JPH06163773A - Lead frame for semiconductor device and its manufacture - Google Patents

Lead frame for semiconductor device and its manufacture

Info

Publication number
JPH06163773A
JPH06163773A JP33364492A JP33364492A JPH06163773A JP H06163773 A JPH06163773 A JP H06163773A JP 33364492 A JP33364492 A JP 33364492A JP 33364492 A JP33364492 A JP 33364492A JP H06163773 A JPH06163773 A JP H06163773A
Authority
JP
Japan
Prior art keywords
groove
lead frame
semiconductor
resin
grooves
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP33364492A
Other languages
Japanese (ja)
Inventor
Norinaga Watanabe
典永 渡辺
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Goto Seisakusho KK
Original Assignee
Goto Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Goto Seisakusho KK filed Critical Goto Seisakusho KK
Priority to JP33364492A priority Critical patent/JPH06163773A/en
Publication of JPH06163773A publication Critical patent/JPH06163773A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/93Batch processes
    • H01L24/95Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
    • H01L24/97Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation
    • H01L2924/183Connection portion, e.g. seal
    • H01L2924/18301Connection portion, e.g. seal being an anchoring portion, i.e. mechanical interlocking between the encapsulation resin and another package part

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Lead Frames For Integrated Circuits (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)

Abstract

PURPOSE:To provide a lead frame wherein the close contact strength of a semiconductor sealing resin is enhanced and a moisture-resistant property at the inside of the resin is enhanced. CONSTITUTION:Grooves 4, 5 are formed at the resin-sealed part of a semiconductor mounting part 2 in a long-belt plate material. The grooves 4, 5 are formed to be narrow dovetail groove shapes whose open part is narrower than the width of the bottom part. The groove 4 is formed in such a way that a first groove 7 is formed by a rolling roller in a process to roll the long-belt plate material, that a second groove 8 is formed by compressing the first groove 7 from its upper part by a roller which is wider than it and that edges 4a of the first groove 7 are pushed out to the inside. A lead frame 1 is punched from the long-belt plate material having the groove 4, and a plurality of semiconductor mounting parts 2 and leads 3 connected to semiconductors by conductors are formed continuously in the lengthwise direction. The groove 5 is formed in such a way that a first groove 9 is formed when the lead frame 1 is punched and worked, that the first groove 9 is compressed from the upper part by a punch which is wider than it and that edges 5a of the first groove 9 are pushed out to the inside.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、ICやLSI等の半導
体装置用のリードフレーム及びこれを製造する方法の改
良に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an improved lead frame for a semiconductor device such as an IC or LSI and a method for manufacturing the same.

【0002】[0002]

【従来の技術】半導体装置用のリードフレームは、長尺
帯板材をプレス加工して、半導体を載せる半導体搭載部
と、後に導線によって半導体に接続される複数のリード
とを、長手方向に連続的に形成して成る。従来のリード
フレームには、例えば特開平3−54851号のように
長手方向の溝を有するものがある。この溝は、半導体搭
載部上に搭載された半導体を樹脂モールドにて封止する
際に、リードフレームに対する樹脂の食い付きをよくす
るものである。このようなリードフレームの長手方向の
溝は、断面が矩形を成している。
2. Description of the Related Art A lead frame for a semiconductor device is formed by pressing a long strip plate material to form a semiconductor mounting portion on which a semiconductor is mounted and a plurality of leads which are subsequently connected to the semiconductor by conductors in a longitudinal direction. It is formed by. Some conventional lead frames have a groove in the longitudinal direction as disclosed in, for example, JP-A-3-54851. The groove improves the biting of the resin with respect to the lead frame when the semiconductor mounted on the semiconductor mounting portion is sealed with the resin mold. Such a groove in the longitudinal direction of the lead frame has a rectangular cross section.

【0003】[0003]

【発明が解決しようとする課題】上記従来のリードフレ
ームは、半導体を樹脂封止するのにリードフレームに対
する樹脂の食い付きが十分でなく、密着強度が低いし、
耐湿性も不十分であるという問題がある。従って、本発
明は、密着強度及び耐湿性を向上させたリードフレーム
を提供することを課題としている。
In the above-mentioned conventional lead frame, the resin does not bite sufficiently onto the lead frame to seal the semiconductor with resin, and the adhesion strength is low.
There is a problem that the moisture resistance is also insufficient. Therefore, an object of the present invention is to provide a lead frame having improved adhesion strength and moisture resistance.

