JPH0620126Y2 - Degasser for elemental analyzer - Google Patents

Degasser for elemental analyzer

Info

Publication number
JPH0620126Y2
JPH0620126Y2 JP1988135699U JP13569988U JPH0620126Y2 JP H0620126 Y2 JPH0620126 Y2 JP H0620126Y2 JP 1988135699 U JP1988135699 U JP 1988135699U JP 13569988 U JP13569988 U JP 13569988U JP H0620126 Y2 JPH0620126 Y2 JP H0620126Y2
Authority
JP
Japan
Prior art keywords
metal sample
degasser
main body
gas
elemental analyzer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1988135699U
Other languages
Japanese (ja)
Other versions
JPH0257049U (en
Inventor
毅 山田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Horiba Ltd
Original Assignee
Horiba Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Horiba Ltd filed Critical Horiba Ltd
Priority to JP1988135699U priority Critical patent/JPH0620126Y2/en
Publication of JPH0257049U publication Critical patent/JPH0257049U/ja
Application granted granted Critical
Publication of JPH0620126Y2 publication Critical patent/JPH0620126Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating And Analyzing Materials By Characteristic Methods (AREA)

Description

【考案の詳細な説明】 〔産業上の利用分野〕 本考案は、例えば不活性ガス融解型や酸素気流中燃焼ガ
ス分析型の元素分析装置に用いられる脱ガス装置に関す
るものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial field of application] The present invention relates to a degassing device used in, for example, an inert gas melting type or oxygen gas combustion gas analysis type elemental analysis device.

〔従来の技術〕[Conventional technology]

金属試料の元素分析を行うのに従来は、該金属試料の表
面にグラインダーやヤスリを掛けて当該試料表面の偏析
や錆等を研磨排除し、次いで、前記研磨面を酸やアルカ
リ溶液などで処理した後、水洗・乾燥あるいは有機溶剤
などで洗浄後乾燥を行い、この金属試料を元素分析装置
に投入して元素分析が行われている。
Conventionally, for performing elemental analysis of a metal sample, the surface of the metal sample is grinded or sanded to remove segregation or rust on the sample surface, and then the polished surface is treated with an acid or alkali solution. After that, it is washed with water and dried, or washed with an organic solvent and then dried, and this metal sample is put into an elemental analyzer for elemental analysis.

〔考案が解決しようとする課題〕[Problems to be solved by the device]

ところが、上記の前処理における乾燥および洗浄剤の除
去が不十分であった場合に、金属試料の表面に水分や有
機物の一部が残ったり、あるいは、乾燥の過程で金属試
料の表面が活性化して当該試料表面に空気などがが吸着
することがあった。
However, if the drying and cleaning agent removal in the above pretreatment was insufficient, some water or organic matter remained on the surface of the metal sample, or the surface of the metal sample was activated during the drying process. Therefore, air or the like may be adsorbed on the surface of the sample.

而して、これらは分析時に分解し、H,O,N,Sなど
のガス成分として測定されることから測定値に誤差を与
え、精度の高い測定結果を得難い点で改善の余地があっ
た。
There is room for improvement in that they are decomposed at the time of analysis and are measured as gas components such as H, O, N, and S, which gives an error to the measured values and it is difficult to obtain highly accurate measurement results. .

そこで、このようなガス成分を予め除去するために脱ガ
スをおこなう装置の採用が考えられる。しかし、その脱
ガス装置は、省スペース化のためにもコンパクトに形成
され、かつ操作性が良好であることが望ましいことはい
うまでもない。
Therefore, it is conceivable to employ an apparatus that performs degassing in order to remove such gas components in advance. However, it goes without saying that it is desirable that the degassing device is formed compact in order to save space and has good operability.

本考案は、上記の実情に鑑みて成されたものであって、
前処理をより一層厳密に行わせることで誤差要因をなく
し、試料測定の精度と信頼性を向上させるコンパクトで
操作性が良好な元素分析装置用脱ガス装置を提供するこ
とを目的としている。
The present invention has been made in view of the above situation,
It is an object of the present invention to provide a degassing apparatus for an elemental analyzer, which is compact and has good operability, in which the error factor is eliminated by performing the pretreatment more strictly, and the accuracy and reliability of sample measurement are improved.

