JPH0567050B2 - - Google Patents
Info
- Publication number
- JPH0567050B2 JPH0567050B2 JP61308704A JP30870486A JPH0567050B2 JP H0567050 B2 JPH0567050 B2 JP H0567050B2 JP 61308704 A JP61308704 A JP 61308704A JP 30870486 A JP30870486 A JP 30870486A JP H0567050 B2 JPH0567050 B2 JP H0567050B2
- Authority
- JP
- Japan
- Prior art keywords
- alignment marks
- alignment
- alignment mark
- marks
- patterns
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61308704A JPS63164316A (ja) | 1986-12-26 | 1986-12-26 | アライメントマ−クの形成方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61308704A JPS63164316A (ja) | 1986-12-26 | 1986-12-26 | アライメントマ−クの形成方法 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP21085494A Division JP2614418B2 (ja) | 1994-09-05 | 1994-09-05 | アライメントマーク |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS63164316A JPS63164316A (ja) | 1988-07-07 |
JPH0567050B2 true JPH0567050B2 (enrdf_load_html_response) | 1993-09-24 |
Family
ID=17984275
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP61308704A Granted JPS63164316A (ja) | 1986-12-26 | 1986-12-26 | アライメントマ−クの形成方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63164316A (enrdf_load_html_response) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL1036476A1 (nl) * | 2008-02-01 | 2009-08-04 | Asml Netherlands Bv | Alignment mark and a method of aligning a substrate comprising such an alignment mark. |
JP5006889B2 (ja) * | 2008-02-21 | 2012-08-22 | エーエスエムエル ネザーランズ ビー.ブイ. | 粗ウェーハ位置合わせ用マーク構造及びこのようなマーク構造の製造方法 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5617017A (en) * | 1979-07-20 | 1981-02-18 | Nippon Kogaku Kk <Nikon> | Positioning device using bidirectional diffraction grating |
-
1986
- 1986-12-26 JP JP61308704A patent/JPS63164316A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS63164316A (ja) | 1988-07-07 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |