JPH06244524A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPH06244524A JPH06244524A JP3153393A JP3153393A JPH06244524A JP H06244524 A JPH06244524 A JP H06244524A JP 3153393 A JP3153393 A JP 3153393A JP 3153393 A JP3153393 A JP 3153393A JP H06244524 A JPH06244524 A JP H06244524A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor package
- substrate
- board
- semiconductor device
- gap
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/303—Surface mounted components, e.g. affixing before soldering, aligning means, spacing means
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/341—Surface mounted components
- H05K3/3421—Leaded components
Landscapes
- Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】この発明は、基板上に間隙を形成
して半導体パッケージを実装した半導体装置に関するも
のである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device in which a semiconductor package is mounted with a gap formed on a substrate.
【0002】[0002]
【従来の技術】図4は従来の半導体装置の実装状態を示
す側面図である。図において、1は合成樹脂で封止され
た半導体パッケージで、TCP(Tape Carrier Package)
型半導体装置である。1aは半導体パッケージ1の実装側
の面に形成された突起、2は半導体パッケージ1の外部
リード、3は基板、4は基板3上に形成されたランド、
5は基板3の配線とランド4の周囲とに施された絶縁コ
ートである。2. Description of the Related Art FIG. 4 is a side view showing a mounted state of a conventional semiconductor device. In the figure, 1 is a semiconductor package sealed with a synthetic resin, which is TCP (Tape Carrier Package)
Type semiconductor device. 1a is a protrusion formed on the surface of the semiconductor package 1 on the mounting side, 2 is an external lead of the semiconductor package 1, 3 is a substrate, 4 is a land formed on the substrate 3,
Reference numeral 5 is an insulating coat applied to the wiring of the substrate 3 and the periphery of the land 4.
【0003】次に動作について説明する。TCP半導体
パッケージ1は、射出成形手法によって合成樹脂で樹脂
封止のとき突起1aを形成し、外部リード2は納入先で所
定の形状に折り曲げ成形される。したがって、樹脂封止
のとき突起1aを形成するように成形金型が構成されてい
る。そして、この突起1aによって基板3と半導体パッケ
ージ1との間に0.1mm〜0.3mmの間隙を形成し、外部リー
ド2とランド4とにフラックスを塗布して、はんだ等で
外部リード2とランド4とが接続される。上記のよう
に、半導体パッケージ1に形成した突起1aで基板3と半
導体パッケージ1との間に間隙を形成すると、洗浄によ
ってフラックスを除去するとき、半導体パッケージ1の
裏面に回り込んだフラックスを除去し易く、また、半導
体パッケージ1や基板3の反りや表面凹凸を吸収でき、
さらに、間隙によって外部リード2の長さを長くするこ
とにより、半導体パッケージ1の実装時に外部リード1a
自身の変形に対する自由度を向上することができる。と
ころで、TCPによる半導体パッケージ1は、リード成
形寸法、形状を特に規制するものがなく、ユーザーが自
由に形状を選択することができるので、突起1aの高さ、
サイズ、位置等をユーザーの要求に応じて樹脂成形が行
われる。Next, the operation will be described. The TCP semiconductor package 1 forms a protrusion 1a when resin-sealed with a synthetic resin by an injection molding method, and the external lead 2 is bent and molded into a predetermined shape at the delivery destination. Therefore, the molding die is configured so as to form the protrusion 1a when the resin is sealed. Then, a gap of 0.1 mm to 0.3 mm is formed between the substrate 3 and the semiconductor package 1 by the protrusion 1a, flux is applied to the external lead 2 and the land 4, and the external lead 2 and the land 4 are soldered or the like. And are connected. As described above, when the gap is formed between the substrate 3 and the semiconductor package 1 by the protrusion 1a formed on the semiconductor package 1, when the flux is removed by cleaning, the flux sneaking around the back surface of the semiconductor package 1 is removed. Easy, and can absorb warpage and surface irregularities of the semiconductor package 1 and the substrate 3,
Further, by increasing the length of the external lead 2 by the gap, the external lead 1a can be mounted when the semiconductor package 1 is mounted.