〔課題を解決するための手段〕[Means for Solving the Problems]

上記の目的を達成するために本考案は、上部に金属試料
挿入用の気密開閉蓋が設けられる一方、下部に金属試料
の下方への通過を許容する金属試料供給口が設けられ、
中間部には金属試料を乗載させることができ、かつその
金属試料を落下させることができる外部からスライド操
作が可能な受け部材を有する金属試料投入具が設けられ
ている気密構造の脱ガス器本体が、元素分析装置の上部
に載設されてその元素分析装置の上部に設けた金属試料
投入口を前記金属試料供給口と対応させる一方、前記脱
ガス器本体内のガスを真空排気するための排気ライン
と、不活性ガスまたは前記元素分析装置に用いられるキ
ャリアガスの供給ラインとが、前記脱ガス器本体に接続
され、かつその両ラインに、前記脱ガス器本体に対する
排気およびガス供給を行わせるためのバルブが設けられ
ていることを特徴としている。
In order to achieve the above object, the present invention provides an airtight opening / closing lid for inserting a metal sample at the upper part, and a metal sample supply port at the lower part for allowing the metal sample to pass downward.
An airtight degasser provided with a metal sample loading tool having a receiving member capable of loading a metal sample and dropping the metal sample from the outside in the middle part. The main body is mounted on the upper part of the elemental analysis device and the metal sample inlet provided on the upper part of the elemental analysis device is made to correspond to the metal sample supply port, while the gas in the degasser main body is evacuated. And an inert gas or carrier gas supply line used in the elemental analysis device are connected to the degasser body, and both lines are provided with exhaust gas and gas supply to the degasser body. It is characterized in that a valve for performing the operation is provided.

〔作用〕[Action]

上記の特徴構成によれば、金属試料を受け部材上に乗載
させて気密開閉蓋を閉じた前記脱ガス器本体を真空排気
下におくことで、測定の誤差要因となる金属試料表面お
よび表層部に付着したガス成分や金属試料表面に残留し
てなる水分が真空排気される。
According to the above characteristic configuration, by placing the degasser main body, on which the metal sample is mounted on the receiving member and closed the airtight opening / closing lid, under vacuum evacuation, the surface of the metal sample and the surface layer that cause an error in measurement. The gas components attached to the parts and the water remaining on the surface of the metal sample are evacuated.

そして、上記の真空排気処理後に、前記脱ガス器本体内
を不活性ガスあるいはキャリアガスの雰囲気で置換した
後、受け部材をスライドさせて前記脱ガス処理後の金属
試料を元素分析装置に落下投入すれば、測定誤差の発生
要因となるガス成分や水分が除去され、かつ不活性ガス
によって試料表面が被われて清浄な状態が保護されてい
るため、精度および信頼性の高い分析値が得られる。
Then, after the above vacuum evacuation treatment, the inside of the degasser main body is replaced with an atmosphere of an inert gas or a carrier gas, and then the receiving member is slid to drop the degassed metal sample into the elemental analyzer. By doing so, the gas components and water that cause the measurement error are removed, and the sample surface is covered with an inert gas to protect the clean state, so that highly accurate and reliable analysis values can be obtained. .

上述の操作では、金属試料を外部に取り出すことなく、
脱ガス処理後に受け部材をスライドさせて金属試料を落
下させるだけでよく、きわめて操作性が良い。
In the above operation, without taking out the metal sample to the outside,
After degassing, it is sufficient to slide the receiving member and drop the metal sample, and the operability is extremely good.

〔実施例〕〔Example〕

以下、本考案の実施例を図面に基づいて説明する。 Embodiments of the present invention will be described below with reference to the drawings.

第1図は脱ガス装置1を示す。第2図は元素分析設備を
示すもので、例えば不活性ガス融解型や酸素気流中燃焼
ガス分析型の元素分析装置2の金属試料供給口3に前記
脱ガス装置1を連設して成る。
FIG. 1 shows a degassing apparatus 1. FIG. 2 shows an elemental analysis facility. For example, the degassing apparatus 1 is connected to a metal sample supply port 3 of an elemental analysis apparatus 2 of an inert gas melting type or a combustion gas analysis type in an oxygen stream.

