JPH0611498Y2 - アドレス変換装置 - Google Patents
アドレス変換装置Info
- Publication number
- JPH0611498Y2 JPH0611498Y2 JP1988024785U JP2478588U JPH0611498Y2 JP H0611498 Y2 JPH0611498 Y2 JP H0611498Y2 JP 1988024785 U JP1988024785 U JP 1988024785U JP 2478588 U JP2478588 U JP 2478588U JP H0611498 Y2 JPH0611498 Y2 JP H0611498Y2
- Authority
- JP
- Japan
- Prior art keywords
- inspection
- plate
- dedicated
- printed wiring
- mesh plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988024785U JPH0611498Y2 (ja) | 1988-02-26 | 1988-02-26 | アドレス変換装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988024785U JPH0611498Y2 (ja) | 1988-02-26 | 1988-02-26 | アドレス変換装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01128179U JPH01128179U (https=) | 1989-09-01 |
| JPH0611498Y2 true JPH0611498Y2 (ja) | 1994-03-23 |
Family
ID=31244943
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1988024785U Expired - Lifetime JPH0611498Y2 (ja) | 1988-02-26 | 1988-02-26 | アドレス変換装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0611498Y2 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6788078B2 (en) | 2001-11-16 | 2004-09-07 | Delaware Capital Formation, Inc. | Apparatus for scan testing printed circuit boards |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4179823B2 (ja) * | 2002-08-06 | 2008-11-12 | イビデンエンジニアリング株式会社 | プリント配線板通電検査治具の検査装置 |
-
1988
- 1988-02-26 JP JP1988024785U patent/JPH0611498Y2/ja not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6788078B2 (en) | 2001-11-16 | 2004-09-07 | Delaware Capital Formation, Inc. | Apparatus for scan testing printed circuit boards |
| US7071716B2 (en) | 2001-11-16 | 2006-07-04 | Delaware Capital Formation, Inc. | Apparatus for scan testing printed circuit boards |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01128179U (https=) | 1989-09-01 |
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