JPH06184676A - High strength and high electric conductivity copper alloy - Google Patents

High strength and high electric conductivity copper alloy

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Publication number
JPH06184676A
JPH06184676A JP35718192A JP35718192A JPH06184676A JP H06184676 A JPH06184676 A JP H06184676A JP 35718192 A JP35718192 A JP 35718192A JP 35718192 A JP35718192 A JP 35718192A JP H06184676 A JPH06184676 A JP H06184676A
Authority
JP
Japan
Prior art keywords
copper alloy
less
strength
workability
total
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP35718192A
Other languages
Japanese (ja)
Inventor
Junji Miyake
淳司 三宅
Takatsugu Hatano
隆紹 波多野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikko Kinzoku KK
Original Assignee
Nikko Kinzoku KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikko Kinzoku KK filed Critical Nikko Kinzoku KK
Priority to JP35718192A priority Critical patent/JPH06184676A/en
Publication of JPH06184676A publication Critical patent/JPH06184676A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To provide a copper alloy having electric conductivity, strength, spring characteristics, suitability to blanking and bendability required by the lead material of a semiconductor device and an electric conductive spring material. CONSTITUTION:A compsn. consisting of 25% to <43% Zn, 0.0005% to <0.05%, in total, of one or more among Ti, Zr, Hf and Th and the balance Cu with inevitable impurities or further contg. 0.01% to <1%, in total, of one or more among P, Sn, Si, Fe, Cr, B, Co, Mg, Ni, Al and Mn is imparted to a copper alloy and the average grain diameter of the copper alloy is optionally regulated to <25mum.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は、トランジスタや集積
回路(IC)等のような半導体機器のリ−ド材やコネク
タ−,端子,リレ−,スイッチ等の導電性ばね材として
好適な、高い強度,導電性等に加えて優れた打抜き加工
性,曲げ加工性を備えた銅合金に関するものである。
BACKGROUND OF THE INVENTION The present invention is suitable as a lead material for semiconductor devices such as transistors and integrated circuits (ICs) and as a conductive spring material for connectors, terminals, relays and switches. The present invention relates to a copper alloy having excellent punching workability and bending workability in addition to strength and conductivity.

【0002】[0002]

【従来技術とその課題】従来、半導体機器のリ−ド材に
は、熱膨張係数が低く、素子及びセラミックスとの接着
性,封着性の良好な“コバ−ル(商標名:Fe-29wt%Ni-1
6wt%Co合金)”或いは“42合金”等といった高ニッケ
ル合金が好んで使われてきた。ところが、近年、半導体
回路の集積度向上に伴って消費電力の高いICが多く使
用されるようになってきたことや、封止材料として樹脂
が多く用いられるようになり、しかも素子とリ−ドフレ
−ムの接着にも改良が加えられたこと等の事情もあっ
て、半導体機器のリ−ド材に放熱性の良い銅基合金を使
用する傾向が目立つようになっている。
2. Description of the Related Art Conventionally, as a lead material for semiconductor devices, "COVAL (trade name: Fe-29wt), which has a low coefficient of thermal expansion and good adhesiveness and sealing property with elements and ceramics. % Ni-1
High-nickel alloys such as “6 wt% Co alloy)” or “42 alloy” have been used favorably.In recent years, however, ICs with high power consumption have been widely used as the integration degree of semiconductor circuits has improved. As a result of the fact that resin has been widely used as a sealing material and that the adhesion between the element and the lead frame has also been improved, the lead material for semiconductor equipment has been improved. The tendency to use a copper-based alloy with good heat dissipation has become prominent.

【0003】ところで、材料の種類はともかく、このよ
うな半導体機器のリ−ド材には一般に次のような特性が
要求されている。 a) リ−ドは電気信号伝達部であると同時に、パッケ−
ジング工程中及び回路使用中に発生する熱を外部に放出
する機能を必要とするので、熱及び電気の伝導性に優れ
ること, b) 半導体素子保護の観点から“リ−ドとモ−ルドとの
密着性”が重要であるため、熱膨張係数がモ−ルド材と
近いこと, c) パッケ−ジング時に種々の加熱工程が加わるため、
耐熱性が良好であること, d) リ−ドは、リ−ド材を打抜き加工し、また曲げ加工
して作成されるものが殆どであるため、これらの加工性
が良好であること, e) リ−ドには表面に貴金属のめっきが施されるため、
これら貴金属とのめっき密着性が良好であること, f) パッケ−ジング後にも封止材の外に露出している所
謂“アウタ−・リ−ド部”に半田付けする場合が多いの
で、良好な半田付け性を示すこと, g) 機器の信頼性及び寿命の観点から耐食性が良好なこ
と, h) 価格が低廉であること。
Regardless of the type of material, lead materials for such semiconductor devices are generally required to have the following characteristics. a) The lead is the electrical signal transmission part and at the same time the package.
Since it needs a function to release heat generated during the aging process and during circuit use to the outside, it has excellent heat and electrical conductivity. B) From the viewpoint of semiconductor device protection, "lead and mold "Adhesion" is important, so the coefficient of thermal expansion is close to that of the mold material. C) Various heating steps are added during packaging,
Good heat resistance, d) Most of the leads are made by punching and bending the lead material, so they have good workability, e ) Since the surface of the lead is plated with precious metal,
Good plating adhesion with these noble metals, f) Good because it is often soldered to the so-called "outer lead" that is exposed outside the encapsulant even after packaging. Good solderability, g) good corrosion resistance from the viewpoint of equipment reliability and life, and h) low price.

【0004】しかしながら、これら各種の要求特性に対
し、従来より使用されている無酸素銅,錫入り銅,りん
青銅,コバ−ル(商品名)及び42合金には何れも一長
一短があり、前記特性の全てを必ずしも満足し得るもの
ではなかった。特に、リ−ドの多ピン化,小型化の進展
に伴って形状の複雑化やピンの狭小化が進み、材料に一
層良好な打抜き性及び曲げ加工性が求められていること
を考慮すれば、上記従来材はこれらの点で十分な性能を
有しているとは言い難かった。
However, with respect to these various required characteristics, oxygen-free copper, tin-containing copper, phosphor bronze, Kovar (trade name) and 42 alloy, which have been conventionally used, have advantages and disadvantages. Was not always satisfactory. In particular, considering that the shape is becoming more complicated and the pins are becoming narrower with the increase in the number of leads and the miniaturization of the leads, considering that the material is required to have better punchability and bendability. However, it was difficult to say that the above-mentioned conventional materials have sufficient performance in these points.

【0005】一方、同様に優れた導電性,耐食性,強
度,打抜き性,曲げ加工性等が要求されるところの電気
機器,計測機器,スイッチ或いはコネクタ−等に用いら
れるばね用材料としては、従来から比較的安価な "黄
銅" ,ばね特性の優れた“りん青銅”,ばね特性に加え
て耐食性にも優れた“洋白”といった銅合金が使用され
てきた。
On the other hand, as a spring material used for electrical equipment, measuring equipment, switches, connectors, etc., which are required to have excellent conductivity, corrosion resistance, strength, punching property, bending workability, etc. Therefore, copper alloys such as "brass" which is relatively cheap, "phosphor bronze" which has excellent spring characteristics, and "white silver" which has excellent corrosion resistance in addition to spring characteristics have been used.

【0006】しかし、一層の高性能化が進む前記機器類
のばね材として上記銅合金を検討すると、黄銅は強度や
ばね特性の点で十分満足できるものではなく、また強度
及びばね特性に優れる洋白やりん青銅にしても部品の軽
薄短小化が進むにつれてより厳しい打抜き加工,曲げ加
工が施されるようになったことから、従来の材料ではこ
れら加工性面での不満が指摘されるようになってきた。
従って、より改善された打抜き加工性及び曲げ加工性を
示し、かつばね特性の優れた合金の出現が待たれてい
た。
However, when the above-mentioned copper alloy is examined as a spring material for the above-mentioned devices which are further improved in performance, brass is not sufficiently satisfactory in terms of strength and spring characteristics, and it is excellent in strength and spring characteristics. Even with white and phosphor bronze, as the lightness, thinness and shortness of parts have progressed, more severe punching and bending processes have come to be performed, so it is pointed out that these conventional materials are dissatisfied in terms of workability. It's coming.
Therefore, the emergence of an alloy exhibiting improved punching workability and bending workability and having excellent spring properties has been awaited.

【0007】このようなことから、本発明の目的は、銅
系材料の優れた電気,熱の伝導性を生かすと同時に、半
導体機器のリ−ド材や導電性ばね材として十分に満足で
きる強度,ばね特性,耐食性,打抜き加工性並びに曲げ
加工性をも兼備した銅合金を実現することに置かれた。
From the above, the object of the present invention is to make use of the excellent electrical and thermal conductivity of the copper-based material, and at the same time, to sufficiently satisfy the strength as a lead material or a conductive spring material for semiconductor devices. , The spring characteristics, corrosion resistance, punching workability and bending workability were also combined to realize a copper alloy.

【0008】[0008]

【課題を解決するための手段】そこで、本発明者等は上
記目的を達成すべく鋭意研究を重ねたところ、「優れた
強度,ばね特性等を備えるCu−Zn系合金の成分調整を行
った上で、 これに適量のTi,Zr,Hf又はThを含有させる
と、 半導体機器のリ−ド材や導電性ばね材としての必要
特性に格別な悪影響を及ぼすことなく十分とは言えなか
った打抜き加工性や曲げ加工性が著しく向上する」との
新事実が明らかとなり、更には「このような組成を有し
た銅合金の結晶粒度を特定の細かい領域に調整するとそ
の打抜き加工性や曲げ加工性が一層向上する」という知
見も得ることができた。
Then, the inventors of the present invention conducted extensive studies to achieve the above-mentioned object, and found that "the components of a Cu-Zn alloy having excellent strength and spring characteristics were adjusted. In the above, when an appropriate amount of Ti, Zr, Hf, or Th was added to this, punching which was not sufficient without adversely affecting the required properties as a lead material or conductive spring material for semiconductor equipment was not possible. The new fact that "workability and bending workability are remarkably improved" has been clarified. Furthermore, if the grain size of a copper alloy having such a composition is adjusted to a specific fine region, the punching workability and bending workability are improved. It has also been obtained.

【0009】本発明は、上記知見事項等を基にして完成
されたものであり、「銅合金を、Zn:25%以上43%未満
(以降、 成分割合を表す%は重量%とする),Ti,Zr,Hf
又はThのうちの1種以上: 総量で0.0005%以上0.05%未
満を含有し、 必要によりP,Sn,Si,Fe,Cr,B,Co,
Mg,Ni, Al又はMnのうちの1種以上:総量で0.01%以上
1%未満をも含むと共に残部がCu及び不可避的不純物か
ら成る成分組成とするか、 或いはこれに加えてその平均
結晶粒径を25μm未満に調整することにより、 半導体
機器のリ−ド材として十分満足できる優れた電気及び熱
伝導性,加工性,めっき密着性,半田付け性並びに耐熱
性、 更には導電性ばね材としても十分な強度,ばね特
性,導電性,加工性を兼備せしめた点」に大きな特徴を
有している。
The present invention has been completed on the basis of the above-mentioned findings and the like. "Copper alloy contains Zn: 25% or more and less than 43% (hereinafter,% representing a component ratio shall be% by weight), Ti, Zr, Hf
Or one or more of Th: 0.0005% or more and less than 0.05% in total, and if necessary P, Sn, Si, Fe, Cr, B, Co,
One or more of Mg, Ni, Al or Mn: The total amount is 0.01% or more and less than 1% and the balance is Cu and inevitable impurities, or in addition to this, the average crystal grain By adjusting the diameter to less than 25 μm, it has excellent electrical and thermal conductivity, workability, plating adhesion, solderability and heat resistance that can be sufficiently satisfied as a lead material for semiconductor equipment, and as a conductive spring material. It also has sufficient strength, spring characteristics, conductivity, and workability ”.

