JPH056641B2 - - Google Patents

Info

Publication number
JPH056641B2
JPH056641B2 JP59187750A JP18775084A JPH056641B2 JP H056641 B2 JPH056641 B2 JP H056641B2 JP 59187750 A JP59187750 A JP 59187750A JP 18775084 A JP18775084 A JP 18775084A JP H056641 B2 JPH056641 B2 JP H056641B2
Authority
JP
Japan
Prior art keywords
thin film
measured
inductance
measurement
thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59187750A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6166104A (ja
Inventor
Shiro Fukushima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Anelva Corp
Original Assignee
Anelva Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anelva Corp filed Critical Anelva Corp
Priority to JP18775084A priority Critical patent/JPS6166104A/ja
Publication of JPS6166104A publication Critical patent/JPS6166104A/ja
Publication of JPH056641B2 publication Critical patent/JPH056641B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
JP18775084A 1984-09-07 1984-09-07 金属薄膜膜厚測定方法 Granted JPS6166104A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18775084A JPS6166104A (ja) 1984-09-07 1984-09-07 金属薄膜膜厚測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18775084A JPS6166104A (ja) 1984-09-07 1984-09-07 金属薄膜膜厚測定方法

Publications (2)

Publication Number Publication Date
JPS6166104A JPS6166104A (ja) 1986-04-04
JPH056641B2 true JPH056641B2 (US06420036-20020716-C00037.png) 1993-01-27

Family

ID=16211542

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18775084A Granted JPS6166104A (ja) 1984-09-07 1984-09-07 金属薄膜膜厚測定方法

Country Status (1)

Country Link
JP (1) JPS6166104A (US06420036-20020716-C00037.png)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3519806B2 (ja) * 1994-11-29 2004-04-19 株式会社小野測器 厚さ弁別装置
SE517293C2 (sv) * 1999-06-30 2002-05-21 Abb Ab Förfarande och anordning för induktiv mätning av geometrisk dimension och elektrisk egenskap med motriktade magnetfält
JP3907414B2 (ja) * 2000-01-17 2007-04-18 株式会社荏原製作所 ポリッシング装置
TWI241398B (en) * 2000-03-28 2005-10-11 Toshiba Corp Eddy current loss measuring sensor, film thickness measuring device, film thickness measuring method and recording medium
JP4514942B2 (ja) * 2000-12-07 2010-07-28 株式会社アルバック 成膜装置
US7205166B2 (en) * 2002-06-28 2007-04-17 Lam Research Corporation Method and apparatus of arrayed, clustered or coupled eddy current sensor configuration for measuring conductive film properties
US7112961B2 (en) * 2002-12-13 2006-09-26 Applied Materials, Inc. Method and apparatus for dynamically measuring the thickness of an object
US6788050B2 (en) * 2002-12-23 2004-09-07 Lam Research Corp. System, method and apparatus for thin-film substrate signal separation using eddy current
TWI681184B (zh) * 2017-12-21 2020-01-01 國立虎尾科技大學 應用於pcb多層板之非接觸式上下層銅厚的量測方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5425755A (en) * 1977-07-27 1979-02-26 Measurex Corp Thickness meter for measuring sheettlike body
JPS5753604A (en) * 1980-09-18 1982-03-30 Yokogawa Hokushin Electric Corp Thickness gauge

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5425755A (en) * 1977-07-27 1979-02-26 Measurex Corp Thickness meter for measuring sheettlike body
JPS5753604A (en) * 1980-09-18 1982-03-30 Yokogawa Hokushin Electric Corp Thickness gauge

Also Published As

Publication number Publication date
JPS6166104A (ja) 1986-04-04

Similar Documents

Publication Publication Date Title
US6028427A (en) Magnetism sensor using a magnetism detecting device of a magnetic impedance effect type and control apparatus using the same
JPS5845168B2 (ja) 計器用変成器
US20010030537A1 (en) Magnetic field detection device
US3815016A (en) Method of measuring thickness of nonmetallic paving material with compensation for properties of the material
GB2064140A (en) Measuring transducers for measuring magnetic fields
JPS58501692A (ja) 電流測定用変成器
US10295573B2 (en) Compensated rogowski coil
JPH056641B2 (US06420036-20020716-C00037.png)
JP3574409B2 (ja) 電流センサ及び電流測定回路
JPH08297006A (ja) 移動中の金属板上に形成された絶縁性被膜の厚さ測定装置、およびその測定方法
US20120063631A1 (en) Method for manufacturing spiral coil, the spiral coil, and electro-magnetic acoustic transducer including the same
JPS618639A (ja) 磁歪式トルク検出装置
JP3634281B2 (ja) 磁気インピーダンス効果センサー
JPH08278358A (ja) 磁気特性測定方法及びその装置
Gledhill et al. A new method for measurement of the high field conductance of electrolytes (The Wien effect)
US3693072A (en) Ferromagnetic resonance magnetometer
JPS604084Y2 (ja) 変位変換器
JPS6041474B2 (ja) 信号伝達素子
JPH0552470B2 (US06420036-20020716-C00037.png)
JPS58123402A (ja) 非接触変位測定装置
JPS58223704A (ja) 海氷の厚さ推定方法
RU1795310C (ru) Способ изготовлени чувствительного элемента магнитоупругого датчика усили
Lewis A miniature mutual-inductive proximity transducer
JPS63128255A (ja) 励磁型薄膜ピツクアツプコイル
RU2059259C1 (ru) Магниточувствительный элемент

Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term