるいはロジック回路の動作速度試験回路
JP2651178B2 (ja) Ｉｃカード試験装置
JP2539956Y2 (ja) テスターのタイミング発生回路
JPS6045375B2 (ja) Ｉｃ試験器用タイミング発生装置
JPH082629Y2 (ja) Ｌｓｉテスタ
SU723575A1 (ru) Устройство дл контрол дискретных блоков
SU888136A1 (ru) Устройство дл контрол монтажных схем
SU1038926A1 (ru) Устройство дл задани тестов
SU532830A1 (ru) Устройство контрол интегральных схем
SU947789A1 (ru) Устройство дл контрол функционировани интегральных схем пам ти
JP2570885B2 (ja) 半導体集積回路装置の試験装置
JPH0679055B2 (ja) 集積回路試験装置
SU809185A1 (ru) Устройство дл функциональногоКОНТРОл МиКРОэлЕКТРОННыХ узлОВ
JPS5855873A (ja) Ｉｃテスタ