【0004】[0004]

【課題を解決するための手段】上記課題を解決するた
め、本発明においては、長尺帯板材6に、複数組のリー
ド3と半導体搭載部2とを相隣接して連続的に形成して
成り、かつ半導体封止用樹脂Mのモールド封止部に樹脂
Mの喰い付き増強用の溝4,5を有するリードフレーム
1であって、この溝4,5は、その底部より開放部の幅
を狭く形成して半導体装置用リードフレーム1を構成し
た。さらに、具体的には、例えば溝5が半導体搭載部2
の半導体Sを取り囲むように形成した。そして、これら
のリードフレーム1を製造するに当たり、モールド封止
部に溝7,9を形成した後、この溝7,9の上部をこの
溝の幅より広く圧搾することにより溝4,5の底部より
開放部の幅を狭く形成する方法を採用した。
In order to solve the above problems, according to the present invention, a plurality of sets of leads 3 and semiconductor mounting portions 2 are continuously formed adjacent to each other on a long strip plate member 6. The lead frame 1 has grooves 4 and 5 for strengthening the bite of the resin M in the mold sealing portion of the semiconductor sealing resin M, and the grooves 4 and 5 have a width from the bottom to the opening. To form a lead frame 1 for a semiconductor device. Further, specifically, for example, the groove 5 is the semiconductor mounting portion 2
Was formed so as to surround the semiconductor S. Then, in manufacturing these lead frames 1, after forming the grooves 7 and 9 in the mold sealing portion, the upper portions of the grooves 7 and 9 are squeezed wider than the width of the grooves to form the bottom portions of the grooves 4 and 5. The method of forming the width of the open portion narrower was adopted.

【0005】[0005]

【作用】本発明のリードフレーム1は、長尺帯板材6
に、例えばローラRやプレスPなどにて溝7,9を形成
し、この溝7,9をさらに圧搾することにより、溝4,
5の縁部4a,5aを内側に押し出して溝4,5の底部
より開放部の幅を狭く形成する。この溝4,5により、
半導体Sを樹脂モールドにて封止する際に、リードフレ
ーム1に対する樹脂Mの食い付きがよく、着接強度が増
し、良好な耐湿性を有することとなる。特に、半導体搭
載部2を取り囲むように溝5を形成すれば、さらに着接
強度が増す。
The lead frame 1 of the present invention is composed of a long strip plate member 6
Then, the grooves 7 and 9 are formed by, for example, the roller R and the press P, and the grooves 7 and 9 are further squeezed to form the grooves 4 and 9.
The edges 4a and 5a of the groove 5 are extruded inward so that the width of the open portion is narrower than the bottom of the grooves 4 and 5. With these grooves 4 and 5,
When the semiconductor S is sealed with a resin mold, the resin M bites well onto the lead frame 1, the adhesion strength increases, and good moisture resistance is obtained. Particularly, if the groove 5 is formed so as to surround the semiconductor mounting portion 2, the attachment strength is further increased.

【0006】[0006]

【実施例】本発明の実施例を図面について説明する。図
1(A)はリードフレームの平面図、同図(B)はA−
A線拡大断面図、(C)はB−B線拡大断面図、図2は
長尺帯板材のプレス成形前の状態の平面図、図3(A)
は圧搾前の溝の拡大断面図、(B)は圧搾後の溝の拡大
断面図、図4(A)は圧搾前の溝の拡大断面図、(B)
は圧搾後の拡大断面図、図5はリードフレームの断面図
である。図1(A)において、1は半導体Sを載せる半
導体搭載部2と、後に導線Wによって半導体Sに接続さ
れるリード3とが、長手方向に相隣接して連続的に複数
形成されたリードフレームである。このリードフレーム
1の半導体搭載部2の樹脂封止部には長手方向の溝4が
形成されている。この溝4は、図1(B)に示すよう
に、二段構造を有し、下側の対向する両縁4a,4aの
間隔が底部の幅より狭く、蟻溝状を成している。また、
半導体搭載部2の周縁部にも溝5が設けられている。こ
の溝5は、図1(C)に示すように、溝4と同様に二段
構造を有するが、下側の対向する両縁5a,5aが上方
に傾いている。
Embodiments of the present invention will be described with reference to the drawings. 1A is a plan view of the lead frame, and FIG. 1B is A-.
A line enlarged cross-sectional view, (C) is a BB line enlarged cross-sectional view, FIG. 2 is a plan view of the long strip plate material in a state before press molding, FIG.
Is an enlarged sectional view of the groove before squeezing, (B) is an enlarged sectional view of the groove after squeezing, FIG. 4 (A) is an enlarged sectional view of the groove before squeezing, (B)
Is an enlarged cross-sectional view after squeezing, and FIG. 5 is a cross-sectional view of the lead frame. In FIG. 1 (A), 1 is a lead frame in which a semiconductor mounting portion 2 on which a semiconductor S is placed and a plurality of leads 3 which are later connected to the semiconductor S by a conductive wire W are continuously formed adjacent to each other in the longitudinal direction. Is. A groove 4 in the longitudinal direction is formed in the resin sealing portion of the semiconductor mounting portion 2 of the lead frame 1. As shown in FIG. 1 (B), the groove 4 has a two-step structure, and the interval between the opposite edges 4a, 4a on the lower side is narrower than the width of the bottom portion and forms a dovetail groove shape. Also,
Grooves 5 are also provided in the peripheral portion of the semiconductor mounting portion 2. As shown in FIG. 1 (C), this groove 5 has a two-step structure similar to the groove 4, but both lower edges 5a, 5a facing each other are inclined upward.

【0007】このリードフレーム1は、図2に示すよう
に、素材である長尺帯板材6を所要の基本的形状に圧延
加工する工程において、圧延ローラによって全体の外形
の成型と同時に、図3(A)に示すような断面矩形の第
1溝7を形成する。次に、第1溝7の上部からローラR
にて圧搾して第1溝7より浅くかつ幅を広く、図3
(B)に示すような第2溝8を形成する。これによっ
て、第1溝7の縁4a,4aが内側に水平に押し出され
て、溝7は蟻溝状になり溝4が形成される。この場合に
は、ローラRによって圧搾された溝4部の金属素材が、
均等に周辺に逃げるため、溝4の両縁または裏側に膨出
部を生じることがなく、溝4の周辺が平滑な断面形状の
長尺帯板材6が得られる。
As shown in FIG. 2, this lead frame 1 is formed by rolling a long strip plate material 6 as a raw material into a required basic shape at the same time as molding the entire outer shape by rolling rollers. A first groove 7 having a rectangular cross section as shown in FIG. Next, from the upper part of the first groove 7, the roller R
It is squeezed by and is shallower and wider than the first groove 7,
The second groove 8 as shown in (B) is formed. As a result, the edges 4a, 4a of the first groove 7 are extruded horizontally inward, and the groove 7 becomes dovetail-shaped to form the groove 4. In this case, the metal material of the groove 4 portion squeezed by the roller R is
Since it escapes evenly to the periphery, bulging portions are not formed on both edges or the back side of the groove 4, and the long strip plate member 6 having a smooth cross-section around the groove 4 can be obtained.

【0008】この後、長尺帯板材6をプレス加工して、
複数の半導体搭載部2とリード3とを連続的に形成する
と共に溝5を形成する。溝5は、打ち抜き加工の際に、
広狭二種の断面矩形のパンチにて、ローラRに代えて二
段圧搾することにより形成してもよいが、図4(A)に
示すような断面矩形の第1溝9を形成した後、第1溝9
の上部から異形のパンチPにて、図4(B)に示すよう
な第1溝9より幅の広い第2溝10を形成してもよい。
これによって、第1溝9の縁5a,5aが傾斜しつつ内
側に押し出されて、溝9は蟻溝状になり溝5が形成され
る。こうして、形成されたリードフレーム1の半導体搭
載部2に半導体Sを載せて導線Wにてリード3と接続し
た後、半導体Sを樹脂封止すると、図5に示すように、
モールディング樹脂Mが溝4,5に入り込んでリードフ
レーム1に対する食い付きがよくなる。
After that, the long strip plate material 6 is pressed,
A plurality of semiconductor mounting portions 2 and leads 3 are continuously formed, and a groove 5 is formed. Groove 5 is used for punching
It may be formed by squeezing in two steps in place of the roller R with two kinds of wide and narrow punches having a rectangular cross section, but after forming the first groove 9 having a rectangular cross section as shown in FIG. First groove 9
The second groove 10 having a width wider than that of the first groove 9 as shown in FIG.
As a result, the edges 5a, 5a of the first groove 9 are pushed inward while being inclined, and the groove 9 becomes a dovetail groove, and the groove 5 is formed. After mounting the semiconductor S on the semiconductor mounting portion 2 of the lead frame 1 thus formed and connecting it to the lead 3 by the conductive wire W, when the semiconductor S is resin-sealed, as shown in FIG.
The molding resin M enters the grooves 4 and 5 to improve the biting of the lead frame 1.

