JPH0583122B2 - - Google Patents

Info

Publication number
JPH0583122B2
JPH0583122B2 JP63130381A JP13038188A JPH0583122B2 JP H0583122 B2 JPH0583122 B2 JP H0583122B2 JP 63130381 A JP63130381 A JP 63130381A JP 13038188 A JP13038188 A JP 13038188A JP H0583122 B2 JPH0583122 B2 JP H0583122B2
Authority
JP
Japan
Prior art keywords
rays
ray
optical element
reflected
ray optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP63130381A
Other languages
English (en)
Japanese (ja)
Other versions
JPH01301153A (ja
Inventor
Ryohei Yokoyama
Mitsuo Sumya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP63130381A priority Critical patent/JPH01301153A/ja
Publication of JPH01301153A publication Critical patent/JPH01301153A/ja
Publication of JPH0583122B2 publication Critical patent/JPH0583122B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Optical Devices Or Fibers (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP63130381A 1988-05-30 1988-05-30 X線光学素子評価装置 Granted JPH01301153A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63130381A JPH01301153A (ja) 1988-05-30 1988-05-30 X線光学素子評価装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63130381A JPH01301153A (ja) 1988-05-30 1988-05-30 X線光学素子評価装置

Publications (2)

Publication Number Publication Date
JPH01301153A JPH01301153A (ja) 1989-12-05
JPH0583122B2 true JPH0583122B2 (enrdf_load_stackoverflow) 1993-11-24

Family

ID=15032976

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63130381A Granted JPH01301153A (ja) 1988-05-30 1988-05-30 X線光学素子評価装置

Country Status (1)

Country Link
JP (1) JPH01301153A (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2742867B1 (fr) * 1995-12-22 1998-02-06 Commissariat Energie Atomique Procede et dispositif interferometrique de caracterisation d'un milieu
FR2742866B1 (fr) * 1995-12-22 1998-01-30 Commissariat Energie Atomique Procede et dispositif de caracterisation d'un milieu ionise mettant en oeuvre une source de rayonnement electromagnetique a duree ultracourte

Also Published As

Publication number Publication date
JPH01301153A (ja) 1989-12-05

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