JPH0628659Y2 - 光弾性測定装置 - Google Patents
光弾性測定装置Info
- Publication number
- JPH0628659Y2 JPH0628659Y2 JP16412288U JP16412288U JPH0628659Y2 JP H0628659 Y2 JPH0628659 Y2 JP H0628659Y2 JP 16412288 U JP16412288 U JP 16412288U JP 16412288 U JP16412288 U JP 16412288U JP H0628659 Y2 JPH0628659 Y2 JP H0628659Y2
- Authority
- JP
- Japan
- Prior art keywords
- light
- inspected
- transparent
- stress
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005259 measurement Methods 0.000 claims description 26
- 230000000694 effects Effects 0.000 claims description 13
- 230000010287 polarization Effects 0.000 claims description 12
- 238000007689 inspection Methods 0.000 description 25
- 230000003287 optical effect Effects 0.000 description 5
- 238000012360 testing method Methods 0.000 description 4
- 239000011521 glass Substances 0.000 description 2
- 229920003023 plastic Polymers 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 230000003213 activating effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000005469 synchrotron radiation Effects 0.000 description 1
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16412288U JPH0628659Y2 (ja) | 1988-12-19 | 1988-12-19 | 光弾性測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16412288U JPH0628659Y2 (ja) | 1988-12-19 | 1988-12-19 | 光弾性測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0283438U JPH0283438U (OSRAM) | 1990-06-28 |
| JPH0628659Y2 true JPH0628659Y2 (ja) | 1994-08-03 |
Family
ID=31449454
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16412288U Expired - Lifetime JPH0628659Y2 (ja) | 1988-12-19 | 1988-12-19 | 光弾性測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0628659Y2 (OSRAM) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4317558B2 (ja) * | 2006-08-23 | 2009-08-19 | 株式会社堀場製作所 | 試料解析方法、試料解析装置及びプログラム |
| CN104272091A (zh) * | 2012-04-23 | 2015-01-07 | 法国圣戈班玻璃厂 | 用于测量经预加应力的片材的喷吹结构的方法和装置 |
| KR101913922B1 (ko) * | 2014-06-03 | 2018-10-31 | 각코호진 오키나와가가쿠기쥬츠다이가쿠인 다이가쿠가쿠엔 | 광탄성에 기초하여 힘을 획득하기 위한 시스템 및 방법 |
-
1988
- 1988-12-19 JP JP16412288U patent/JPH0628659Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0283438U (OSRAM) | 1990-06-28 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4859066A (en) | Linear and angular displacement measuring interferometer | |
| JP2997047B2 (ja) | 光学式計測装置 | |
| JP2007024827A (ja) | 位相シフト干渉計 | |
| KR20000016177A (ko) | 반도체 웨이퍼의 두께 변화를 측정하는 간섭계 | |
| US3434787A (en) | Double axes interferometer | |
| BG103823A (en) | Instrument for monitoring the qualities of sheet materials | |
| US4072422A (en) | Apparatus for interferometrically measuring the physical properties of test object | |
| JPH0628659Y2 (ja) | 光弾性測定装置 | |
| JPS6159224A (ja) | 準単色光線の偏光状態を実時間測定するための方法と装置 | |
| JPS5818604B2 (ja) | 厚さの測定方法 | |
| JP2005062012A (ja) | 耐振動型干渉計装置 | |
| CN114577111A (zh) | 面形检测系统及检测方法 | |
| SU1716406A1 (ru) | Портативный рентгеновский гониометр дл определени напр жений в крупногабаритных объектах | |
| SU932219A1 (ru) | Двухлучевой интерферометр | |
| CN222850166U (zh) | 一种基于角反射器的斯托克斯偏振测量系统及设备 | |
| JPS63113503A (ja) | ウオ−ラストンプリズム | |
| JP2503037Y2 (ja) | 断面形状測定器 | |
| JPH032401B2 (OSRAM) | ||
| JPS55140102A (en) | Measuring device for flatness of inspected plane glass | |
| JPH03195907A (ja) | 偏光フィゾー干渉計 | |
| JPH0244204A (ja) | 光フアイバ式干渉膜厚計 | |
| JPS58225304A (ja) | 光学式機械量測定装置 | |
| JPS6029057B2 (ja) | 三面合せ鏡式反射器の反射検査装置 | |
| JP2521324Y2 (ja) | 干渉計 | |
| JP2501738Y2 (ja) | 光学式表面粗さ測定装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |