JPH0614400Y2 - 走査電子顕微鏡付き材料試験機 - Google Patents
走査電子顕微鏡付き材料試験機Info
- Publication number
- JPH0614400Y2 JPH0614400Y2 JP1987181407U JP18140787U JPH0614400Y2 JP H0614400 Y2 JPH0614400 Y2 JP H0614400Y2 JP 1987181407 U JP1987181407 U JP 1987181407U JP 18140787 U JP18140787 U JP 18140787U JP H0614400 Y2 JPH0614400 Y2 JP H0614400Y2
- Authority
- JP
- Japan
- Prior art keywords
- test piece
- electron microscope
- scanning electron
- testing machine
- material testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987181407U JPH0614400Y2 (ja) | 1987-11-28 | 1987-11-28 | 走査電子顕微鏡付き材料試験機 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987181407U JPH0614400Y2 (ja) | 1987-11-28 | 1987-11-28 | 走査電子顕微鏡付き材料試験機 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0186055U JPH0186055U (enrdf_load_stackoverflow) | 1989-06-07 |
JPH0614400Y2 true JPH0614400Y2 (ja) | 1994-04-13 |
Family
ID=31472891
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1987181407U Expired - Lifetime JPH0614400Y2 (ja) | 1987-11-28 | 1987-11-28 | 走査電子顕微鏡付き材料試験機 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0614400Y2 (enrdf_load_stackoverflow) |
-
1987
- 1987-11-28 JP JP1987181407U patent/JPH0614400Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH0186055U (enrdf_load_stackoverflow) | 1989-06-07 |
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