JPH0573178B2 - - Google Patents

Info

Publication number
JPH0573178B2
JPH0573178B2 JP62144984A JP14498487A JPH0573178B2 JP H0573178 B2 JPH0573178 B2 JP H0573178B2 JP 62144984 A JP62144984 A JP 62144984A JP 14498487 A JP14498487 A JP 14498487A JP H0573178 B2 JPH0573178 B2 JP H0573178B2
Authority
JP
Japan
Prior art keywords
light
voltage
electro
intensity
optic material
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP62144984A
Other languages
English (en)
Japanese (ja)
Other versions
JPS63308572A (ja
Inventor
Takuya Nakamura
Shinichiro Aoshima
Yutaka Tsucha
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Priority to JP62144984A priority Critical patent/JPS63308572A/ja
Priority to US07/203,929 priority patent/US4855591A/en
Priority to EP88109295A priority patent/EP0294836B1/en
Priority to DE3851654T priority patent/DE3851654T2/de
Publication of JPS63308572A publication Critical patent/JPS63308572A/ja
Publication of JPH0573178B2 publication Critical patent/JPH0573178B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
    • G01R15/242—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/07—Non contact-making probes
    • G01R1/071—Non contact-making probes containing electro-optic elements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
JP62144984A 1987-06-10 1987-06-10 電圧検出装置 Granted JPS63308572A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP62144984A JPS63308572A (ja) 1987-06-10 1987-06-10 電圧検出装置
US07/203,929 US4855591A (en) 1987-06-10 1988-06-08 Electro-optical voltage detector
EP88109295A EP0294836B1 (en) 1987-06-10 1988-06-10 Voltage detector
DE3851654T DE3851654T2 (de) 1987-06-10 1988-06-10 Spannungsdetektor.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62144984A JPS63308572A (ja) 1987-06-10 1987-06-10 電圧検出装置

Publications (2)

Publication Number Publication Date
JPS63308572A JPS63308572A (ja) 1988-12-15
JPH0573178B2 true JPH0573178B2 (en, 2012) 1993-10-13

Family

ID=15374775

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62144984A Granted JPS63308572A (ja) 1987-06-10 1987-06-10 電圧検出装置

Country Status (4)

Country Link
US (1) US4855591A (en, 2012)
EP (1) EP0294836B1 (en, 2012)
JP (1) JPS63308572A (en, 2012)
DE (1) DE3851654T2 (en, 2012)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4975635A (en) * 1987-11-05 1990-12-04 Hironori Takahashi Voltage detector using a sampling type high-speed photodetector
US5025209A (en) * 1988-06-30 1991-06-18 Victor Company Of Japan, Ltd. Apparatus for detecting surface potential distribution
US5034903A (en) * 1989-01-30 1991-07-23 Alfano Robert R Apparatus and method for measuring the time evolution of carriers propogating within submicron and micron electronic devices
US4928058A (en) * 1989-05-23 1990-05-22 The University Of Rochester Electro-optic signal measurement
DE3924369A1 (de) * 1989-07-22 1991-01-31 Asea Brown Boveri Verfahren zur messung eines elektrischen feldes oder einer elektrischen spannung und einrichtung zur durchfuehrung des verfahrens
JP2556910B2 (ja) * 1989-11-30 1996-11-27 浜松ホトニクス株式会社 光強度変化検出装置
US5124635A (en) * 1990-02-15 1992-06-23 Photon Dynamics, Inc. Voltage imaging system using electro-optics
US4983911A (en) * 1990-02-15 1991-01-08 Photon Dynamics, Inc. Voltage imaging system using electro-optics
US5097201A (en) * 1990-02-15 1992-03-17 Photon Dynamics, Inc. Voltage imaging system using electro-optics
US5170127A (en) * 1991-02-19 1992-12-08 Photon Dynamics, Inc. Capacitance imaging system using electro-optics
US5432461A (en) * 1991-06-28 1995-07-11 Photon Dynamics, Inc. Method of testing active matrix liquid crystal display substrates
US5465052A (en) * 1991-09-10 1995-11-07 Photon Dynamics, Inc. Method of testing liquid crystal display substrates
US5444385A (en) * 1991-09-10 1995-08-22 Photon Dynamics, Inc. Testing apparatus for liquid crystal display substrates
US5459409A (en) * 1991-09-10 1995-10-17 Photon Dynamics, Inc. Testing device for liquid crystal display base plate
US5406213A (en) * 1991-09-10 1995-04-11 Photon Dynamics, Inc. Instrument for testing liquid crystal display base plates
US5543729A (en) * 1991-09-10 1996-08-06 Photon Dynamics, Inc. Testing apparatus and connector for liquid crystal display substrates
US5504438A (en) * 1991-09-10 1996-04-02 Photon Dynamics, Inc. Testing method for imaging defects in a liquid crystal display substrate
JPH06265574A (ja) * 1993-03-15 1994-09-22 Hamamatsu Photonics Kk Ｅ−ｏプローブ
DE4416298A1 (de) * 1994-05-09 1995-11-16 Abb Research Ltd Verfahren und Vorrichtung zur optischen Ermittlung einer physikalischen Größe
SE9502257D0 (sv) 1995-06-21 1995-06-21 Asea Brown Boveri High voltage measuring device
DE19634251A1 (de) * 1996-08-26 1998-03-05 Abb Patent Gmbh Spannungswandler
JP3223155B2 (ja) * 1998-02-05 2001-10-29 科学技術振興事業団 薄膜スピンプローブ
DE19810781C1 (de) * 1998-03-06 1999-08-26 Siemens Ag Vorrichtung zum Messen einer elektrischen Spannung oder einer elektrischen Feldstärke
JP2000221213A (ja) 1998-11-24 2000-08-11 Ando Electric Co Ltd 電気光学プロ―ブ
DE19955978C2 (de) * 1998-11-24 2002-06-27 Ando Electric Elektrooptische Sonde für ein Oszilloskop das eine Signalwellenform mißt
US6269199B1 (en) * 1998-12-30 2001-07-31 Intel Corporation Through silicon modulator and method using polarized light
US6323985B1 (en) 1998-12-30 2001-11-27 Intel Corporation Mosfet through silicon modulator and method

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2845625A1 (de) * 1978-10-19 1980-04-30 Siemens Ag Anordnung zur elektrooptischen spannungsmessung
US4446425A (en) * 1982-02-12 1984-05-01 The University Of Rochester Measurement of electrical signals with picosecond resolution
US4618819A (en) * 1984-03-27 1986-10-21 The University Of Rochester Measurement of electrical signals with subpicosecond resolution
US4603293A (en) * 1984-03-27 1986-07-29 University Of Rochester Measurement of electrical signals with subpicosecond resolution
JPS61124834A (ja) * 1984-11-21 1986-06-12 Sharp Corp 光応用センサ
EP0197196A1 (en) * 1985-03-08 1986-10-15 The University Of Rochester Electro-electron optical oscilloscope system for time-resolving picosecond electrical waveforms

Also Published As

Publication number Publication date
EP0294836A2 (en) 1988-12-14
DE3851654T2 (de) 1995-01-19
JPS63308572A (ja) 1988-12-15
EP0294836A3 (en) 1990-08-01
DE3851654D1 (de) 1994-11-03
US4855591A (en) 1989-08-08
EP0294836B1 (en) 1994-09-28

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees