JPH0637347Y2 - Ｉｃ試験用スキャナ - Google Patents

Ｉｃ試験用スキャナ

Info

Publication number
JPH0637347Y2
JPH0637347Y2 JP15037788U JP15037788U JPH0637347Y2 JP H0637347 Y2 JPH0637347 Y2 JP H0637347Y2 JP 15037788 U JP15037788 U JP 15037788U JP 15037788 U JP15037788 U JP 15037788U JP H0637347 Y2 JPH0637347 Y2 JP H0637347Y2
Authority
JP
Japan
Prior art keywords
test
switch
mode changeover
contact
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP15037788U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0271269U (cg-RX-API-DMAC7.html
Inventor
典秀 安彦
茂之 落合
幸男 川鍋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP15037788U priority Critical patent/JPH0637347Y2/ja
Publication of JPH0271269U publication Critical patent/JPH0271269U/ja
Application granted granted Critical
Publication of JPH0637347Y2 publication Critical patent/JPH0637347Y2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
JP15037788U 1988-11-18 1988-11-18 Ｉｃ試験用スキャナ Expired - Fee Related JPH0637347Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15037788U JPH0637347Y2 (ja) 1988-11-18 1988-11-18 Ｉｃ試験用スキャナ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15037788U JPH0637347Y2 (ja) 1988-11-18 1988-11-18 Ｉｃ試験用スキャナ

Publications (2)

Publication Number Publication Date
JPH0271269U JPH0271269U (cg-RX-API-DMAC7.html) 1990-05-30
JPH0637347Y2 true JPH0637347Y2 (ja) 1994-09-28

Family

ID=31423465

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15037788U Expired - Fee Related JPH0637347Y2 (ja) 1988-11-18 1988-11-18 Ｉｃ試験用スキャナ

Country Status (1)

Country Link
JP (1) JPH0637347Y2 (cg-RX-API-DMAC7.html)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6069831B2 (ja) * 2011-12-16 2017-02-01 富士電機株式会社 半導体試験装置

Also Published As

Publication number Publication date
JPH0271269U (cg-RX-API-DMAC7.html) 1990-05-30

Similar Documents

Publication Publication Date Title
US5345182A (en) Impedance meter capable of performing measurements at high precision over wide impedance and frequency ranges
US5680039A (en) Probe apparatus for use in both high and low frequency measurements
US6259256B1 (en) Cable testing apparatus
JP3415697B2 (ja) 電磁誘導式プローブ
JPH0637347Y2 (ja) Ｉｃ試験用スキャナ
JPH0720172A (ja) 回路定数・材料特性測定装置
JPH0587857A (ja) コンタクトチエツク機能付二端子回路素子測定装置
JP2544121Y2 (ja) リード・リレー及びこれを用いたスイッチ・マトリクス装置
JPH10274668A (ja) チップ上に集積化されたコイルの巻線の短絡を検出する測定方法及びその測定方法を採用した集積回路構造
JPH11190760A (ja) 半導体試験装置
JPH0333665A (ja) プリント配線板の導体欠陥検査装置
JP2000258468A (ja) 高周波電流検出装置
JPS6221065A (ja) スプリング・コンタクト式プロ−ブ
CN214225400U (zh) 一种变压器集成测试系统
JP3102709B2 (ja) 電子素子測定装置
JPH0541419A (ja) 検査装置の評価方法
JPH0882648A (ja) 接続ケーブルの断線検出装置
JPH05180892A (ja) 複数導線の導通検査方法および装置
SU1684720A1 (ru) Устройство дл измерени активного сопротивлени
JP4448239B2 (ja) 発振器試験方法・発振器試験装置
JPH0330919B2 (cg-RX-API-DMAC7.html)
JP2001308277A (ja) 半導体装置
JPH0370838B2 (cg-RX-API-DMAC7.html)
CN120064927A (zh) 一种印制板测试系统
JPH11174084A (ja) コンタクトプローブ

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees