JPH0633429Y2 - 電子装置用温度試験装置 - Google Patents

電子装置用温度試験装置

Info

Publication number
JPH0633429Y2
JPH0633429Y2 JP6644386U JP6644386U JPH0633429Y2 JP H0633429 Y2 JPH0633429 Y2 JP H0633429Y2 JP 6644386 U JP6644386 U JP 6644386U JP 6644386 U JP6644386 U JP 6644386U JP H0633429 Y2 JPH0633429 Y2 JP H0633429Y2
Authority
JP
Japan
Prior art keywords
temperature
air
electronic device
unit
nozzle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP6644386U
Other languages
English (en)
Japanese (ja)
Other versions
JPS62178380U (enrdf_load_stackoverflow
Inventor
文雄 ▲高▼橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP6644386U priority Critical patent/JPH0633429Y2/ja
Publication of JPS62178380U publication Critical patent/JPS62178380U/ja
Application granted granted Critical
Publication of JPH0633429Y2 publication Critical patent/JPH0633429Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP6644386U 1986-05-01 1986-05-01 電子装置用温度試験装置 Expired - Lifetime JPH0633429Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6644386U JPH0633429Y2 (ja) 1986-05-01 1986-05-01 電子装置用温度試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6644386U JPH0633429Y2 (ja) 1986-05-01 1986-05-01 電子装置用温度試験装置

Publications (2)

Publication Number Publication Date
JPS62178380U JPS62178380U (enrdf_load_stackoverflow) 1987-11-12
JPH0633429Y2 true JPH0633429Y2 (ja) 1994-08-31

Family

ID=30904454

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6644386U Expired - Lifetime JPH0633429Y2 (ja) 1986-05-01 1986-05-01 電子装置用温度試験装置

Country Status (1)

Country Link
JP (1) JPH0633429Y2 (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS62178380U (enrdf_load_stackoverflow) 1987-11-12

Similar Documents

Publication Publication Date Title
JP2003194874A (ja) 半導体素子テストハンドラの素子加熱及び冷却装置
JP2002022794A (ja) バーンイン装置のための冷却システム
US6227701B1 (en) Apparatus for thermally testing an electronic device
KR930010263B1 (ko) 가열장치
CN106848889A (zh) 一种自动降温变电柜
JPH0633429Y2 (ja) 電子装置用温度試験装置
US20120103967A1 (en) Burn-in oven having inverter fan and heat regulator
JPH0573468B2 (enrdf_load_stackoverflow)
CN109655694A (zh) 一种可自动装载电源的多开门周转老化测试设备
CN112205375B (zh) 一种储藏空间的温升循环系统及方法
JPH06186283A (ja) テストヘッドの冷却制御装置
CN218422852U (zh) 一种恒温恒湿试验箱
JPH08126191A (ja) 電子回路モジュール冷却装置
JP2625977B2 (ja) 電子機器の温度試験方法
CN212260244U (zh) 一种储藏空间的温升循环系统
JPH10239386A (ja) バーンイン装置
WO2023197886A1 (zh) 起动机考核设备及方法
CN115616027A (zh) 一种pvc压延膜耐温检测装置及检测系统
JP3006756B2 (ja) バーンイン試験装置
TWI597483B (zh) 用於老化測試裝置之負壓冷卻系統以及使用該負壓冷卻系統之老化測試裝置
JP2758959B2 (ja) 加熱装置
JP2000009551A (ja) 高温目視検査装置
CN208898095U (zh) 温控装置及具有其的太阳式翻板机
JPH0417233Y2 (enrdf_load_stackoverflow)
CN222190632U (zh) 半导体硅片加热装置