【0010】次に、本発明において銅合金の成分組成,
平均結晶粒径を前記の如くに限定した理由を、その作用
と共に説明する。Zn量 Znには合金の強度を確保する作用があるが、その含有量
が25%未満であると他の成分の複合添加を伴っても所望
とする強度が得られず、一方、43%以上の割合でZnを含
有させると導電性が低下し、しかもCu−Zn系に特有のβ
相が発生しやすくてこれにより加工性が劣化することか
ら、Zn含有量は「25%以上43%未満」と定めた。
Next, in the present invention, the component composition of the copper alloy,
The reason why the average grain size is limited as described above will be explained together with its action. The Zn content Zn has the function of ensuring the strength of the alloy, but if the content is less than 25%, the desired strength cannot be obtained even with the combined addition of other components, while at least 43% When Zn is contained in the ratio of, the conductivity decreases, and β peculiar to Cu-Zn system
The Zn content is defined as "25% or more and less than 43%" because phases are likely to occur and workability deteriorates due to this.

【0011】Ti,Zr,Hf又はTh量 Ti,Zr,Hf,ThのIVa族元素には、微量添加により打抜
き加工性及び曲げ加工性を改善する等しい作用があるこ
とから、その1種又は2種以上の添加がなされる。な
お、上記元素がこれらの作用を発揮する機構は現在研究
中であるが、Ti,Zr,Hf又はThのうちの1種又は2種以
上の含有量が総量で0.0005%未満であると前記作用によ
る所望の効果が得られず、一方、その含有量が総量で0.
05%以上になると打抜き加工性及び曲げ加工性が逆に劣
化すると共に、導電性も低下することから、これら元素
の含有量は総量で「0.0005%以上0.05%未満」と定め
た。
Ti, Zr, Hf or Th amount Ti, Zr, Hf, Th group IVa elements have the same action of improving punching workability and bending workability by adding a trace amount thereof, and therefore one or two of them is used. More than one seed is added. The mechanism by which the above-mentioned elements exert these actions is currently under study, but if the content of one or more of Ti, Zr, Hf or Th is less than 0.0005% in total, the above-mentioned action is obtained. The desired effect is not obtained, on the other hand, its content is 0.
If it exceeds 05%, the punching workability and bending workability are deteriorated, and the conductivity is also deteriorated. Therefore, the total content of these elements is defined as "0.0005% or more and less than 0.05%".

【0012】P,Sn,Si,Fe,Cr,B,Co,Mg,Ni, Al又はMn量 P,Sn,Si,Fe,Cr,B,Co,Mg,Ni, Al及びMnには、
上記銅合金の強度並びに耐熱性を更に改善する等しい作
用があるので必要により1種又は2種以上の添加がなさ
れる。しかし、その含有量が総量で0.01%未満であると
前記作用による所望の効果が得られず、一方、総含有量
が1%以上になると導電率が著しく低下することから、
これら元素の含有量は総量で「0.01%以上1%未満」と
定めた。
[0012] P, Sn, Si, Fe, Cr, B, Co, Mg, Ni, Al or Mn amount P, Sn, Si, Fe, Cr, B, Co, Mg, Ni, Al and Mn are
Since they have the same effect of further improving the strength and heat resistance of the above-mentioned copper alloy, one or more of them are added if necessary. However, if the total content is less than 0.01%, the desired effect due to the above action cannot be obtained, while if the total content is 1% or more, the conductivity remarkably decreases.
The total content of these elements was defined as "0.01% or more and less than 1%".

【0013】結晶粒径 本発明に係る銅合金では、その結晶粒の粗大化が打抜き
加工性及び曲げ加工性に少なからぬ悪影響を及ぼす。特
に、平均結晶粒径が25μm以上になると打抜き加工
性,曲げ加工性の劣化が顕著となる。従って、良好な打
抜き加工性及び曲げ加工性を確保するためには、平均結
晶粒径が25μm以上とならないように調整するのが良
い。
[0013] In the crystal grain size of copper alloy according to the present invention, coarsening of the crystal grains exerts considerable adverse effect on punching processability and bending workability. In particular, when the average crystal grain size is 25 μm or more, the punching workability and bending workability are significantly deteriorated. Therefore, in order to secure good punching workability and bending workability, it is preferable to adjust so that the average crystal grain size does not exceed 25 μm.