前記脱ガス装置1は、脱ガス器本体4の上部に金属試料
aの挿入口5を且つ下部に金属試料aの供給口6を形成
すると共に、エアーシリンダ等の駆動手段7によって開
閉操作される気密開閉蓋8を前記金属試料挿入口5に取
り付け、かつ、前記金属試料挿入口5を通して挿入され
る金属試料aを受け止めて、これを前記供給口6から前
記元素分析装置2の金属試料投入口3に投入させるスラ
イド自在な金属試料投入具9を設けると共に、前記脱ガ
ス器本体4内のガスを加熱するためのヒーターHを設け
てある。
The degassing device 1 has an insertion port 5 for the metal sample a formed in the upper part of the degasser main body 4 and a supply port 6 for the metal sample a in the lower part, and is opened / closed by a driving means 7 such as an air cylinder. An airtight open / close lid 8 is attached to the metal sample insertion port 5, and the metal sample a inserted through the metal sample insertion port 5 is received, and the metal sample insertion port of the elemental analyzer 2 is supplied from the supply port 6. 3 is provided with a slidable metal sample introduction tool 9 and a heater H for heating the gas in the degasser main body 4.

そして、コンプレッサーPが接続された排気ライン10を
前記脱ガス器本体4に連通連設すると共に、不活性ガス
のボンベBが接続された不活性ガスの供給ライン11を前
記排気ライン10に合流連設し、かつ、前記排気ライン10
と供給ライン11の夫々に開閉バルブV1,V2を設けて成
る。
An exhaust line 10 to which a compressor P is connected is connected to the degasser main body 4, and an inert gas supply line 11 to which an inert gas cylinder B is connected is joined to the exhaust line 10. And the exhaust line 10
On-off valves V 1 and V 2 are provided on the supply line 11 and the supply line 11, respectively.

尚、前記金属試料投入具9は、前記金属試料挿入口5を
通して挿入される金属試料aの受け部材12を、前記脱ガ
ス器本体4に対して気密状態でスライド自在に設けると
共に、該受け部材12をスライド操作するためのソレノイ
ド等の駆動手段13を当該受け部材12に連通連結して成
る。
The metal sample throwing tool 9 is provided with a receiving member 12 for the metal sample a inserted through the metal sample insertion port 5 slidably in an airtight state with respect to the degasser main body 4, and A driving means 13 such as a solenoid for slidingly operating 12 is communicatively connected to the receiving member 12.

而して、前記両ライン10,11のバルブV1,V2を閉弁下に
おいて状態で、前記気密開閉蓋8を開放して前記受け部
材12上に金属試料aを乗載させ、前記気密開閉蓋8を閉
塞すると、該気密開閉蓋8が閉塞されたことをリミット
スイッチLSが検知し、以下のプログラムで脱ガス制御が
行われる。
Then, with the valves V 1 and V 2 of the both lines 10 and 11 closed, the airtight open / close lid 8 is opened and the metal sample a is placed on the receiving member 12 to set the airtightness. When the opening / closing lid 8 is closed, the limit switch LS detects that the airtight opening / closing lid 8 is closed, and degassing control is performed by the following program.

即ち、前記リミットスイッチLSによる気密開閉蓋8の閉
塞検知に基づいて、先ず、前記脱ガス器本体4の雰囲気
を100〜300℃程度に加熱させるべく、前記ヒーターHが
発熱制御されると共に、前記金属試料aが所定の温度に
昇温された時点で前記コンプレッサーPが駆動される。
That is, based on the detection of blockage of the airtight open / close lid 8 by the limit switch LS, first, the heater H is controlled to generate heat so as to heat the atmosphere of the degasser main body 4 to about 100 to 300 ° C. The compressor P is driven when the temperature of the metal sample a is raised to a predetermined temperature.

次いで、前記排気ライン10のバルブV1が所定時間(例え
ば1〜2分程度)だけ開弁されて、前記脱ガス器本体4
内の加熱ガス(本体内の空気と、金属試料aの表面およ
び表層部に吸着しているO2やN2やCO2やSO2等のガス成
分、及び、金属試料aの表面に残留している水分)が真
空排気される。
Then, the valve V 1 of the exhaust line 10 is opened for a predetermined time (for example, about 1 to 2 minutes), and the degasser main body 4 is opened.
Heating gas inside (main body air, gas components such as O 2 , N 2 , CO 2 and SO 2 adsorbed on the surface and surface layer of the metal sample a, and remaining on the surface of the metal sample a) Water) is evacuated.