The degree of freedom with respect to the deformation of itself can be improved. By the way, since the semiconductor package 1 made of TCP has no particular restrictions on the lead molding size and shape, and the user can freely select the shape, the height of the protrusion 1a
Resin molding is performed according to the size, position, etc. of the user's request.
【0004】[0004]
【発明が解決しようとする課題】従来の半導体装置は以
上のように構成されており、半導パッケージ1の突起1a
はユーザーによって異なるので、半導体メーカーがユー
ザー対応で突起1aの高さ、サイズ、位置を変えるにはそ
の都度異なる金型が必要となり、半導体パッケージ1の
汎用性を高めることが困難であるという問題点があっ
た。The conventional semiconductor device is constructed as described above, and the projection 1a of the semiconductor package 1 is formed.
Is different depending on the user, so that a semiconductor maker needs different molds to change the height, size, and position of the protrusion 1a for each user, which makes it difficult to increase the versatility of the semiconductor package 1. was there.
【0005】この発明は上記のような問題点を解消する
ためになされたもので、半導体パッケージに突起を形成
せずに半導体パッケージと基板との間に間隙を形成し、
半導体パッケージの汎用性を高めることができる半導体
装置を得ることを目的とする。The present invention has been made to solve the above problems, and a gap is formed between a semiconductor package and a substrate without forming a protrusion on the semiconductor package,
An object of the present invention is to obtain a semiconductor device that can improve the versatility of a semiconductor package.
【0006】[0006]
【課題を解決するための手段】この発明に係わる請求項
1による半導体装置は、基板と半導体パッケージとの間
に第3の部材を介挿させて両者間に所定の間隙を形成し
たものである。また、この発明に係わる請求項2による
半導体装置は、基板と半導体パッケージとの間に接着剤
を介して粒状体を配置させて両者間に所定の間隙を形成
したものである。また、この発明に係わる請求項3によ
る半導体装置は、基板と半導体パッケージとの間に所定
の厚さを有する板状部材を配置させて両者間に所定の間
隙を形成したものである。また、この発明に係わる請求
項4による半導体装置は、基板に突起を形成し両者間に
所定の間隙を形成したものである。A semiconductor device according to a first aspect of the present invention is such that a third member is interposed between a substrate and a semiconductor package to form a predetermined gap therebetween. . A semiconductor device according to a second aspect of the present invention is such that a granular body is arranged between a substrate and a semiconductor package via an adhesive to form a predetermined gap therebetween. Further, a semiconductor device according to a third aspect of the present invention is such that a plate-like member having a predetermined thickness is arranged between the substrate and the semiconductor package and a predetermined gap is formed therebetween. A semiconductor device according to a fourth aspect of the present invention is such that a protrusion is formed on the substrate and a predetermined gap is formed between the two.
【0007】[0007]
【作用】この発明の請求項1における半導体装置の第3
の部材、また、この発明の請求項2における半導体装置
の接着剤を介して配置された粒状体、また、この発明の
請求項3における半導体装置の板状部材、また、この発
明の請求項4における半導体装置の基板に形成された突
起は、それぞれ半導体パッケージとの間に所定の間隙を
形成する。The third aspect of the semiconductor device according to the first aspect of the present invention
Member, the granular body arranged via the adhesive of the semiconductor device according to claim 2 of the present invention, the plate-like member of the semiconductor device according to claim 3 of the present invention, and the claim 4 of the present invention. The protrusions formed on the substrate of the semiconductor device in 1) form a predetermined gap with the semiconductor package.
【0008】[0008]
【実施例】実施例1.以下、この発明の実施例を図につ
いて説明する。図1はこの発明の実施例1による半導体
装置の実装状態を示す側面図である。図において、3〜
5は従来のものと同様のため説明を省略する。6は樹脂
封止された半導体パッケージで、基板3と対向する面は
平坦に形成されている。7は半導体パッケージ6の外部
リード、8は半導体パッケージ6と基板3との間に介挿
された接着剤、9は接着剤8を介して配置された0.1〜
0.3mmの径を有する球形の粒状体で、例えば合成樹脂で
形成されている。EXAMPLES Example 1. Embodiments of the present invention will be described below with reference to the drawings. 1 is a side view showing a mounted state of a semiconductor device according to a first embodiment of the present invention. In the figure, 3 to
Since 5 is the same as the conventional one, its explanation is omitted. Reference numeral 6 denotes a resin-sealed semiconductor package, the surface of which faces the substrate 3 is formed flat. Reference numeral 7 is an external lead of the semiconductor package 6, 8 is an adhesive agent interposed between the semiconductor package 6 and the substrate 3, and 9 is 0.1 to 0.1 which is disposed via the adhesive agent 8.
It is a spherical granular material having a diameter of 0.3 mm and is made of, for example, a synthetic resin.
【0009】次に動作について説明する。接着剤8に所
定量の粒状体9を混入したものを、例えば半導体パッケ
ージ6の基板3と対向する面の所定の位置に塗布し、外
部リード7がランド4の所定の位置と接触するように半
導体パッケージ6を基板3上に配置し、半導体パッケー
ジ6を基板3に押圧すると、粒状体9は接着剤8を介し
て整列し、基板3と半導体パッケージ6は粒状体9によ
って間隙を形成して接着剤8で接着される。そして、外
部リード7とランド4とにフラックスを塗布したのち、
はんだ等で外部リード7とランド4とが接続される。上
記基板3と半導体パッケージ6とに形成された間隙は、
従来と同様にフラックスの洗浄の容易化、半導体パッケ
ージ6および基板3の反りや表面凹凸の吸収、あるいは
外部リード7の実装時の自由度増加等に寄与する。Next, the operation will be described. A mixture of a predetermined amount of the granular material 9 in the adhesive 8 is applied to a predetermined position on the surface of the semiconductor package 6 facing the substrate 3 so that the external lead 7 contacts the predetermined position of the land 4. When the semiconductor package 6 is placed on the substrate 3 and the semiconductor package 6 is pressed against the substrate 3, the particles 9 are aligned with the adhesive 8, and the substrate 3 and the semiconductor package 6 form a gap by the particles 9. It is adhered with an adhesive 8. Then, after applying flux to the external leads 7 and the lands 4,
The external lead 7 and the land 4 are connected by solder or the like. The gap formed between the substrate 3 and the semiconductor package 6 is
As in the conventional case, it contributes to facilitating cleaning of the flux, absorbing warpage and surface irregularities of the semiconductor package 6 and the substrate 3, increasing the degree of freedom in mounting the external leads 7, and the like.
【0010】実施例2.上記実施例1においては、粒状
体9を混入した接着剤8を半導体パッケージ6に塗布し
たが、基板3上の半導体パッケージ6を取り付ける位置
に、粒状体9を有する接着剤8を塗布して粒状体9を配
列し、半導体パッケージ6との間に間隙を形成しても上
記実施例1と同様の効果を発揮する。Embodiment 2. In the first embodiment, the adhesive 8 mixed with the particles 9 is applied to the semiconductor package 6. However, the adhesive 8 having the particles 9 is applied to the position where the semiconductor package 6 is mounted on the substrate 3 to apply the particles 8. Even if the bodies 9 are arranged and a gap is formed between the body 9 and the semiconductor package 6, the same effect as that of the first embodiment is exhibited.
【0011】実施例3.上記実施例1および実施例2に
おける粒状体9の径を選定することによって、半導体パ
ッケージ6と基板3との間に粒状体9に応じた間隙を形
成することができ、上記実施例と同様の効果を発揮す
る。Embodiment 3. By selecting the diameter of the granular body 9 in the above-described first and second embodiments, a gap corresponding to the granular body 9 can be formed between the semiconductor package 6 and the substrate 3, which is the same as the above-described exemplary embodiment. Be effective.
【0012】実施例4.上記各実施例において間隙を形
成する粒状体9を、熱伝導率の高いアルミナ等の金属材
料で形成したものを用いると、上記実施例と同様の効果
を発揮することは勿論のこと、半導体パッケージ6の放
熱を向上させることができる。Embodiment 4. If the granular material 9 forming the gap in each of the above-mentioned embodiments is made of a metal material having a high thermal conductivity such as alumina, the same effects as those in the above-mentioned embodiments can be obtained and the semiconductor package can be obtained. The heat dissipation of 6 can be improved.