【0014】上述のように、本発明に係る銅合金は、優
れた強度,ばね特性,電気伝導性,耐熱性等を具備する
と共に良好な打抜き加工性及び曲げ加工性を示し、しか
も半田付け性やめっき密着性にも優れるものであるが、
以下、実施例によって本発明をより具体的に説明する。
As described above, the copper alloy according to the present invention has excellent strength, spring characteristics, electric conductivity, heat resistance, etc., and exhibits excellent punching workability and bending workability, and moreover, solderability. It also has excellent plating adhesion,
Hereinafter, the present invention will be described more specifically with reference to Examples.

【0015】[0015]

【実施例】電気銅を原料とし高周波溶解炉にて表1及び
表2に示される各種成分組成の銅合金を溶製し、厚さ2
0mmのインゴットに鋳造した。なお、溶解・鋳造は大気
中で実施した。
[Embodiment] Copper alloy having various component compositions shown in Tables 1 and 2 was melted in a high-frequency melting furnace using electrolytic copper as a raw material to obtain a thickness of 2
It was cast into a 0 mm ingot. The melting / casting was performed in the atmosphere.

【0016】[0016]

【表1】 [Table 1]

【0017】[0017]

【表2】 [Table 2]

【0018】次に、このインゴットを800℃に1時間
加熱保持してから8mmまで熱間圧延を行い、その後厚さ
1.5mm にまで冷間圧延を行った。続いて、これに400
℃で1時間の焼鈍を施してから厚さ0.6mm にまで冷間圧
延し、350〜500℃の温度で1時間焼鈍して結晶粒
径を調整した後、更なる冷間圧延で 0.4mmの板材とし
た。そして、最後に300℃で1時間の歪取焼鈍を施
し、このようにして得られた各板材につき平均結晶粒径
を調べると共に、諸特性の評価を行った。
Next, the ingot was heated and held at 800 ° C. for 1 hour and then hot-rolled to 8 mm, and then the thickness was increased.
Cold rolling was performed to 1.5 mm. Then 400
After annealing at 0 ° C for 1 hour, cold rolling to a thickness of 0.6 mm, annealing at 350-500 ° C for 1 hour to adjust the crystal grain size, and further cold rolling to 0.4 mm It was a plate material. Finally, strain relief annealing was carried out at 300 ° C. for 1 hour, and the average crystal grain size of each plate material thus obtained was examined and various properties were evaluated.

【0019】なお、“強度”及び“伸び”の評価は引張
試験により、また“耐熱性”の評価は加熱時間5分に於
ける軟化温度の測定により、そして“電気伝導性(放熱
性)"の評価は導電率の(%IACS) 測定によりそれぞれ実施
した。
The "strength" and "elongation" are evaluated by a tensile test, the "heat resistance" is evaluated by measuring the softening temperature at a heating time of 5 minutes, and "electrical conductivity (heat dissipation)". Was evaluated by measuring the conductivity (% IACS).

【0020】“曲げ加工性”については、図1に示す如
く、10mm幅の試験片を圧延方向と直角に、そして内側
曲げ半径:0.4mm(=板厚)で片側に90°の曲げを繰り
返し行い、破断までの曲げ回数(往復で1回とする)を
測定した。試験はn=5で行い、その平均値で評価を行
った。
Regarding the "bending workability", as shown in FIG. 1, a test piece having a width of 10 mm is bent at right angles to the rolling direction, and an inner bending radius of 0.4 mm (= plate thickness) is repeatedly bent at 90 ° on one side. The measurement was performed and the number of times of bending until breakage (reciprocating once) was measured. The test was performed with n = 5, and the average value was used for evaluation.

【0021】また、“打抜き加工性”の評価は打抜き加
工後のプレス破面を観察することで行い、破断面比率
{(破断面/板厚)×100}が20%以上のときを
「良好」、20%未満のときを 「不良」 と判定した。
The "punching workability" is evaluated by observing the press fracture surface after punching, and when the fracture surface ratio {(fracture surface / plate thickness) × 100} is 20% or more.
“Good” and less than 20% were judged as “poor”.

【0022】これらの評価結果を、前記表1及び表2に
併せて示す。さて、表1及び表2に示される結果からも
明らかなように、本発明合金No.1〜No.18 は、何れも優
れた強度,伸び,導電性,耐熱性を有すると共に良好な
打抜き加工性及び曲げ加工性を示すことが分かる。
The results of these evaluations are also shown in Tables 1 and 2 above. As is clear from the results shown in Tables 1 and 2, the alloys No. 1 to No. 18 of the present invention all have excellent strength, elongation, conductivity, heat resistance and good punching. It can be seen that the material exhibits bendability and bendability.

【0023】これに対し、比較合金No.19 〜22は、Ti,
Zr,Hf又はThを含有していないため本発明合金に比べて
打抜き加工性及び曲げ性が劣っている。比較合金No.23
は、副成分としてのCo含有量が1%以上となっているた
め導電率が低くなっている。
On the other hand, the comparative alloys Nos. 19 to 22 are Ti,
Since it does not contain Zr, Hf or Th, it is inferior in punching workability and bendability to the alloy of the present invention. Comparative alloy No.23
Has a low conductivity because the Co content as a subcomponent is 1% or more.

【0024】また、比較合金No.24 はZn含有量が少ない
ために強度が低く、一方、比較合金No.26 はZn含有量が
多過ぎるために導電率が低くなっている。比較合金No.2
5 は、TiとZrの合計含有量が0.05%以上であるため打抜
き加工性及び曲げ加工性が却って悪くなっており、導電
性も低い。
Further, the comparative alloy No. 24 has a low strength due to the low Zn content, while the comparative alloy No. 26 has a low electrical conductivity due to the excessive Zn content. Comparative alloy No.2
In No. 5, since the total content of Ti and Zr is 0.05% or more, the punching workability and bending workability are rather poor and the conductivity is low.

【0025】ところで、合金No.22 は結晶粒の粗大化し
たものの例であるが、結晶粒径がこのように大きいと打
抜き加工性及び曲げ加工性が悪くなることを確認でき
る。
Alloy No. 22 is an example in which the crystal grains are coarse, and it can be confirmed that the punching workability and bending workability deteriorate when the crystal grain size is such large.

【0026】[0026]

【効果の総括】以上に説明した如く、この発明によれ
ば、半導体機器のリ−ド材及び導電性ばね材としての従
来合金で指摘された打抜き性及び曲げ加工性の難点を克
服し、前記材料の性能を大幅に向上する高力高導電性銅
合金を提供することが可能となるなど、産業上極めて有
用な効果がもたらされる。
[Summary of Effects] As described above, according to the present invention, the problems of punchability and bendability pointed out in the conventional alloys as the lead material and the conductive spring material of the semiconductor device are overcome, and It is possible to provide a high-strength and high-conductivity copper alloy that significantly improves the performance of the material, and an extremely useful effect in industry is brought about.

【図面の簡単な説明】[Brief description of drawings]

【図1】90°繰り返し曲げ試験方法の説明図である。FIG. 1 is an explanatory view of a 90 ° cyclic bending test method.