【0009】なお、上記実施例では、圧延加工工程で第
1溝7を形成した後に第2溝8をローラRにて圧搾して
溝4を形成したが、これに代えて第1溝7を切削加工に
より形成してもよく、また第2溝8をプレス加工工程で
打ち抜きと同時に、あるいはその前後に形成してもよ
い。さらに、第2溝8を形成するローラRの断面形状を
図4(A)に示すパンチPと同形状にすることができ
る。
In the above embodiment, the first groove 7 is formed in the rolling process, and then the second groove 8 is squeezed by the roller R to form the groove 4, but instead of this, the first groove 7 is formed. It may be formed by cutting, or the second groove 8 may be formed at the same time as punching or before and after punching in a press working step. Further, the cross-sectional shape of the roller R forming the second groove 8 can be made the same as that of the punch P shown in FIG.

【0010】[0010]

【発明の効果】以上のように、本発明は、長尺帯板材6
に、複数組のリード3と半導体搭載部2とを相隣接して
連続的に形成して成り、かつ半導体封止用樹脂Mのモー
ルド封止部に樹脂Mの喰い付き増強用の長手方向の溝
4,5を有するリードフレーム1であって、この溝4,
5の底部より開放部の幅を狭く形成して半導体装置用リ
ードフレーム1を構成し、特に、溝5が半導体搭載部2
の半導体Sを取り囲むように形成した。また、これらの
リードフレーム1を製造するに当たり、モールド封止部
に溝7,9を形成した後、この溝7,9の上部をこの溝
の幅より広く圧搾することにより溝4,5の底部より開
放部の幅を狭く形成する方法を採用したため、半導体S
を樹脂封止するのにリードフレーム1に対する樹脂Pの
食い付きがよく、密着強度が向上し、耐湿性を増すこと
ができるという効果を奏する。
As described above, according to the present invention, the long strip plate material 6 is used.
A plurality of sets of leads 3 and the semiconductor mounting portion 2 are continuously formed adjacent to each other, and the resin M is embedded in the mold sealing portion of the resin M for semiconductor sealing in the longitudinal direction for increasing. A lead frame 1 having grooves 4, 5,
The width of the open portion is narrower than the bottom portion of the semiconductor device 5 to form the lead frame 1 for a semiconductor device.
Was formed so as to surround the semiconductor S. Further, in manufacturing these lead frames 1, after forming the grooves 7 and 9 in the mold sealing portion, the upper portions of the grooves 7 and 9 are squeezed to be wider than the width of the grooves so that the bottom portions of the grooves 4 and 5 are formed. Since the method of forming the width of the open portion narrower is adopted, the semiconductor S
The resin P is well bited to seal the resin with the lead frame 1, and the adhesion strength is improved, and the moisture resistance can be increased.

【図面の簡単な説明】[Brief description of drawings]

【図1】(A)はリードフレームの平面図、(B)はA
−A線拡大断面図、(C)はB−B線拡大断面図であ
る。
FIG. 1A is a plan view of a lead frame, and FIG.
-A line expanded sectional view, (C) is a BB line expanded sectional view.

【図2】長尺帯板材のプレス成形前の状態の平面図であ
る。
FIG. 2 is a plan view of a long strip plate material before press molding.

【図3】(A)は圧搾前の溝の拡大断面図、(B)は圧
搾後の溝の拡大断面図である。
FIG. 3A is an enlarged cross-sectional view of a groove before squeezing, and FIG. 3B is an enlarged cross-sectional view of a groove after squeezing.

【図4】(A)は圧搾前の溝の拡大断面図、(B)は圧
搾後の拡大断面図である。
FIG. 4A is an enlarged cross-sectional view of a groove before squeezing, and FIG. 4B is an enlarged cross-sectional view after squeezing.

【図5】リードフレームの縦断面図である。FIG. 5 is a vertical sectional view of a lead frame.

【符号の説明】[Explanation of symbols]

1 リードフレーム 2 半導体搭載部 3 リード 4 溝 4a 縁 5 溝 5a 縁 6 長尺帯板材 7 第1溝 8 第2溝 9 第1溝 10 第2溝 M 半導体封止用樹脂 1 Lead Frame 2 Semiconductor Mounting Part 3 Lead 4 Groove 4a Edge 5 Groove 5a Edge 6 Long Strip Plate Material 7 First Groove 8 Second Groove 9 First Groove 10 Second Groove M Semiconductor Sealing Resin