【0013】実施例5.図2はこの発明の実施例5によ
る半導体パッケージの実装状態を示す側面図である。図
において、3〜7はこの発明の実施例1を示す図1のも
のと同様のため説明を省略する。3aは基板3上に形成さ
れた突起で、例えば、基板3を製作するとき、ランド
4,4との間で半導体パッケージ6が配置される予定位
置に、絶縁コート5を所定の厚さ塗布して突起3aを形成
することにより、基板3と半導体パッケージ6との間に
所定の間隙を形成することができ、上記実施例と同様の
効果を発揮する。Embodiment 5. Second Embodiment FIG. 2 is a side view showing a mounted state of a semiconductor package according to a fifth embodiment of the present invention. In the figure, reference numerals 3 to 7 are the same as those in FIG. Reference numeral 3a is a protrusion formed on the substrate 3. For example, when the substrate 3 is manufactured, the insulating coat 5 is applied to a predetermined position where the semiconductor package 6 is to be arranged between the lands 4 and 4. By forming the protrusions 3a with the protrusions 3a, a predetermined gap can be formed between the substrate 3 and the semiconductor package 6, and the same effect as that of the above-described embodiment is exhibited.
【0014】実施例6.上記実施例5においては、基板
3上に絶縁コート5を所定の厚さ塗布して突起3aを形成
したが、例えば、基板3上の配線パターン(図示せず)
上に部分的に所定の厚さのめっきを施して突起3aを形成
することにより、基板3と半導体パッケージ6との間に
所定の間隙を形成することができ、上記実施例と同様の
効果を発揮する。Example 6. In the fifth embodiment, the insulating coat 5 is applied on the substrate 3 to a predetermined thickness to form the protrusions 3a. For example, a wiring pattern on the substrate 3 (not shown)
By partially plating the protrusions 3a on the upper side to form the protrusions 3a, a predetermined gap can be formed between the substrate 3 and the semiconductor package 6, and the same effect as that of the above embodiment can be obtained. Demonstrate.
【0015】実施例7.図3はこの発明の施例7による
半導体装置の実装状態を示す側面図である。図におい
て、3〜7はこの発明の実施例1を示す図1のものと同
様のため説明を省略する。10は半導体パッケージ6と基
板3との間に配置された板状部材で、0.1〜0.3mmの合成
樹脂フィルムや金属板等で形成され、半導体パッケージ
1または基板3の何れかに接着剤で貼り付けて間隙を形
成することにより、基板3と半導体パッケージ6との間
に所定の間隙を形成することができ、上記実施例と同様
の効果を発揮する。Example 7. Third Embodiment FIG. 3 is a side view showing a mounted state of a semiconductor device according to a seventh embodiment of the present invention. In the figure, reference numerals 3 to 7 are the same as those in FIG. Reference numeral 10 denotes a plate-shaped member arranged between the semiconductor package 6 and the substrate 3, which is formed of a synthetic resin film or a metal plate having a thickness of 0.1 to 0.3 mm and is attached to either the semiconductor package 1 or the substrate 3 with an adhesive. A predetermined gap can be formed between the substrate 3 and the semiconductor package 6 by forming the gap, and the same effect as that of the above-described embodiment is exhibited.
【0016】実施例8.上記実施例7においては、板状
部材10は1枚で形成した場合について説明したが、薄い
板状部材を形成する間隙に応じて複数枚を積層しても、
上記実施例7と同様の効果を発揮する。Example 8. Although the case where the plate-shaped member 10 is formed of one sheet has been described in the above-described Example 7, even if a plurality of sheets are stacked in accordance with the gap forming the thin plate-shaped member,
The same effect as that of the above-mentioned Example 7 is exhibited.
【0017】[0017]
【発明の効果】以上のようにこの発明の請求項1によれ
ば、半導体パッケージと基板との間に第3の部材を介挿
させて両者間に所定の間隙を形成し、また、この発明の
請求項2によれば、半導体パッケージと基板との間に接
着剤を介して所定の間隙を形成する粒状体を配置させ
て、両者間に所定の間隙を形成し、また、この発明の請
求項3によれば、基板に半導体パッケージとの間に所定
の間隙を形成する板状部材を配置させて両者間に所定の
間隙を形成し、また、この発明の請求項4によれば、基
板に突起を形成して両者間に所定の間隙を形成するよう
にしたので、半導体パッケージの汎用性を向上する。As described above, according to the first aspect of the present invention, the third member is interposed between the semiconductor package and the substrate to form a predetermined gap therebetween, and the present invention is also provided. According to the second aspect of the present invention, a granular body that forms a predetermined gap is disposed between the semiconductor package and the substrate via an adhesive to form a predetermined gap therebetween, and the present invention According to claim 3, a plate-like member that forms a predetermined gap with the semiconductor package is arranged on the substrate to form a predetermined gap therebetween, and according to claim 4 of the present invention, the substrate Since the projections are formed on the base to form a predetermined gap between the two, the versatility of the semiconductor package is improved.
【図1】この発明の実施例1による半導体装置の半導体
パッケージの実装状態を示す側面図である。FIG. 1 is a side view showing a mounted state of a semiconductor package of a semiconductor device according to a first embodiment of the present invention.
【図2】この発明の実施例5による半導体装置の半導体
パッケージの実装状態を示す側面図である。FIG. 2 is a side view showing a mounted state of a semiconductor package of a semiconductor device according to a fifth embodiment of the present invention.
【図3】この発明の実施例7による半導体装置の半導体
パッケージの実装状態を示す側面図である。FIG. 3 is a side view showing a mounted state of a semiconductor package of a semiconductor device according to a seventh embodiment of the present invention.
【図4】従来の半導体装置の半導体パッケージの実装状
態を示す側面図である。FIG. 4 is a side view showing a mounted state of a semiconductor package of a conventional semiconductor device.
3 基板 6 半導体パッケージ 7 外部リード 8 接着剤 9 粒状体 3 substrate 6 semiconductor package 7 external lead 8 adhesive 9 granular material
Claims (4)
ッケージを実装した半導体装置において、上記基板と半
導体パッケージとの間に第3の部材を介挿させて上記所
定の間隙を形成したことを特徴とする半導体装置。1. In a semiconductor device in which a semiconductor package is mounted with a predetermined gap formed on a substrate, a third member is inserted between the substrate and the semiconductor package to form the predetermined gap. A semiconductor device characterized by:
粒状体であることを特徴とする請求項1記載の半導体装
置。2. The semiconductor device according to claim 1, wherein the third member is a granular body arranged via an adhesive.
材であることを特徴とする請求項1記載の半導体装置。3. The semiconductor device according to claim 1, wherein the third member is a plate-shaped member having a predetermined thickness.
ッケージを実装した半導体装置において、上記基板上に
上記半導体パッケージと上記基板との間に所定の間隙を
形成する突起を形成したことを特徴とする半導体装置。4. A semiconductor device in which a semiconductor package is mounted with a predetermined gap formed on a substrate, wherein a protrusion is formed on the substrate to form a predetermined gap between the semiconductor package and the substrate. Characteristic semiconductor device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3153393A JPH06244524A (en) | 1993-02-22 | 1993-02-22 | Semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3153393A JPH06244524A (en) | 1993-02-22 | 1993-02-22 | Semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH06244524A true JPH06244524A (en) | 1994-09-02 |
Family
ID=12333843
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3153393A Pending JPH06244524A (en) | 1993-02-22 | 1993-02-22 | Semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH06244524A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008300588A (en) * | 2007-05-31 | 2008-12-11 | Renesas Technology Corp | Electronic apparatus, and manufacturing method thereof |
-
1993
- 1993-02-22 JP JP3153393A patent/JPH06244524A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008300588A (en) * | 2007-05-31 | 2008-12-11 | Renesas Technology Corp | Electronic apparatus, and manufacturing method thereof |
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