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 重量割合にてZn:25%以上43%未満,T
i,Zr,Hf又はThのうちの1種以上: 総量で0.0005%以
上0.05%未満を含むと共に、残部がCu及び不可避的不純
物から成ることを特徴とする高力高導電性銅合金。
1. A weight ratio of Zn: 25% or more and less than 43%, T
One or more of i, Zr, Hf, and Th: A high-strength and high-conductivity copper alloy containing 0.0005% or more and less than 0.05% in total and the balance being Cu and inevitable impurities.
【請求項2】 重量割合にてZn:25%以上43%未満,T
i,Zr,Hf及びThのうちの1種以上: 総量で0.0005%以
上0.05%未満,P,Sn,Si,Fe,Cr,B,Co,Mg,Ni,
Al又はMnのうちの1種以上:総量で0.01%以上1%未満
を含むと共に、残部がCu及び不可避的不純物から成るこ
とを特徴とする高力高導電性銅合金。
2. Zn by weight: 25% or more and less than 43%, T
One or more of i, Zr, Hf and Th: 0.0005% or more and less than 0.05% in total, P, Sn, Si, Fe, Cr, B, Co, Mg, Ni,
One or more of Al or Mn: A high strength and high conductivity copper alloy containing 0.01% or more and less than 1% in total and the balance being Cu and inevitable impurities.
【請求項3】 重量割合にてZn:25%以上43%未満,T
i,Zr,Hf又はThのうちの1種以上: 総量で0.0005%以
上0.05%未満を含むと共に、残部がCu及び不可避的不純
物から成り、かつ平均結晶粒径が25μm未満であるこ
とを特徴とする高力高導電性銅合金。
3. By weight ratio, Zn: 25% or more and less than 43%, T
One or more of i, Zr, Hf, or Th: The total amount is 0.0005% or more and less than 0.05%, the balance is Cu and inevitable impurities, and the average crystal grain size is less than 25 μm. High strength and high conductivity copper alloy.
【請求項4】 重量割合にてZn:25%以上43%未満,T
i,Zr,Hf及びThのうちの1種以上: 総量で0.0005%以
上0.05%未満,P,Sn,Si,Fe,Cr,B,Co,Mg,Ni,
Al又はMnのうちの1種以上:総量で0.01%以上1%未満
を含むと共に、残部がCu及び不可避的不純物から成り、
かつ平均結晶粒径が25μm未満であることを特徴とす
る高力高導電性銅合金。
4. Zn by weight: 25% or more and less than 43%, T
One or more of i, Zr, Hf and Th: 0.0005% or more and less than 0.05% in total, P, Sn, Si, Fe, Cr, B, Co, Mg, Ni,
One or more of Al or Mn: 0.01% or more and less than 1% in total, with the balance being Cu and inevitable impurities,
A high-strength and high-conductivity copper alloy having an average crystal grain size of less than 25 μm.
JP35718192A 1992-12-23 1992-12-23 High strength and high electric conductivity copper alloy Pending JPH06184676A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP35718192A JPH06184676A (en) 1992-12-23 1992-12-23 High strength and high electric conductivity copper alloy

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP35718192A JPH06184676A (en) 1992-12-23 1992-12-23 High strength and high electric conductivity copper alloy

Publications (1)

Publication Number Publication Date
JPH06184676A true JPH06184676A (en) 1994-07-05

Family

ID=18452806

Family Applications (1)

Application Number Title Priority Date Filing Date
JP35718192A Pending JPH06184676A (en) 1992-12-23 1992-12-23 High strength and high electric conductivity copper alloy

Country Status (1)

Country Link
JP (1) JPH06184676A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1452612A2 (en) * 2003-02-28 2004-09-01 Wieland-Werke AG Lead-free copper alloy and use thereof
WO2007091690A1 (en) * 2006-02-10 2007-08-16 Mitsubishi Shindoh Co., Ltd. Raw material brass alloy for casting of semi-molten alloy
JP2015034332A (en) * 2013-07-10 2015-02-19 三菱マテリアル株式会社 Copper alloy for electronic/electric equipment, copper alloy thin sheet for electronic/electric equipment and conductive part and terminal for electronic/electric equipment
WO2017071672A1 (en) * 2015-10-27 2017-05-04 华南理工大学 Lead-free easy cutting high strength corrosion resistant silicon brass alloy, and preparation method and application

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1452612A2 (en) * 2003-02-28 2004-09-01 Wieland-Werke AG Lead-free copper alloy and use thereof
EP1452612A3 (en) * 2003-02-28 2004-09-22 Wieland-Werke AG Lead-free copper alloy and use thereof
WO2007091690A1 (en) * 2006-02-10 2007-08-16 Mitsubishi Shindoh Co., Ltd. Raw material brass alloy for casting of semi-molten alloy
JP2007211310A (en) * 2006-02-10 2007-08-23 Sanbo Copper Alloy Co Ltd Raw material brass alloy for casting half-melted alloy
JP2015034332A (en) * 2013-07-10 2015-02-19 三菱マテリアル株式会社 Copper alloy for electronic/electric equipment, copper alloy thin sheet for electronic/electric equipment and conductive part and terminal for electronic/electric equipment
WO2017071672A1 (en) * 2015-10-27 2017-05-04 华南理工大学 Lead-free easy cutting high strength corrosion resistant silicon brass alloy, and preparation method and application
US10697045B2 (en) 2015-10-27 2020-06-30 South China University Of Technology Lead-free easy-cutting high-strength corrosion-resistant silicon-brass alloy and the preparation method and use thereof

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