JPS5425755A - Thickness meter for measuring sheettlike body - Google Patents

Thickness meter for measuring sheettlike body

Info

Publication number
JPS5425755A
JPS5425755A JP9137878A JP9137878A JPS5425755A JP S5425755 A JPS5425755 A JP S5425755A JP 9137878 A JP9137878 A JP 9137878A JP 9137878 A JP9137878 A JP 9137878A JP S5425755 A JPS5425755 A JP S5425755A
Authority
JP
Japan
Prior art keywords
sheettlike
measuring
thickness meter
meter
thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9137878A
Other languages
Japanese (ja)
Other versions
JPS5839283B2 (en
Inventor
Matsutei Teitsupo Peka
Uenabaagu Ganaa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Honeywell Measurex Corp
Original Assignee
Measurex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US05/819,469 external-priority patent/US4107606A/en
Application filed by Measurex Corp filed Critical Measurex Corp
Publication of JPS5425755A publication Critical patent/JPS5425755A/en
Publication of JPS5839283B2 publication Critical patent/JPS5839283B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/40—Caliper-like sensors
    • G01B2210/46—Caliper-like sensors with one or more detectors on a single side of the object to be measured and with a transmitter on the other side
JP53091378A 1977-07-27 1978-07-26 Thickness gauge for measuring sheet-like objects Expired JPS5839283B2 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/819,469 US4107606A (en) 1976-12-14 1977-07-27 Non-contacting electromagnetic thickness gauge for sheet measurement having improved small distance sensitivity

Publications (2)

Publication Number Publication Date
JPS5425755A true JPS5425755A (en) 1979-02-26
JPS5839283B2 JPS5839283B2 (en) 1983-08-29

Family

ID=25228254

Family Applications (1)

Application Number Title Priority Date Filing Date
JP53091378A Expired JPS5839283B2 (en) 1977-07-27 1978-07-26 Thickness gauge for measuring sheet-like objects

Country Status (5)

Country Link
JP (1) JPS5839283B2 (en)
CA (1) CA1096956A (en)
DE (1) DE2829264A1 (en)
FR (1) FR2398999A1 (en)
IT (1) IT1097875B (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57197434A (en) * 1981-05-29 1982-12-03 Hitachi Ltd Measuring method of tension
JPS59122505U (en) * 1983-02-07 1984-08-17 株式会社キ−エンス Transmitting coil of double feed detector
JPS59230136A (en) * 1983-06-09 1984-12-24 Rohm Co Ltd Light leakage inspecting method of light emitting display device
JPS6166104A (en) * 1984-09-07 1986-04-04 Anelva Corp Method for measuring thickness of thin metal film
JP2003503683A (en) * 1999-06-30 2003-01-28 エービービー エービー Target guidance measurement method
JP2007517218A (en) * 2003-12-30 2007-06-28 ラム　リサーチ　コーポレーション Method and apparatus for measuring film thickness with a coupled eddy current sensor

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3331407A1 (en) * 1983-08-31 1985-03-14 Helmut Fischer GmbH & Co Institut für Elektronik und Meßtechnik, 7032 Sindelfingen Electromagnetic measuring probe
DE3612914A1 (en) * 1986-04-17 1987-10-22 Heidelberger Druckmasch Ag DEVICE FOR MEASURING THE THICKNESS OF PAPER OR THE LIKE
US4813147A (en) * 1987-03-27 1989-03-21 Amp Incorporated Apparatus for interacting with both sides of a two-sided strip
DE4011646A1 (en) * 1990-04-11 1991-10-24 Micro Epsilon Messtechnik THICKNESS MEASURING DEVICE
FI103918B (en) 1998-02-26 1999-10-15 Metso Paper Automation Oy Method and apparatus for measuring the properties of a moving web
WO2009024187A1 (en) * 2007-08-21 2009-02-26 Thomas Edye Contactless device for measuring the thickness of moving thin layers or films
US10119837B2 (en) * 2016-07-06 2018-11-06 Biosense Webster (Israel) Ltd. Magnetic-field generating circuit for a tracking system

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE480971A (en) * 1948-03-05
US2563254A (en) * 1948-05-10 1951-08-07 Hydril Corp Thickness indicator
US2665333A (en) * 1950-11-30 1954-01-05 Libbey Owens Ford Glass Co Apparatus for measuring thickness of sheet material
GB843624A (en) * 1955-12-19 1960-08-04 Roe A V & Co Ltd Improvements relating to thickness measuring instruments
US3528002A (en) * 1968-01-04 1970-09-08 Conrac Corp Caliper with air bearings for continuously moving sheet material
US3696290A (en) * 1970-07-22 1972-10-03 Hays Corp Magnetic non-contact thickness gauge with means to compensate the effects of stray fields on the gauge
SU394654A1 (en) * 1970-12-28 1973-08-22 DEVICE FOR MEASURING THE THICKNESS OF LARGE-SIZED PRODUCTS
DE2640155C3 (en) * 1976-09-07 1982-02-11 Electronic Production Aids Co., Ltd., Worcester Park, Surrey Measuring device working according to the eddy current principle for continuous measurement of the thickness of a moving metal object.

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57197434A (en) * 1981-05-29 1982-12-03 Hitachi Ltd Measuring method of tension
JPS59122505U (en) * 1983-02-07 1984-08-17 株式会社キ−エンス Transmitting coil of double feed detector
JPS59230136A (en) * 1983-06-09 1984-12-24 Rohm Co Ltd Light leakage inspecting method of light emitting display device
JPH0449059B2 (en) * 1983-06-09 1992-08-10 Rohm Kk
JPS6166104A (en) * 1984-09-07 1986-04-04 Anelva Corp Method for measuring thickness of thin metal film
JPH056641B2 (en) * 1984-09-07 1993-01-27 Anelva Corp
JP2003503683A (en) * 1999-06-30 2003-01-28 エービービー エービー Target guidance measurement method
JP2007517218A (en) * 2003-12-30 2007-06-28 ラム　リサーチ　コーポレーション Method and apparatus for measuring film thickness with a coupled eddy current sensor

Also Published As

Publication number Publication date
JPS5839283B2 (en) 1983-08-29
CA1096956A (en) 1981-03-03
FR2398999B1 (en) 1985-05-17
DE2829264A1 (en) 1979-02-08
FR2398999A1 (en) 1979-02-23
DE2829264C2 (en) 1989-09-28
IT7825874A0 (en) 1978-07-19
IT1097875B (en) 1985-08-31

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