次に、前記排気ライン10のバルブV1が開弁されると共
に、前記供給ライン11のバルブV2が開弁され、かつ、前
記コンプレッサーPの駆動ならびに前記ヒーターHに対
する発熱制御が停止されて、前記脱ガス器本体4内が不
活性ガスに置換される。
Next, the valve V 1 of the exhaust line 10 is opened, the valve V 2 of the supply line 11 is opened, and the driving of the compressor P and the heat generation control for the heater H are stopped. The inside of the degasser main body 4 is replaced with an inert gas.

そして、所定のガス置換が完了された時点で、前記金属
試料投入具9の受け部材12がスライド操作され、該受け
部材12の金属試料aが前記金属試料投入口3を通して元
素分析装置2に投入される。
Then, when the predetermined gas replacement is completed, the receiving member 12 of the metal sample introducing tool 9 is slid, and the metal sample a of the receiving member 12 is introduced into the elemental analyzer 2 through the metal sample introducing port 3. To be done.

この後に、前記受け部材12が元の姿勢にスライド操作さ
れると共に、前記供給ライン11のバルブV2が閉弁され、
これをもって、前記金属試料aに対する一連の前処理が
完了する。
After that, the receiving member 12 is slid to the original posture, and the valve V 2 of the supply line 11 is closed.
This completes a series of pretreatments for the metal sample a.

尚、前記脱ガス器本体4内のガスを真空排気して後に、
該脱ガス器本体4内に不活性ガスを供給する形態の前処
理について説明したが、上記の不活性ガスに代えて、前
記元素分析装置2で用いられるキャリアガスで前記脱ガ
ス器本体4内を置換させる形態とするも良い。
In addition, after the gas in the degasser main body 4 is evacuated,
Although the pretreatment in the form of supplying the inert gas into the degasser main body 4 has been described, the inside of the degasser main body 4 is replaced with the carrier gas used in the elemental analysis device 2 instead of the above-mentioned inert gas. May be replaced.

また、前記脱ガス器本体4に対する脱ガスとガス置換を
プログラム制御することで説明したが、これは単に一例
であって、その他の自動制御や手動制御を任意に選択可
能であることは言うまでもない。
Further, although the degassing and gas replacement for the degasser main body 4 are described as program control, this is merely an example, and it goes without saying that other automatic control or manual control can be arbitrarily selected. .

更に、上記の真空排気に際し、前記脱ガス器本体4内の
雰囲気を加熱して排気効率を高めるように考慮している
が、これは好ましい排気形態の一例であって、前記ヒー
ターHを省略して実施可能である。
Further, when performing the above-described vacuum exhaust, it is considered that the atmosphere inside the degasser main body 4 is heated to enhance the exhaust efficiency, but this is an example of a preferable exhaust mode, and the heater H is omitted. Can be implemented.

〔考案の効果〕 以上説明したように本考案の元素分析装置用脱ガス装置
によれば、元素分析装置に連設した脱ガス器本体を真空
排気下におくことで、測定の誤差要因となる試料表面お
よび表層部に付着のガス成分や試料表面に残留の水分を
効率的に真空排気できるようになり、而して、上記の真
空排気処理後に、前記脱ガス器本体内を不活性ガスある
いはキャリアガスの雰囲気に置換した後、前記脱ガス処
理後の金属試料を元素分析装置に落下投入することで、
きわめて操作性よく、精度および信頼性の高い元素分析
を個人差なくした状態で行うことができ、延いては、試
料測定の信頼性を向上できるに至ったのである。そし
て、脱ガス器本体を元素分析装置の上部に載設している
ので装置全体がコンパクト化され、省スペースを実現す
ることができる。
[Effects of the Invention] As described above, according to the degasser for elemental analyzer of the present invention, the degasser main body connected to the elemental analyzer is placed under vacuum exhaust, which causes an error in measurement. It becomes possible to efficiently evacuate the gas components adhering to the sample surface and the surface layer portion and the residual water on the sample surface, and thus, after the above-mentioned vacuum evacuation treatment, the inside of the degasser main body is fed with an inert gas or After substituting the atmosphere of carrier gas, by dropping the metal sample after the degassing treatment into an elemental analyzer,
It was possible to perform elemental analysis with extremely high operability, high accuracy and high reliability without individual differences, and in turn, to improve the reliability of sample measurement. Since the degasser main body is mounted on the upper part of the elemental analysis device, the entire device can be made compact and space saving can be realized.

