JPH058498Y2 - - Google Patents
Info
- Publication number
- JPH058498Y2 JPH058498Y2 JP4093588U JP4093588U JPH058498Y2 JP H058498 Y2 JPH058498 Y2 JP H058498Y2 JP 4093588 U JP4093588 U JP 4093588U JP 4093588 U JP4093588 U JP 4093588U JP H058498 Y2 JPH058498 Y2 JP H058498Y2
- Authority
- JP
- Japan
- Prior art keywords
- output
- photodiodes
- outputs
- circuit
- spike noise
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005259 measurement Methods 0.000 description 9
- 238000001514 detection method Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- JJWKPURADFRFRB-UHFFFAOYSA-N carbonyl sulfide Chemical compound O=C=S JJWKPURADFRFRB-UHFFFAOYSA-N 0.000 description 1
- 238000011965 cell line development Methods 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
Landscapes
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4093588U JPH058498Y2 (da) | 1988-03-26 | 1988-03-26 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4093588U JPH058498Y2 (da) | 1988-03-26 | 1988-03-26 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01142820U JPH01142820U (da) | 1989-09-29 |
| JPH058498Y2 true JPH058498Y2 (da) | 1993-03-03 |
Family
ID=31267391
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4093588U Expired - Lifetime JPH058498Y2 (da) | 1988-03-26 | 1988-03-26 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH058498Y2 (da) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009216411A (ja) * | 2008-03-07 | 2009-09-24 | Advanced Mask Inspection Technology Kk | 試料検査装置及び試料検査方法 |
-
1988
- 1988-03-26 JP JP4093588U patent/JPH058498Y2/ja not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009216411A (ja) * | 2008-03-07 | 2009-09-24 | Advanced Mask Inspection Technology Kk | 試料検査装置及び試料検査方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01142820U (da) | 1989-09-29 |
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