JPH0576774B2 - - Google Patents

Info

Publication number
JPH0576774B2
JPH0576774B2 JP58089210A JP8921083A JPH0576774B2 JP H0576774 B2 JPH0576774 B2 JP H0576774B2 JP 58089210 A JP58089210 A JP 58089210A JP 8921083 A JP8921083 A JP 8921083A JP H0576774 B2 JPH0576774 B2 JP H0576774B2
Authority
JP
Japan
Prior art keywords
program
test
address
instruction
register
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58089210A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59215738A (ja
Inventor
Shigeo Kamya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP58089210A priority Critical patent/JPS59215738A/ja
Publication of JPS59215738A publication Critical patent/JPS59215738A/ja
Publication of JPH0576774B2 publication Critical patent/JPH0576774B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Relating To Insulation (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP58089210A 1983-05-23 1983-05-23 集積回路 Granted JPS59215738A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58089210A JPS59215738A (ja) 1983-05-23 1983-05-23 集積回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58089210A JPS59215738A (ja) 1983-05-23 1983-05-23 集積回路

Publications (2)

Publication Number Publication Date
JPS59215738A JPS59215738A (ja) 1984-12-05
JPH0576774B2 true JPH0576774B2 (enrdf_load_stackoverflow) 1993-10-25

Family

ID=13964352

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58089210A Granted JPS59215738A (ja) 1983-05-23 1983-05-23 集積回路

Country Status (1)

Country Link
JP (1) JPS59215738A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS59215738A (ja) 1984-12-05

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