【図面の簡単な説明】[Brief description of drawings]

第1図は脱ガス装置の縦断側面図、第2図は元素分析設
備の形態図である。 2…元素分析装置、3…金属試料投入口、4…脱ガス器
本体、6…金属試料供給口、8…気密開閉蓋、9…金属
試料投入具、10…排気ライン、11…供給ライン、V1,V2
…バルブ。
FIG. 1 is a vertical sectional side view of a degassing apparatus, and FIG. 2 is a configuration diagram of elemental analysis equipment. 2 ... Elemental analysis device, 3 ... Metal sample inlet, 4 ... Degasser main body, 6 ... Metal sample inlet, 8 ... Airtight opening / closing lid, 9 ... Metal sample inlet, 10 ... Exhaust line, 11 ... Supply line, V 1 , V 2
…valve.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】上部に金属試料挿入用の気密開閉蓋が設け
られる一方、下部に金属試料の下方への通過を許容する
金属試料供給口が設けられ、中間部には金属試料を乗載
させることができ、かつその金属試料を落下させること
ができる外部からスライド操作が可能な受け部材を有す
る金属試料投入具が設けられている気密構造の脱ガス器
本体が、元素分析装置の上部に載設されてその元素分析
装置の上部に設けた金属試料投入口を前記金属試料供給
口と対応させる一方、前記脱ガス器本体内のガスを真空
排気するための排気ラインと、不活性ガスまたは前記元
素分析装置に用いられるキャリアガスの供給ラインと
が、前記脱ガス器本体に接続され、かつその両ライン
に、前記脱ガス器本体に対する排気およびガス供給を行
わせるためのバルブが設けられていることを特徴とする
元素分析装置用脱ガス装置。
1. An airtight opening / closing lid for inserting a metal sample is provided on an upper part, a metal sample supply port for allowing a metal sample to pass downward is provided on a lower part, and a metal sample is mounted on an intermediate part. The degasser main body of the airtight structure is provided on the upper part of the elemental analyzer, which is provided with a metal sample input tool having a receiving member capable of sliding the metal sample from the outside and capable of dropping the metal sample. The metal sample inlet provided on the upper part of the elemental analyzer is made to correspond to the metal sample supply port, and an exhaust line for exhausting the gas in the degasser main body to vacuum, an inert gas or the above A carrier gas supply line used in an elemental analyzer is connected to the degasser body, and a valve for causing both lines to perform exhaust and gas supply to the degasser body. Vignetting degasser elemental analysis apparatus characterized by being.
JP1988135699U 1988-10-17 1988-10-17 Degasser for elemental analyzer Expired - Lifetime JPH0620126Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988135699U JPH0620126Y2 (en) 1988-10-17 1988-10-17 Degasser for elemental analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988135699U JPH0620126Y2 (en) 1988-10-17 1988-10-17 Degasser for elemental analyzer

Publications (2)

Publication Number Publication Date
JPH0257049U JPH0257049U (en) 1990-04-25
JPH0620126Y2 true JPH0620126Y2 (en) 1994-05-25

Family

ID=31395561

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988135699U Expired - Lifetime JPH0620126Y2 (en) 1988-10-17 1988-10-17 Degasser for elemental analyzer

Country Status (1)

Country Link
JP (1) JPH0620126Y2 (en)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5612541A (en) * 1979-07-11 1981-02-06 Chiyou Lsi Gijutsu Kenkyu Kumiai Removing device of contaminant
JPH065627Y2 (en) * 1985-11-12 1994-02-09 昭和アルミニウム株式会社 Gas analyzer for aluminum material
JPH0641906B2 (en) * 1985-12-20 1994-06-01 株式会社島津製作所 Degasser for sample for surface area measurement by gas adsorption method

Also Published As

Publication number Publication date
JPH0257049U (en) 1990-04-25

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