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 長尺帯板材に、複数組のリードと半導体
搭載部とを相隣接して連続的に形成して成り、かつ半導
体封止用樹脂のモールド封止部に樹脂の喰い付き増強用
の溝を有するリードフレームであって、 前記溝は、底部より開放部の幅が狭いことを特徴とする
半導体装置用リードフレーム。
1. A long strip plate material, which is formed by continuously forming a plurality of sets of leads and a semiconductor mounting portion adjacent to each other, and enhances the resin encapsulation portion of the resin for semiconductor encapsulation. A lead frame having a groove for use in a semiconductor device, wherein the groove has a width of an opening portion narrower than a bottom portion thereof.
【請求項2】 前記溝は、半導体搭載部の半導体を囲む
ことを特徴とする請求項1に記載の半導体装置用リード
フレーム。
2. The lead frame for a semiconductor device according to claim 1, wherein the groove surrounds the semiconductor of the semiconductor mounting portion.
【請求項3】 長尺帯板材を打ち抜いて多数組のリード
と半導体搭載部とを相隣接して連続的に形成する請求項
1又は2に記載のリードフレームの製造方法であって、 前記モールド封止部に溝を形成した後、この溝の上部を
この溝の幅より広く圧搾することにより溝の底部より開
放部の幅を狭くすることを特徴とする半導体装置用リー
ドフレームの製造方法。
3. The method of manufacturing a lead frame according to claim 1, wherein a long strip of plate material is punched out to form a large number of sets of leads and semiconductor mounting portions adjacently and continuously. A method for manufacturing a lead frame for a semiconductor device, comprising forming a groove in a sealing portion, and squeezing an upper portion of the groove wider than a width of the groove so that a width of an opening portion is narrower than a bottom portion of the groove.
JP33364492A 1992-11-19 1992-11-19 Lead frame for semiconductor device and its manufacture Pending JPH06163773A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP33364492A JPH06163773A (en) 1992-11-19 1992-11-19 Lead frame for semiconductor device and its manufacture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33364492A JPH06163773A (en) 1992-11-19 1992-11-19 Lead frame for semiconductor device and its manufacture

Publications (1)

Publication Number Publication Date
JPH06163773A true JPH06163773A (en) 1994-06-10

Family

ID=18268365

Family Applications (1)

Application Number Title Priority Date Filing Date
JP33364492A Pending JPH06163773A (en) 1992-11-19 1992-11-19 Lead frame for semiconductor device and its manufacture

Country Status (1)

Country Link
JP (1) JPH06163773A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008155726A2 (en) * 2007-06-21 2008-12-24 Nxp B.V. A carrier for electric packages and a method of structuring a carrier
JP2011091330A (en) * 2009-10-26 2011-05-06 Shindengen Electric Mfg Co Ltd Resin-sealed semiconductor device and method or manufacturing the samef
CN102969297A (en) * 2012-11-20 2013-03-13 无锡市威海达机械制造有限公司 Pouring basin type lead frame structure
JP2014143326A (en) * 2013-01-24 2014-08-07 Transphorm Japan Inc Semiconductor device, method of manufacturing semiconductor device, lead, and method of manufacturing lead
CN105575822A (en) * 2015-12-28 2016-05-11 四川金湾电子有限责任公司 Method for punching dovetail groove in front surface of lead frame of semiconductor
JP2020161671A (en) * 2019-03-27 2020-10-01 日亜化学工業株式会社 Light-emitting device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6378558A (en) * 1986-09-22 1988-04-08 Hitachi Ltd Electronic device
JPH05235228A (en) * 1991-02-28 1993-09-10 Sanken Electric Co Ltd Method of manufacturing electronic component

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6378558A (en) * 1986-09-22 1988-04-08 Hitachi Ltd Electronic device
JPH05235228A (en) * 1991-02-28 1993-09-10 Sanken Electric Co Ltd Method of manufacturing electronic component

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008155726A2 (en) * 2007-06-21 2008-12-24 Nxp B.V. A carrier for electric packages and a method of structuring a carrier
WO2008155726A3 (en) * 2007-06-21 2009-03-05 Nxp Bv A carrier for electric packages and a method of structuring a carrier
JP2011091330A (en) * 2009-10-26 2011-05-06 Shindengen Electric Mfg Co Ltd Resin-sealed semiconductor device and method or manufacturing the samef
CN102969297A (en) * 2012-11-20 2013-03-13 无锡市威海达机械制造有限公司 Pouring basin type lead frame structure
JP2014143326A (en) * 2013-01-24 2014-08-07 Transphorm Japan Inc Semiconductor device, method of manufacturing semiconductor device, lead, and method of manufacturing lead
CN105575822A (en) * 2015-12-28 2016-05-11 四川金湾电子有限责任公司 Method for punching dovetail groove in front surface of lead frame of semiconductor
JP2020161671A (en) * 2019-03-27 2020-10-01 日亜化学工業株式会社 Light-emitting device

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