JPH06215058A - 多端子装置の測定回路設計装置 - Google Patents
多端子装置の測定回路設計装置Info
- Publication number
- JPH06215058A JPH06215058A JP5023806A JP2380693A JPH06215058A JP H06215058 A JPH06215058 A JP H06215058A JP 5023806 A JP5023806 A JP 5023806A JP 2380693 A JP2380693 A JP 2380693A JP H06215058 A JPH06215058 A JP H06215058A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- measurement
- knowledge base
- ideal
- terminal device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000013461 design Methods 0.000 claims abstract description 13
- 238000000034 method Methods 0.000 claims abstract description 6
- 238000005259 measurement Methods 0.000 claims description 87
- 230000002194 synthesizing effect Effects 0.000 claims description 7
- 238000012546 transfer Methods 0.000 claims description 4
- 238000007599 discharging Methods 0.000 claims 1
- 238000012360 testing method Methods 0.000 abstract description 16
- 238000006243 chemical reaction Methods 0.000 abstract description 9
- 230000003247 decreasing effect Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 10
- 230000015572 biosynthetic process Effects 0.000 description 8
- 238000003786 synthesis reaction Methods 0.000 description 8
- 230000002093 peripheral effect Effects 0.000 description 6
- 238000000691 measurement method Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 230000007717 exclusion Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5023806A JPH06215058A (ja) | 1993-01-19 | 1993-01-19 | 多端子装置の測定回路設計装置 |
| TW83100230A TW259843B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1993-01-19 | 1994-01-13 | |
| KR1019940000836A KR100317727B1 (ko) | 1993-01-19 | 1994-01-18 | 디바이스의 자동 측정방법 및 측정장치 |
| US08/183,358 US5414639A (en) | 1993-01-19 | 1994-01-19 | Automatic testing method and testing apparatus for devices |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5023806A JPH06215058A (ja) | 1993-01-19 | 1993-01-19 | 多端子装置の測定回路設計装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH06215058A true JPH06215058A (ja) | 1994-08-05 |
Family
ID=12120573
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5023806A Pending JPH06215058A (ja) | 1993-01-19 | 1993-01-19 | 多端子装置の測定回路設計装置 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPH06215058A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
| TW (1) | TW259843B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
-
1993
- 1993-01-19 JP JP5023806A patent/JPH06215058A/ja active Pending
-
1994
- 1994-01-13 TW TW83100230A patent/TW259843B/zh active
Also Published As
| Publication number | Publication date |
|---|---|
| TW259843B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1995-10-11 |
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